The 19th Czech - Slovak Spectroscopis Conference (19th CSSC) is a proceeding based on a long-term scientific cooperation between Ioannes Marcus Marci Spectroscopic Society and The Slovak Spectroscopic Society. The meetings organized by the former Czechoslovak spectroscopic society (1949 – 1993) in the past and the continuation in this tradition in the form national Slovak and Czech spectroscopic conferences now, since 2008, exist as a joint event.The Czech spectroscopic conference was repeated every four years, while the Slovak spectroscopic conference took place biannually. Joint scientific meetings are now held every two years, alternating between the Czech Republic and Slovakia. The order may change if this conference is combined with the European Symposium on Analytical Spectrometry (ESAS). To maintain the tradition of the original separate national conferences, the conferences held in the Czech Republic retain their original serial numbering, and the same applies to the conferences held in Slovakia.<h3>Registration</h3><blockquote>👉<a target="_blank" rel="noopener noreferrer" href="https://cssc2026.spektroskopie.cz/registration_online">Online registration form</a></blockquote><h4>Registration Fees</h4><h5>Early (before June 15, 2026)</h5><ul><li>Participant (Member of IMMSS and SSS): 10 000 CZK&nbsp;&nbsp;</li><li>Participant (Non-member of IMMSS and SSS): 14 000 CZK&nbsp;&nbsp;&nbsp;</li><li>Students: 7 000 CZK&nbsp;</li><li>1-day registration: 5 000 CZK</li><li>Accompanying person*: 5 000 CZK</li></ul><h5>Regular (after June 15, 2026)</h5><ul><li>Participant (Member of IMMSS and SSS): 13 000 CZK&nbsp;&nbsp;</li><li>Participant (Non-member of IMMSS and SSS): 18 200 CZK&nbsp;&nbsp;&nbsp;</li><li>Students: 9 100 CZK&nbsp;</li><li>1-day registration: 6 500 CZK</li><li>Accompanying person*: 6 500 CZK</li></ul>* The accompanying person does not have access to the scientific programmeThe conference fee is calculated with VAT and includes:<ul><li>attendance to lectures and poster session</li><li>book of abstracts (electronic version)</li><li>booklet</li><li>lunches, refreshments (coffee/tea breaks)</li><li>excursion</li><li>attendance at Welcome Party and Gala Dinner.&nbsp;</li></ul>For an accompanying person, the conference fee includes the Welcome Party, the excursion and the Conference Dinner. The Conference Dinner is not included in the 1-day registration. This payment should be arranged with the Organising Committee.Accommodation is not included in the conference fee.<h4>TOPICS &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp;&nbsp;</h4><h5>Czech - Slovak Spectroscopic Conference</h5><ul><li>Atomic spectrometry (AAS, ICP-MS, AFS, OES, speciation analysis, etc.)</li><li>Molecular spectrometry/spectroscopy (UV-Vis, NMR, IR, Raman, circular dichroism, etc.)</li><li>New techniques and data processing methods in IR and Raman spectroscopy, Special methods of Raman spectroscopy (resonance Raman, SERS, SERRS, TERS)</li><li>XRF spectrometry (EDS, WDS, XRF, PIXE, etc.)</li><li>Mass spectrometry &amp; hyphenated techniques</li><li>Instrumental radioanalytical methods (Gamma spectroscopy, NAA, etc.)</li><li>Laser spectroscopy and special spectroscopy techniques</li><li>Sample preparation and introduction techniques</li><li>Applications &nbsp;of atomic and molecular spectroscopy</li><li>Statistics and metrology in spectroscopy</li></ul><h5>Mössbauer Spectroscopy in Material Science</h5><ul><li>Environmental, catalytic, biologic, medical applications</li><li>Magnetism, magnetic nanoparticles, molecular magnets</li><li>Nanomaterials, nanostructures, nanocomposites, core-shell nanoparticles, thin films</li><li>Nanomaterials in biomedicine</li><li>Nuclear forward scattering in materials science</li><li>Solid-state chemistry and physics</li><li>Industrial applications, corrosion</li><li>Instrumentation, software</li><li>Earth Science, Mineralogy and Archaeology</li></ul><h4>Venue</h4><h5>Faculty of Science</h5><ul><li>Palacky University Olomouc</li><li>17. listopadu 1192/12, &nbsp;Olomouc, Czech Republic</li></ul><h4>Contacts</h4>David Milde (Conference Chair) &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp; &nbsp;<ul><li>Palacky University Olomouc</li><li>e-mail: david.milde(at)upol.cz</li></ul>Libor Machala (MSMS 2026)<ul><li>Palacky University Olomouc</li><li>e-mail: libor.machala(at)upol.cz</li></ul>

