Next-Generation Rheology for Pharma: Precision at 0.2 nNm and Beyond
Discover how next-generation rheometers and compliant software are transforming pharma R&D, QC, and production—from protein solutions to powders and syringes.
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Already taken place Th, 22.1.2026
Anton Paar
Optimized Elemental Analysis with Tabletop Electron Microscopes
Learn how the upgraded Hitachi TM4000PlusⅢ SEM and Bruker QUANTAX EDS enable fast, high-quality elemental analysis and mapping in minutes—bringing advanced EDS performance to a compact, user-friendly system.
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Already taken place Th, 22.1.2026
Bruker
Effortless UV-VIS Analysis with Long Pathlength Measurements
The Cary 3500's flexible sampling options make this concentration analysis more effortless than ever before.
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Already taken place Th, 15.1.2026
Agilent Technologies
The importance of controlling contamination and choosing the right sample introduction system even before you start your analysis to achieve the best detection limits
Even before you start your analysis, controlling environmental contamination and choosing the right sample introduction system is the first step.
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Already taken place Tu, 13.1.2026
Agilent Technologies
Characterization of Composite Materials by Thermal Analysis
Learn how thermal analysis (DSC, TGA, TMA, DMA) characterizes modern composites, from Tg and curing to stiffness and delamination, supporting R&D and QC workflows.
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Already taken place Th, 8.1.2026
Mettler-Toledo
Elemental Analysis of Alloy Samples on an Agilent ICP-OES
Learn how Agilent ICP-OES enables precise alloy analysis by tackling spectral interferences and wide dynamic range needs, ensuring reliable results for industry.
This workshop will show the workflow of analyzing a microplastic sample on the Agilent 8700 Laser Direct Infrared Imaging (LDIR).
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Already taken place Th, 18.12.2025
Agilent Technologies
Analysis of aqueous Environmental samples using UV-Vis instrumentation
Discover even more analysis you can perform with the Cary 60 UV-Vis in the Environmental area.
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Already taken place Tu, 16.12.2025
Agilent Technologies
Hyperspectral Characterization of Advanced Materials using AFM
We warmly invite you to join us for this webinar on the Hyperspectral Characterization of Advanced Materials using Atomic Force Microscopy (AFM).
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Already taken place Tu, 16.12.2025
Bruker
Understanding the Difference Between Type and Control Standards in Elemental Analysis
Discover how type and control standards enhance calibration, precision and QC stability in arc/spark OES and XRF analysis, with practical software integration tips.