Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices
Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices.
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Already taken place Tu, 10.2.2026
Agilent Technologies
Meet Compact-Q DEER Spectrometer, Your Gateway to Quantum Innovation
Discover how the Compact-Q DEER spectrometer enables high-fidelity qubit characterization and control, combining advanced microwave architecture, AWGs, and cryogen-free operation.
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Already taken place Tu, 10.2.2026
Bruker
Process Raman: A Reliable and Versatile Tool For Downstream Process Monitoring and Control For mAB Production
The presentation highlights how process Raman spectroscopy offers several advantages over traditional in-line UV-Vis analysis for process monitoring and metabolite production control.
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Already taken place Tu, 10.2.2026
Thermo Fisher Scientific
Advancing energy storage with spectroelectrochemistry
Discover how combining electrochemistry with FTIR, Raman, and microscopy reveals electrode reactions and chemical homogeneity, accelerating research in batteries, fuel cells, and energy materials.
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Already taken place Th, 5.2.2026
SelectScience
Fundamentals of Atomic Spectroscopy: ICP-MS
In this webinar, we will be looking at and defining hardware features essential for strong ICPMS performance.
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Already taken place Th, 5.2.2026
Agilent Technologies
Rare Earth Magnet Analysis: The Role of XRF in Production and Recycling
Learn how small-spot ED-XRF enables fast, digestion-free analysis of rare earth elements in permanent magnets, supporting quality control, recycling, and regulatory compliance.
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Already taken place Th, 5.2.2026
SPECTRO Analytical Instruments
New microwave digestion tools for heavy metals analysis of environmental samples
Discover modern sample preparation solutions for environmental analysis. Episode 1 focuses on new microwave digestion tools that improve throughput, accuracy, and cost efficiency in heavy metals analysis.
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Already taken place Th, 5.2.2026
Milestone
Semiconductor Applications and Setup for a variety of Solvents and Matrices by ICP-OES
Explore how ICP-OES supports semiconductor analysis of high-silicon matrices and inorganic/organic reagents, with setup tips for solvents and trace detection.
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Already taken place Tu, 3.2.2026
Agilent Technologies
Thermal Analysis of Electronic Components
Discover how thermal analysis (DSC, TGA, TMA, DMA) characterizes electronic materials and PCBs, supporting design, reliability, and lifetime performance.
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Already taken place Th, 29.1.2026
Mettler-Toledo
Measuring Diffuse Powders and Films With UV-VIS-NIR
We will discuss diffuse reflectance accessories (DRAs) as well as Agilent's universal measurement accessory (UMA) for measuring the angular distribution of the reflected light.