Characterization of Powders, Particles, 2D materials by AFM-in-SEM.

This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).

Learn how automated AFM can be applied to the most current hybrid bonding technology nodes and wafer processing steps.

Join us for this webinar to hear about AFM operating modes for failure analysis, with relevant information provided for each mode.

Introduction to AFM-in-SEM and In-Situ Correlative Microscopy. Discover key Innovations and features of LiteScope 2.5. Open Hardware/Software Philosophy.

Learn about the benefits and applications of AFM-in-SEM for in-situ correlative microscopy in materials science, life science, and other research fields.

We kindly invite you to join us for this live webinar: An Introduction to Nanoscale Infrared Spectroscopy and Imaging with Photothermal AFM-IR.

In this webinar, Bruker nanoscale IR spectroscopy experts show how photothermal AFM-IR can identify the local chemistry of defects.

We warmly invite you to join us for this webinar on the Hyperspectral Characterization of Advanced Materials using Atomic Force Microscopy (AFM).

Discover how LiteScope’s integrated AFM-in-SEM technology allows precise in-situ electrical and topographical characterization of semiconductor structures down to the nanoscale.