<p><strong>Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 6th April 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!</strong></p><blockquote><p><span style="font-size:20px;">👉 </span><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library"><span style="font-size:20px;"><strong>SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</strong></span></a></p></blockquote><blockquote><p><strong>👉 Need info about different analytical techniques?</strong> Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library"><strong>LabRulezLCMS</strong></a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library"><strong>LabRulezGCMS</strong></a> libraries.</p></blockquote><p>This week we bring you application notes by <strong>Metrohm,</strong> <strong>Shimadzu, Thermo Fisher Scientific </strong>and <strong>Waters Corporation!</strong></p><h3><strong>1. Metrohm: Whey permeate analysis with NIRS</strong></h3><p><strong>Monitor dairy production processes easily in seconds</strong></p><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_nir_144_download_34598659f1.pdf"><strong>Full PDF for download</strong></a></li></ul><p>Whey permeate, a byproduct of manufacturing whey protein powder, contains high amounts of lactose, phosphate, and minerals. Because of its sweet and mild taste, whey permeate is often used in bakeries and chocolate manufacturing. The key to optimizing whey permeate production is to control production streams in real time. It is important to monitor the production process with highthroughput analytical techniques to maximize product yield and ensure high product quality.&nbsp;</p><p>Nearinfrared spectroscopy (NIRS) is a fast, and chemicalfree analysis technique that can support this kind of testing. NIR spectroscopy can measure the most important quality parameters (i.e., protein, lactose, moisture, ash, pH, and phosphate) simultaneously in whey permeate without any sample preparation. The NIRS solution is fast, easy to operate, and can be used atline or offline in a quality control lab.</p><h4><strong>EXPERIMENTAL EQUIPMENT&nbsp;</strong></h4><p>158 whey permeate samples were analyzed on a <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=220&amp;search=NIR+analyzer"><strong>Metrohm NIR Analyzer</strong></a> equipped with a small cup accessory. All measurements were performed in reflection mode (1000–2250 nm). Metrohm software was used for data acquisition and prediction model development.</p><h4><strong>CONCLUSION&nbsp;</strong></h4><p>This Application Note demonstrates the feasibility of using NIR spectroscopy for whey permeate quality control. Near infrared-spectroscopy is a rapid, nondestructive analytical technique that can monitor the production process of dairy products. Aside from the analysis of whey permeate, the whey protein production stream can also be monitored by NIRS.</p><h3><strong>2. Shimadzu: Measurement of Residual Metal Catalysts by X-ray Fluorescence</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01086_en_4beb25fd1d.pdf"><strong>Full PDF for download</strong></a></li></ul><h4><strong>User Benefits</strong></h4><ul><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=ALTRACE"><strong>ALTRACE</strong></a> can determine levels of heavy metals present in organic compounds at around 1 mg/kg in under 10 minutes per sample.</li><li>Analyzing and managing levels of residual metal catalysts can be performed by simply placing samples in the sample vessel and analyzing them without the need for complex sample pretreatment.</li><li>By increasing the X-ray tube power and optimizing the optical design, the sensitivity of ALTRACE for heavy metals has been<br>dramatically improved compared to the previous model.</li></ul><p>Many industrial products we encounter every day are produced from organic compounds by manufacturing processes that utilize a range ofsynthesisreactions and metal catalysts. Catalysis can be classified as either homogeneous or heterogeneous (although drug and chemical production processes typically use homogeneous catalytic systems). While homogeneous catalysis allows for precise control over catalytic reactions, recovering the catalyst after the reaction can be difficult.&nbsp;</p><p>Nevertheless, managing the levels of residual catalysts in industrial products is critical to ensure safety and because of their high costs. For example, the ICH Q3D Guideline for Elemental Impurities (adopted in April 2017) requires risk assessments when materials such as metal catalysts are added intentionally during a production process.&nbsp;</p><p>Energy dispersive X-ray fluorescence (EDXRF) spectrometry offers a simple but effective technique for assessing the levels of residual metal catalysts. Normally, the lower limit of quantification for EDXRF spectrometric analysis of heavy metals is above 1 mg/kg, which limitsits use in quantitative analysis. However, the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=ALTRACE"><strong>ALTRACE</strong></a> is equipped with a high-power X-ray tube that dramatically improves its sensitivity for heavy metals, enabling their determination at 1 mg/kg and below in lessthan 10 minutes. This Application News describes using ALTRACE to determine residual levels of a homogeneous catalyst after a synthesis reaction. The catalyst used in this analysis is palladium (Pd), which is a widely applied heavy metal catalyst, and the reaction catalyzed by the Pd catalyst is a cross-coupling reaction. A metal scavenger and activated carbon were each used to remove the Pd catalyst from the reaction products. Metal scavengers are frequently used in this role, and activated carbon offers a relatively cheap method for removing catalysts.