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Rare Earth Magnet Analysis: The Role of XRF in Production and Recycling

Rare Earth Magnet Analysis: The Role of XRF in Production and Recycling

Learn how small-spot ED-XRF enables fast, digestion-free analysis of rare earth elements in permanent magnets, supporting quality control, recycling, and regulatory compliance.
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Already taken place Th, 5.2.2026
SPECTRO Analytical Instruments
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Rare Earth Magnet Analysis: The Role of XRF in Production and Recycling
New microwave digestion tools for heavy metals analysis of environmental samples

New microwave digestion tools for heavy metals analysis of environmental samples

Discover modern sample preparation solutions for environmental analysis. Episode 1 focuses on new microwave digestion tools that improve throughput, accuracy, and cost efficiency in heavy metals analysis.
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Already taken place Th, 5.2.2026
Milestone
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New microwave digestion tools for heavy metals analysis of environmental samples
Semiconductor Applications and Setup for a variety of Solvents and Matrices by ICP-OES

Semiconductor Applications and Setup for a variety of Solvents and Matrices by ICP-OES

Explore how ICP-OES supports semiconductor analysis of high-silicon matrices and inorganic/organic reagents, with setup tips for solvents and trace detection.
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Already taken place Tu, 3.2.2026
Agilent Technologies
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Semiconductor Applications and Setup for a variety of Solvents and Matrices by ICP-OES
Thermal Analysis of Electronic Components

Thermal Analysis of Electronic Components

Discover how thermal analysis (DSC, TGA, TMA, DMA) characterizes electronic materials and PCBs, supporting design, reliability, and lifetime performance.
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Already taken place Th, 29.1.2026
Mettler-Toledo
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Thermal Analysis of Electronic Components
Measuring Diffuse Powders and Films With UV-VIS-NIR

Measuring Diffuse Powders and Films With UV-VIS-NIR

We will discuss diffuse reflectance accessories (DRAs) as well as Agilent's universal measurement accessory (UMA) for measuring the angular distribution of the reflected light.
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Already taken place Tu, 27.1.2026
Agilent Technologies
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Measuring Diffuse Powders and Films With UV-VIS-NIR
Automation, Speed, and Simplicity for Total Lipid Nanoparticle Characterization

Automation, Speed, and Simplicity for Total Lipid Nanoparticle Characterization

Join our exclusive webinar and discover how to overcome the toughest challenges in Lipid Nanoparticle analysis.
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Already taken place Tu, 27.1.2026
Waters Corporation
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Automation, Speed, and Simplicity for Total Lipid Nanoparticle Characterization
Tips and Tricks Workshop on ICP-OES: Smarter Method Development

Tips and Tricks Workshop on ICP-OES: Smarter Method Development

Techniques on how to achieve the best sensitivity and detection limits through tuning techniques and strategies.
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Already taken place Th, 22.1.2026
Agilent Technologies
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Tips and Tricks Workshop on ICP-OES: Smarter Method Development
Next-Generation Rheology for Pharma: Precision at 0.2 nNm and Beyond

Next-Generation Rheology for Pharma: Precision at 0.2 nNm and Beyond

Discover how next-generation rheometers and compliant software are transforming pharma R&D, QC, and production—from protein solutions to powders and syringes.
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Already taken place Th, 22.1.2026
Anton Paar
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Next-Generation Rheology for Pharma: Precision at 0.2 nNm and Beyond
Optimized Elemental Analysis with Tabletop Electron Microscopes

Optimized Elemental Analysis with Tabletop Electron Microscopes

Learn how the upgraded Hitachi TM4000PlusⅢ SEM and Bruker QUANTAX EDS enable fast, high-quality elemental analysis and mapping in minutes—bringing advanced EDS performance to a compact, user-friendly system.
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Already taken place Th, 22.1.2026
Bruker
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Optimized Elemental Analysis with Tabletop Electron Microscopes
Effortless UV-VIS Analysis with Long Pathlength Measurements

Effortless UV-VIS Analysis with Long Pathlength Measurements

The Cary 3500's flexible sampling options make this concentration analysis more effortless than ever before.
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Already taken place Th, 15.1.2026
Agilent Technologies
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Effortless UV-VIS Analysis with Long Pathlength Measurements
 

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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike