The Thermo Scientific™ ARL™ EQUINOX 1000 enables ultra-fast XRD with a unique curved detector capturing all diffraction peaks at once, delivering complete analysis in just minutes.
Thermo Scientific Niton XL5 Plus Handheld XRF Analyzer
Confidently perform elemental analysis with the Thermo Scientific™ Niton™ XL5 Plus handheld XRF analyzer; it delivers unprecedented performance even for lightweight elements.
Thermo Scientific Niton XL2 100G General Metal Analyzer
Get immediate, nondestructive elemental analysis of alloy materials from titanium to nickel with the Thermo Scientific™ Niton™ XL2 100G General Metal Analyzer.
Thermo Scientific ARL EQUINOX 3000 XRD: real-time acquisition, no scanning, superb resolution, versatile sample handling, reliable and easy to use for research and industry.
Thermo Scientific Nexsa G2 XPS System
Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.
Thermo Scientific ARL SMS-3500 Automation for Twin OES or XRF
The ARL SMS-3500 automates two OES or XRF spectrometers with smart sample flow management for fast, efficient, and continuous production control.
Thermo Scientific Niton XL3t GOLDD+ XRF Analyzer
High-performance handheld XRF analyzer with GOLDD™ technology for fast, accurate analysis of metals, light elements, ores, soils and contaminants – no helium or vacuum needed.
Thermo Scientific Hypulse Surface Analysis System
Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.
Thermo Scientific™ ARL™ SMS-XY Automation for XRF
The Thermo Scientific™ ARL™ SMS-XY XRF system enables unattended operation, sample prep and analysis with high quality, efficiency, and reduced cost.
Thermo Scientific K-Alpha XPS System
Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.