</p><h4><strong>Conclusion&nbsp;</strong></h4><p>Common methods of elemental impurity analysis, such as atomic absorption spectrometry (AAS), ICP atomic emission spectroscopy (ICP-AES), and ICP mass spectrometry (ICP-MS), require liquid samples, so solid and powder samples must be prepared into a solution prior to analysis. However, EDXRF spectrometry can determine levels of elemental impurities regardless of the sample phase or form (solution, powder, etc.), provided the target element is distributed uniformly throughout the sample. The sensitivity of ALTRACE for heavy metals has been substantially improved compared to previous models, allowing for rapid quantitative determination of heavy metals at 1 mg/kg and below. Based on the performance presented in this article, ALTRACE is an effective tool for managing residual levels of metal catalysts.</p><h3><strong>3. Thermo Fisher Scientific: The Raman Spectroscopy of Graphene and the Determination of Layer Thickness</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/raman_spectroscopy_graphene_determination_layer_thickness_an52252_29274e8aea.pdf"><strong>Full PDF for download</strong></a></li></ul><p>Currently, a tremendous amount of study is being directed toward graphene. This interest is driven by the novel properties that graphene possesses and its potential use in a variety of application areas that include but are not limited to electronics, heat transfer, bio-sensing, membrane technology, battery technology and advanced composites. Graphene exists as a transparent two-dimensional network of carbon atoms. It can exist as a single atomic-layer thick material, or it can be readily stacked to form stable, moderately thick samples containing millions of layers—a form generally referred to as graphite. However, the interesting properties exhibited by graphene (substantial electrical and thermal conductivity, high mechanical strength, and high optical transparency) are only observed for graphene films that contain only one or a few layers. Therefore, developing technologies and devices based upon graphene’s unusual properties requires accurate determination of the layer thickness for materials under investigation. Raman spectroscopy can be employed to provide a fast, non-destructive means of determining layer thickness for graphene thin films.</p><h4><strong>Instrument considerations&nbsp;</strong></h4><p>There are a few specifications that should be considered when selecting a Raman instrument for graphene characterization. First, since graphene samples are usually very small, selecting a Raman instrument with microscopy capabilities is imperative.</p><p>The next issue to consider is which excitation laser to select. While graphene measurements can be made successfully with any of the readily available Raman lasers, it is also important to consider the substrate that the graphene will be deposited onto. It is common for graphene to be deposited on on either Si or SiO2 substrates, and both of these materials can exhibit fluorescence with near-infrared (NIR) lasers such as 780 nm or 785 nm. For this reason, visible lasers are usually recommended, typically a 633 nm or 532 nm laser.&nbsp;</p><p>Next, since relatively small wavenumber shifts can significantly impact the interpretation of the Raman spectra, it is crucial to have a robust wavelength calibration across the entire spectrum. Using a single point wavelength calibration with some other applications may be sufficient, but this only ensures that one wavelength is calibrated and leaves room for a large margin of error. A multipoint wavelength calibration that is regularly refreshed, such as the standard calibration routine used with <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=184&amp;manufacturerItems=3&amp;search=dxr3"><strong>Thermo Scientific DXR3 Raman instruments</strong></a>, will provide considerably more confidence in the results. It is also necessary to have an instrument with high wavenumber precision to observe small wavenumber shifts when altering the sample. In fact, small wavenumber shifts can represent changes in the sample rather than represent the variability from the instrument. There is a common myth that it is necessary to utilize high resolution in order to achieve high wavenumber precision. Not only is this incorrect, but a high resolution will actually add considerable noise to the spectrum, which will add to the wavenumber variability. A high degree of wavenumber precision, such as that provided by the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2239"><strong>Thermo Scientific™ DXR™3 Raman Microscope</strong></a>, will significantly improve data confidence even when you are evaluating band shifts from low levels of strain or doping. It is also important to have exact control of your laser power at the sample and be able to adjust that laser power in small increments. This is important to control temperature-related effects and to provide flexibility to maximize Raman signal while still avoiding sample heating or damage from the laser. The DXR3 Raman systems are equipped with a unique device called a laser power regulator, which maintains laser power with unprecedented accuracy and provides exceptional ability to fine-tune laser power and optimize it for each experiment.