ICPMS webinars focusing on Microscopy - page 5

Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM

Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM

Discover how LiteScope’s integrated AFM-in-SEM technology allows precise in-situ electrical and topographical characterization of semiconductor structures down to the nanoscale.
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Already taken place Tu, 13.5.2025
NenoVision
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Inside the Chip: Semiconductor Failure Analysis with AFM-in-SEM
AFM Probes: From Fabrication to Functionality

AFM Probes: From Fabrication to Functionality

Join us on a journey through the probe fabrication process at Bruker's state‑of‑the‑art facility in Camarillo, CA—where we turn raw material into packaged probes.
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Already taken place Th, 8.5.2025
Bruker
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AFM Probes: From Fabrication to Functionality
Microscopy with ZEN core: A unified approach to imaging and analysis

Microscopy with ZEN core: A unified approach to imaging and analysis

Join us for an informative webinar sponsored by ZEISS, where we will introduce ZEN core, a sophisticated software solution designed to enhance your microscopy workflows.
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Already taken place Tu, 29.4.2025
SelectScience
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Microscopy with ZEN core: A unified approach to imaging and analysis
The Dawn of a New Era in EBSD Technology

The Dawn of a New Era in EBSD Technology

This webinar will introduce our new Direct Electron Detector (DED) EBSD detector, eWARP - which solves speed limitations while maximizing signal efficiency.
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Already taken place Tu, 29.4.2025
Bruker
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The Dawn of a New Era in EBSD Technology
Quantitative measurement solutions for flow cytometry

Quantitative measurement solutions for flow cytometry

In this webinar, Dr. Virginia Litwin (Eurofins) will review the fundamental principles and current best practices for instrument qualification and calibration, assay optimization, and method validation.
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Already taken place We, 16.4.2025
SelectScience
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Quantitative measurement solutions for flow cytometry
Intrinsic Structure of Sodium Battery Interfaces via cryoEM

Intrinsic Structure of Sodium Battery Interfaces via cryoEM

Join us for an enlightening webinar on the intrinsic structure of sodium battery interfaces, explored through advanced cryoEM techniques.
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Already taken place Th, 10.4.2025
Wiley
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Intrinsic Structure of Sodium Battery Interfaces via cryoEM
Simultaneous polyclonal antibody sequencing and epitope mapping by cryo-electron microscopy and mass spectrometry

Simultaneous polyclonal antibody sequencing and epitope mapping by cryo-electron microscopy and mass spectrometry

Learn how to characterize antigen-specific antibodies from serum using a combined cryo-EM and LC-MS/MS approach for simultaneous antibody sequencing and epitope mapping.
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Already taken place We, 9.4.2025
Thermo Fisher Scientific
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Simultaneous polyclonal antibody sequencing and epitope mapping by cryo-electron microscopy and mass spectrometry
Biomechanical Analysis of Tissues, Organoids, and 3D Cellular Structures using AFM

Biomechanical Analysis of Tissues, Organoids, and 3D Cellular Structures using AFM

Join us and special guest speaker Dr. Lydia Powell, Swansea University Medical School, for this webinar on the Biomechanical Analysis of Tissues, Organoids, and 3D Cellular Structures using AFM.
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Already taken place Th, 27.2.2025
Bruker
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Biomechanical Analysis of Tissues, Organoids, and 3D Cellular Structures using AFM
The New Future of Micro-CT and 3D X-Ray Microscopy

The New Future of Micro-CT and 3D X-Ray Microscopy

Discover the new, enhanced 3D imaging system.
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Already taken place Th, 27.2.2025
Bruker
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The New Future of Micro-CT and 3D X-Ray Microscopy
Nanoscale Chemical Characterization of Semiconductor Materials and Devices using Photothermal AFM-IR

Nanoscale Chemical Characterization of Semiconductor Materials and Devices using Photothermal AFM-IR

In this webinar, Bruker nanoscale IR spectroscopy experts show how photothermal AFM-IR can identify the local chemistry of defects.
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Already taken place We, 22.1.2025
Bruker
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Nanoscale Chemical Characterization of Semiconductor Materials and Devices using Photothermal AFM-IR
 

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