Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices

Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices

Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices.
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Already taken place Tu, 10.2.2026
Agilent Technologies
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Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices
Meet Compact-Q DEER Spectrometer, Your Gateway to Quantum Innovation

Meet Compact-Q DEER Spectrometer, Your Gateway to Quantum Innovation

Discover how the Compact-Q DEER spectrometer enables high-fidelity qubit characterization and control, combining advanced microwave architecture, AWGs, and cryogen-free operation.
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Already taken place Tu, 10.2.2026
Bruker
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Meet Compact-Q DEER Spectrometer, Your Gateway to Quantum Innovation
Process Raman: A Reliable and Versatile Tool For Downstream Process Monitoring and Control For mAB Production

Process Raman: A Reliable and Versatile Tool For Downstream Process Monitoring and Control For mAB Production

The presentation highlights how process Raman spectroscopy offers several advantages over traditional in-line UV-Vis analysis for process monitoring and metabolite production control.
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Already taken place Tu, 10.2.2026
Thermo Fisher Scientific
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Process Raman: A Reliable and Versatile Tool For Downstream Process Monitoring and Control For mAB Production
Advancing energy storage with spectroelectrochemistry

Advancing energy storage with spectroelectrochemistry

Discover how combining electrochemistry with FTIR, Raman, and microscopy reveals electrode reactions and chemical homogeneity, accelerating research in batteries, fuel cells, and energy materials.
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Already taken place Th, 5.2.2026
SelectScience
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Advancing energy storage with spectroelectrochemistry
Fundamentals of Atomic Spectroscopy: ICP-MS

Fundamentals of Atomic Spectroscopy: ICP-MS

In this webinar, we will be looking at and defining hardware features essential for strong ICPMS performance.
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Already taken place Th, 5.2.2026
Agilent Technologies
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Fundamentals of Atomic Spectroscopy: ICP-MS
Rare Earth Magnet Analysis: The Role of XRF in Production and Recycling

Rare Earth Magnet Analysis: The Role of XRF in Production and Recycling

Learn how small-spot ED-XRF enables fast, digestion-free analysis of rare earth elements in permanent magnets, supporting quality control, recycling, and regulatory compliance.
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Already taken place Th, 5.2.2026
SPECTRO Analytical Instruments
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Rare Earth Magnet Analysis: The Role of XRF in Production and Recycling
New microwave digestion tools for heavy metals analysis of environmental samples

New microwave digestion tools for heavy metals analysis of environmental samples

Discover modern sample preparation solutions for environmental analysis. Episode 1 focuses on new microwave digestion tools that improve throughput, accuracy, and cost efficiency in heavy metals analysis.
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Already taken place Th, 5.2.2026
Milestone
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New microwave digestion tools for heavy metals analysis of environmental samples
Semiconductor Applications and Setup for a variety of Solvents and Matrices by ICP-OES

Semiconductor Applications and Setup for a variety of Solvents and Matrices by ICP-OES

Explore how ICP-OES supports semiconductor analysis of high-silicon matrices and inorganic/organic reagents, with setup tips for solvents and trace detection.
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Already taken place Tu, 3.2.2026
Agilent Technologies
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Semiconductor Applications and Setup for a variety of Solvents and Matrices by ICP-OES
Thermal Analysis of Electronic Components

Thermal Analysis of Electronic Components

Discover how thermal analysis (DSC, TGA, TMA, DMA) characterizes electronic materials and PCBs, supporting design, reliability, and lifetime performance.
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Already taken place Th, 29.1.2026
Mettler-Toledo
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Thermal Analysis of Electronic Components
Measuring Diffuse Powders and Films With UV-VIS-NIR

Measuring Diffuse Powders and Films With UV-VIS-NIR

We will discuss diffuse reflectance accessories (DRAs) as well as Agilent's universal measurement accessory (UMA) for measuring the angular distribution of the reflected light.
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Already taken place Tu, 27.1.2026
Agilent Technologies
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Measuring Diffuse Powders and Films With UV-VIS-NIR
 

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