<sup>1</sup>&nbsp;</p><p>Lastly, the Raman microscope must have an automated stage and associated software to generate detailed Raman point maps. As will be seen in the next section, Raman point mapping or imaging extends the single point measurement to assess a sample’s layer thickness uniformity. The <strong>Thermo Scientific OMNIC™ Software</strong> suite contains powerful mapping and processing tools that diminish the complexity of collecting highly detailed maps and interpreting their results.</p><h4><strong>Conclusions&nbsp;</strong></h4><p>Raman spectroscopy is an excellent tool for the characterization of graphene and layer thickness. Few techniques will provide as much information about the structure of graphene samples as Raman spectroscopy, and any lab doing graphene characterization without Raman would be at a significant disadvantage. The DXR3 Raman Microscope is an ideal Raman instrument for graphene characterization because it can provide the high level of stability, control, and sensitivity needed to produce confident results.</p><h3><strong>4. Waters Corporation: See What’s Really in Your Formulation with Backgrounded Membrane Imaging</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/720009098_en_5d36d71789.pdf"><strong>Full PDF for download</strong></a></li></ul><p>Protein aggregation in therapeutic protein products can induce adverse immunogenic responses in patients<sup>1–4</sup> . Per the FDA’s recommendations, “strategies to minimize aggregate formation should be developed as early as feasible in product development”<sup>5</sup> and “an assessment should be made of the range and levels of subvisible particles (2–10 µm) present in therapeutic protein products initially and over the course of the shelf life”.<sup>5</sup> Yet, accurate subvisible protein aggregation analysis has remained elusive to protein drug formulators since current subvisible analyzers are not sensitive enough to measure protein aggregates effectively. In this application note, we explore how backgrounded membrane imaging (BMI), a high refractive index contrast technique used by the HORIZON particle analysis system, performs highly sensitive measurements of subvisible protein aggregates in the 2 µm–4 mm size range, enabling 30% higher reproducibility compared to flow imaging.</p><h4><strong>Conclusion&nbsp;</strong></h4><p>When studying the impact of protein aggregate refractive index, IgG protein aggregates analyzed on both the<strong> </strong><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=5&amp;search=HORIZON"><strong>HORIZON® instrument</strong></a> and flow imager systems produced equivalent particle count trends. However, the HORIZON® system was more sensitive (measured more overall counts) and had overall lower variability with average CVs of 14.4% compared to the flow imager which produced average CVs of 20.1%. The differences in variability and counts were most pronounced at lower concentrations and size range respectively. Given that most particles in a therapeutic drug formulation are small, the inability of flow imagers to accurately count the smallest of protein aggregates has a dramatic impact on the total number of particles measured. This can mean an undercounting by as much as 3–10X depending on the protein and formulation conditions.&nbsp;</p><p>High variability at low concentrations in flow imagers can pose a hurdle for early stage analysis were sample is scarce. In low volume analysis (&lt;250 µL), the possibility of measuring fewer particles increases, therefore it is imperative to have high sensitivity measurements when already challenged by low sampling statistics.&nbsp;</p><p>In the excipient effect study, sucrose did not have an impact on the overall particle counts when measured using the HORIZON® system. This contrasts with previous studies comparing excipient effects on three flow imagers.10 In each case, the particle counts decreased up to 30% or more using standard sucrose formulation concentrations of 0–20%. The difference between the data generated by BMI and FI can be attributed to the fact that the HORIZON® instrument is not affected by particle or solution refractive index.&nbsp;</p><p>Flow imagers are deeply vulnerable to the impact of refractive index when measuring protein aggregates due to their translucency and the negative impact of surfactants. Due to this basic optical phenomenon, flow imagers can dramatically undersize and undercount particles. Finding the right tool for the job will have a critical impact on data accuracy and sensitivity. Powered with BMI, the HORIZON® system provides high refractive index contrast analysis to enable accurate, robust, and sensitive subvisible particle counting from 2 µm–4 mm in as little as 25 µL of sample and 96 samples in under 2 hours.</p>

