Electron spectroscopy for chemical analysis of liquids

In the week from June 29, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry<blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars">👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</a></h4>👉 Search and filter in the largest global database with over 5 500 GC, LC, MS and spectroscopy webinars.</blockquote><h5>1. Metrohm: Simplifying Through-Container Testing with Raman Spectroscopy in the Pharmaceutical Industry</h5><ul><li>Mo, 29.6.2026 15:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6308">Registration</a></li></ul>In this webinar, we will demonstrate a more robust and practical alternative to SORS for see-through Raman analysis.<h5>2. SelectScience: End-to-end PAT: Connecting advanced analytics and data across the bioprocess lifecycle</h5><ul><li>Mo, 29.6.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6307">Registration</a></li></ul>Learn how integrated PAT strategies combining NMR, Raman, IR, and digital workflows enable continuous process understanding, smoother tech transfer, and QbD from development to GMP manufacturing.<h5>3. Bruker: Bruker Fluorescence Microscopy Solutions: Automated Imaging and Light-Sheet Microscopy</h5><ul><li>Tu, 30.6.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6309">Registration</a></li></ul>Discover Bruker’s integrated imaging ecosystem combining light-sheet microscopy, high-content screening, and high-performance data management for scalable, high-quality biological imaging workflows.<h5>4. Agilent Technologies: Measuring Diverse Samples with UV/VIS Spectrometers and Integrating Spheres</h5><ul><li>Tu, 30.6.2026 20:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6052">Registration</a></li></ul>This webinar will discuss diffuse transmission and reflection UV/VIS measurements, including how to perform measurements with Agilent’s Cary 60 UV/VIS Spectrometer.<h5>5. Milestone: Unlock Smarter Digestion: AI and the Smart Features that Transform Your Daily Routine</h5><ul><li>We, 1.7.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6312">Registration</a></li></ul>Learn how Milestone’s intelligent digestion technologies, including MAIA AI Agent, easyTEMP, and SRC, help reduce downtime, simplify workflows, and improve laboratory productivity.<h5>6. Bruker: High-Energy XRD - Diffraction Without Limits</h5><ul><li>Th, 2.7.2026 10:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6314">Registration</a></li></ul>Join us to explore how high-energy XRD with the D8 ADVANCE HE and D8 DISCOVER HE enables the study of materials under realistic conditions.<h5>7. Agilent Technologies: Spectral Flow Cytometry Masterclass - Session 1</h5><ul><li>Fr, 3.7.2026 07:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6316">Registration</a></li></ul>Learn how full-spectrum flow cytometry enables high-dimensional cell analysis. Explore spectral flow technology, experimental design, and applications in immunology, oncology, and vaccine research.

Webinars LabRulezICPMS Week 27/2026

The international standard ISO/IEC 17025 [1] clause 7.7.2 with regards to ensuring the validity of results, requires a laboratory to participate in proficiency testing (PT) and/or to participate in interlaboratory comparisons (ILCs) other than PT. However, no guidance as to what these other ILCs might be, or indeed how they might compare in relation to PT, is provided. This leaflet aims to outline other ILCs available, pointing out some of the limitations as compared to PT.&nbsp;There are three major types of ILCs in which a group of laboratories analyses identical portions from a homogeneous, stable test sample, with each type being characterized by its intended purpose [2,3]:<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_2_d9263807fb.jpg" alt="Eurachem: Interlaboratory comparisons other than proficiency testing" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_2_d9263807fb.jpg 245w," sizes="100vw" width="1507" height="607">A key point is that PT is an ILC that is designed to specifically evaluate the performance of participants, providing them with an infrastructure to monitor and assess the validity of their results. This is not the key purpose of the two other ILCs, and thus depending on their intended purpose they have a number of limitations that laboratories need to be aware of when using them rather than PT. Only proficiency testing should have been conducted in full compliance to the competency standard ISO/IEC 17043 [4].&nbsp;<h4>Evaluation of measurement procedure performance&nbsp;</h4>These ILCs, are designed to assess how a particular measurement procedure performs and whether it is fit for its intended purpose. These ILCs are often referred to as a ‘method performance study’ or a ‘collaborative study’ [2]. Some limitations of using such ILCs for monitoring laboratory performance as an alternative to PT are:&nbsp;<ul><li>All participants use the same measurement procedure i.e. the measurement procedure that is being validated. Unless the measurement procedure is being routinely used by the participating laboratory such an ILC will not assess the routine performance of the laboratory using their own routine measurement procedure. Nor does it enable them to compare their performance with other laboratories using alternative measurement procedures.&nbsp;</li><li>The measurement procedure is likely to be new, so participants may not have established stable procedures and quality control, so performance may not reflect routine use.&nbsp;</li><li>The report from such an ILC would not provide information on the performance of the participant, if the statistical model used makes the assumption that all laboratories perform with equal variability.</li><li>The design of the study may require the participants to assess multiple samples and/or to undertake multiple replicate analysis on the test materials. This may not be representative of the routine measurements or tests undertaken by the laboratory.&nbsp;</li><li>The conclusion of the ILC might be that the measurement procedure being assessed is not valid.&nbsp;</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_3_a53ecd2f5d.jpg" alt="Eurachem: Interlaboratory comparisons other than proficiency testing" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_3_a53ecd2f5d.jpg 157w," sizes="100vw" width="570" height="566"><h4>Characterisation of candidate reference materials&nbsp;</h4>These are ILCs that assign a property value to a candidate reference material, usually with a stated measurement uncertainty. These are often referred to as a ‘material certification study’ [2]. Limitations of using such ILCs as an alternative to PT are:&nbsp;<ul><li>The analysis of the candidate reference material is likely to require additional care in exercising the routine measurement procedure, such as substantially more replication, and/or may require quite different reporting formats (e.g. all valid replicates instead of a mean result). Thus, such an ILC will not necessarily provide an evaluation of the performance of the laboratory based on the routine use of their measurement procedures.&nbsp;</li><li>The report from such an ILC may include the results from the participating laboratories but would not provide information on the performance of each laboratory.&nbsp;</li><li>Participating laboratories may be required to assess multiple samples and/or to undertake multiple replicate analysis on the candidate reference materials. Thus this may not be representative of the routine measurements or tests undertaken by the laboratory.&nbsp;</li></ul><h4>Other ILCs&nbsp;</h4>Some other ILCs, whilst not being conducted in full compliance of the requirements of ISO/IEC 17043, may be designed to evaluate participant performance. These would include small ILCs as defined by EA‑2/21 [5] or split sample ILCs i.e. where a portion of a single sample is sent to two or three laboratories. Whilst these ILCs are specifically designed to evaluate participant performance, they may not provide a comprehensive comparison that a PT might provide. In such cases the laboratory needs to evaluate carefully the competence of the organization managing the ILC and the suitability of the service externally provided (ISO/IEC 17025 clause 6.6).

Interlaboratory comparisons other than proficiency testing

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Eurachem is a European network promoting international traceability of chemical measurements and good analytical practice. It provides expert guidance, supports method validation, uncertainty evaluation, proficiency testing, and facilitates discussion on technical and policy issues in analytical quality.

Eurachem

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Thermo Scientific MSA-330 Multi-Stream Slurry XRF Analyzer

Thermo Scientific MSA-330 (XRF) analyzer delivers elemental analysis (Ca–U) for up to 12 slurry streams, eliminating cross-contamination, with low operational cost and easy maintenance.

The Thermo Scientific™ MSA-330 Multi-Stream Slurry XRF Analyzer provides reliable, flexible, cost-effective elemental analysis for up to 12 slurry streams, delivering information for the monitoring and control (manual or automatic) of mineral beneficiation circuits. Keeping each stream in a separate analysis zone, it eliminates cross-contamination without any need for a multiplexer or demultiplexer, minimizing head loss and plant elevation requirements. Use the MSA-330 to monitor feed, concentrate and tailings grades, to drive up process efficiency, improve metal recovery, optimize reagent consumption, and reduce costs.The MSA-330 quantifies % solids and up to 20 elements for between 3 and 12 slurry streams according to a predefined schedule to deliver real-time process trend information for monitoring and control.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_MSA_330_Multi_Stream_Slurry_XRF_Analyzer_56ef33bd34.jpg" alt="Thermo Scientific™ MSA-330 Multi-Stream Slurry XRF Analyzer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_MSA_330_Multi_Stream_Slurry_XRF_Analyzer_56ef33bd34.jpg 156w," sizes="100vw" width="650" height="650"><h3>Key features include:</h3><ul><li>Capability to measure and provide composite samples for 3 to 12 slurry streams, for flexible, cost-efficient process monitoring.</li><li>Dedicated, separate path for each process stream, from sample point to sample discharge, for the elimination of cross-contamination and simplified sample return.</li><li>Low head design simplifies sample transport design and is advantageous for gravity feed or return of samples to the process.</li><li>Advanced energy dispersive X-ray detector, for accurate measurement from calcium to uranium with integrated Peltier cooler for reliable, trouble-free operation over a wide range of in-plant environmental conditions.</li><li>Cross-cut sampler for each stream provides sampling for analyser calibration and composite samples.</li><li>Optional vacuum filter station available for each of the composite samplers.</li><li>When fed from a SamStat30C, the dedicated cross-cut samplers in the MSA-330 can be used to acquire composite samples for material balancing and accounting purposes.</li><li>No multiplexer or demultiplexer delivers a flow head space solution, lowering implementation and operational costs for a centralized analyser system.</li><li>High flow capability, for handling the full flow of low flowrate process streams, eliminating additional costs associated with a sampler and sample delivery system. 300mm wide tank as standard with larger sizes available for higher flow rates.</li></ul>

Thermo Scientific ARL SMS-3300 Automation for Single or Twin OES or XRF

Thermo Scientific™ ARL SMS-3300 enables fully automated operation of one or two OES or XRF spectrometers, enhancing lab efficiency in industrial environments.

Drive process control laboratory efficiencies in the metals, mining and cement industries with the Thermo Scientific™ ARL™ SMS-3300 Automation for Single or Twin OES or XRF, a complete laboratory workflow automation solution. The automation of single or multiple spectrometers and preparation machines with the ARL SMS-3300 system offers:👉 Reduced sample analysis cost, 👉 Increased sample throughput, 👉 Better reproducibility, and 👉 Higher quality resultsfor users requiring more comprehensive and integrated automation solutions in the metals, mining and cement industries.<h3>🔧 ARL SMS-3300 – Automation for Single or Twin OES or XRF</h3>Provides ultimate power and flexibility for automatic, unattended, 24/7 operation of:<ul><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/1213">Thermo Scientific™ ARL™ iSpark </a>/<a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/1977"> iSpark Plus </a>(Optical Emission Spectrometers)</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?instrumentationItems=100&amp;manufacturerItems=3&amp;search=9900">Thermo Scientific™ ARL™ 9900</a> (X-ray Fluorescence Spectrometer)</li></ul><h3>✅ Main Features</h3><ul><li>Designed for easy integration into fully automatic laboratories</li><li>Can be mounted in Thermo Scientific ARL QuantoShelter, close to the production process</li><li>Parallel task execution:<ul><li>Sample preparation</li><li>Sample introduction</li><li>Analysis</li><li>Instrument stand cleaning performed in hidden time by the spectrometer, independently of the robot</li></ul></li><li>Direct access to milling machine for reduced processing times of ferrous samples</li><li>Higher throughput with:<ul><li>Automatic sample preparation</li><li>ARL™ PrepControl™ system + ARL™ EasyPrep™ software</li></ul></li><li>Factory configured and customized</li><li>Compact chassis and simple installation</li><li>Integrated electronics</li><li>Improved analysis reliability and quality</li><li>Very rapid payback</li><li>Faster result availability</li><li>Qualified lab personnel freed from routine tasks</li><li>Manufactured and maintained according to ISO 9001-2000 procedures</li></ul><h3>🚀 Advanced Technology</h3><ul><li>State-of-the-art Fanuc industrial robot</li><li>OXSAS analytical software</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_SMS_3300_Automation_for_Single_or_Twin_OES_or_XRF_fadcbb621a.jpg" alt="Thermo Scientific™ ARL SMS-3300 Automation for Single or Twin OES or XRF" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_SMS_3300_Automation_for_Single_or_Twin_OES_or_XRF_fadcbb621a.jpg 245w," sizes="100vw" width="650" height="366">

Thermo Scientific ARL SMS-3500 Automation for Twin OES or XRF

The ARL SMS-3500 automates two OES or XRF spectrometers with smart sample flow management for fast, efficient, and continuous production control.

