Key benefits in the characterisation of Powders, Particles, and 2D materials by AFM-in-SEM
Characterization of Powders, Particles, 2D materials by AFM-in-SEM.
RECORD
|
Already taken place We, 25.10.2023
NenoVision
Advances in AFM for the Characterization of 2D Materials
Explore how AFM enables comprehensive nanoscale characterization of 2D materials. Learn about structural, electrical, and chemical mapping, AFM-IR, and nanomanipulation for device fabrication.
We, 8.4.2026 17:00 CET
Bruker
Unlocking BioAFM Performance: From Sample Preparation to Advanced Accessories
Learn best practices for atomic force microscopy (AFM) in this webinar covering sample preparation, advanced imaging modes, environmental control, and AI-enabled features that expand AFM capabilities.
RECORD
|
Already taken place We, 25.3.2026
Bruker
Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM
This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).
RECORD
|
Already taken place Sa, 31.12.2022
Bruker
Atomic Force Microscopy Methods for Semiconductor Failure Analysis
Join us for this webinar to hear about AFM operating modes for failure analysis, with relevant information provided for each mode.
RECORD
|
Already taken place We, 28.5.2025
Bruker
Automated AFM for Inline Hybrid Bonding Metrology in the Semiconductor Industry
Learn how automated AFM can be applied to the most current hybrid bonding technology nodes and wafer processing steps.
Learn about the benefits and applications of AFM-in-SEM for in-situ correlative microscopy in materials science, life science, and other research fields.
RECORD
|
Already taken place We, 5.6.2024
NenoVision
Introduction to Nanoscale Infrared Spectroscopy and Imaging with Photothermal AFM-IR
We kindly invite you to join us for this live webinar: An Introduction to Nanoscale Infrared Spectroscopy and Imaging with Photothermal AFM-IR.
RECORD
|
Already taken place Th, 17.10.2024
Bruker
Nanoscale Chemical Characterization of Semiconductor Materials and Devices using Photothermal AFM-IR
In this webinar, Bruker nanoscale IR spectroscopy experts show how photothermal AFM-IR can identify the local chemistry of defects.
RECORD
|
Already taken place We, 22.1.2025
Bruker
Hyperspectral Characterization of Advanced Materials using AFM
We warmly invite you to join us for this webinar on the Hyperspectral Characterization of Advanced Materials using Atomic Force Microscopy (AFM).