News from LabRulezICPMS Library - Week 15, 2026

<p><strong>The set of soils consist of two natural agricultural soils differing in elemental composition&nbsp;</strong></p><ul><li><strong>AN-ZP01:</strong> Heavy loam with normal analyte levels&nbsp;</li><li><strong>AN-ZP02:</strong> Silty clay loam contaminated with some heavy metals&nbsp;</li></ul><p>Contents of element extractable fractions with aqua regia according to ISO 11466&nbsp;</p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/ANALYTIKA_agricultural_soil_CRM_0534e68e65.jpg" alt="ANALYTIKA: Matrix CRM of agricultural soil METRANAL® CRM AN-ZP01 and AN-ZP02" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_ANALYTIKA_agricultural_soil_CRM_0534e68e65.jpg 156w," sizes="100vw" width="827" height="827"></p><h5><strong>Packing:&nbsp;</strong></h5><ul><li>50 g of powder of the respective soil with a particle size of less than 100 µm in amber glass bottle.&nbsp;</li></ul><h5><strong>Intended use:&nbsp;</strong></h5><p>This set of certified reference materials is intended primarily for use in realizing metrological traceability, validation of analytical methods and the transfer of property values to other materials of similar composition.&nbsp;</p><h5><strong>Recommended analytical methods for method dependent measurements:</strong></h5><ul><li>Flame AAS, ETA-AAS, ICP-OES, ICP-MS, AMA-254&nbsp;</li></ul><h5><strong>Metrological traceability:&nbsp;</strong></h5><p>Metrological traceability is realized by using certified calibration standards solutions for the calibration of measurement methods used (direct traceability to SI unit) and/or by simultaneous analysis of a matrix CRM (RM) of similar composition.</p><h5><strong>Sample preparation (aqua regia extract according to ISO 11466):&nbsp;</strong></h5><p>Weigh a 3 g (± 0.001 g) sample into a 100 ml round bottom flask. Add a small amount of water (2 to 3 ml) to obtain a slurry, then 7.5 ml of conc. HNO<sub>3</sub> (density 1.40 g/ml). Let the mixture stand until intensive foaming ceases, then add (in several portions) 22.5 ml of conc. HCl (density 1.19 g/ml), shake the mixture manually, cover the flask with a watch glass, and let stand for 16 hours (overnight) at the laboratory temperature (20 ± 2°C). Then mount a reflux condenser (a Dimroth type or similar) of about 40 cm length on the top of the flask and boil gently under reflux for 2 hours. After cooling, rinse the condenser with 20 ml of warm (~ 50°C) dilute nitric acid (5%, v/v), the liquid being collected in the round bottom flask. Remove the condenser and filter the solution from the flask through an acid-resistant high density paper filter and collect it in a 100 ml volumetric flask (make sure in preliminary tests that a suitable filter was chosen, so that the filtrate is clear). Rinse the filter and the residue three times with 5 ml of warm (~ 50°C) dilute nitric acid (5%, v/v); allow to cool and dilute with nitric acid 5% (v/v) to the mark. Transfer immediately the solution from the volumetric flask into a clean, dry 100 ml polyethylene bottle. Realize three blanks using exactly the same analytical procedure.&nbsp;</p><p>It is acceptable to realize the operation described above in a glass beaker covered with a watch glass. Minimum sample size for analysis is defined with the prescribed working procedure.&nbsp;</p><h5><strong>Storing and instruction for use:&nbsp;</strong></h5><p>These CRM have to be stored in original bottle and between 5-30°C (in a dark and dry place). The materials should be analysed in the "as received" state and their dry weight should be determined on non-analysed aliquots oven-dried at 105°C till the constant weight. The material in the bottle must be rehomogenized before each use by mechanical shaking of the content for 1-2 minutes. The bottle should be opened a minimum of 2 minutes after rehomogenization in order to prevent an escape of fine powder particles from the bottle into the environment and their sedimentation.&nbsp;</p><h5><strong>Certified and indicative values and their uncertainties:&nbsp;</strong></h5><p>The certified and indicative values of extractable element fraction are summarized in Table 1. The overall means evaluated have been given a status of certified and indicative values using the following criteria: data should be available from at least two independent analytical methods, at least 5 and 3 accepted laboratory means should be available for calculation of the overall mean for certified and indicative value, respectively. At combined uncertainties presented, the contribution of uncertainty of characterization of a particular property value is dominant.</p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/ANALYTIKA_Table_1_Certified_and_indicative_values_of_contents_of_element_fractions_extractable_by_f56fa06aa5.jpg" alt="ANALYTIKA: Table 1 - Certified and indicative values of contents of element fractions extractable by aqua regia in CRM AN-ZP01 and AN-ZP02 and their associated uncertainties." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_ANALYTIKA_Table_1_Certified_and_indicative_values_of_contents_of_element_fractions_extractable_by_f56fa06aa5.jpg 187w," sizes="100vw" width="998" height="835"></p><h5><strong>Chemical composition of soil matrix:&nbsp;</strong></h5><p>The bulk composition of CRM AN-ZP01 and AN-ZP02 is shown in Table 2. The values presented in this table are not certified, but they may be useful for considerations concerning possible interferences while determining analytes given in Table 1, and for selection of suitable decomposition procedures if destructive analytical methods are to be used.</p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/ANALYTIKA_Table_2_Matrix_composition_of_CRM_AN_ZP_01_and_AN_ZP_02_of_the_oxides_dry_cd1273cf9c.jpg" alt="ANALYTIKA: Table 2 Matrix composition of CRM AN-ZP01 and AN-ZP02 (% of the oxides dry weight at 105°C)" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_ANALYTIKA_Table_2_Matrix_composition_of_CRM_AN_ZP_01_and_AN_ZP_02_of_the_oxides_dry_cd1273cf9c.jpg 170w," sizes="100vw" width="883" height="811"></p><h5><strong>Note:&nbsp;</strong></h5><p>Detailed information about the production, homogeneity testing and characterization of these CRM are described in the Certification report, which is available on request.</p>

