AFM-in-SEM LiteScope 2.5: Redefining In-Situ Correlative Analyses

What will you learn at the webinar?

• Introduction to AFM-in-SEM and In-Situ Correlative Microscopy - Learn about the benefits and applications of AFM-in-SEM for in-situ correlative microscopy in materials science, life science, and other research fields.

• Discover key Innovations and features of LiteScope 2.5 - Explore its advanced features, exceptional performance, and optimized workflows that enable in-situ correlative microscopystudies to reach new limits.

• Open Hardware/Software Philosophy - Learn about the benefits of an Open hardware/software philosophy and how it can help you achieve your research goals. Get insight into the Open Hardware GwyScope and its potential to support your research innovation using AFM-in-SEM technology.

Presenter: Jan Neuman (CEO and co-founder of NenoVision)

Presenter: Petr Klapetek (group leader at the Czech Metrology Institute in Brno, Czech Republic)