Discover how the iCAP PRO ICP-OES helps reduce method complexity, maintain stability with challenging matrices, and gain faster sample insight using AI-powered SemiQuantFor decades, ICP-OES has been a trusted workhorse for laboratories analyzing everything from clean water to complex brine, alloys, organics, and other challenging matrices. But today’s laboratories are being asked to do more: meet stricter regulatory and industry requirements, process more samples, reduce turnaround time, develop methods for complex samples, and improve workflow efficiency.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Fisher_Scientific_How_to_Simplify_ICP_OES_Analysis_Method_Development_High_Matrix_Samples_and_Daily_Operation_f6b97f35e6.jpg" alt="Thermo Fisher Scientific: How to Simplify ICP-OES Analysis: Method Development, High Matrix Samples, and Daily Operation" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Fisher_Scientific_How_to_Simplify_ICP_OES_Analysis_Method_Development_High_Matrix_Samples_and_Daily_Operation_f6b97f35e6.jpg 245w," sizes="100vw" width="1024" height="512">That is where next-generation ICP-OES technology can make a meaningful difference.The <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=227&amp;manufacturerItems=3&amp;search=PRO">Thermo Scientific iCAP PRO Series ICP-OES</a> is designed to help laboratories improve productivity, robustness, sensitivity, and ease of use — while introducing intelligent, AI-powered tools that give analysts faster insight into their samples.In the on-demand webinar, “<a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6198">Time to Go PRO: Discover the future of ICP-OES analysis</a>,” Thermo Fisher Scientific experts take ICP users inside the iCAP PRO ICP-OES platform for a practical virtual demonstration of the hardware, software, and differentiating technologies that support modern trace elemental analysis.<h3>Small footprint, big laboratory benefits</h3>Laboratory space is valuable, and ICP-OES instruments need to fit efficiently into busy workflows. The iCAP PRO ICP-OES features a compact vertical design that helps conserve bench space while keeping maintenance and service areas easy to access.Key benefits include:<ul><li>Space-saving vertical footprint that allows the instrument to sit flush against the wall.</li><li>Front and side access to routine maintenance points and service connections.</li><li>Simplified installation, service, and maintenance.</li><li>Streamlined sample introduction system with familiar, quick-connect components.</li><li>A smoother transition for laboratories currently using previous iCAP systems.</li></ul>For ICP analysts, the result is a system designed not only for performance but also for everyday usability.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Fisher_Scientific_How_to_Simplify_ICP_OES_Analysis_Method_Development_High_Matrix_Samples_and_Daily_Operation_2_dd16d95db6.jpg" alt="Thermo Fisher Scientific: How to Simplify ICP-OES Analysis: Method Development, High Matrix Samples, and Daily Operation" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Fisher_Scientific_How_to_Simplify_ICP_OES_Analysis_Method_Development_High_Matrix_Samples_and_Daily_Operation_2_dd16d95db6.jpg 245w," sizes="100vw" width="1000" height="553"><h3>Robust performance for high-matrix samples</h3>High-matrix samples and high-throughput workloads are common in industrial, environmental, materials, and contract testing laboratories. To keep up, an ICP-OES system must maintain plasma stability, reduce drift, and minimize downtime.The iCAP PRO ICP-OES is built with design features that support robust, reliable operation across demanding sample types.<h3>Optimized vertical torch designed for extended stability and uptime</h3>The iCAP PRO ICP-OES vertical torch design optimizes airflow within the torch box to support a stable, matrix-tolerant plasma. This helps reduce deposition on the torch and injector, which can support longer, more stable analytical runs.For ICP analysts, the benefits are clear:<ul><li>Reduced signal drift</li><li>Fewer sample failures and reruns</li><li>Less matrix buildup on key components</li><li>Reduced maintenance-related downtime</li><li>Long-term stability and reliability when analyzing challenging samples</li></ul>If cleaning is needed, the passivated aluminum torch box can be removed with just three screws, making maintenance more straightforward.<h3>Purged Optical Path for efficient UV transmission</h3>The iCAP PRO ICP-OES also uses a Purged Optical Path, or POP, interface to help maintain efficient light transmission from the plasma to the spectrometer. Low-flow argon purge gas exits through ceramic axial and radial POP nozzles, creating a protected optical path that helps reduce UV absorption by air and helps prevent plasma byproducts, dust, soot, and sample material from reaching the optical system.This is especially important for ICP-OES analysis because many critical emission lines are in the UV range.Key benefits include:<ul><li>Improved UV sensitivity.</li><li>Lower detection limits for important elements such as arsenic, selenium, and lead.</li><li>Reduced contamination of the optical interface.</li><li>No need for a separate shear gas supply or air compressor.</li><li>Simplified operation and lower running complexity.</li></ul><h3>Mirror protection for long-term optical performance</h3>The intense ultraviolet light produced by the plasma can gradually degrade optical mirrors over time. To help protect the optical system, the iCAP PRO ICP-OES uses an automated beam blocker that shields mirrors from unnecessary UV exposure when measurements are not being taken.This helps support:<ul><li>Long-term optical stability.</li><li>Reduced mirror wear.</li><li>Lower maintenance requirements.</li></ul><h3>High-efficiency optics and detection for confident results</h3>The iCAP PRO Series ICP-OES combines a compact, high-efficiency optical design with proprietary Charge Injection Device, or CID, detector technology to help maximize sensitivity, speed, and confidence in results.The optimized optical path helps transmit more light from the plasma to the detector, while the 5th generation CID821 detector captures high-quality spectral information across the wavelength range with more than 2 million pixels and smaller pixel size than in the previous iCAP platform.Together, these technologies support:<ul><li>Efficient light transmission</li><li>Improved sensitivity</li><li>Better spectral resolution</li><li>Faster analysis</li><li>More confident results in complex matrices</li></ul><h3>The CID detector advantage: more spectral detail, less compromise</h3>In real-world ICP-OES analysis, a single sample can contain trace-level analytes that produce weak signals and major matrix elements that produce very intense emission lines. The detector must manage both at the same time.That is where CID detector technology provides a significant advantage.The iCAP PRO ICP-OES CID821 smaller pixel size and high pixel density help improve physical separation between adjacent wavelengths, giving analysts more flexibility when choosing emission lines and background correction points. This also makes it easier to resolve trace analytes from nearby matrix lines, such as trace molybdenum in a tungsten matrix or trace lead in high-concentration copper.For the ICP-OES user, this means:<ul><li>Better peak separation</li><li>Easier background correction</li><li>Reduced spectral overlap</li><li>Less reliance on correction strategies and mathematical equations</li><li>Greater confidence in complex sample analysis.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Fisher_Scientific_How_to_Simplify_ICP_OES_Analysis_Method_Development_High_Matrix_Samples_and_Daily_Operation_3_e3e0cb27d9.jpg" alt="Thermo Fisher Scientific: How to Simplify ICP-OES Analysis: Method Development, High Matrix Samples, and Daily Operation" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Fisher_Scientific_How_to_Simplify_ICP_OES_Analysis_Method_Development_High_Matrix_Samples_and_Daily_Operation_3_e3e0cb27d9.jpg 245w," sizes="100vw" width="768" height="357"><h3>Why anti-blooming matters in ICP-OES</h3>Instruments have advanced significantly from classical Paschen-Runge, or Rowland Circle, spectrometers that used individual photomultiplier tubes, or PMTs, positioned at fixed wavelengths. While effective, these systems required larger optical layouts and offered less flexibility because each PMT was dedicated to a specific emission line. The transition to solid-state chip detectors, known as Charge Transfer Devices, or CTDs, helped make ICP-OES instruments more compact, flexible, and information-rich by enabling many wavelengths to be captured across a detector array. This shift supported faster multi-element analysis, easier wavelength selection, improved method development, and access to full-spectrum data from a smaller instrument platform. The two primary CTD technologies used in ICP-OES are the Charge-Coupled Device, or CCD, and the CID.In CTD detector-based ICP-OES, photons from emission lines are converted into electrical charge within individual pixels. When an intense emission line saturates a detector region, excess charge can spread into neighboring pixels, an effect known as blooming. In CCD detectors, where charge is shifted pixel by pixel across the chip during readout, blooming can distort nearby weaker signals and lead to overestimation of their intensity.The CID detector within the iCAP PRO ICP-OES works differently. In a CID, each pixel is an independent site with its own set of electrodes. The electrical charge generated by incoming light is collected and stored directly inside that specific pixel. If a pixel fills to capacity, the excess charge drains into the underlying silicon substrate rather than spilling into neighboring pixels. Pixels are addressed individually and read without shifting charge across the array, helping contain intense signals. In this way, CID detectors are inherently anti-blooming.For analysts, anti-blooming helps protect trace-level analyte peaks near strong matrix emission lines. This can reduce the need to choose less sensitive wavelengths, add extra dilutions, or rely on additional correction strategies that may increase method complexity.Additionally, because the charge doesn’t have to move across the chip to be read (unlike a CCD), a CID can perform Non-Destructive Readout (NDRO) where the CID detector can measure the charge in an individual pixel without emptying it. For ICP-OES analysis, this provides two important benefits.<ul><li>First, weak emission lines can be integrated for a longer time to collect more signal.</li><li>Second, bright emission lines can be monitored during the exposure and read before they approach saturation.</li></ul>In practical terms, NDRO helps the CID detector capture weak trace-level signals more effectively while managing intense matrix lines — improving signal-to-noise ratio resulting to better sensitivity, extending dynamic range, and leading to more confident trace-level results.The blooming effect experienced in CCD detectors can be minimized by setting integration times, segmenting the detector, or by adding anti-blooming or overflow drains. These approaches can help reduce the impact of very intense emission lines on weaker trace-level signals and reduce blooming, but they are mitigation strategies rather than the inherent pixel-level readout advantage of CID technology.<h3>Intelligent Full Range and enhanced UV modes</h3>The larger CID detector also enables Intelligent Full Range, or iFR, mode, which captures the full elemental spectrum in one simultaneous acquisition. This reduces analysis time by eliminating sequential low- and high-wavelength exposures.For applications requiring improved UV performance, enhanced UV, or eUV, mode provides added sensitivity for key elements with emission lines in the low UV range.<h3>Key takeaways from the optical and detector design</h3>The practical benefits of the iCAP PRO ICP-OES compact optical design combined with the unique and proprietary CID technology are clear:<ul><li>High sensitivity,</li><li>Faster analysis,</li><li>Reduced spectral interferences,</li><li>Better performance in high-matrix samples, and</li><li>Greater confidence in the analysis of complex sample matrices.</li></ul>The same rich, simultaneous spectral data captured by the CID detector also helps power advanced software capabilities such as the innovative AI-driven SemiQuant, giving analysts rapid insight into unknown samples without having to build a calibration curve.<h3>AI-powered SemiQuant: instant sample insight</h3>One of the most compelling parts of the on-demand webinar is the software demonstration, including a deep dive into the new AI-powered SemiQuant feature within the<a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/1489"> Thermo Scientific Qtegra Intelligent Scientific Data Solution (ISDS) software</a>.Traditional ICP-OES method development often starts with several questions: Which elements are present? What concentration ranges should be expected? Which wavelengths should be selected? What interferences might occur? Which samples need dilution?AI-powered SemiQuant helps answer those questions faster. Using the rich, simultaneous spectral information captured by the CID detector, SemiQuant evaluates many wavelengths for each element rather than relying on a single emission line. The AI model interprets these spectral patterns to provide rapid, semi-quantitative concentration estimates without requiring instrument calibration.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Fisher_Scientific_How_to_Simplify_ICP_OES_Analysis_Method_Development_High_Matrix_Samples_and_Daily_Operation_4_56ce880ee0.jpg" alt="Thermo Fisher Scientific: How to Simplify ICP-OES Analysis: Method Development, High Matrix Samples, and Daily Operation" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Fisher_Scientific_How_to_Simplify_ICP_OES_Analysis_Method_Development_High_Matrix_Samples_and_Daily_Operation_4_56ce880ee0.jpg 245w," sizes="100vw" width="768" height="409">For ICP users, this provides immediate insight into unknown samples.The SemiQuant feature can help analysts quickly assess:<ul><li>What elements are present.</li><li>Which elements are high or low in concentration.</li><li>What calibration ranges to build.</li><li>Which matrix components may cause spectral interferences.</li><li>Which samples may need dilution before quantitative analysis.</li><li>How to streamline method development and sample preparation.</li></ul>This makes AI-powered SemiQuant especially valuable for sample screening, unknown identification, method development, contamination investigations, and troubleshooting before committing to a full quantitative workflow<h3>Watch the on-demand iCAP PRO ICP-OES technical showcase</h3>The on-demand virtual technical showcase gives ICP users an insider’s look at the iCAP PRO ICP-OES from both the hardware and software perspective.In the hardware demonstration, you will see:<ul><li>The compact vertical instrument design</li><li>The vertical torch and torch box access</li><li>The simplified sample introduction system</li><li>Maintenance and user-friendly design features</li><li>How analysts interact with the instrument during routine operation</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Fisher_Scientific_How_to_Simplify_ICP_OES_Analysis_Method_Development_High_Matrix_Samples_and_Daily_Operation_5_4485b11821.jpg" alt="Thermo Fisher Scientific: How to Simplify ICP-OES Analysis: Method Development, High Matrix Samples, and Daily Operation" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Fisher_Scientific_How_to_Simplify_ICP_OES_Analysis_Method_Development_High_Matrix_Samples_and_Daily_Operation_5_4485b11821.jpg 245w," sizes="100vw" width="768" height="480">In the Qtegra ISDS software demonstration, you will see:<ul><li>How to develop a method</li><li>Wavelength selection</li><li>Acquisition settings</li><li>Interference correction tools</li><li>Sample list setup</li><li>AI-powered SemiQuant analysis</li><li>A deep dive into how SemiQuant provides fast insight into unknown samples</li></ul>Whether you are running environmental samples, industrial materials, or high-salt brines, the iCAP PRO Series ICP-OES is designed to help your laboratory move from sample to reliable result with greater speed, confidence, and ease.Register now to watch the on-demand virtual technical showcase, “<a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6198">Time to Go PRO: Discover the future of ICP-OES analysis</a>,” and get firsthand insight from our application experts into the innovations that make the iCAP PRO ICP-OES our most powerful, user-friendly instrument yet. To learn more, visit the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=227&amp;manufacturerItems=3&amp;search=PRO">iCAP PRO Series ICP-OES</a> instruments.<blockquote>Visit us on&nbsp;<a target="_blank" rel="noopener noreferrer" href="https://www.linkedin.com/showcase/72003132/admin/dashboard/">LinkedIn:</a>&nbsp;#ICP-OES #ElementalAnalysis #MetalsAnalysis #AtomicSpectroscopy</blockquote>

How to Simplify ICP-OES Analysis: Method Development, High Matrix Samples, and Daily Operation

In this leaflet we discuss whether or not you should correct for an observed significant bias and the impact this may have on the measurement uncertainty (MU). How to apply the correction and how to increase the uncertainty to take account of an uncorrected bias is outside the scope of this leaflet.&nbsp;Important issues for deciding on how to treat an observed significant bias are:&nbsp;<ul><li>whether we understand the cause of the bias, and&nbsp;</li><li>whether its size can be reliably determined.&nbsp;</li></ul>Further we must decide:&nbsp;<ul><li>whether the bias is consistent for all test samples within the scope of the method and&nbsp;</li><li>whether any correction for bias should be multiplicative or additive, depending on whether the magnitude of the bias is constant or changes with the concentration level.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Treatment_of_an_observed_bias_2_d221a32b8b.jpg" alt="Eurachem: Treatment of an observed bias" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Treatment_of_an_observed_bias_2_d221a32b8b.jpg 245w," sizes="100vw" width="1528" height="448"><h4>Should we correct, and should we increase the measurement uncertainty?&nbsp;</h4>The ISO Guide to the expression of uncertainty in measurement, GUM [1], assumes that “the result of a measurement has been corrected for all recognised significant systematic effects” (GUM 3.2.4). This implies that when developing a measurement method all known sources of bias should be investigated and if possible, eliminated or their effect minimised. If this cannot be achieved, then, if appropriate, a correction should be applied and the measurement uncertainty revised.&nbsp;Let’s assume we have available a standardised method or a fully developed in-house method, with a clear description of the measurand, where any known bias has been minimised during method development (e.g. the effect of interferences has been minimised or a correction is included in the method). The next step, as a part of the validation, is to reliably determine any additional bias for the concentration interval and different matrices specified within the scope of the method. On the next page we present a roadmap outlining how to handle any additional significant bias.&nbsp;Note that the observed bias in a laboratory could be due to laboratory as well as method bias. For empirical methods where the measurand is operationally defined by the method, the method bias is by definition zero, however, the laboratory bias still needs to be considered.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Treatment_of_an_observed_bias_3_5d99940abd.jpg" alt="Eurachem: Treatment of an observed bias" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Treatment_of_an_observed_bias_3_5d99940abd.jpg 62w," sizes="100vw" width="426" height="1060"><ol><li>There is no point in trying to eliminate or correct a small bias, since both elimination and correction need resources.&nbsp;</li><li>If bias is not negligible then the best approach, if possible, is to try to eliminate it by modifying the method.&nbsp;</li><li>If bias is not negligible, but eliminating it is either impossible or impractical, then we can consider correcting for bias. There are three possibilities:&nbsp;<ul><li>Correction may be required (e. g. by regulations).&nbsp;</li><li>Correction may be forbidden, in which case no correction should be made.&nbsp;</li><li>Correction may be allowed. Then we should look at two more criteria to determine whether correction is justified.&nbsp;</li></ul></li><li>If bias can be reliably determined and a correction method can be applied that is relevant for all test samples within the scope of the method we may decide to correct for bias. However, if the cause of bias is not known then correcting for bias cannot be generally recommended. If bias cannot be reliably determined then we should not correct for it. If we correct the result on the basis of an unreliable bias estimate then we may even increase the uncertainty of the results.&nbsp;</li><li>Correcting for bias is meaningful only if a useful reduction of measurement uncertainty (MU) is achieved. Correcting for the bias is only meaningful if the MU of the correction is smaller than the component of the MU arising from not applying the correction.&nbsp;</li></ol>If a significant bias is not corrected, it is difficult to give clear guidance on what action to take. For the case of recovery correction, IUPAC [2] lists some possibilities if no correction is applied:&nbsp;<ol><li>No action;&nbsp;</li><li>Report recovery separately, including the uncertainty of both the result and the recovery&nbsp;</li><li>Take the bias into account in the uncertainty estimate of the results</li></ol>These principles can be applied to other forms of bias. Further options have also been reviewed in the literature: See, for example, reference [3]

Treatment of an observed bias

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 3rd August 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you application notes by Agilent Technologies and Shimadzu and other document by Thermo Fisher Scientific!<h3>1. Agilent Technologies: Determination of Toxic Elements in Durian and Jackfruit Using an Agilent Automated ICP-MS System According to China GB 5009.268</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_icpms_durian_5994_9351en_agilent_fcafe537c7.pdf">Full PDF for download</a>&nbsp;</li></ul>Fruit is an essential part of daily human nutrition, providing vital vitamins, minerals, and dietary fiber.3 The Chinese market, with over 1.4 billion people, has become one of the largest fruit markets in the world. It is expected that China's total fruit consumption will reach about 312 million tons by 2025.4 Additionally, fruit imports are projected to exceed 9 million tons annually, underscoring the country's strong domestic demand and reliance on imported supplies.&nbsp;Within this context, China has become a major export destination for Asian countries, including Vietnam, Thailand, Laos, Cambodia, Philippines, Indonesia, and others. Thanks to favorable climate conditions and a wide variety of tropical fruit cultivars, these countries have strategically increased their fruit exports to satisfy Chinese market demand. Specifically, products such as durian and jackfruit have gained significant popularity, playing an increasingly vital role in regional agricultural trade.&nbsp;However, the biggest challenge for those countries when entering the Chinese market is strict food safety regulations, especially limits on trace elements and heavy metals such as lead (Pb), cadmium (Cd), mercury (Hg), and arsenic (As). The General Administration of Customs of the People's Republic of China (GACC) sets very low Maximum Residue Limits (MRLs, Table 1). Additionally, the large, continuous volume of fruit exports makes time a critical factor, as any delay can affect product quality and reduce its economic value. This situation places significant pressure on testing laboratories, requiring the development of stable, rapid, and accurate methods to ensure continuous and reliable operations.&nbsp;To address these challenges, the Agilent ICP Workflow Automation System offers a practical solution. The ICP‑MS 7900 provides high-throughput, highly sensitive, and precise measurements of trace elements and heavy metals, including Pb, Cd, Hg, and As. The combination of ADS2 and AVS helps reduce sample turnaround time and cost per analysis. The Advanced Dilution System (ADS2) automatically performs important tasks such as preparing a multipoint calibration from a single stock standard up to 400 times, diluting samples above the calibration range, or, if there is an internal standard recovery issue, eliminating the need for manual dilution. The Advanced Valve System (AVS) automatically rinses the sample introduction system while the next sample is being analyzed, virtually eliminating the delays typical of conventional analysis. Using controlled argon bubble injection between the sample and rinse solution prevents mixing, reducing uptake and rinse times. This study describes the use of the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=7900">Agilent 7900 ICP-MS</a>, <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=SPS+4">Agilent SPS 4 autosampler</a>, AVS, and ADS2 auto-dilution for the analysis of four toxic elements in durian and jackfruit samples using the China GB 5009.268 method.1<h4>Results and discussion&nbsp;</h4><h5>Automatic calibration standards and Instrument stability&nbsp;</h5>A 7-point calibration curve automatically prepared using the ADS 2 demonstrated excellent linearity over the concentration range of 0.05–10 µg/L. Using a 1/x weighted regression without forcing the calibration through the origin, all analytes achieved coefficients of determination (R²) ≥ 0.995 (Figure 3), with back-calculated concentrations within 90–110% of their theoretical values, confirming the suitability of the calibration range for routine quantification. The integrated automation workflow significantly improved laboratory productivity by completing calibration preparation and analysis in approximately 1.5 minutes per sample. By minimizing manual operations and operator intervention, the ADS 2 reduced the risk of contamination and human error while enabling higher sample throughput for routine food safety testing.&nbsp;To evaluate instrument stability during continuous operation, the variation in internal standard recoveries was monitored throughout an analytical sequence of more than 70&nbsp;consecutive samples. The recoveries of the three internal standards across different measurement modes remained consistently within the ±20% acceptance limit throughout the analytical sequence (Figure 4). Blank samples interspersed between concentration intervals showed no evidence of carryover, demonstrating effective system cleanliness and analytical robustness. These results confirm the excellent long-term stability and robust matrix tolerance of the Agilent 7900 ICP-MS, providing reliable performance for high-throughput routine food safety testing.<h4>Conclusion&nbsp;</h4>The Agilent 7900 ICP-MS, integrated with the SPS 4 autosampler, ADS 2, and AVS, delivers a fully automated, high-throughput workflow for routine trace-level multi-element analysis. By eliminating manual standard preparation and minimizing operator intervention, the solution reduces labor costs, improves data consistency, and empowers laboratories to maximize productivity and analytical capacity to meet increasing testing demands.&nbsp;Excellent sensitivity, long-term stability, and robust interference removal, together with satisfactory recoveries, repeatability, and reproducibility for As, Cd, Pb, and Hg at an LOQ of 5 µg/kg, demonstrate reliable analytical performance. Compliance with Chinese regulatory requirements further position the Agilent automation solution as a cost-effective platform for high-volume food safety testing and export quality assurance, enabling laboratories to confidently support the growing demand for exports to the Chinese&nbsp;market.<h3>2. Shimadzu: TOC Evaluation of Surfactants</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01160_en_539fba0ba2.pdf">Full PDF for download</a></li></ul><h5>User benefits</h5><ul><li>TOC can be evaluated accurately using the TC-IC method, even for foaming surfactants.&nbsp;</li><li>The ASI-L autosampler enables automatic, continuous measurement of multiple samples, improving analytical efficiency.</li></ul>Surfactants are important chemicals widely used in detergents and dispersants for pharmaceutical equipment cleaning processes, chemical manufacturing processes, and environmental water management. If surfactant residues remain after such processes, they can not only affect manufacturing processes and final product quality, but also increase the organic load in wastewater and environmental water. Therefore, quality control is also needed for organic matter derived from surfactants.&nbsp;Total organic carbon (TOC) analysis is effective for evaluating the quality of surfactants. In general, the NPOC (non-purgeable organic carbon) method is often selected for TOC measurement in terms of sample volume and analysis time requirements. On the other hand, because surfactants have both hydrophilic and hydrophobic groups in their structure, they tend to foam even at low concentrations. When such samples are measured by the NPOC method, which involves acid addition and sparging, foaming can cause the sample to overflow from the syringe vessel inside the instrument into the waste line. That can result in measurement valuesthat are lower than the true value.&nbsp;This article compares TOC measurement results for surfactants obtained by the NPOC method and the TC-IC method using the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=TOC-L">Shimadzu TOC-L total organic carbon analyzer</a>, which uses the combustion oxidation method.<h4>Conclusion&nbsp;</h4>Table 5 summarizes the results obtained by measuring sodium dodecylbenzenesulfonate solutions, used here as representative surfactant samples, by the NPOC method and the TC-IC method. With the NPOC method, the TOC recovery rates were below 50 % for all samples, whereas the TC-IC method produced satisfactory TOC recovery rates close to 100 % for all samples.Sodium dodecylbenzenesulfonate solutions (carbon concentration: 0.5 mg/L) is also used in Japanese Pharmacopoeia (JP) recovery tests. For surfactants that readily foam, such as in this example, NPOC measurements involving acid addition and sparging may affect measurement accuracy due to sample loss. For such samples, accurate TOC values can be obtained by using the TC-IC method. In addition, by using the ASI-L autosampler, multiple samples can be measured automatically and continuously.<h3>3. Thermo Fisher Scientific: How rhodium plating can affect gold XRF results</h3><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=315&amp;manufacturerItems=3&amp;search=niton">Thermo Scientific™ Niton™ XRF Analyzers</a> can help precious metals professionals detect rhodium (Rh) plating and interpret gold (Au) results with confidence.<ul><li>Other document (smart note)</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/rhodium_plating_can_affect_gold_xrf_results_sn1862_en_331edc099a.pdf">Full PDF for download</a></li></ul><h4>Benefits of XRF in jewelry analysis&nbsp;</h4>Niton XRF analyzers provide capabilities that can enhance a jeweler’s operations in several ways:&nbsp;<ul><li>Identify Rh-plated gold items during routine testing&nbsp;</li><li>Reduce confusion around unexpected Au readings&nbsp;</li><li>Support more confident buying, selling, refining, and verification decisions&nbsp;</li><li>Help explain results to customers, suppliers, and trading partners&nbsp;</li></ul><h4>Reduce risk in precious metals trading&nbsp;</h4>In precious metals trading, small differences in reported gold concentration can affect pricing, settlement, customer trust, and supplier relationships. Recognizing Rh plating helps users avoid unnecessary disputes, retesting, or destructive testing when the surface finish is influencing the measurement.&nbsp;<h4>Best practices&nbsp;</h4>One should always check the result for Rh when Au appears lower than expected.&nbsp;<ul><li>Test multiple locations, especially where plating may vary&nbsp;</li><li>Look for worn or unplated areas when appropriate&nbsp;</li><li>Interpret Au results in the context of surface finish and item history&nbsp;</li><li>If appropriate, remove the rhodium plating prior to XRF analysis to evaluate the underlying alloy&nbsp;</li></ul><h4>The bottom line&nbsp;</h4>Rhodium plating can make a properly karated gold item appear to return a lower Au result when it is evaluated by XRF. <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=315&amp;manufacturerItems=3&amp;search=niton">Niton XRF analyzers</a> can detect Rh at the surface, helping precious metals professionals recognize plating, interpret results correctly, and make more confident decisions.