Matrix CRM of agricultural soil METRANAL® CRM AN-ZP01 and AN-ZP02

<div><div><div><p><strong>Our immune system is incredibly powerful: among other things, it can recognize and destroy cancer cells. But tumors can be just as effective at avoiding detection – they build “invisibility shields” to protect themselves from attack.</strong></p></div></div><div><p>One breakthrough in cancer therapy has been immune checkpoint inhibitors (ICIs), drugs that reactivate immune T cells and help them fight tumors again. However, only about 20–50% of patients respond well to this treatment. Researchers are therefore seeking alternative therapeutic strategies. A small and well-known molecule called adenosine plays a key role in these efforts.</p><p>When tumor cells are stressed or dying, they release ATP, which is normally a signal that something is wrong in the tissue. But in the tumor microenvironment, ATP gets rapidly broken down by two enzymes, CD39 and CD73. Released adenosine acts like a chemical “calm-down” signal, binds to immune cells (T cells, NK cells, and others), and tells them to slow down, reducing their ability to kill cancer cells. Targeting CD73 therefore represents a promising strategy for developing new cancer treatments.</p></div><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/UOCHB_Nove_latky_mohou_podporit_imunitni_system_v_boji_s_rakovinou_88c5e82cd5.jpeg" alt="IOCB Prague: Development of potent inhibitors to boost the immune system's ability to fight cancer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_UOCHB_Nove_latky_mohou_podporit_imunitni_system_v_boji_s_rakovinou_88c5e82cd5.jpeg 245w," sizes="100vw" width="661" height="363"></p><p>At IOCB Prague, interdisciplinary teams led by Jan Řezáč, Jan Konvalinka, and Michal Hocek used a newly developed high-throughput screening method to test over 5,000 compounds, identifying two ribonucleoside derivatives as promising CD73 inhibitors.</p><p>The scientists then improved the compounds’ activity by carefully modifying the ribonucleoside scaffold with bulky (het)aryl groups. Further optimization improved the pharmacokinetic properties of these compounds, yielding inhibitors with low clearance, long half-life, high solubility, and strong selectivity over related enzymes such as CD39.</p><p>In cellular experiments, the compounds reduced adenosine production in cancer cells, restored T cell activation, and showed no toxicity toward human fibroblasts. The most active compound showed a single-digit picomolar inhibition constant (Ki).</p><p>These findings establish a strong foundation for further in vivo efficacy and combination studies, which will explore the therapeutic potential of this novel inhibitor class.</p><blockquote><h4><strong>The Original article</strong></h4><h4><a target="_blank" rel="noopener noreferrer" href="https://pubs.acs.org/doi/10.1021/acsptsci.5c00707"><strong>Potent Competitive Inhibitors of Ecto-5′-nucleotidase (CD73) based on 6-(Het)aryl-7-deazapurine Ribonucleoside 5′-O-Bisphosphonates</strong></a></h4><p>Ugnė Šinkevičiu̅tė, Magdalena Šímová, Radek Staník, Lenka Poštová Slavětínská, Kristýna Blažková, Pavel Šácha, Martin Lepšík, Jan Řezáč, Jan Konvalinka, Tereza Ormsby, Michal Tichý, Michal Hocek</p><p><i><span><strong>ACS Pharmacol. Transl. Sci.</strong></span></i><strong> </strong><span><strong>2026, 9, 1, 191–213</strong></span></p><p><a target="_blank" rel="noopener noreferrer" href="https://pubs.acs.org/doi/10.1021/acsptsci.5c00707">https://pubs.acs.org/doi/10.1021/acsptsci.5c00707</a></p><h6>licensed under <a target="_blank" rel="noopener noreferrer" href="https://creativecommons.org/licenses/by/4.0/"><strong>CC-BY 4.0</strong></a></h6></blockquote><h4><strong>Abstract</strong></h4><p>CD73 generates immunosuppressive adenosine in the tumor microenvironment and is a promising target for cancer immunotherapy. We have designed and systematically studied diverse 2-substituted 7-deazapurine ribonucleoside 5′-<i>O</i>-bisphosphonates bearing a variety of (het)aryl groups at position 6 and discovered their highly potent and selective CD73 inhibition activity. The most active compounds (with single-digit picomolar <i>K</i><sub>i</sub>) contained bicyclic (het)aryl groups at position 6 in combination with chlorine at position 2. Further optimization of pharmacokinetic properties identified inhibitors with low clearance, long half-life, high solubility, and excellent selectivity over CD39 and NTPDase3. They effectively suppressed adenosine formation in MDA-MB-231 cells, rescued CD8<sup>+</sup> T cell activation, and were nontoxic to human fibroblasts. Overall, their profile compares favorably with <strong>AB680</strong>, a CD73 inhibitor currently in phase I/II clinical trials.</p></div>

Development of potent inhibitors to boost the immune system's ability to fight cancer

Article

Product

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Science and research

The Institute of Organic Chemistry and Biochemistry of the Czech Academy of Sciences (IOCB Prague) is a leading scientific institution in the Czech Republic, recognized internationally. Its primary mission is basic research in the fields of chemical biology and medicinal chemistry, organic and material oriented chemistry, chemistry of natural compounds, biochemistry and molecular biology, physical chemistry, theoretical chemistry, and analytical chemistry. 

Institute of Organic Chemistry and Biochemistry of the Czech Academy of Sciences

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Analytika is a Czech company that offers and produces certified reference materials (CRM) and (ultra)pure chemicals for quality control and quality assurance in laboratories, including accredited laboratories.

Our portfolio also includes pipettes and tips, digestors, PFA labware and other equipment for analytical laboratory and trace analysis.

ANALYTIKA

SPECTRO Analytical Instruments

Bruker

PerkinElmer

<p><strong>The interest in complete microplastics solutions is tremendous, but many analytical labs shun the initial investment in time, money and labor to establish a well-running standard procedure.</strong></p><p><strong>In this webinar, our microplastic application specialist Dr. Marten Seeba will show you:</strong></p><ul><li>Demands and requirements to establish a microplastic lab based on FT-IR technology</li><li>Necessary steps in sample preparation from various sources</li><li>Theoretical basics to understand the idea behind FT-IR analysis of microparticles</li><li>That there are wholesome, complete solutions to microplastic analysis, right out of the box</li></ul><div><div><div><div><div><p><strong>You will learn about:</strong></p><ul><li>Instrumental setup and experimentals</li><li>Particle analysis and evaluation</li><li>Microplastic software solutions</li></ul><p><strong>We will cover the basics of:</strong></p><ul><li>Sample types</li><li>Sample preparation steps</li><li>FT-IR experimental procedures</li><li>FT-IR instrumentation</li></ul></div></div></div></div></div><div><div><div><div><div><p><strong>Who should attend:</strong></p><ul><li>Analytical service laboratories</li><li>Environmental researchers</li><li>Food &amp; Feed producers</li><li>Drinks &amp; Beverages producers</li></ul><blockquote><p><strong>Presenter: </strong>Dr. Marten Seeba</p><p>Dr. Marten Seeba graduated in chemistry from the University of Göttingen before joining Bruker as an application expert for FT-IR and IR laser microscopy. He is a point of contact for our customers and as such has gained a great deal of expertise in many applications such as microplastics, pharmaceuticals, tissue analysis and materials science.</p></blockquote></div></div></div></div></div>

Bruker: Getting your lab ready for microplastic analysis by FT-IR spectroscopy

Getting your lab ready for microplastic analysis by FT-IR spectroscopy

Learn how to set up an FT-IR microplastic lab, including key requirements, sample preparation steps, analysis principles, and ready-to-use solution options.

Preparing Your Lab for Microplastic Analysis via FT-IR

<p><strong>LUMOS II ushers in a new era in FT-IR Microscopy.</strong></p><blockquote><p><strong>Presenter: &nbsp;</strong>Dr. Tom Tague (Applications Manager and Chair of the Safety Committee Bruker Corporation)</p><div><p>Dr. Tom Tague is the Applications Manager (FTIR and Raman products) and Chair of the Safety Committee for Bruker Corporation. He is also a member of the Visiting Advisory Committee of the Metropolitan Museum of Art in New York and the Advisory Board of Amplified Sciences. Dr. Tague received his Ph.D. from the University of Utah in Physical Chemistry and his B.S. in Chemistry, from the University of Texas at San Antonio. He conducted his postdoctoral research at the University of Virginia working with professor Lester Andrews. He is a member of the American Chemical Society, the Society for Applied Spectroscopy, the American Physical Society, and the Optical Society of America. Dr. Tague is active in developing new methods and instrumentation with the goal of improving the sensitivity and detection limits of spectroscopy related applications. Dr. Tague has more than 80 publications and 5 patents.</p></div></blockquote>

Bruker: The State-of-the-Art in Infrared Microscopy

The State-of-the-Art in Infrared Microscopy

LUMOS II ushers in a new era in FT-IR Microscopy.

<p><strong>In an emission experimental setup, the sample itself acts as light source of the spectrometer and may emit light in various scenarios, e.g.: thermal emission, photoluminescence or the characterization of self-made lasers and other emission devices. Therefore, emission spectroscopy is established in versatile application fields in academia as well as in industrial applied research &amp; development or failure analysis.</strong></p><p>Bruker provides innovative instrumental solutions for emission spectroscopy with a broad palette of research spectrometers, dedicated measurement modules and accessories. In a series of customer webinars, we will explain the basic principles and give application examples as well as practical handling hints for emission spectroscopy.</p><div><div><div><div><blockquote><h5><strong>Part 1: General Setup of Emission Experiments and Determination of Emissivity.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/6908255056900555277"><strong>Watch Recording of Part 1&nbsp;</strong></a></a></p></blockquote><div><blockquote><h5><strong>Part 2: Photoluminescence (PL) Experiments: Challenges and the Suitable Instrumental Solutions.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/216857088501568015"><strong>Watch Recording of Part 2&nbsp;</strong></a></a></p></blockquote><div><blockquote><h5><strong>Part 3: Step Scan as a Powerful Tool for Emission Experiments and Source Characterization.</strong></h5><p><a data-g-name="CallToAction" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1595203200000,&quot;onWebinar&quot;:true,&quot;external&quot;:true}" data-protectable="" rel="noopener" target="_blank"><a target="_blank" rel="noopener noreferrer" href="https://register.gotowebinar.com/recording/6306834291730245889">W<strong>atch Recording of Part 3&nbsp;</strong></a></a></p></blockquote></div></div></div></div></div></div>

FTIR Emission Spectroscopy

We will explain the basic principles and give application examples as well as practical handling hints for emission spectroscopy.

<div><p><strong>This webinar introduces scattering scanning nearfield optical microscopy (s-SNOM), which provides&nbsp;information about the complex optical properties of the nanoscale region of a sample under a metallized tip that nanofocuses optical radiation. Recent developments in novel methods, advanced light sources, and refined instrumentation have made s-SNOM more valuable and accessible.</strong></p><p>Capabilities for s-SNOM are available on Bruker’s <a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/anasys-nanoir3-s.html">nanoIR3-s</a> and <a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/anasys-nanoir3-s-broadband.html">nanoIR3-s Broadband</a> platforms, and the technique itself was developed in collaboration with the webinar’s guest speaker, Professor Markus Raschke, Dept. of Physics/JILA, University of Colorado.</p><p>After a thorough and illustrative introduction to the method, Prof. Raschke presents his research efforts towards using s-SNOM, this new dimension in optical nanoprobe imaging, to access the functional properties of materials and systems including electronic materials, energy materials, nano-biomaterials, quantum systems, and more.</p><p>Following Prof. Raschke’s comprehensive presentation, he answers questions from the audience covering topics from the maximum sensitivity level of s-SNOM to the use of complementary AFM techniques with s-SNOM.&nbsp;</p></div>

Bruker: Recent Advancements in Infrared Nano-imaging with Nano-FTIR Spectroscopy

Recent Advancements in Infrared Nano-imaging with Nano-FTIR Spectroscopy

Learn how s-SNOM advances understanding of the functional properties of materials

