Introduction to AFM-in-SEM and In-Situ Correlative Microscopy. Discover key Innovations and features of LiteScope 2.5. Open Hardware/Software Philosophy.

Discover how LiteScope’s integrated AFM-in-SEM technology allows precise in-situ electrical and topographical characterization of semiconductor structures down to the nanoscale.

Discover how LiteScope’s integrated AFM-in-SEM technology allows precise in-situ electrical and topographical characterization of semiconductor structures down to the nanoscale.

Discover how diamond AFM probes enhance precision, durability, and electrical imaging—boosting throughput and lifetime in advanced nanoscale and semiconductor applications.

This webinar covers numerous AFM-IR applications in the field of life sciences, illustrating broad applicability for samples from tissue to single protein fibrils.

Join us and special guest Dr. Simone Ruggeri for this webinar on Photothermal AFM-IR – Delivering Enhanced Analysis Capabilities for Life Science Research.

Join us for this live webinar where we will introduce a powerful new technique for nanoscale IR characterization: Resonance Enhanced Force Volume AFM-IR.

Characterizing nanometer-scale features in semiconductor devices using nanoIR spectroscopy

This webinar shows how photothermal AFM-IR provides nanoscale chemical information with highly resolved IR spectra that directly correlate to FT-IR transmission spectroscopy.

Join us on a journey through the probe fabrication process at Bruker's state‑of‑the‑art facility in Camarillo, CA—where we turn raw material into packaged probes.