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Thermo Scientific MSA-330 Multi-Stream Slurry XRF Analyzer

Thermo Scientific MSA-330 (XRF) analyzer delivers elemental analysis (Ca–U) for up to 12 slurry streams, eliminating cross-contamination, with low operational cost and easy maintenance.

The Thermo Scientific™ MSA-330 Multi-Stream Slurry XRF Analyzer provides reliable, flexible, cost-effective elemental analysis for up to 12 slurry streams, delivering information for the monitoring and control (manual or automatic) of mineral beneficiation circuits. Keeping each stream in a separate analysis zone, it eliminates cross-contamination without any need for a multiplexer or demultiplexer, minimizing head loss and plant elevation requirements. Use the MSA-330 to monitor feed, concentrate and tailings grades, to drive up process efficiency, improve metal recovery, optimize reagent consumption, and reduce costs.The MSA-330 quantifies % solids and up to 20 elements for between 3 and 12 slurry streams according to a predefined schedule to deliver real-time process trend information for monitoring and control.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_MSA_330_Multi_Stream_Slurry_XRF_Analyzer_56ef33bd34.jpg" alt="Thermo Scientific™ MSA-330 Multi-Stream Slurry XRF Analyzer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_MSA_330_Multi_Stream_Slurry_XRF_Analyzer_56ef33bd34.jpg 156w," sizes="100vw" width="650" height="650"><h3>Key features include:</h3><ul><li>Capability to measure and provide composite samples for 3 to 12 slurry streams, for flexible, cost-efficient process monitoring.</li><li>Dedicated, separate path for each process stream, from sample point to sample discharge, for the elimination of cross-contamination and simplified sample return.</li><li>Low head design simplifies sample transport design and is advantageous for gravity feed or return of samples to the process.</li><li>Advanced energy dispersive X-ray detector, for accurate measurement from calcium to uranium with integrated Peltier cooler for reliable, trouble-free operation over a wide range of in-plant environmental conditions.</li><li>Cross-cut sampler for each stream provides sampling for analyser calibration and composite samples.</li><li>Optional vacuum filter station available for each of the composite samplers.</li><li>When fed from a SamStat30C, the dedicated cross-cut samplers in the MSA-330 can be used to acquire composite samples for material balancing and accounting purposes.</li><li>No multiplexer or demultiplexer delivers a flow head space solution, lowering implementation and operational costs for a centralized analyser system.</li><li>High flow capability, for handling the full flow of low flowrate process streams, eliminating additional costs associated with a sampler and sample delivery system. 300mm wide tank as standard with larger sizes available for higher flow rates.</li></ul>

Thermo Scientific AnStat-330 Online Sampling and Elemental Analysis Station

The AnStat-330 provides real-time elemental analysis of slurries, improving metal recovery and eliminating delays and the need for sampling pumps.

The Thermo Scientific™ AnStat-330 Online Sampling and Elemental Analysis Station is a high availability, low head loss solution for:<ul><li>Metallurgical accounting</li><li>High-quality measurement of critical slurry streams in mineral processing plants</li></ul>It features an integrated analyzer and a full-flow, multistage, representative sampler, delivering:<ul><li>Accurate real-time assays</li><li>Enhanced control of flotation circuits, including:<ul><li>Flotation plant feed</li><li>Roughing and cleaning circuits</li><li>Final concentrates and tailings</li></ul></li></ul><h3>🔧 Key Advantages</h3><ul><li>Eliminates:<ul><li>Costly and unreliable sample transport systems</li><li>Measurement lag from cycle time delays and cross-contamination common with centralized analyzers</li></ul></li><li>Delivers:<ul><li>Reliable and rapid response to process upsets and feed fluctuations</li><li>Low head loss design, removing the need for sample pumps</li><li>Simplified flotation plant layout and installation</li></ul></li></ul><h3>⚙️ Operational Benefits</h3>Use the AnStat-330 to:<ul><li>Improve processing efficiency</li><li>Reduce life-of-mine OPEX for sampling and analysis</li><li>Lower energy consumption</li><li>Optimize reagent use</li><li>Improve metal recovery</li><li>Maximize Net Smelter Return (NSR)</li></ul><h3>📌 Key Features</h3><ul><li>Real-time elemental analysis and composite sampling for effective process control and metallurgical accounting</li><li>Very low head loss for simplified plant design – no sample pumps required</li><li>Advanced EDXRF detector (Ca to U), with Peltier cooling for stable, reliable operation in harsh environments</li><li>Versatile, compact system – easy to integrate into existing plants</li><li>24/7 high availability for both analysis and sampling</li><li>Multistage proportional sampling, including final-stage hardened cross-cut sampler for representative samples</li><li>Low maintenance – only moving parts in final-stage cross-cut sampler</li><li>Final-stage sampler identical for both AnStat-330 and SamStat-30 across full flow range</li></ul><h3>🧩 Optional Features</h3><ul><li>Pebble screen: Removes oversized particles from cyclone overflow; acts as backup to upstream primary screen</li><li>Outlet distributor: Splits slurry flow into 2+ streams with defined volume ratios</li><li>Upwelling/reverse flow sampling zone: Ideal for particle size analysis (with PSM-500)</li><li>Vacuum filter: For use with composite sampling</li></ul>

Thermo Scientific ARL EQUINOX 100 X-ray Diffractometer

The ARL EQUINOX 100 is a compact benchtop XRD for QC, research, and routine use. It captures full diffraction patterns in real time with a CPS detector — no moving parts or scanning needed.

