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UV-Vis Instrumentation : From Routine to Advanced Applications Part II

UV-Vis Instrumentation : From Routine to Advanced Applications Part II

We will focus on the high end UV-Vis-nir instrumentation and the accessories which allow for a more complex measurements to be made.
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Already taken place Th, 5.12.2024
Agilent Technologies
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UV-Vis Instrumentation : From Routine to Advanced Applications Part II
Leveraging ASTM D6122 & D8340 for a Competitive Edge in Petrochemicals

Leveraging ASTM D6122 & D8340 for a Competitive Edge in Petrochemicals

We will discuss recent advancements in process spectroscopy and their integration with Process Analytical Technology (PAT).
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Already taken place Th, 5.12.2024
Metrohm
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Leveraging ASTM D6122 & D8340 for a Competitive Edge in Petrochemicals
Battery Cell Manufacturing Process improvement: Advanced X-ray and Magnetic Resonance Solutions

Battery Cell Manufacturing Process improvement: Advanced X-ray and Magnetic Resonance Solutions

Experts in Advanced X-ray and Magnetic Resonance Solutions will discuss how these cutting-edge technologies can significantly enhance LIB production.
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Already taken place Th, 5.12.2024
Bruker
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Battery Cell Manufacturing Process improvement: Advanced X-ray and Magnetic Resonance Solutions
Analyzing archaeological objects and handcraft using micro-XRF analysis

Analyzing archaeological objects and handcraft using micro-XRF analysis

If you're curious to discover what spatially resolved micro-XRF can achieve, we invite you to join us for our webinar.
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Already taken place Th, 5.12.2024
Bruker
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Analyzing archaeological objects and handcraft using micro-XRF analysis
How to Implement an Efficient Quality Control Program in Preclinical Imaging: Insights from the Field

How to Implement an Efficient Quality Control Program in Preclinical Imaging: Insights from the Field

Preclinical imaging requires quality control to maintain the reliability, reproducibility, and repeatability and to ensure the accuracy and precision of SPECT and PET quantification.
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Already taken place We, 4.12.2024
Bruker
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How to Implement an Efficient Quality Control Program in Preclinical Imaging: Insights from the Field
How to use Inter Element Correction (IEC) to Overcome Interferences in ICP-OES

How to use Inter Element Correction (IEC) to Overcome Interferences in ICP-OES

How you can deal with complex spectral interferences on ICP-OES by using Inter Element Correction (IEC) in an easy and simple way.
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Already taken place We, 4.12.2024
Thermo Fisher Scientific
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How to use Inter Element Correction (IEC) to Overcome Interferences in ICP-OES
Non-Traditional Elements in Semiconductor Solvents by 8900 Triple Quad ICP-MS

Non-Traditional Elements in Semiconductor Solvents by 8900 Triple Quad ICP-MS

Non-Traditional Elements in Semiconductor Solvents by 8900 Triple Quad ICP-MS.
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Already taken place Tu, 3.12.2024
Agilent Technologies
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Non-Traditional Elements in Semiconductor Solvents by 8900 Triple Quad ICP-MS
Advanced Indentation - Cyclic Modes

Advanced Indentation - Cyclic Modes

The session will cover fundamental concepts such as cyclic mode principles, examining how they contribute to understanding material behavior under repeated loading conditions.
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Already taken place Tu, 3.12.2024
Anton Paar
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Advanced Indentation - Cyclic Modes
Raw Material ID Through Non-Transparent Packaging Using Agilent Vaya Handheld Raman

Raw Material ID Through Non-Transparent Packaging Using Agilent Vaya Handheld Raman

If you regularly receive a large number of raw materials from a variety of suppliers at a high frequency and want to optimize their release, this webinar is for you!
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Already taken place Th, 28.11.2024
Agilent Technologies
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Raw Material ID Through Non-Transparent Packaging Using Agilent Vaya Handheld Raman
Semicon e-Symposium 2024

Semicon e-Symposium 2024

Expert discussions on crucial topics in the semiconductor industry, including yield improvement, sustainability, PFAS analysis, and advanced analytical techniques.
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Already taken place Th, 28.11.2024
Agilent Technologies
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Semicon e-Symposium 2024
 

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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike