In the week from May 11, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry<blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars">👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</a></h4>👉 Search and filter in the largest global database with over 5 500 GC, LC, MS and spectroscopy webinars.</blockquote><h5>1. Thermo Fisher Scientific: Uncovering Microplastics: Identification, Quantification, and Exposure Assessment</h5><ul><li>Tu, 12.5.2026 08:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6136">Registration</a></li></ul>In this webinar, we will explore complementary analytical solutions for comprehensive microplastics characterization.<h5>2. SPECTRO Analytical Instruments: Elemental Analysis of Superalloys: Ensuring Performance in Extreme Applications</h5><ul><li>Tu, 12.5.2026 10:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6170">Registration</a></li></ul>Learn how accurate elemental analysis ensures superalloy performance, with OES and XRF solutions for reliable quality control from lab to field.<h5>3. Agilent Technologies: What have you been smoking? Elemental Analysis in Cannabis and Cannabis Products with ICP-MS</h5><ul><li>Tu, 12.5.2026 20:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6063">Registration</a></li></ul>Learn how automated calibration and dilution streamline ICP-MS food testing workflows, improving accuracy, traceability, and productivity while addressing rare-earth doubly charged interferences.<h5>4. AZoM: Faster REE Exploration Decisions with XRF Technology Explained</h5><ul><li>We, 13.5.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6195">Registration</a></li></ul>Join the webinar to see how handheld XRF provides a significant advantage in today's fast-paced REE landscape.<h5>5. Bruker: Advancing Industrial Metrology Automation with Bruker's Dimension AFMs</h5><ul><li>We, 13.5.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6172">Registration</a></li></ul>This webinar will explore how Dimension AFM platforms support increasing levels of automation, from scripted measurements to data-driven control.<h5>6. Anton Paar: Polymer Rheology: Impact of Humidity on Material Behavior</h5><ul><li>We, 13.5.2026 18:00 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5801">Registration</a></li></ul>Discover how humidity impacts polymers and soft materials. Learn how moisture alters rheology, tackiness, curing, and flowability through real case studies across films, adhesives, foods, and powders.<h5>7. LECO: TOC Determination in Soil and Waste</h5><ul><li>Th, 14.5.2026 14:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6038">Registration</a></li></ul>Join this webinar to explore modern methods for TOC determination in soils and waste. Learn how standardized approaches, instrumentation, and method selection influence data quality and regulatory compliance.

Webinars LabRulezICPMS Week 20/2026

Routine chemical analysis typically involves several steps, e.g. selection of procedure, sampling, sample preparation, measurement, result calculation, uncertainty estimation, and reporting to customer. Based on the result, important decisions and actions are taken. The steps before and after the measurement are often referred to as “pre- and post-analytical”. There are many sources of uncertainty associated with this work, some of which can actually limit the overall quality.&nbsp;Proficiency testing (PT) and external quality assessment (EQA) schemes are effective means of assessing the quality of routine analyses. However, if there are specific procedures, either before or after the measurement, which are applied to the routine samples, but not to the PT test sample, the result reflects only the quality of part of the measurement process. Pre- and post-analytical PT/ EQA schemes are already widely used in laboratory medicine. The standard ISO 15189, that underpins accreditation of medical laboratories, stresses that EQA schemes should “... have the effect of checking the entire process including pre- and post-examination procedures ...”&nbsp;The examples in this leaflet illustrate the potential and importance of pre- and post-analytical PT/EQA. They are intended as an inspiration for the providers to further develop their external quality control activities.<h4>Pre- and post-analytical PT/EQA – a means for harmonisation&nbsp;</h4>By illustrating, e.g. lack of adherence to guidelines, or variation in sample preparation, or inconsistency in interpretation, pre- and post-analytical PT/EQA schemes pinpoint problems not apparent in other schemes. This may lead to improved harmonisation and changes to guidelines and standards.<h4>Example 1: Interpreting clinical chemistry information&nbsp;</h4>Patient background information together with analytical results can be used to check agreement of interpretational advice given by medical doctors. This type of scheme can, therefore, include both pre- and post-analytical aspects. The provider, e.g. through an expert group, ranks the quality of participants’ response and suggestions, and presents them in the report with comments.<h4>Example 2: Sampling requests in microbiology&nbsp;</h4>Using the scenario of food poisoning, pre- &amp; post-analytical aspects of sampling requests in a microbiology scheme can be highlighted. The provider gives information about food type, symptoms, and incubation time with a simulated sample. Participants choose which organism(s) to test for. The associated laboratory work involves examination of samples, report on method(s) of choice and results. Participants could, e.g. be asked to specify which toxins or pathogens are likely to cause the food poisoning and state whether or not they will disseminate information, e.g. to hospitals or food suppliers. The feedback report would then show the results of each participant together with the comments of the provider.&nbsp;<h4>Example 3: Toy testing&nbsp;</h4>Faulty design, usage and chance play a role in injury and death incidents related to children’s toys. Toy safety is the practice of ensuring that toys are safe, usually through the application of set safety standards. The PT provider sources a toy, performs visual assessment of its homogeneity, and distributes the samples. Participants are requested to assess the toy against the European standard EN 71 and they have to decide which clauses of the standard apply. The clauses chosen define the test(s) to be carried out. The feedback report will contain a “model answer” including clauses, tests and labeling requirements (when applicable).&nbsp;<h4>Example 4: Monitoring drinking water quality&nbsp;</h4>A post-analytical application can be underpinned by legislation and national regulations (Directive 98/83/EC). Participants receive a synthetic drinking water sample with properties close to one or more limiting values. They are requested to deliver results, uncertainties and a “pass/fail” recommendation to the customer. The recommendations of the provider are listed in the feedback report for educational purposes. Information can be fed back also to regulators to serve, e.g. as basis for further discussions.&nbsp;<blockquote><h5>More information / further reading&nbsp;</h5>Information about PT providers and schemes can be obtained from your national accreditation body, from the <a target="_blank" rel="noopener noreferrer" href="https://www.eptis.org/">EPTIS website</a> or from other national or international organisations.</blockquote>