Advances in Infrared Nano-imaging with Nano-FTIR

<div><div><div><p><strong>Due to the systematic shrinking of the size of devices in the semiconductor industry, characterizing nanoscale surface contaminations in interconnects and circuitries has become a pivotal issue in test and failure analysis. Continuous development in process technology/engineering has led to the fabrication of semiconductor devices with sub-µm feature resolution, which in turn demands high-resolution analytical tools for proper characterization.&nbsp;</strong></p><p>Nanoscale AFM-IR spectroscopy is a non-destructive chemical analysis method that takes advantage of the nanoscale capabilities of AFM and outputs easy-to-understand, FTIR-like spectra. As described by the presenters, the advantages of nanoscale AFM-IR can be leveraged in the semiconductor industry in many ways, like for chemical characterization of organic contaminants, nano-patterned metal/low-k dielectrics, and directed self-assembly of block copolymers.</p></div></div></div><div><div><blockquote><ul><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/two-complementary-nanoscale-ir-techniques-photothermal-afm-ir-and-s-snom.html"><strong>watch part 1: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/online-demo-of-the-nanoir3-system-photothermal-afm-ir.html"><strong>watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/chemical-characterization-of-heterogenous-polymeric-materials-on-the-nanoscale-using-photothermal-afm-ir.html"><strong>watch part 3: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/2d-material-characterization-using-photothermal-afm-ir-and-s-snom.html"><strong>watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li></ul></blockquote></div></div>

Bruker: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Characterizing nanometer-scale features in semiconductor devices using nanoIR spectroscopy

Nanoscale AFM-IR for Failure Analysis of Electronics

<div><p><span style="letter-spacing:0.0px;"><strong>This webinar will show you the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II.&nbsp;</strong></span></p><p>Our application specialist Eric Klein skips lengthy PowerPoint presentations and welcomes you directly to our demo lab for a hands-on instrument session. After 20 minutes of analyzing typical samples, Eric will answer your questions about using µ-FT-IR in your daily QC and failure analysis for at least 30 minutes.</p><p><strong>About the samples:</strong></p><ul><li>The first sample is a typical customer complaint which was returned due to an unknown contaminant on the products surface.</li><li>The second sample is is a product contamination found during quality control. It is analyzed to understand the contamination route and prevent recurrence.</li></ul><p><strong>Content of webinar:</strong></p><ul><li>Measurement two typical µ-FT-IR samples</li><li>Detection and identification of unknown contaminants</li><li>Q&amp;A session on failure analysis by FT-IR</li></ul><p><strong>What you'll learn:</strong></p><ul><li>How to FT-IR microscopy is used to analyze contaminations.</li><li>How to apply the LUMOS II FT-IR microscope</li><li>How to evaluate using OPUS software</li></ul><blockquote><p><strong>Presenter: </strong>Eric Klein&nbsp;</p><p>Eric Klein has been with Bruker for 10 years and started out as an application scientist. During this time, he has acquired a great deal of expertise in infrared microscopy and, as a product manager, played a leading role in the development of LUMOS II. The session will be moderated.</p></blockquote></div>

Bruker: About Failure Analysis, Customer Complaints and Troubleshooting

About Failure Analysis, Customer Complaints and Troubleshooting

This webinar will show you the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II. 

Failure Analysis, Complaints & Troubleshooting Insights

<p><a target="_blank" rel="noopener noreferrer" href="https://www.spectro.com/icp-oes-principle"><span style="font-size:16px;"><strong>Inductively Coupled Plasma Optical Emission Spectrometry (ICP-OES)</strong></span></a><span style="font-size:16px;"><strong> is a powerful tool used for the precise quantification of over 70 elements across diverse sample types, from water and soils to oils and fuels. However, due to varying sample matrices, selecting the appropriate sample introduction system – including the nebulizer, spray chamber, and plasma torch – is vital to achieving accurate and reliable results.</strong></span><br><br><span style="font-size:16px;"><strong>In this webinar, we will cover:</strong></span></p><ul><li><span style="font-size:16px;">The influence of sample matrices on the analytical performance</span></li><li><span style="font-size:16px;">A detailed comparison of the most commonly used nebulizers across various matrices</span></li><li><span style="font-size:16px;">Key insights into optimizing plasma parameters for different applications, including plasma power and gas flow rates</span></li></ul>

SPECTRO Analytical Instruments: A Comparative Analysis of Nebulizer Types for ICP-OES in Various Sample Matrices 

A Comparative Analysis of Nebulizer Types for ICP-OES in Various Sample Matrices

Learn how sample matrices affect analysis, compare nebulizers, and optimize plasma power and gas flow for improved performance across applications.

Comparing Nebulizer Types for ICP-OES in Different Matrices

<p><span style="font-size:16px;"><strong>This on-demand webinar presents an in-depth analysis of vanadium electrolytes using </strong></span><a target="_blank" rel="noopener noreferrer" href="https://www.spectro.com/icp-oes-principle"><span style="font-size:16px;"><strong>ICP-OES</strong></span></a><span style="font-size:16px;"><strong>&nbsp;and </strong></span><a target="_blank" rel="noopener noreferrer" href="https://www.spectro.com/xrf-principle"><span style="font-size:16px;"><strong>ED-XRF</strong></span></a><span style="font-size:16px;"><strong>&nbsp;technology. The analysis is essential for the optimization and quality control of vanadium redox flow batteries (VRFBs), which are recognized for their scalability, long lifespan, and high energy storage capacity. As VRFBs are increasingly integrated into renewable energy systems, ensuring the purity and chemical stability of vanadium electrolytes becomes critical for maintaining performance and extending battery life.</strong></span></p><p><span style="font-size:16px;">The </span><a target="_blank" rel="noopener noreferrer" href="https://www.spectro.com/products/icp-oes-aes-spectrometers/arcos-inductively-coupled-plasma"><span style="font-size:16px;">SPECTRO ARCOS ICP-OES</span></a><span style="font-size:16px;">, equipped with DSOI, delivers enhanced sensitivity and precision, making it particularly effective in detecting trace elements that may affect electrolyte performance. The webinar will outline the instrument’s capacity to meet current quality standards and its potential for future adaptability. The precision offered by the SPECTRO ARCOS ensures that even minor impurities are detected, thus facilitating better control over the electrolyte formulation and enhancing the efficiency of VRFBs in renewable energy applications.</span></p><p><span style="font-size:16px;">The </span><a target="_blank" rel="noopener noreferrer" href="https://www.spectro.com/products/xrf-spectrometer/xepos-xrf-spectrometer"><span style="font-size:16px;">SPECTRO XEPOS ED-XRF</span></a><span style="font-size:16px;">&nbsp;analyzer delivers high sensitivity and flexibility, enabling accurate multi-elemental analysis of vanadium electrolytes, from trace to major components. With detailed experimental data on electrolyte samples at various states, the webinar will highlight how ED-XRF technology can identify and quantify impurities that could impact the efficiency and lifespan of VRFBs.</span></p>

SPECTRO Analytical Instruments: Elemental Analysis of Vanadium Electrolytes Using ICP-OES and ED-XRF Technology

Elemental Analysis of Vanadium Electrolytes Using ICP-OES and ED-XRF Technology 

This on-demand webinar presents an in-depth analysis of vanadium electrolytes using ICP-OES and ED-XRF technology.

Vanadium Electrolyte Analysis with ICP-OES & ED-XRF

<p><strong>Join us for an insightful webinar exploring the latest advancements in ICP-MS technology tailored for mining applications. From handling challenging sample matrices with high total dissolved solids to achieving interference-free, ultra-trace level detection, discover how PerkinElmer’s NexION ICP-MS systems address the diverse needs of the mining industry. This session will highlight cutting-edge design innovations and showcase experimental data demonstrating precise and accurate measurements, even at ppt levels.</strong></p><p><strong>HIGHLIGHTS</strong></p><ul><li>Explore the evolution of PerkinElmer’s ICP-MS technology and its impact on industrial applications.</li><li>Understand the unique challenges of analyzing mining samples, including wide concentration ranges, high TDS, and interferences.</li><li>Learn about the latest advancements in NexION ICP-MS, including design innovations for low maintenance and ultra-trace detection.</li><li>Review experimental data demonstrating accurate and interference-free elemental measurements in mining applications.</li><li>Gain practical insights into improving throughput and accuracy in challenging mining sample analyses.</li></ul><blockquote><p><strong>Presenter: </strong>Aaron Hineman (Atomic Spectroscopy Product Line Leader)</p><p>Aaron Hineman is the Atomic Spectroscopy Product Line Leader at PerkinElmer, with over 25 years of experience in analytical chemistry and a strong background in atomic spectroscopic technologies.&nbsp;</p></blockquote>

PerkinElmer: Advances in ICP-MS Technology for Mining Applications 

Advances in ICP-MS Technology for Mining Applications 

Join us for an insightful webinar exploring the latest advancements in ICP-MS technology tailored for mining applications.

<p><a target="_blank" rel="noopener noreferrer" href="https://www.spectro.com/icp-oes-principle"><span style="font-size:16px;"><strong>ICP-OES</strong></span></a><span style="font-size:16px;"><strong>&nbsp;is the standard elemental analytical method in almost every laboratory. Since it enables the analysis of about 75 elements including non-metals and halogens, provides high analysis speeds using simultaneous measuring technology, covers a wide concentration range from ppb to percent, and is quite easy to calibrate (few interferences &amp; calibrations are mostly linear) the method has largely replaced other techniques for routine analysis.</strong></span></p><p><span style="font-size:16px;">But what used to be the manual analysis of a hand full of samples per day, is the fully automatic processing of hundreds of samples today. In addition, analytical requirements have increased. Particularly for the control of formulations an accurate analysis is often paramount for the performance of the product and the economic success.</span></p><p><span style="font-size:16px;">Principally, ICP-OES is a stable method. Still, there are influences on the sample and the sample transport through ambient changes and the wear of components. Even though small, they can add up over time.</span></p><p><span style="font-size:16px;">Standard correction methodologies help to improve the precision of the analysis, compensate for such variations, and ensure the validity of the analysis. But to work efficiently, they need to be based on tolerances – acceptable when analyzing trace amounts but often insufficient for the accurate analysis of major compounds. Dynamic compensation solves this dilemma. Relevant methods will be presented in this webcast.</span></p>

SPECTRO Analytical Instruments:  Improving the Precision and Accuracy of ICP-OES Analyses 

 Improving the Precision and Accuracy of ICP-OES Analyses 

Learn how dynamic correction improves ICP-OES analyses, boosting accuracy and precision for both trace-level elements and major component determinations.