ICPMS webinars focusing on Microscopy - page 1

Join this webinar by Bruker to explore AFM-based nanoscale characterization of 2D materials, including electrical mapping, AFM-IR, and nanolithography.

With photothermal atomic force microscope infrared spectroscopy (AFM-IR), chemical identification at the nanoscale is achieved by measuring local IR spectra directly at the AFM tip.

Characterization of Powders, Particles, 2D materials by AFM-in-SEM.

Learn best practices for atomic force microscopy (AFM) in this webinar covering sample preparation, advanced imaging modes, environmental control, and AI-enabled features that expand AFM capabilities.

In this webinar, presenters will demonstrate the use of NanoScope API for safe and flexible control of Bruker Dimension series AFMs.

Join us for this webinar to hear about AFM operating modes for failure analysis, with relevant information provided for each mode.

Learn how automated AFM can be applied to the most current hybrid bonding technology nodes and wafer processing steps.

This webinar will explore how Dimension AFM platforms support increasing levels of automation, from scripted measurements to data-driven control.

We warmly invite you to join us for this webinar on the Hyperspectral Characterization of Advanced Materials using Atomic Force Microscopy (AFM).

In this webinar, Bruker nanoscale IR spectroscopy experts show how photothermal AFM-IR can identify the local chemistry of defects.