UV-VIS-NIR in Battery Development

UV-VIS-NIR in Battery Development

Agilent's portfolio of instruments offers the high performance and flexible accessories needed for pioneering new applications.
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Already taken place Th, 25.9.2025
Agilent Technologies
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UV-VIS-NIR in Battery Development
Next-generation NIR spectroscopy and how to use it for high-throughput food testing

Next-generation NIR spectroscopy and how to use it for high-throughput food testing

Learn how NIR spectroscopy accelerates food testing. Discover moisture, fat, and protein analysis with Metrohm’s OMNIS NIR Analyzer for faster, greener QC.
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Already taken place Th, 25.9.2025
Metrohm
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Next-generation NIR spectroscopy and how to use it for high-throughput food testing
SORDINO fMRI for Awake Behaving Mice

SORDINO fMRI for Awake Behaving Mice

Discover SORDINO, a silent, artifact-resistant alternative to BOLD fMRI. Learn how it enables brain-wide mapping in awake, interacting mice with high sensitivity and specificity.
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Already taken place Th, 25.9.2025
Bruker
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SORDINO fMRI for Awake Behaving Mice
Comparison of Acid Type for Removal of Carbonates from Soil for Total Organic Carbon Determination using the LECO C832 and CN928

Comparison of Acid Type for Removal of Carbonates from Soil for Total Organic Carbon Determination using the LECO C832 and CN928

This webinar offers both theoretical insights and practical guidance for reliable TOC analysis in diverse soil environments.
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Already taken place Th, 25.9.2025
LECO
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Comparison of Acid Type for Removal of Carbonates from Soil for Total Organic Carbon Determination using the LECO C832 and CN928
Optimization of Electrolytic Refining Processes: Advanced Monitoring of Liquids with ED-XRF

Optimization of Electrolytic Refining Processes: Advanced Monitoring of Liquids with ED-XRF

Discover how ED-XRF is revolutionizing electrolytic refining of precious metals. Learn fundamentals, monitoring challenges, and see real-world process improvements.
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Already taken place Th, 25.9.2025
SPECTRO Analytical Instruments
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Optimization of Electrolytic Refining Processes: Advanced Monitoring of Liquids with ED-XRF
Thermo-Optical Analysis with Hot-Stage Microscopy

Thermo-Optical Analysis with Hot-Stage Microscopy

In this webinar, you will gain an understanding of the principles behind TOA, learn about METTLER TOLEDO’s hot-stage instruments, and explore practical applications for different industries.
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Already taken place Th, 25.9.2025
Mettler-Toledo
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Thermo-Optical Analysis with Hot-Stage Microscopy
Spectroscopic Analysis of Food Dyes: Ensuring Colour Consistency

Spectroscopic Analysis of Food Dyes: Ensuring Colour Consistency

In this webinar we will demonstrate the ability to assess a material’s colour using UV-Visible instrumentation.
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Already taken place We, 24.9.2025
New Food magazine
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Spectroscopic Analysis of Food Dyes: Ensuring Colour Consistency
Rapid Raw Material ID - From Pallet to Production 50% Faster

Rapid Raw Material ID - From Pallet to Production 50% Faster

Discover how the Agilent Vaya handheld Raman with SORS accelerates raw material ID by 50%, streamlining synthetic peptide production and improving pharma manufacturing efficiency.
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Already taken place We, 24.9.2025
The Analytical Scientist
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Rapid Raw Material ID - From Pallet to Production 50% Faster
Improve your workflow and Increase Lab Productivity with the Agilent MH 5.4 software and ADS2/AVS auto-dilution system

Improve your workflow and Increase Lab Productivity with the Agilent MH 5.4 software and ADS2/AVS auto-dilution system

Streamline sample prep with Agilent MH 5.4 software and ADS2/AVS auto-dilution. Learn how to minimize contamination risks and improve efficiency in environmental labs.
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Already taken place Tu, 23.9.2025
Agilent Technologies
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Improve your workflow and Increase Lab Productivity with the Agilent MH 5.4 software and ADS2/AVS auto-dilution system
 Peeling Back the Layers: Thickness Analysis by Means of micro-XRF

Peeling Back the Layers: Thickness Analysis by Means of micro-XRF

Explore the basics and applications of micro-XRF layer analysis. Learn its strengths, limitations, and real-world use cases for materials science, semiconductors, and R&D.
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Already taken place Tu, 23.9.2025
Bruker
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 Peeling Back the Layers: Thickness Analysis by Means of micro-XRF
 

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