<h4>Compact, powerful, and flexible benchtop XRD system for routine and advanced applications</h4>The ARL EQUINOX 100 is a compact benchtop X-ray diffractometer (XRD) designed for quality control, academic research, and routine analysis. It features a unique curved position-sensitive (CPS) detector that enables real-time acquisition of the entire diffraction pattern — with no moving parts and no scanning required.<h3>Key Features</h3><ul><li>Real-time acquisition: entire diffraction pattern captured in seconds</li><li>Wide angular range: up to 110° 2θ without moving components</li><li>No external water cooling: no chiller required</li><li>Standard power outlet: plug-and-play with no special electrical setup</li><li>Low-power microfocus X-ray source: high intensity and efficient optics</li><li>Versatile measurement: reflection and transmission modes</li><li>Easy installation: suitable for labs, mobile labs, and field vans</li></ul><h3>Sample Handling &amp; Accessories</h3><ul><li>Fixed non-spinning sample stage</li><li>Spinning stages for powders, bulks, filters, and pressed pellets</li><li>Capillary sample stage for transmission mode</li><li>Controlled atmosphere sample stage</li><li>6-position automatic sample changer</li><li>Dedicated stage for thin film analysis (GIXRD, XRR)</li><li>Temperature-controlled stages (–10 °C to 500 °C)</li></ul><h3>Typical Applications</h3><ul><li>Phase identification and quantification</li><li>Degree of crystallinity, crystallite size, and lattice parameters</li><li>Crystal structure solutions and Rietveld refinement</li><li>Thin film characterization (GIXRD, XRR)</li><li>In-situ and dynamic studies (e.g., phase transitions)</li><li>Fields: materials science, geology, nanomaterials, chemistry, pharmaceuticals, metallurgy, teaching</li></ul><h3>Software &amp; Compliance</h3><ul><li>SolstiX™ XRD Software with 21 CFR Part 11 compliance</li><li>Electronic signatures, audit trails, secured data handling — ideal for pharmaceutical QA/QC environments</li></ul><h3>Why Choose ARL EQUINOX 100?</h3><ul><li>Simultaneous, real-time data acquisition</li><li>Compact, rugged, and mobile-ready design</li><li>High performance at low operating cost</li><li>Flexible platform for a broad range of samples and applications</li></ul>

Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat

Streamline slurry analysis with the Thermo Scientific™ MEP-300 probe—no liquid nitrogen needed. Replaces MEP/MEP-200 and features SDD technology for reliable, high-performance XRF results.

<h4>Enhance XRF Slurry Analysis with the Thermo Scientific™ MEP-300 Multi-Element Probe – No Liquid Nitrogen Required</h4>Streamline elemental analysis of slurries with the Thermo Scientific™ MEP-300 Multi-Element Probe, designed to eliminate the need for liquid nitrogen while improving performance and reliability. Developed as a direct replacement for earlier MEP and MEP-200 immersion probes used in <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2027">AnStat </a>and <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2004">MSA</a> X-ray analyzer systems, the MEP-300 leverages advanced Silicon Drift Detector (SDD) technology for superior results in demanding industrial environments.<h3>Why Choose the MEP-300 Probe?</h3><h4>Advanced SDD Technology</h4><ul><li>Operates without cryogenic cooling</li><li>Delivers lower detection limits and improved analytical accuracy</li><li>Achieves higher count rates, reduced background, and wider field of view</li><li>Demonstrated stability under shock and vibration, ideal for on-line industrial use</li><li>No special storage or handling required</li></ul><h4>Occupational Health &amp; Safety</h4><ul><li>No liquid nitrogen, eliminating associated hazards</li><li>Enhanced radiation safety with:<ul><li>Automatic source retraction on window rupture or probe lift</li><li>Fail-safe, spring-loaded design to withdraw the source on power loss</li><li>High-visibility beacon for status and alarm indication</li></ul></li></ul><h4>Optimized Maintenance &amp; Operations</h4><ul><li>Zero ongoing cost for liquid nitrogen</li><li>Lower cost of spare parts</li><li>Field-repairable detector — no need to return to the factory</li><li>Easy-to-replace modules and cable assemblies</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg" alt="Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg 192w," sizes="100vw" width="1374" height="1116"><h3>Specifications</h3><ul><li>Air Requirements:&nbsp;<ul><li>Instrument Air: ANSI ISA-S7 0 0-1996 (clean and dry to 0.1 microns with dew point &lt;2°C)</li><li>Air Pressure: 550 kPa nominal – 1000 kPa maximum</li></ul></li><li>Certifications/Compliance: CE, ICES 001, CSA, FCC Part 15B and RCM AS/NZS CISPR11</li><li>Electrical Requirements:&nbsp;<ul><li>Three Phase 48 to 62 Hz. Max 2.5kVA Neutral not required.</li><li>Identical power requirements to previous generation products.</li><li>Any of the standard three phase voltages used in the world mining industry in the range 380–600 Volts AC may be factory or field selected.</li><li>Variation should not exceed ±10% of the nominal voltage selected.</li></ul></li><li>Operating Temperature:&nbsp;<ul><li>Ambient -10°C to +55°C (measured at enclosure surface temperature, temperature to not exceed 55°C)</li><li>Process Fluid: 0°C to 45°C, Check with factory for higher temperature options</li></ul></li><li>Type: MEP-300 Upgrade Package for MSA and AnStat</li><li>Unit Size: Each</li></ul>

Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer

The Thermo Scientific™ ARL™ EQUINOX 1000 enables ultra-fast XRD with a unique curved detector capturing all diffraction peaks at once, delivering complete analysis in just minutes.

