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Handheld and Portable XRF in Cultural Heritage - Part III. Quantitative Data: What do the Numbers Mean?

Handheld and Portable XRF in Cultural Heritage - Part III. Quantitative Data: What do the Numbers Mean?

Using practical examples from the field, we will highlight the advantages and pitfalls of quantitative analysis in the field of cultural heritage and art conservation.
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Already taken place Tu, 2.7.2024
Bruker
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Handheld and Portable XRF in Cultural Heritage - Part III. Quantitative Data: What do the Numbers Mean?
Navigating 21 CFR Part 11 Compliance for ICP-MS with Open Lab ECM

Navigating 21 CFR Part 11 Compliance for ICP-MS with Open Lab ECM

21 CFR Part 11 Compliance for ICP-MS with Open Lab ECM
RECORD
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Already taken place Th, 27.6.2024
Agilent Technologies
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Navigating 21 CFR Part 11 Compliance for ICP-MS with Open Lab ECM
Semiconductor Specialty Gas Analysis Using GDI-ICP-MS

Semiconductor Specialty Gas Analysis Using GDI-ICP-MS

You will learn about an alternative sample prep method using a gas exchange device.
RECORD
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Already taken place Th, 27.6.2024
PerkinElmer
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Semiconductor Specialty Gas Analysis Using GDI-ICP-MS
Laboratory of the Future: A Tech Spotlight on the Future of Research

Laboratory of the Future: A Tech Spotlight on the Future of Research

This immersive webinar offers an exclusive glimpse into the groundbreaking technologies shaping the laboratories of tomorrow.
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Already taken place Th, 27.6.2024
Technology Networks
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Laboratory of the Future: A Tech Spotlight on the Future of Research
SciY Mestrelab Mnova & ZONTAL Join Forces for Next-Level Data Integration

SciY Mestrelab Mnova & ZONTAL Join Forces for Next-Level Data Integration

ZONTAL and Mestrelab by SciY are leaders in their respective areas of data digitalisation and complex analytical data processing. In this talk we explore how the two products can be seamlessly integrated.
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Already taken place Th, 27.6.2024
SciY/Mestrelab Research
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SciY Mestrelab Mnova & ZONTAL Join Forces for Next-Level Data Integration
SciY Mestrelab Mnova & ZONTAL Join Forces for Next-Level Data Integration

SciY Mestrelab Mnova & ZONTAL Join Forces for Next-Level Data Integration

In this talk we explore how the two products can be seamlessly integrated to add convenience and value.
RECORD
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Already taken place Th, 27.6.2024
SciY/Mestrelab Research
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SciY Mestrelab Mnova & ZONTAL Join Forces for Next-Level Data Integration
Modular UV-Vis Spectroscopy: A Smart and Scalable Approach to High-Performance Analysis

Modular UV-Vis Spectroscopy: A Smart and Scalable Approach to High-Performance Analysis

Dr. Mathieu Rault, will present the Agilent Cary 3500 UV-Vis spectrophotometer series, developed from the ground-up to address UV-Vis pain points and go beyond traditional user experiences.
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Already taken place Th, 27.6.2024
SelectScience
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Modular UV-Vis Spectroscopy: A Smart and Scalable Approach to High-Performance Analysis
Thermal Analysis of Lithium-Ion Batteries

Thermal Analysis of Lithium-Ion Batteries

Key Techniques for Studying Anode, Cathode, Separator, Binder, and Electrolyte Materials
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Already taken place Th, 27.6.2024
Mettler-Toledo
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Thermal Analysis of Lithium-Ion Batteries
Unlocking the Potential of Your SEM: The Future of In-Situ Automated Nanoindentation with Bruker’s New PI 89 Auto SEM PicoIndenter

Unlocking the Potential of Your SEM: The Future of In-Situ Automated Nanoindentation with Bruker’s New PI 89 Auto SEM PicoIndenter

During this webinar, attendees will be introduced to Bruker’s new Hysitron PI 89 Auto SEM PicoIndenter.
RECORD
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Already taken place We, 26.6.2024
Bruker
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Unlocking the Potential of Your SEM: The Future of In-Situ Automated Nanoindentation with Bruker’s New PI 89 Auto SEM PicoIndenter
Transform Challenging EDS Measurements into Routine Analytical Work

Transform Challenging EDS Measurements into Routine Analytical Work

In this webinar, you will learn how the XFlash® FlatQUAD detector can transform your SEM EDS elemental analysis from slow, difficult, and sometimes impossible - to an easy routine analysis.
RECORD
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Already taken place We, 26.6.2024
Bruker
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Transform Challenging EDS Measurements into Routine Analytical Work
 

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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike