ASTM 8322: Elemental Analysis of Crude Oils and Residual Fuels Using MP-AES

ASTM 8322: Elemental Analysis of Crude Oils and Residual Fuels Using MP-AES

Join us for an in-depth look at ASTM D8322 using MP-AES to analyze V, Ni, Ca, Na, Al, Si, Zn, and S in residual fuels, and Fe, V, Ni, Ca, Na, K, and S in crude oils.
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Already taken place Tu, 20.5.2025
Agilent Technologies
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ASTM 8322: Elemental Analysis of Crude Oils and Residual Fuels Using MP-AES
Mechanical Recycling Meets Innovation: Real-Time Analysis in the Extrusion Process

Mechanical Recycling Meets Innovation: Real-Time Analysis in the Extrusion Process

Felix Mehrens and Niklas Rode present inline extrusion monitoring using Raman spectroscopy—a real-time method for continuous control and improved recyclate quality.
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Already taken place Tu, 20.5.2025
AZoM
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Mechanical Recycling Meets Innovation: Real-Time Analysis in the Extrusion Process
Discover the Next Level of Analytical Excellence in XRF

Discover the Next Level of Analytical Excellence in XRF

Register for this launch event to discover the most advanced XRF system yet and to find out how to take your elemental analysis to the next level.
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Already taken place Tu, 20.5.2025
Bruker
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Discover the Next Level of Analytical Excellence in XRF
Strategies to Improve the Precision and Accuracy of your Isotope Ratio Measurements

Strategies to Improve the Precision and Accuracy of your Isotope Ratio Measurements

This webinar will provide some strategies and techniques to minimize the impact of these factors, ultimately enhancing the accuracy and precision of your isotope ratio measurements when using ICP-MS.
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Already taken place Th, 15.5.2025
Agilent Technologies
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Strategies to Improve the Precision and Accuracy of your Isotope Ratio Measurements
Streamline your genomic workflows for seamless and accurate quantification with Nanodrop Ultra

Streamline your genomic workflows for seamless and accurate quantification with Nanodrop Ultra

Join this educational webinar where Senior Product Manager, Patrick Brown from Thermo Fisher Scientific will introduce the NanoDrop™ Ultra family of instruments for nucleic acid quantification
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Already taken place Th, 15.5.2025
SelectScience
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Streamline your genomic workflows for seamless and accurate quantification with Nanodrop Ultra
 Fluorescence Microscopy Webinars Enabling Light Sheet Imaging and Tissue Clearing in a Shared Facility

Fluorescence Microscopy Webinars Enabling Light Sheet Imaging and Tissue Clearing in a Shared Facility

Learn how our guest speaker uses different imaging techniques in an imaging facility.
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Already taken place We, 14.5.2025
Bruker
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 Fluorescence Microscopy Webinars Enabling Light Sheet Imaging and Tissue Clearing in a Shared Facility
Enhancing Quality Control in Food and Feed Production

Enhancing Quality Control in Food and Feed Production

Join us for an insightful online seminar where BRUKER and RETSCH will explore comprehensive QC solutions for food and feed production.
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Already taken place We, 14.5.2025
Bruker
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Enhancing Quality Control in Food and Feed Production
Understanding Your Materials: How X-ray Diffraction Reveals the Secrets of Cement, Concrete, and Mining Samples

Understanding Your Materials: How X-ray Diffraction Reveals the Secrets of Cement, Concrete, and Mining Samples

This session dives into how X-ray diffraction (XRD) helps uncover the composition of cement, concrete, and mining materials by analyzing their crystalline structure.
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Already taken place We, 14.5.2025
Anton Paar
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Understanding Your Materials: How X-ray Diffraction Reveals the Secrets of Cement, Concrete, and Mining Samples
The Analysis of Petroleum and Petroleum Products with an Agilent ICP-MS system

The Analysis of Petroleum and Petroleum Products with an Agilent ICP-MS system

The ease of organic solvent introduction in an Agilent ICPMS system and the optimization of the ICPMS system for petroleum analysis.
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Already taken place Tu, 13.5.2025
Agilent Technologies
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The Analysis of Petroleum and Petroleum Products with an Agilent ICP-MS system
Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM

Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM

Discover how LiteScope’s integrated AFM-in-SEM technology allows precise in-situ electrical and topographical characterization of semiconductor structures down to the nanoscale.
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Already taken place Tu, 13.5.2025
NenoVision
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Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM
 

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