AFM-in-SEM LiteScope: Redefining In-Situ Correlative Analyses

The webinar will be held at two different times to make it accessible to everyone across the globe. Choose the right session based on your time zone.

Session 1 - 9:00 CEST - REGISTER HERE

Session 2 - 17:00 CEST - REGISTER HERE

During this webinar Veronika Hegrová, the Application Manager at NenoVision will explain following topics:

• Introduction to AFM-in-SEM and In-Situ Correlative Microscopy
• Discover key Benefits and features of LiteScope
• Open Hardware/Software Philosophy

What will you learn at the webinar?

• Learn about the benefits and applications of AFM-in-SEM for in-situ correlative microscopy in materials science, life science, and other research fields.
• Explore its advanced features, exceptional performance, and optimized workflows that enable in-situ correlative microscopy studies to reach new limits.
• AFM-in-SEM Application Overview: Explore the possibilities and examples of in-situ correlative microscopy analysis for Material Science, Nanostructures, Semiconductors, and Life Sciences.

Presenter: Veronika Hegrová (Head of Applications, NenoVision s.r.o.)