The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.
Thermo Scientific Nexsa G2 XPS System
High-performance X-ray source
A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.
Thermo Scientific Nexsa G2 XPS System
Optimized electron optics
The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.
Thermo Scientific Nexsa G2 XPS System
XPS sample viewing
Bring sample features into focus with the Nexsa G2 Surface Analysis.
Thermo Scientific Nexsa G2 XPS System
XPS insulator analysis
The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.
Thermo Scientific Nexsa G2 XPS System
XPS depth profiling
Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.
Thermo Scientific Nexsa G2 XPS System
Optional XPS sample holders
Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.
Thermo Scientific Nexsa G2 XPS System
Avantage Software
Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.
Thermo Scientific Nexsa G2 XPS System
Correlative XPS imaging and surface analysis workflow
Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.
Thermo Scientific Nexsa G2 XPS System
Thermo Scientific - The full spectrum of surface analysis