Pre- and post-analytical proficiency testing

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 11th May 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you presentation by MDCW / Mount Royal University, application by Shimadzu, and brochure by Thermo Fisher Scientific!<h3>1. MDCW / Mount Royal University: An Analysis of Fresh and Used Aircraft Oil: An Indication of Exposure Pathway Possibility to Inorganic and Organic Pollutants</h3><ul><li>Presentation</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/O_4_Hayes_fed01ca35a.pdf">Full PDF for download</a></li></ul>Aircraft engine oils are highly complex mixtures formulated to meet strict MIL-SPEC requirements for piston, turboprop, and jet engines, often containing proprietary additive packages designed to improve thermal stability, reduce wear, and prevent corrosion. In this presentation at the 17th Multidimensional Chromatography Workshop, Kevin Hayes investigated how aircraft oils change during engine operation and whether these changes could contribute to occupational exposure risks for flight crews and maintenance personnel. The study focused on comparing fresh and used oils from piston, turboprop, and jet aircraft to better understand how inorganic and organic contaminants accumulate or are depleted during normal engine operation.The research combined routine multi-element analysis using ICP-OES with advanced GC×GC-TOFMS speciation analysis. Used piston and turboprop oils were collected with assistance from the MRU Aviation Program, while used jet oil samples were obtained from a private European jet operator. Elemental analysis showed significant differences between new and used oils. In piston engine oils, sulfur and lead concentrations increased substantially during use, with lead accumulation linked to tetraethyl lead (TEL) from 100LL aviation fuel. Phosphorus compounds were also detected in used oils despite not being present in the fresh oil samples, indicating additional contributions from operational processes or additives.For jet and turboprop oils, phosphorus-containing additives behaved differently. Fresh oils contained relatively high phosphorus concentrations, but these levels decreased significantly after engine operation, suggesting additive depletion or release of phosphorus-containing compounds during use. The authors highlighted that this may be particularly relevant for bleed-air systems in commercial aircraft, where oil-derived compounds could potentially enter cabin air. GC×GC-TOFMS analysis further identified several organophosphate compounds in piston engine oils. Interestingly, commonly discussed compounds such as tricresyl phosphate (TCP) were not detected, while other organophosphates were observed instead, demonstrating the importance of comprehensive speciation analysis rather than focusing solely on previously suspected contaminants.The presentation concluded that aircraft engine oils undergo substantial chemical changes during normal operation, with both inorganic and organic compounds accumulating or being depleted in ways that are not captured by analyses of unused oils alone. While elemental analysis provided valuable first-level insight into wear metals and additive behavior, GC×GC-TOFMS delivered critical molecular-level information about specific contaminant classes and transformation products. Together, the results suggest that current hazard assessments based only on fresh oils may underestimate potential occupational exposure risks and demonstrate the value of combining elemental analysis with advanced multidimensional chromatography for a more complete understanding of aircraft oil-related exposure pathways.<h3>2. Shimadzu: Measurement of TOC in Chloroisocyanuric Acid Used as Disinfectant</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01019_en_4c48146421.pdf">Full PDF for download</a></li></ul><h4>User Benefits</h4><ul><li>Samples such as chloroisocyanuric acid, which are difficult to detect using a wet oxidation TOC analyzer, can be measured with high sensitivity using the combustion oxidation <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=TOC-L">TOC-L,</a> which has a strong oxidizing power.</li><li>One sample can be measured quickly, typically within 10-20 minutes.</li></ul>In facilities where people have direct contact with water, such as swimming pools, hot springs, and bathhouses, strict water quality management is essential to protect public health and safety. Total organic carbon (TOC) measurement is widely used to detect water quality degradation caused by microbial growth and contamination with foreign substances.&nbsp;Solid powder chloroisocyanuric acids (including dichloroisocyanuric acid and trichloroisocyanuric acid), which exhibit minimal chlorine deactivation, are commonly used as disinfectants for swimming pool water instead of sodium hypochlorite solutions. However, because chlorinated isocyanuric acid is a recalcitrant substance, it is challenging to detect using wet oxidation TOC analyzers due to itsresistance to oxidation and decomposition. In contrast, a combustion oxidation TOC analyzer can measure chloroisocyanuric acids with high sensitivity and recovery rates due to itsstrong oxidizing power. In this application, we compared the TOC measurement results for sodium dichloroisocyanurate using a combustion oxidation <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=TOC-LCPH">TOC-LCPH</a> analyzer and a wet oxidation <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=TOC-VWP">TOC-VWP</a> analyzer.<h4>Conclusion</h4>The combustion oxidation TOC analyzer demonstrated high accuracy in measuring the samples. Due to its strong oxidizing power, the combustion oxidation TOC analyzer is particularly suitable for measuring TOC in samples containing recalcitrant substances such as sodium dichloroisocyanurate.<h3>3. Thermo Fisher Scientific: Exploring the surface in depth with XPS analysis</h3><ul><li>Brochure</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/exploring_surface_depth_xps_analysis_a5a921a258.pdf">Full PDF for download</a></li></ul><h5>The need for surface and interface analysis&nbsp;</h5>In today’s rapidly evolving technological landscape, precise material analysis is crucial for the development and optimization of advanced materials and devices. X-ray photoelectron spectroscopy (XPS) is an established technique for the characterization of material surface chemistry, capable of revealing compositional information several nanometers into a sample. Depth profiling is a method that extends the analysis range of XPS; by alternating material removal and XPS analysis, it can reveal how composition changes from the surface to the bulk, or across interfaces between different compounds in a sample. This information can be just as critical as how a material’s surface interacts with its environment, and can provide a more complete picture of the material’s behavior and properties.&nbsp;The <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2206">Thermo Scientific™ Hypulse™ Surface Analysis System</a> is a fully featured XPS instrument with a range of additional analytical capabilities, including reflected electron energy loss spectroscopy (REELS) and low-energy ion scattering spectroscopy (ISS). The system is equipped with a Thermo Scientific MAGCIS Dual-Mode Ion Source and a novel femtosecond laser-ablation system (fs-LA) for XPS depth profiling.&nbsp;This eBook explores XPS depth profiling in detail and shows how the Hypulse System is ideally suited for this technique, helping you uncover critical surface and sub-surface information.