Registration to 19th Czech - Slovak Spectroscopic Conference & Mössbauer Spectroscopy in Material Science

<h4>The problem&nbsp;</h4>We live in a “global village” but we are all different and we use many different languages to communicate.&nbsp;Even when people speak the same language, the same words may be used with different meanings. See, for example, some different uses of the word “standard” in English – a normative document, a solution of known concentration or even a type of flag.&nbsp;Even in the same area of activity misunderstandings do occur which may result in a waste of time and money, or even worse consequences.&nbsp;When talking about laboratory tests, lack of a full understanding of key terms and inappropriate translations leaves room for different interpretations of stated requirements. For example, there have historically been a number of different but related uses of the term ‘detection limit’. This may lead to inadequate fulfilment of those requirements, thus becoming an obstacle to the production of analytical data that is fit for its intended use. A shared interpretation of concepts related to quality in measurement between laboratories and accreditation bodies is also crucial for a fair and harmonised approach to laboratory assessment across the world.&nbsp;<h4>A common language&nbsp;</h4>We need a common language; clear and unambiguous. We need a common vocabulary to provide consistent definitions of concepts with their associated terms. To this end, several organisations participate in a joint effort to develop and maintain an international vocabulary of metrology (VIM) [1], which aims to achieve a unique understanding of concepts related to measurements across all sectors. The VIM is a normative reference in the standards ISO/IEC 17025, ISO 15189 and ISO/IEC 17043, and is therefore a key document for all organisations seeking accreditation.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_You_talk_we_understand_The_way_out_of_the_tower_of_Babel_Standards_8d947dbd5f.jpg" alt="Eurachem: You talk, we understand – The way out of the tower of Babel_A common language" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_You_talk_we_understand_The_way_out_of_the_tower_of_Babel_Standards_8d947dbd5f.jpg 245w," sizes="100vw" width="1126" height="499"><h4>Is this enough?&nbsp;</h4>For laboratory staff some problems still stand and need to be addressed:&nbsp;<ul><li>Many people are confused about both concepts and terms.&nbsp;</li><li>It may be difficult to understand the “formal” VIM definitions – they are short statements intended to apply to many different measurement sectors.</li><li>Translations into local languages may add to the confusion, e.g. if different terms are used in different sectors for the same VIM concept and the translator overlooks this issue.</li><li>Some substantial changes to terminology have been made in an attempt to accommodate chemical and biological measurements. Some “old” concepts still stand but have new names, e.g. “within laboratory reproducibility” vs. “intermediate precision”.&nbsp;</li></ul>To address these issues Eurachem has produced a guide [2] which provides an accessible reference containing simple and in context explanations of terms most relevant to analysts, with additional examples relating those concepts to chemical and biological measurements.&nbsp;<h4>Do you understand the meaning of these terms?&nbsp;</h4>Are you interested in a quantity or a quality? Depending on the answer, will you use a measurement procedure or an examination? Is method verification the same or less demanding than method validation? Do you need a calibration or just performance verification? Do you have a measurement standard in your laboratory? Is metrological traceability something you worry about? These are examples of the terms supporting the reliability of any measurement result that need to be clearly understood.&nbsp;<h5>Example – Accuracy, trueness, precision: are they synonyms?&nbsp;</h5><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_You_talk_we_understand_The_way_out_of_the_tower_of_Babel_accuracy_231e1e005e.jpg" alt="Eurachem: You talk, we understand – The way out of the tower of Babel_Example – Accuracy, trueness, precision" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_You_talk_we_understand_The_way_out_of_the_tower_of_Babel_accuracy_231e1e005e.jpg 146w," sizes="100vw" width="754" height="807"><ul><li>Closeness between measurement results (relating to the concept of precision)</li><li>Closeness of the average of the measurement results to a reference value (relating to the concept of trueness)&nbsp;</li><li>Closeness of an individual measurement result to the true value (relating to the concept of accuracy)&nbsp;</li></ul>The different situations in the figure show the effect of:&nbsp;<ol style="list-style-type:lower-latin;"><li>poor precision and trueness (imprecise and biased)&nbsp;</li><li>good precision, poor trueness (precise but biased)&nbsp;</li><li>poor precision, good trueness (imprecise but unbiased)&nbsp;</li><li>good precision and trueness (precise and unbiased)&nbsp;</li></ol>Improving both precision and trueness is expected to improve accuracy.&nbsp;<h4>Is all this relevant to you?&nbsp;</h4>Do you work in a laboratory, either as an analyst, quality manager or director? Are you involved in other activities related to analytical work, such as providing proficiency tests, producing reference materials or accrediting any such activity? Do you teach or study subjects related to measurements? Do you use measurement results or prescribe how to use them? If the answer is yes to any of these questions, the following reference documents are also for you.

You talk, we understand – The way out of the tower of Babel

Visit the LabRulez booth at <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/events/871">analytica 2026</a> in Munich, 24. - 27. March 2026! You can find us in Hall A1, Booth A1.506. At the booth, you will be able to explore live demonstrations of how the LabRulez portals work and see selected analytical instruments from our pre-owned marketplace section.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Lab_Rulez_at_Analytica_2026_Floor_plan_55e1057e03.jpg" alt="LabRulez at Analytica 2026: Hall A1 Floor Plan and Booth Location" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Lab_Rulez_at_Analytica_2026_Floor_plan_55e1057e03.jpg 245w," sizes="100vw" width="1516" height="881"><h3>Would you like to learn how the LabRulez portals work?</h3>➡︎ <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/">LabRulezLCMS</a> ➡︎ <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/">LabRulezGCMS</a> ➡︎ <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/">LabRulezICPMS</a><ul><li>A unique online solution for your marketing</li><li>A targeted audience from the analytical chemistry community</li><li>Modern technologies and a unique concept</li><li>Design optimized for most smart devices – PC, mobile, and tablet</li><li>Advanced statistical tools fully available to users</li></ul><h3>Services Offered</h3><h4>News + Company Updates</h4><ul><li>Publish news related to your instrumentation, applications, services, events, job openings, and more</li><li>News is shared both on our portals and across our social media channels</li></ul><h4>Library – All Documents in One Place</h4><ul><li>Applications, posters, presentations, technical articles, brochures, specifications</li><li>Fast and advanced search capabilities</li><li>Over 32,000 documents currently available in our database</li></ul><h4>Webinars</h4><ul><li>Upcoming and on-demand webinars from the field of analytical chemistry</li><li>More than 5,500 webinars covering chromatography, mass spectrometry, and spectroscopy</li></ul><h4>Careers</h4><ul><li>Targeted job listings in analytical chemistry</li><li>Clear filtering by specialization or location</li><li>Increased visibility for job postings</li></ul><h4>Companies</h4><ul><li>Company profile with key information and contacts</li><li>Integration of all your activities on our portal: News, Library documents, Webinars, Upcoming Events, Careers, and mentions by partners or customers</li><li>Connection to your Products listed on LabRulez portals</li></ul><h4>Products and Services</h4><ul><li>Comprehensive overview of instrumental techniques and services</li><li>Targeting the analytical chemistry community and customers in the growing online environment</li></ul><h4>Marketplace</h4><ul><li>Buying and selling pre-owned analytical equipment</li><li>We purchase analytical instrumentation of all brands and ages</li><li>Sell your equipment through LabRulez</li><li>Request and purchase complete systems, modules, or spare parts with warranty and service</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Lab_Rulez_at_analytica_2026_bazar_7edf4a0872.jpg" alt="LabRulez at analytica 2026" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Lab_Rulez_at_analytica_2026_bazar_7edf4a0872.jpg 88w," sizes="100vw" width="1600" height="2844"><h3>What Will Be on Display at Our Booth?</h3>Come and explore selected spare parts and modules from our marketplace section. These include both new, tested, and pre-owned items.<h4><a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/bazaar">LabRulezLCMS Marketplace</a></h4>Spare parts for LC/MS:<ul><li><a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/bazaar?category=378">Vacuum turbo pumps for LC/MS</a></li></ul>Spare parts for HPLC:<ul><li><a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/bazaar?category=397">Degassers for HPLC/UHPLC</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/bazaar?category=368&amp;search=valve">Automatic valves for HPLC</a></li><li>HPLC components for Agilent 1100, 1200, and 1260 Infinity II series</li></ul>Consumables:<ul><li><a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/bazaar?category=377">HPLC lamps</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/bazaar?category=48">HPLC columns</a></li></ul><h4><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/bazaar">LabRulezGCMS Marketplace</a></h4>Spare parts for GC/MS:<ul><li><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/bazaar?category=367&amp;search=turbo">Turbo pumps for GC/MS</a></li></ul>Spare parts for GC:<ul><li><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/bazaar?category=366&amp;search=EPC">EPC modules</a></li></ul>Sample injection<ul><li><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/bazaar/432">Autosampler 7693A for GC</a></li></ul>Consumables:<ul><li><a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/bazaar?category=7">GC columns </a>and selected accessories</li></ul>

LabRulez at analytica 2026

Article

Events

Science and research

Ioannes Marcus Marci Spectroscopic Society is a voluntary organization of scientific, scientific-pedagogical and professional workers in the field of spectroscopy, or legal entities engaged in scientific and application activities in this field, associated with joint activities. SSJMM was founded in 1949.

Spektroskopická společnost Jana Marka Marci

Eurachem is a European network promoting international traceability of chemical measurements and good analytical practice. It provides expert guidance, supports method validation, uncertainty evaluation, proficiency testing, and facilitates discussion on technical and policy issues in analytical quality.

Eurachem

Everything from the world of analytical chemistry in one place. We connect people in solving their problems. At Labrulez you will find all the necessary information easily, quickly and clearly. Stop searching and start finding.

LabRulez

Thermo Scientific AnStat-330 Online Sampling and Elemental Analysis Station

The AnStat-330 provides real-time elemental analysis of slurries, improving metal recovery and eliminating delays and the need for sampling pumps.

The Thermo Scientific™ AnStat-330 Online Sampling and Elemental Analysis Station is a high availability, low head loss solution for:<ul><li>Metallurgical accounting</li><li>High-quality measurement of critical slurry streams in mineral processing plants</li></ul>It features an integrated analyzer and a full-flow, multistage, representative sampler, delivering:<ul><li>Accurate real-time assays</li><li>Enhanced control of flotation circuits, including:<ul><li>Flotation plant feed</li><li>Roughing and cleaning circuits</li><li>Final concentrates and tailings</li></ul></li></ul><h3>🔧 Key Advantages</h3><ul><li>Eliminates:<ul><li>Costly and unreliable sample transport systems</li><li>Measurement lag from cycle time delays and cross-contamination common with centralized analyzers</li></ul></li><li>Delivers:<ul><li>Reliable and rapid response to process upsets and feed fluctuations</li><li>Low head loss design, removing the need for sample pumps</li><li>Simplified flotation plant layout and installation</li></ul></li></ul><h3>⚙️ Operational Benefits</h3>Use the AnStat-330 to:<ul><li>Improve processing efficiency</li><li>Reduce life-of-mine OPEX for sampling and analysis</li><li>Lower energy consumption</li><li>Optimize reagent use</li><li>Improve metal recovery</li><li>Maximize Net Smelter Return (NSR)</li></ul><h3>📌 Key Features</h3><ul><li>Real-time elemental analysis and composite sampling for effective process control and metallurgical accounting</li><li>Very low head loss for simplified plant design – no sample pumps required</li><li>Advanced EDXRF detector (Ca to U), with Peltier cooling for stable, reliable operation in harsh environments</li><li>Versatile, compact system – easy to integrate into existing plants</li><li>24/7 high availability for both analysis and sampling</li><li>Multistage proportional sampling, including final-stage hardened cross-cut sampler for representative samples</li><li>Low maintenance – only moving parts in final-stage cross-cut sampler</li><li>Final-stage sampler identical for both AnStat-330 and SamStat-30 across full flow range</li></ul><h3>🧩 Optional Features</h3><ul><li>Pebble screen: Removes oversized particles from cyclone overflow; acts as backup to upstream primary screen</li><li>Outlet distributor: Splits slurry flow into 2+ streams with defined volume ratios</li><li>Upwelling/reverse flow sampling zone: Ideal for particle size analysis (with PSM-500)</li><li>Vacuum filter: For use with composite sampling</li></ul>

Thermo Scientific ARL EQUINOX 100 X-ray Diffractometer

The ARL EQUINOX 100 is a compact benchtop XRD for QC, research, and routine use. It captures full diffraction patterns in real time with a CPS detector — no moving parts or scanning needed.

<h4>Compact, powerful, and flexible benchtop XRD system for routine and advanced applications</h4>The ARL EQUINOX 100 is a compact benchtop X-ray diffractometer (XRD) designed for quality control, academic research, and routine analysis. It features a unique curved position-sensitive (CPS) detector that enables real-time acquisition of the entire diffraction pattern — with no moving parts and no scanning required.<h3>Key Features</h3><ul><li>Real-time acquisition: entire diffraction pattern captured in seconds</li><li>Wide angular range: up to 110° 2θ without moving components</li><li>No external water cooling: no chiller required</li><li>Standard power outlet: plug-and-play with no special electrical setup</li><li>Low-power microfocus X-ray source: high intensity and efficient optics</li><li>Versatile measurement: reflection and transmission modes</li><li>Easy installation: suitable for labs, mobile labs, and field vans</li></ul><h3>Sample Handling &amp; Accessories</h3><ul><li>Fixed non-spinning sample stage</li><li>Spinning stages for powders, bulks, filters, and pressed pellets</li><li>Capillary sample stage for transmission mode</li><li>Controlled atmosphere sample stage</li><li>6-position automatic sample changer</li><li>Dedicated stage for thin film analysis (GIXRD, XRR)</li><li>Temperature-controlled stages (–10 °C to 500 °C)</li></ul><h3>Typical Applications</h3><ul><li>Phase identification and quantification</li><li>Degree of crystallinity, crystallite size, and lattice parameters</li><li>Crystal structure solutions and Rietveld refinement</li><li>Thin film characterization (GIXRD, XRR)</li><li>In-situ and dynamic studies (e.g., phase transitions)</li><li>Fields: materials science, geology, nanomaterials, chemistry, pharmaceuticals, metallurgy, teaching</li></ul><h3>Software &amp; Compliance</h3><ul><li>SolstiX™ XRD Software with 21 CFR Part 11 compliance</li><li>Electronic signatures, audit trails, secured data handling — ideal for pharmaceutical QA/QC environments</li></ul><h3>Why Choose ARL EQUINOX 100?</h3><ul><li>Simultaneous, real-time data acquisition</li><li>Compact, rugged, and mobile-ready design</li><li>High performance at low operating cost</li><li>Flexible platform for a broad range of samples and applications</li></ul>

Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat

Streamline slurry analysis with the Thermo Scientific™ MEP-300 probe—no liquid nitrogen needed. Replaces MEP/MEP-200 and features SDD technology for reliable, high-performance XRF results.

<h4>Enhance XRF Slurry Analysis with the Thermo Scientific™ MEP-300 Multi-Element Probe – No Liquid Nitrogen Required</h4>Streamline elemental analysis of slurries with the Thermo Scientific™ MEP-300 Multi-Element Probe, designed to eliminate the need for liquid nitrogen while improving performance and reliability. Developed as a direct replacement for earlier MEP and MEP-200 immersion probes used in <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2027">AnStat </a>and <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2004">MSA</a> X-ray analyzer systems, the MEP-300 leverages advanced Silicon Drift Detector (SDD) technology for superior results in demanding industrial environments.<h3>Why Choose the MEP-300 Probe?</h3><h4>Advanced SDD Technology</h4><ul><li>Operates without cryogenic cooling</li><li>Delivers lower detection limits and improved analytical accuracy</li><li>Achieves higher count rates, reduced background, and wider field of view</li><li>Demonstrated stability under shock and vibration, ideal for on-line industrial use</li><li>No special storage or handling required</li></ul><h4>Occupational Health &amp; Safety</h4><ul><li>No liquid nitrogen, eliminating associated hazards</li><li>Enhanced radiation safety with:<ul><li>Automatic source retraction on window rupture or probe lift</li><li>Fail-safe, spring-loaded design to withdraw the source on power loss</li><li>High-visibility beacon for status and alarm indication</li></ul></li></ul><h4>Optimized Maintenance &amp; Operations</h4><ul><li>Zero ongoing cost for liquid nitrogen</li><li>Lower cost of spare parts</li><li>Field-repairable detector — no need to return to the factory</li><li>Easy-to-replace modules and cable assemblies</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg" alt="Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg 192w," sizes="100vw" width="1374" height="1116"><h3>Specifications</h3><ul><li>Air Requirements:&nbsp;<ul><li>Instrument Air: ANSI ISA-S7 0 0-1996 (clean and dry to 0.1 microns with dew point &lt;2°C)</li><li>Air Pressure: 550 kPa nominal – 1000 kPa maximum</li></ul></li><li>Certifications/Compliance: CE, ICES 001, CSA, FCC Part 15B and RCM AS/NZS CISPR11</li><li>Electrical Requirements:&nbsp;<ul><li>Three Phase 48 to 62 Hz. Max 2.5kVA Neutral not required.</li><li>Identical power requirements to previous generation products.</li><li>Any of the standard three phase voltages used in the world mining industry in the range 380–600 Volts AC may be factory or field selected.</li><li>Variation should not exceed ±10% of the nominal voltage selected.</li></ul></li><li>Operating Temperature:&nbsp;<ul><li>Ambient -10°C to +55°C (measured at enclosure surface temperature, temperature to not exceed 55°C)</li><li>Process Fluid: 0°C to 45°C, Check with factory for higher temperature options</li></ul></li><li>Type: MEP-300 Upgrade Package for MSA and AnStat</li><li>Unit Size: Each</li></ul>

Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer

The Thermo Scientific™ ARL™ EQUINOX 1000 enables ultra-fast XRD with a unique curved detector capturing all diffraction peaks at once, delivering complete analysis in just minutes.

The Thermo Scientific™ ARL™ EQUINOX 1000 offers very fast measurements compared to other diffractometers due to our unique EQUINOX curved detector that can measure all diffraction peaks simultaneously across a wide angular range. It will take you just a few minutes on most samples to get a complete analysis regardless of your resolution requirements.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg 245w," sizes="100vw" width="800" height="361">The ARL EQUINOX 1000 is a rugged multi-purpose benchtop style instrument designed for QA/QC, academic and routine X-ray diffraction applications. The ARL EQUINOX 1000 is the perfect instrument when space becomes a priority. With its truly excellent performance it is the perfect match for laboratories that are looking for a simple and powerful benchtop X-ray diffractometer. Several sample holders are available on this instrument such as a 6 or 30 positions sample holder, powder transmission mode sample holders, small thin film sample attachment.<ul><li>Real time acquisition</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg 245w," sizes="100vw" width="1074" height="286"><ul><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement on small samples? Try our Small Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Silver Behenate powder sample recorded on EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg 245w," sizes="100vw" width="871" height="450"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Si powder sample recorded on ARL EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg 245w," sizes="100vw" width="871" height="452"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Cu, Co - Standard sealed X-ray tube</li><li>Detector: Curved Position Sensitive X-ray Detector, CPS 180 Curvature radius: 180mm Acquisition in real time over 110° 2Theta</li><li>Goniometric table: No moving parts: acquisition in asymmetric mode</li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Zero background sample cup&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Optic: Monochromatic (Germanium, Graphite)</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase indentification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60Hz</li><li>Weight: ~90 kg</li><li>Cooling water:&nbsp;<ul><li>Flow: ~3,5l/min&nbsp;</li><li>T°C: ~18 / 25°C</li></ul></li><li>Dimensions: 996 mm H x 715 mm D x 750 mm W</li></ul>

Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer

Thermo Scientific ARL EQUINOX 3000 XRD: real-time acquisition, no scanning, superb resolution, versatile sample handling, reliable and easy to use for research and industry.

The Thermo Scientific™ ARL™ EQUINOX 3000 measurements are very fast compared with other diffractometers in that the unique Inel curved detector can measure all diffraction peaks simultaneously. Due to this acquisition in real time, all kinetic studies are facilitated.The Thermo Scientific™ ARL™ EQUINOX 3500 is an evolution of ARL EQUINOX 3000 model. It is exactly the same configuration except that it works with a bigger radius of curvature detector. So, obtained data have a better resolution.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg 222w," sizes="100vw" width="790" height="556">The ARL EQUINOX 3000 is a a research-grade diffractometer with a very high resolution diffraction system providing the user a choice of features including higher resolution detectors, a larger sample area and choice of X-ray sources.The free space in the sample compartment is very large and will accommodate practically any sample and any sample handling device including furnaces, auto samplers, large assemblies, etc.<ul><li>Real time acquisition</li><li>Extremely accurate</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs. &nbsp;</li><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement? Try our Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: HTK1200N, TTK450." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg 245w," sizes="100vw" width="1228" height="336"><ul><li>This system allows you to work with controlled temperature or atmosphere chamber. Anton Paar and other suppliers chambers can be availabledepending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: LaB6 powder sample recorded on ARL EQUINOX 3000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg 245w," sizes="100vw" width="850" height="334"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Standard sealed X-ray tube: Cu, Co, Mo, ... radiation</li><li>Detector:&nbsp;<ul><li>Curved Position Sensitive X-ray Detector, CPS120&nbsp;</li><li>Curvature radius: 250mm&nbsp;</li><li>Acquisition in real time over 120° 2Theta&nbsp;</li><li>Option: CPS590 (500mm, 90° 2Theta – EQUINOX 3500)</li></ul></li><li>Goniometric table:&nbsp;<ul><li>No moving parts&nbsp;</li><li>Acquisition in asymmetric mode</li></ul></li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Special camera:&nbsp;<ul><li>Heating camera: low and high temperature&nbsp;</li><li>Humidity chamber, Electrochemistry cell</li></ul></li><li>Optic: Monochromatic</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase identification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Transition phase&nbsp;</li><li>Thin film (reflectometry, etc.)&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60 Hz</li><li>Cooling water: Flow: ≈ 3,5 L/min - T°C: ≈18 to 25 °C</li><li>Dimensions:&nbsp;<ul><li>1565 mm H x 750 mm D x 1040 mm W EQUINOX 3000&nbsp;</li><li>1815 mm H x 744 mm D x 1206 mm W EQUINOX 3500</li></ul></li></ul>

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Thermo Scientific ARL X’TRA Companion X-ray Diffractometer

Thermo Scientific™ ARL™ X’TRA Companion is a benchtop θ/θ Bragg–Brentano X-ray diffractometer for routine QC. 600 W (Cu/Co), pixel detector (55 × 55 µm), one-click Rietveld, ±0.02° accuracy.

The Thermo Scientific™ ARL™ X’TRA Companion is a θ/θ Bragg–Brentano benchtop X-ray diffractometer designed for routine process and quality control applications. The system combines high analytical performance with robust mechanical construction and intuitive software operation.The instrument is based on a vertical θ/θ Bragg–Brentano geometry (160 mm radius) and is suitable for qualitative and quantitative XRD analysis of polycrystalline materials. It operates at 600 W using copper or cobalt radiation, with an optional integrated water chiller available.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_10_4ec7dc4708.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Schema of the geometry of the θ/θ goniometer." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_10_4ec7dc4708.jpg 245w," sizes="100vw" width="1338" height="626">Fast and resolute data acquisition is enabled by a state-of-the-art solid-state pixel detector (55 × 55 µm pitch). One-click Rietveld refinement based on a fundamental parameter approach ensures robust and reproducible phase quantification. Automated result transmission to LIMS is supported.The system is fully shielded in accordance with international X-ray safety regulations and designed for stable operation even in environments exposed to vibration.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_3_b426717a92.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_3_b426717a92.jpg 221w," sizes="100vw" width="1153" height="814"><h3>Key Features</h3><ul><li>θ/θ Bragg–Brentano geometry (160 mm radius)</li><li>600 W operation (Cu or Co radiation)</li><li>Solid-state pixel detector (55 × 55 µm pitch)</li><li>One-click Rietveld quantification (fundamental parameter approach)</li><li>Automated result transmission to LIMS</li><li>Mechanical slits, Soller slits and variable beam knife for precise beam collimation</li><li>Ultra-compact θ/θ goniometer with stepper motors and optical encoders</li><li>Modular design with exchangeable pre-aligned sample stages</li><li>Optional 6-position sample changer (φ 51.5 mm; optional φ 40 mm)</li><li>Angular accuracy better than ±0.02° over full 2θ range</li><li>Angular resolution &lt; 0.04° FWHM (standard configuration)</li><li>Shielded cabinet with lead glass windows, flushing lamps and safety interlocks</li><li>Robust construction resistant to shock and vibration</li><li>Data combination capability with XRF results</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_11_fa2374532a.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: An angular accuracy better than ± 0.02° over the whole 2θ range guarantees optimal instrument alignment to support accurate and reliable analysis. Test with a Si powder." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_11_fa2374532a.jpg 238w," sizes="100vw" width="872" height="573"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_12_ec8343a5a4.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: An angular resolution &lt; 0.04° FWHM can be measured easily in standard configuration. Test with a LaB₆ powder." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_12_ec8343a5a4.jpg 215w," sizes="100vw" width="870" height="630"><h4>Analysis of Cement Clinker according to ASTM C1365</h4>A clinker sample was measured (21 x 10 min) and a Rietveld fit was carried out consecutively using a fundamental parameter approach. Comparing standard deviations calculated from the repetitive refinements with limits given by ASTM C1365 clearly shows that results are in good agreement with the norm, as determined by considering C3A total and C3S total.The ARL X’TRA Companion XRD yields data in compliance with ASTM C1365 norm for analyzing clinker samples. The one-click Rietveld refinement based on a fundamental parameter approach is an extremely robust method with high reproducibility which yields accurate results even for C3S M1 and M3. This makes clear the ARL X’TRA Companion is the perfect solution for any process control tasks in the cement industry.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_6_0d10ca1dc4.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Results of the 21 consecutive refinements of clinker (values in weight percent)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_6_0d10ca1dc4.jpg 245w," sizes="100vw" width="1159" height="465"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_7_8da3de0f8e.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Rietveld fit of clinker (10 min acquisition)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_7_8da3de0f8e.jpg 170w," sizes="100vw" width="872" height="801"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_8_9aad68624e.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Rietveld fit of clinker (29-35° 2θ)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_8_9aad68624e.jpg 169w," sizes="100vw" width="868" height="800"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_9_c7ceefee8d.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Measurement of clinker (55-61° 2θ). Fit for C3S M1 (purple) and C3S M3 (green) explains intensity and shape of the reflections well." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_9_c7ceefee8d.jpg 211w," sizes="100vw" width="871" height="643">

Products from category X-Ray from Thermo Fisher Scientific distributed by Thermo Fisher Scientific (EMEA) - page 1

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