The Thermo Scientific™ ARL™ EQUINOX 1000 offers very fast measurements compared to other diffractometers due to our unique EQUINOX curved detector that can measure all diffraction peaks simultaneously across a wide angular range. It will take you just a few minutes on most samples to get a complete analysis regardless of your resolution requirements.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg 245w," sizes="100vw" width="800" height="361">The ARL EQUINOX 1000 is a rugged multi-purpose benchtop style instrument designed for QA/QC, academic and routine X-ray diffraction applications. The ARL EQUINOX 1000 is the perfect instrument when space becomes a priority. With its truly excellent performance it is the perfect match for laboratories that are looking for a simple and powerful benchtop X-ray diffractometer. Several sample holders are available on this instrument such as a 6 or 30 positions sample holder, powder transmission mode sample holders, small thin film sample attachment.<ul><li>Real time acquisition</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg 245w," sizes="100vw" width="1074" height="286"><ul><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement on small samples? Try our Small Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Silver Behenate powder sample recorded on EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg 245w," sizes="100vw" width="871" height="450"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Si powder sample recorded on ARL EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg 245w," sizes="100vw" width="871" height="452"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Cu, Co - Standard sealed X-ray tube</li><li>Detector: Curved Position Sensitive X-ray Detector, CPS 180 Curvature radius: 180mm Acquisition in real time over 110° 2Theta</li><li>Goniometric table: No moving parts: acquisition in asymmetric mode</li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Zero background sample cup&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Optic: Monochromatic (Germanium, Graphite)</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase indentification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60Hz</li><li>Weight: ~90 kg</li><li>Cooling water:&nbsp;<ul><li>Flow: ~3,5l/min&nbsp;</li><li>T°C: ~18 / 25°C</li></ul></li><li>Dimensions: 996 mm H x 715 mm D x 750 mm W</li></ul>

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Thermo Scientific ARL X’TRA Companion X-ray Diffractometer

Thermo Scientific™ ARL™ X’TRA Companion is a benchtop θ/θ Bragg–Brentano X-ray diffractometer for routine QC. 600 W (Cu/Co), pixel detector (55 × 55 µm), one-click Rietveld, ±0.02° accuracy.

The Thermo Scientific™ ARL™ X’TRA Companion is a θ/θ Bragg–Brentano benchtop X-ray diffractometer designed for routine process and quality control applications. The system combines high analytical performance with robust mechanical construction and intuitive software operation.The instrument is based on a vertical θ/θ Bragg–Brentano geometry (160 mm radius) and is suitable for qualitative and quantitative XRD analysis of polycrystalline materials. It operates at 600 W using copper or cobalt radiation, with an optional integrated water chiller available.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_10_4ec7dc4708.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Schema of the geometry of the θ/θ goniometer." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_10_4ec7dc4708.jpg 245w," sizes="100vw" width="1338" height="626">Fast and resolute data acquisition is enabled by a state-of-the-art solid-state pixel detector (55 × 55 µm pitch). One-click Rietveld refinement based on a fundamental parameter approach ensures robust and reproducible phase quantification. Automated result transmission to LIMS is supported.The system is fully shielded in accordance with international X-ray safety regulations and designed for stable operation even in environments exposed to vibration.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_3_b426717a92.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_3_b426717a92.jpg 221w," sizes="100vw" width="1153" height="814"><h3>Key Features</h3><ul><li>θ/θ Bragg–Brentano geometry (160 mm radius)</li><li>600 W operation (Cu or Co radiation)</li><li>Solid-state pixel detector (55 × 55 µm pitch)</li><li>One-click Rietveld quantification (fundamental parameter approach)</li><li>Automated result transmission to LIMS</li><li>Mechanical slits, Soller slits and variable beam knife for precise beam collimation</li><li>Ultra-compact θ/θ goniometer with stepper motors and optical encoders</li><li>Modular design with exchangeable pre-aligned sample stages</li><li>Optional 6-position sample changer (φ 51.5 mm; optional φ 40 mm)</li><li>Angular accuracy better than ±0.02° over full 2θ range</li><li>Angular resolution &lt; 0.04° FWHM (standard configuration)</li><li>Shielded cabinet with lead glass windows, flushing lamps and safety interlocks</li><li>Robust construction resistant to shock and vibration</li><li>Data combination capability with XRF results</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_11_fa2374532a.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: An angular accuracy better than ± 0.02° over the whole 2θ range guarantees optimal instrument alignment to support accurate and reliable analysis. Test with a Si powder." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_11_fa2374532a.jpg 238w," sizes="100vw" width="872" height="573"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_12_ec8343a5a4.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: An angular resolution &lt; 0.04° FWHM can be measured easily in standard configuration. Test with a LaB₆ powder." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_12_ec8343a5a4.jpg 215w," sizes="100vw" width="870" height="630"><h4>Analysis of Cement Clinker according to ASTM C1365</h4>A clinker sample was measured (21 x 10 min) and a Rietveld fit was carried out consecutively using a fundamental parameter approach. Comparing standard deviations calculated from the repetitive refinements with limits given by ASTM C1365 clearly shows that results are in good agreement with the norm, as determined by considering C3A total and C3S total.The ARL X’TRA Companion XRD yields data in compliance with ASTM C1365 norm for analyzing clinker samples. The one-click Rietveld refinement based on a fundamental parameter approach is an extremely robust method with high reproducibility which yields accurate results even for C3S M1 and M3. This makes clear the ARL X’TRA Companion is the perfect solution for any process control tasks in the cement industry.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_6_0d10ca1dc4.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Results of the 21 consecutive refinements of clinker (values in weight percent)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_6_0d10ca1dc4.jpg 245w," sizes="100vw" width="1159" height="465"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_7_8da3de0f8e.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Rietveld fit of clinker (10 min acquisition)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_7_8da3de0f8e.jpg 170w," sizes="100vw" width="872" height="801"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_8_9aad68624e.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Rietveld fit of clinker (29-35° 2θ)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_8_9aad68624e.jpg 169w," sizes="100vw" width="868" height="800"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_9_c7ceefee8d.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Measurement of clinker (55-61° 2θ). Fit for C3S M1 (purple) and C3S M3 (green) explains intensity and shape of the reflections well." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_9_c7ceefee8d.jpg 211w," sizes="100vw" width="871" height="643">

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