News from LabRulezICPMS Library - Week 20, 2026

Article

Webinars

Application

Academy

Presentation

Eurachem is a European network promoting international traceability of chemical measurements and good analytical practice. It provides expert guidance, supports method validation, uncertainty evaluation, proficiency testing, and facilitates discussion on technical and policy issues in analytical quality.

Eurachem

Everything from the world of analytical chemistry in one place. We connect people in solving their problems. At Labrulez you will find all the necessary information easily, quickly and clearly. Stop searching and start finding.

LabRulez

NenoVision

Bruker

In our webinar, we will present:
<ul>
<li>How to effectively measure and determine the surface roughness of powders and particles, as the surface roughness might strongly influence their behavior. We will discuss the results of examples from the pharmaceutical and ceramic industries.
</li>
<li>Complex multimodal study of low-dimensional materials is crucial to understand the advanced properties of new functional 2D materials. We will show different properties, such as mechanical, electrical, topography, or surface potential.
</li>
</ul>
Why Attend?
<ul>
<li>Gain valuable insights from industry experts.</li>
<li>Stay ahead in the evolving world of materials science.</li>
<li>Access to Q&amp;A sessions for in-depth understanding.</li>
</ul>
<blockquote>
Presenter: Veronika Hegrová (Application Manager, NenoVision)
</blockquote>

NenoVision: Key benefits in the characterisation of Powders, Particles, and 2D materials by AFM-in-SEM

Key benefits in the characterisation of Powders, Particles, and 2D materials by AFM-in-SEM

Characterization of Powders, Particles, 2D materials by AFM-in-SEM webinar.

Powders, Particles, and 2D materials analysis by AFM-in-SEM

We kindly invite you to join us for this live webinar: An Introduction to Nanoscale Infrared Spectroscopy and Imaging with Photothermal AFM-IR. Infrared (IR) spectroscopy is a commonly used characterization technique for organic materials and many inorganic compounds and crystals. While powerful, it is limited by the diffraction limit to resolution on the order of several microns, and the lateral resolution is strongly dependent on the wavelength. Photothermal AFM-IR&nbsp;is a novel technique which offers IR spectroscopy and imaging on materials with a lateral resolution 1000x better than traditional FTIR and &lt;1 nm detection sensitivity with model-free interpretation. AFM-IR achieves this by using an AFM probe as the detector of photothermal expansion. This opens a variety of applications on both organic and inorganic materials where nanometer sensitivity and resolution are key.<div> In this webinar we will:</div><ul><li>Introduce the photothermal AFM-IR technique</li><li>Explore the surprisingly simple mechanism underlying the technique</li><li>Highlight a few of its many broad applications</li><li>Offer a demonstration of photothermal AFM-IR on the Dimension IconIR system</li></ul><blockquote>Presenter: Peter De Wolf, Ph.D., (Director of Technology &amp; Application Development)Peter De Wolf is director for AFM technology &amp; application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC, Belgium on the development of new SPM methods for 2D carrier profiling in semiconductors and has more than 25 years of experience on SPM. He is the author and co-author of over 30 publications related to electrical characterization using SPM. He also owns several SPM patents, and developed several new SPM modes for electrical characterization.Presenter: Cassandra Phillips, Ph.D. (Application Scientist, Bruker)Cassandra did her Ph.D. at the University of Toronto exploring the photophysics of boron nitride nanotubes using scattering scanning nearfield optical microscopy (s-SNOM) and computational models. She has been working at Bruker Nano Surfaces and Metrology since September 2019 as an Applications Scientist focusing on nanoscale IR spectro-microscopy and other correlated imaging techniques realized with atomic force microscopy.Presenter: Dr. Qichi Hu, (Senior Applications Scientist )Qichi is currently a Senior Staff Applications Scientist at Bruker Nano. He received a bachelor’s degree from Peking University and Ph.D. from University of British Columbia. He then did postdocs in U.S. university and national labs. Qichi has been working on nanoIR development and applications for over a decade, at Anasys and now at Bruker.</blockquote>

Bruker: Introduction to Nanoscale Infrared Spectroscopy and Imaging with Photothermal AFM-IR

Introduction to Nanoscale Infrared Spectroscopy and Imaging with Photothermal AFM-IR

An Introduction to Nanoscale Infrared Spectroscopy and Imaging with Photothermal AFM-IR.

Nanoscale IR Spectroscopy / Imaging with Photothermal AFM-IR

This live webinar will focus on applying Automated Atomic Force Microscopy (AFM) in inline metrology of hybrid bonding in the semiconductor industry. Bruker’s fully automated AFM solutions&nbsp;enable the highly accurate, non-destructive, nanoscale characterization of surfaces, while delivering high-throughput data for inline process control and actionable data for hybrid bonding yield enhancement.<div>In this webinar, we will illustrate how Automated AFM can be applied in the most current hybrid bonding technology nodes and wafer processing steps, and its suitability for labs and fabs working on new bonding device design. The following topics will be discussed:<ul><li>Key Automated AFM features for process control in high volume manufacturing of bonded wafers</li><li>High resolution imaging and analysis for critical bond pad metrology</li><li>Large-area scanning of areas of up to 100s of mm2&nbsp;for large scan topography in wafer-to-wafer bonding</li><li>Automated bevel edge metrology for hybrid bonding</li><li>Patterned and bare/blanket wafer defect review</li></ul>Don’t miss the opportunity to speak to our experts in the Q&amp;A session!<blockquote>Presenter: Sean Hand (Senior Staff Applications Scientist, Bruker)Sean Hand is a Senior Staff Applications Scientist with Bruker's Automated AFM group focused on the application of AFM to semiconductor manufacturing. Sean has an M.S. in physics from the University of Vermont where he focused on Atomic Force Microscopy of lipid bilayers for transdermal drug delivery. Sean has over 25 years of experience in AFM for semiconductor manufacturing and has co-authored over 20 papers and owns several patents related to Automated AFM in semiconductor manufacturing.Presenter: Ingo Schmitz, Ph.D. (Technical Marketing Engineer, Bruker)Ingo Schmitz received his Ph.D. in Chemistry from the University of Technology, Vienna Austria in 1996. His Ph.D. work focused on the development of SPM-based in-situ characterization of corrosion processes of glass and metal surfaces. Since 1997, Ingo Schmitz works at Bruker (formerly Digital Instruments &amp; Veeco Instruments) in both Santa Barbara, USA. At Bruker, he held positions as an R&amp;D engineer and application development scientist and contributed in the development of SPM methods including automated surface characterization of polysilicon. Currently, he is working in the technical marketing of automated AFM systems.</blockquote>&nbsp;</div>

Bruker: Automated AFM for Inline Hybrid Bonding Metrology in the Semiconductor Industry

Automated AFM for Inline Hybrid Bonding Metrology in the Semiconductor Industry

Learn how automated AFM can be applied to the most current hybrid bonding technology nodes and wafer processing steps

Automated AFM for Inline Hybrid Bonding Metrology

In this webinar, Bruker nanoscale IR spectroscopy experts show how photothermal AFM-IR can identify the local chemistry of defects. With this detailed knowledge about chemistry, defect origins can be identified and eliminated.AFM-IR is a unique, automation-capable technique that reaches beyond the capabilities of bulk spectroscopy or nanoscale elemental analysis methods. It has redefined the boundaries of nanoscale characterization for the semiconductor manufacturing industry.Join us for this webinar to learn:<ul><li>What AFM-IR is and how it works</li><li>Which parts of the semiconductor manufacturing process could be improved using nanoscale chemical analysis</li><li>What level of automation can be achieved with Bruker’s AFM-IR systems</li></ul><h5>Webinar Abstract</h5><div>Semiconductor devices are an essential part of our modern world. Current challenges exist in reducing contamination on wafers and masks, refining existing deposition, etch and growth techniques and improving EUV lithography and photoresist processes. The ability to accurately characterize and measure these materials is critical to improving wafer yields and pushing towards smaller transistors and developing new packaging solutions. Elemental analytical techniques such as EDS/EELS have stepped up to meet the need for higher sensitivity and resolution, but lack chemical specificity in identifying organic materials. AFM-IR is up to the task to identify the origin and narrow down to one of the many processing/inspection steps during which defects may be introduced.AFM-IR (atomic force microscopy infrared spectroscopy) combines AFM’s high spatial resolution with IR spectroscopy’s chemical specificity, and has been used by many semiconductor companies to improve product outcomes. Bruker’s Dimension IconIR and Dimension IconIR300 systems work as multifunctional instruments for studying the nanoscale chemistry, along with electrical and mechanical properties of semiconductor devices on wafers up to 300 mm. Automation capabilities and the capability to import coordinates from KLARF allows for considerably higher throughput and the best cost of ownership for nanoscale IR imaging and spectroscopy.This webinar highlights AFM-IR's applications in defect identification, process control, and photoresist characterization, and its role in advancing 2D material research for the semiconductor industry. Join us to discover how AFM-IR is redefining the boundaries of nanoscale characterization, and the unique role it can play in semiconductor manufacturing, and how AFM-IR is being used to explore the future of semiconductor devices.</div><blockquote>Presenter: Dr. Qichi Hu (Senior Applications Scientist)Qichi is currently a Senior Staff Applications Scientist at Bruker Nano. He received a bachelor’s degree from Peking University and Ph.D. from University of British Columbia. He then did postdocs in U.S. university and national labs. Qichi has been working on nanoIR development and applications for over a decade, at Anasys and now at Bruker.Presenter: Chunzeng Li, Ph.D. (Applications Engineer, Bruker)Dr. Chunzeng Li is an Applications Engineer with Bruker, Nano Surfaces and Metrology Division, with over 30 years AFM experience. He received his PhD in Physical Chemistry from Xiamen University, China, and is the author of 31 international publications and 2 patents.Presenter: Jin Hee Kim, Ph.D. (Applications Scientist, Bruker)Dr. Jinhee Kim is a NanoIR Applications Scientist at Bruker Nano. She received her Ph.D. in materials chemistry from the University of Michigan and completed her postdoctoral appointment at Monash University in Australia. She specialized in nanoIRs since her time in academia and is continuing to apply NanoIR to various fields.</blockquote>

Bruker: Nanoscale Chemical Characterization of Semiconductor Materials and Devices using Photothermal AFM-IR

Nanoscale Chemical Characterization of Semiconductor Materials and Devices using Photothermal AFM-IR

In this webinar, Bruker nanoscale IR spectroscopy experts show how photothermal AFM-IR can identify the local chemistry of defects.

Semiconductor Materials and Devices by Photothermal AFM-IR

Atomic force microscopy (AFM) and its related technologies have become essential for characterizing semiconductor materials and devices, from R&amp;D to failure analysis and high-volume manufacturing.AFM's standard capability to image surface topography with nanometer-scale spatial resolution is commonly used for characterization of surface roughness, defect inspection, critical dimensions, and depth metrology with sub-nanometer precision. AFM also has the complementary ability to measure electrical, magnetic, thermal, and mechanical properties at the nanoscale. Specially equipped Bruker systems can additionally perform chemical identification at the nanoscale using patented photothermal AFM-based IR spectroscopy (AFM-IR) technology.This webinar focuses on the electrical, thermal, mechanical, and chemical AFM modes important for failure analysis:<ul><li>Electrical modes include methods for carrying out 2D carrier profiling; mapping conductivity variations, work function, and charge related characteristics; and assessing ferroelectric, piezoelectric, or dielectric properties.</li><li>The thermal mode of scanning thermal microscopy is used to measure local variations in temperature or thermal conductivity, even on active devices.</li><li>Mechanical modes are used to evaluate nanomechanical properties, such as adhesion, elastic modulus, and viscoelastic modulus.</li><li>Chemical modes can identify chemical composition of yield-killing defects and process-enabling materials, which are critical for both wafers and photomasks, especially in the EUV era.</li></ul>The presenters will introduce several modes in each of these categories and highlight physical properties characterized, spatial resolution, detection sensitivity, dynamic range, and quantification potential. They will also illustrate the capabilities and limitations of each operating mode with examples from Si-based devices and other materials, such as compound semiconductors, organic devices, and 2D materials.Presenters will also discuss practical aspects of AFM for failure analysis, such as sample preparation, probe selection and lifetime, and environmental influences.&nbsp;Join us for this webinar to hear about AFM operating modes for failure analysis, with relevant information provided for each mode, including:<ul><li>Capabilities and limitations.</li><li>Examples from Si-based devices and other materials.</li><li>Practical advice for implementation.</li></ul>By the end of the webinar, you will understand the AFM modes most valuable for failure analysis and be equipped to make informed decisions for your applications.<blockquote>Presenter: Peter De Wolf, Ph.D. (Senior Director, Research Science, Bruker)Peter De Wolf is director for AFM technology &amp; application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC, Belgium on the development of new SPM methods for 2D carrier profiling in semiconductors and has more than 25 years of experience on SPM. He is the author and co-author of over 30 publications related to electrical characterization using SPM. He also owns several SPM patents, and developed several new SPM modes for electrical characterization.</blockquote>

Bruker: Atomic Force Microscopy Methods for Semiconductor Failure Analysis

Atomic Force Microscopy Methods for Semiconductor Failure Analysis

Hear about AFM operating modes for failure analysis, with relevant information provided for each mode

AFM Methods for Semiconductor Failure Analysis

<div>AFM is widely used to determine the electrical, mechanical and chemical properties of samples at the nanometer scale. In this webinar, we will present an array of electrical AFM techniques that expand the capabilities of traditional AFM modes by enabling the collection of a spectrum in every XY pixel and the creation of rich multidimensional datasets, referred to as DataCubes.DataCube modes, such as DataCube-TUNA, DataCube-PFM and DataCube-sMIM, as well as Hyperspectral AFM-IR and Force Volume AFM-IR allow the simultaneous capture of nanometer-scale electrical, chemical, and mechanical characteristics, and their correlation with spectra that reveal additional information, such as conduction type, charge, and performance transitions, information that was previously impossible to attain in a single measurement.This hyperspectral approach significantly increases the ease and efficiency of material characterization and enables a comprehensive multidimensional, nanoscale analysis.In this webinar, we will give an overview of Bruker’s DataCube modes and perform a live demonstration illustrating their capabilities.<blockquote>Presenter: Hartmut Stadler (Applications Engineer)Presenter: Khaled Kaja (Sale Applications Engineer)Presenter: Mickael Febvre (Bruker EMEA Applications Director)</blockquote></div>

Bruker: Hyperspectral Characterization of Advanced Materials using AFM

Hyperspectral Characterization of Advanced Materials using AFM

We warmly invite you to join us for this webinar on the Hyperspectral Characterization of Advanced Materials using Atomic Force Microscopy (AFM).

Hyperspectral Characterization of Materials using AFM

<div><h4>Learn how to best use atomic force microscopy</h4>During this webinar, Bruker experts will give a general overview of best practices for sample preparation with atomic force microscopy (AFM), along with useful tips and tricks for achieving optimal results. They will also highlight a range of modes, accessories, and add-ons that significantly enhance the functionality of AFM beyond conventional imaging, without major upgrades.Extend your research capabilities with unique features:<ul><li>Environmental control options for temperature, humidity, pH, and CO2</li><li>CellWizard Stage for automated, multi-chamber measurements</li><li>New modes, e.g., SmartMapping for increased ease, speed, and accuracy</li><li>AI and machine learning capabilities for autonomous measurements</li></ul>Atomic force microscopy (AFM) is a powerful tool, and a suite of advanced accessories makes it a highly versatile platform. Tailored configurations can address a diverse range of scientific applications and complex biological questions, from dynamic molecular mechanisms to protein folding events and cellular interactions.</div>

Bruker: Unlocking BioAFM Performance: From Sample Preparation to Advanced Accessories

Unlocking BioAFM Performance: From Sample Preparation to Advanced Accessories

Webinar on atomic force microscopy best practices, sample preparation, advanced modes, and AI-enabled AFM features for biological and materials research.

Unlocking BioAFM Performance

Comprehensive nanoscale characterization of 2D materials using AFM Characterizing 2D materials involves examining a wide range of nanoscale structures, properties, and chemistry. Atomic force microscopy (AFM) is extremely versatile, making it ideal for addressing these complexities. With AFM, researchers can investigate various aspects of 2D materials (often simultaneously), gaining detailed insights that are essential for advanced applications.<h4>Webinar Summary</h4>AFM plays a pivotal role in the nanoscale characterization of 2D materials by providing high-resolution topographical, mechanical, and electrical property mapping at the nanoscale, down to the atomic level. Identifying and characterizing single layers and multilayers is routine, while crystal orientation can often be determined with the proper choice of mode and probe. Since the AFM probe can act as a nanoscale electrode, it is possible to directly measure electrical properties of these materials at the relevant length scales between 1 and 100 nm. Photothermal AFM-IR (AFM-IR) adds localized chemical identification with nanometer scale spatial mapping by integrating infrared spectroscopy with AFM. Together, these capabilities correlate structure and chemistry, enabling comprehensive studies of complex 2D material systems. The AFM probe can also be used for nanomanipulation and nanolithography, allowing device fabrication by cutting, folding, or oxidation.<h5>In this webinar, we discuss:</h5><ul><li>Commonly used AFM modes for identification and characterization of 2D materials</li><li>Recent advancements in consistency of high-resolution 2D material mapping</li><li>Characterization of nanoelectrical properties in 2D materials through conductivity, impedance, and surface potential measurements</li><li>Nanoscale chemical identification through AFM-IR spectroscopy and mapping</li><li>Nanolithography on 2D materials, for example by tip-induced local anodic oxidation</li></ul><blockquote>Speaker:&nbsp;Bede Pittenger, Ph.D., Sr. Staff Development Scientist, AFM Applications, Bruker Nano SurfacesDr. Bede Pittenger is a Senior Staff Development Scientist in the AFM Unit of Bruker's Nano Surfaces Business. &nbsp;He received his PhD in Physics from the University of Washington (Seattle, WA) in 2000, but has worked with scanning probe microscopes for 25 years, building systems, developing techniques, and studying properties of materials at the nanoscale. &nbsp;His work includes more than thirty publications and three patents on various techniques and applications of scanning probe microscopy. &nbsp;Dr. Pittenger's interests span topics from interfacial melting of ice, to mechanobiology of cells and tissues, to the nanomechanics of polymers and composites.Speaker:&nbsp;Ming Ye, Ph.D., Applications Scientist, BrukerMing Ye earned his Ph.D. in chemistry from the Chinese Academy of Sciences and has more than 15 years of BioAFM experience.Speaker:&nbsp;Peter De Wolf, Ph.D., Director of Technology &amp; Application DevelopmentPeter De Wolf is director for AFM technology &amp; application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC, Belgium on the development of new SPM methods for 2D carrier profiling in semiconductors and has more than 25 years of experience on SPM. He is the author and co-author of over 30 publications related to electrical characterization using SPM. He also owns several SPM patents, and developed several new SPM modes for electrical characterization.</blockquote>

Bruker: Advances in AFM for the Characterization of 2D Materials

Advances in AFM for the Characterization of 2D Materials

AFM webinar on nanoscale characterization of 2D materials, including AFM-IR, electrical mapping, and nanolithography.

<h4>Highly productive nanoscale spectroscopy that is easy to use and easy to interpret</h4>With photothermal atomic force microscope infrared spectroscopy (AFM-IR), chemical identification at the nanoscale is achieved by measuring local IR spectra directly at the AFM tip. This method stands out among nanoscale spectroscopic approaches for its user-friendly operation, straightforward data interpretation, fast measurement times, and reliable repeatability. Bruker's AFM-IR technology delivers monolayer sensitivity, offers spatial resolution below 10 nm, accommodates various probing depths, and supports correlative analysis of chemical and mechanical properties.In this webinar, Bruker experts will provide a thorough introduction to photothermal AFM-IR, tailored for IR spectroscopists. They will share explanations of underlying physics, examples of FTIR spectral correlation, and practical experimental considerations.<h4>Join us to learn:</h4><ul><li>How the technique works, both theoretically and practically</li><li>Why AFM-IR is spectrally correlated with FTIR</li><li>When AFM-IR is an ideal technique choice</li><li>What experimental factors impact AFM-IR spectra</li></ul><h4>Webinar Summary</h4>Photothermal atomic force microscope infrared spectroscopy (AFM-IR) enables chemical identification at the nanoscale by collecting local infrared spectra at the AFM tip. Compared to other nanoscale spectroscopic techniques, AFM-IR provides major advantages in ease of use, ease of interpretation, measurement speed, and data repeatability. The AFM-IR technique developed at Bruker has achieved monolayer sensitivity, sub-10 nm spatial resolution, a range of probing depths, and correlative measurements of chemical and mechanical properties.The AFM-IR signal is proportional to sample absorption coefficients of the IR irradiation, leading to correlation between the collected AFM-IR spectra and the transmission mode bulk Fourier transform infrared (FTIR) spectra. This correlation is critical and forms the basis of the chemical identification capability of the AFM-IR technique. Several application examples in different research fields will be highlighted to demonstrate such correlation. Valuable nanoscale chemical information is extracted from the AFM-IR spectra’s peak ratios, band positions and shapes. After that, experimental factors that may impact the AFM-IR spectra will be discussed. These factors need to be properly considered to have correct interpretations of the AFM-IR spectra.<h4>Featured Products and Technology</h4><ul><li>NanoIR Spectrometers: Bruker's nanoIR spectrometers are the world leader in photothermal IR spectroscopy from the nanoscale to the sub-micron and macro scales.</li><li>Dimension IconIR: Flagship photothermal AFM-IR system, offering correlative imaging modes and 150 mm of sample access for ultimate versatility in materials research and industrial R&amp;D</li></ul><blockquote>Speaker: Cassandra Phillips, Ph.D. (Senior Product Manager, Bruker)Cassandra did her Ph.D. at the University of Toronto exploring the photophysics of boron nitride nanotubes using scattering scanning nearfield optical microscopy (s-SNOM) and computational models. She has been working at Bruker Nano Surfaces and Metrology since September 2019 as an Applications Scientist focusing on nanoscale IR spectro-microscopy and other correlated imaging techniques realized with atomic force microscopy.</blockquote><blockquote>Speaker:&nbsp;Dr. Qichi Hu (Senior Applications Scientist)Qichi is currently a Senior Staff Applications Scientist at Bruker Nano. He received a bachelor’s degree from Peking University and Ph.D. from University of British Columbia. He then did postdocs in U.S. university and national labs. Qichi has been working on nanoIR development and applications for over a decade, at Anasys and now at Bruker.</blockquote><blockquote>Speaker:&nbsp;Hartmut Stadler, Ph.D. (Applications Engineer, Bruker Nano GmbH)Hartmut Stadler works as an application scientist for Bruker Nano Surfaces and is now mainly focussed on the chemical side of AFM, including electrochemical operation and nanoscale IR techniques. His background is Physical Chemistry, with a PhD thesis in the field of biofilm characterization using macroscopic and nanoscopic methods. Since more than 25 years he operates AFMs and since more than 20 years he supports Bruker’s European AFM customers and distribution channel partners in AFM-application related questions.</blockquote>

Bruker: Introduction to Photothermal AFM-IR for Infrared Spectroscopists

Introduction to Photothermal AFM-IR for Infrared Spectroscopists

How the technique works, both theoretically and practically

Introduction to Photothermal AFM-IR

<h4>Evolving AFM Automation for Industrial Metrology</h4>Automated AFM metrology plays a central role in meeting yield and precision requirements in advanced manufacturing.This webinar will explore how Dimension AFM platforms support increasing levels of automation, from scripted measurements to data-driven control. The presenters will outline practical approaches that align automation capabilities with real metrology needs.<h4>Join us for this webinar to learn about:</h4><ul><li>Programmed multi-site AFM measurements for efficient data collection</li><li>Recipe-based automation using graphical, zero-programming tools</li><li>Python-enabled interfaces for real-time control and data integration</li></ul>As semiconductor manufacturing demands higher yields and nanometer-scale precision, automated AFM metrology has become an industry standard. This webinar explores how the Bruker Dimension AFM platforms drive this transition through a multi-tiered software evolution, moving from basic automation to AI-powered intelligence.<h4>We will cover three key levels of automation for metrology applications in semiconductors and other industries:</h4><ul><li>The fundamental Programmed Move for high-efficiency, multi-site automated measurements.&nbsp;</li><li>Bruker’s widely adopted AutoMET software, which utilizes a graphical, "zero-programming" recipe creator to reduce operational barriers and enhance measurement repeatability.&nbsp;</li><li>A new Python-based real-time control interface. Built on the Microsoft COM standard, this interface enables seamless integration between AFM hardware and modern data science environments, opening new possibilities for AI-driven defect recognition and closed-loop control.</li></ul><blockquote>Speaker:&nbsp;Senli Guo, Ph.D. (NA Applications Manager, Bruker)Senli earned his Ph.D. in physical chemistry from Duke University (2009) and spent two years in the Center for Nanophase Materials Sciences (CNMS) at Oak Ridge National Lab as a postdoc before joining Bruker as an applications scientist in 2011. All of Senli’s research is about AFM-based methodology developments to address various nanoscience research, ranging from single-molecule interactions to lithium-ion battery electrode properties.Speaker:&nbsp;John Thornton (Senior Applications Scientist, Bruker)John Thornton is a Senior Applications Engineer at Bruker Nano Surfaces with 25+ years of experience in the field of Atomic Force Microscopy (AFM). He learned AFM at North Carolina State University in the 1990s, and then joined Digital Instruments, a pioneering company in early AFM development, and continued with the company through acquisitions by Veeco Instruments, and then Bruker. John has co-authored many scientific publications and developed scanning probe microscopy training courses. Currently, John spends a significant amount of time running AFMs and educating others on techniques. He currently works from his home in Virginia, and from the Bruker AFM applications lab in Billerica, MA.Speaker:&nbsp;Ming Ye, Ph.D. (Applications Scientist, Bruker)Dr. Ming brings over 20 years of extensive experience in the field of Atomic Force Microscopy (AFM) and microanalysis, currently serving as an Application Scientist within the Bruker North America team. After earning a Ph.D. from the Chinese Academy of Sciences in 2010, Dr. Ming conducted advanced postdoctoral research at the Max Planck Institute. The journey into the commercial AFM sector began in 2013 in Berlin, where Dr. Ming joined JPK Instruments AG—the predecessor to Bruker BioAFM. Prior to the current role at Bruker NA, Dr. Ming served as the Principal Scientist for Microanalysis at BASF Asia Pacific, bridging the gap between fundamental research and large-scale industrial solutions.</blockquote>

ICPMS webinars focusing on Microscopy - page 1