Drive process control laboratory efficiencies in the metals and mining industries with the Thermo Scientific™ ARL™ SMS-3500 Automation for Twin OES or XRF, a complete laboratory workflow automation solution. Primary metals producers' laboratories typically run two fully duplicate and separate spectrometry lines to assure fast response times when several urgent samples must be processed simultaneously. 👉 The ARL SMS-3500 system is an affordable alternative.The automation of multiple spectrometers and preparation machines with the ARL SMS-3500 system offers:<ul><li>Reduced sample analysis cost</li><li>Increased sample throughput</li><li>Better reproducibility</li><li>Higher quality results</li></ul>for users requiring more comprehensive and integrated automation solutions in the metals and mining industries.The ARL SMS-3500 Automation for Twin OES or XRF simplifies sample handling by providing:<ul><li>a single introduction location for all samples</li><li>a magazine storage function to free the introduction 👉 This reduces response times, increases sample processing cadence, and improves the availability of automatic sample preparation in highly critical production control environments.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_SMS_3500_Automation_for_Twin_OES_or_XRF_2_0553f2880b.jpg" alt="Thermo Scientific™ ARL™ SMS-3500 Automation for Twin OES or XRF - 2.jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_SMS_3500_Automation_for_Twin_OES_or_XRF_2_0553f2880b.jpg 217w," sizes="100vw" width="650" height="469"><h3>✅ Main Features</h3><ul><li>No need for time-consuming electro-mechanical transfer systems – the SMS-3500 robot moves samples between components within seconds</li><li>Simplified operation and reduced system complexity for easier maintenance and servicing</li><li>Single interface screen for all sample tracking and automation functions</li><li>Unified registration and introduction point for all production samples, with automated routing to the appropriate system components</li><li>Support for two sample preparation machines:<ul><li>Reduces response times</li><li>Increases processing cadence</li><li>Improves automatic sample preparation availability</li></ul></li><li>Operator workload is reduced – the system manages samples by priority and availability of resources<ul><li>Includes internal sample storage to free the introduction point immediately</li></ul></li><li>Each instrument can be used offline for manual tasks without interrupting automated operation</li><li>Uses the same analytical software for XRF and OES</li><li>Automation is based on proven ARL SMS software</li></ul><h3>🔧 Recommended for:</h3><ul><li>Iron and steel applications</li><li>High alloy, stainless steel, copper, brass, and bronze applications</li><li>Aluminum or fire assay applications</li></ul>

Thermo Scientific IonicX Portable XRF Analyzer

Thermo Scientific™ IonicX enables fast and accurate salt analysis in raw materials using portable XRF without complex preparation or destructive testing.

<div><div>Identify ionic salts in seconds with minimal sample preparation. The Thermo Scientific™ IonicX™ Portable XRF Analyzer provides:<ul><li>Fast and accurate verification of ionic salt raw materials</li><li>High sample throughput for pharmaceutical and biopharmaceutical manufacturers</li></ul>Cut testing time and costs by replacing:<ul><li>time-consuming</li><li>resource-intensive</li><li>wet chemistry and benchtop methods</li></ul>with a ✅ non-destructive, ✅ non-contact, ✅ portable XRF analyzer for ionic salts.<h3>⚙️ Key Features</h3><ul><li>Portable verification of a wide range of ionic salts in seconds</li><li>Compliant with 21 CFR Part 11:<ul><li>electronic signatures</li><li>user access control</li><li>audit trails</li></ul></li><li>Non-destructive testing of raw materials</li><li>Minimal sample preparation</li><li>Simple operation, no extensive operator training required</li><li>Lightweight and compact design for easy portability</li><li>Wi-Fi enabled</li><li>Hot Swap Battery</li><li>IP54 Certified – splash and dust proof</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Ionic_X_Portable_XRF_Analyzer_2_aa24221e46.jpg" alt="Thermo Scientific™ IonicX Portable XRF Analyzer " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Ionic_X_Portable_XRF_Analyzer_2_aa24221e46.jpg 156w," sizes="100vw" width="650" height="650"><h3>📏&nbsp;Specifications</h3><ul><li>Bluetooth: Supports print functionality and barcode reader</li><li>Camera:<ul><li>Macro Camera: Integrated CCD macro camera for capturing overview images of parts and tagging measurement locations</li><li>Micro Camera: Integrated CCD micro camera for locating and recording measurement positions</li></ul></li><li>Certifications/Compliance:&nbsp;<ul><li>EN 55011:2010</li><li>EN 61326:2013</li><li>FCC 47 CFR Part 15</li><li>Safety EN 61010; 2010 (3rd Ed) with national deviations for US and Canada</li><li>RoHS EN 50581; 2012</li></ul></li><li>Data Entry:&nbsp;<ul><li>Touchscreen keyboard</li><li>User customizable data entry</li><li>Optional wireless remote barcode reader</li></ul></li><li>Data Storage:&nbsp;<ul><li>512 MB internal system memory/16 GB industrial grade storage</li><li>Stores approximately 130,000 readings with spectra (fewer if macro and micro images are saved)</li></ul></li><li>Data Transfer: Wi-Fi, USB</li><li>Dimensions: 12 × 12 × 8 in. (30.48 × 30.48 × 20.32 cm)</li><li>Display Type: Tilting, color, resistive touchscreen display</li><li>IP Rating: IP54 (splash and dust proof)</li><li>Languages: English</li><li>Licensing: Varies by region; Contact your local distributor</li><li>Operating Environment:&nbsp;<ul><li>Temperature: 0°C to 50°C (external fan recommended when ambient temperature is greater than 33°C)</li><li>Humidity: 10% to 90% relative humidity non-condensing</li></ul></li><li>Operating System: Linux</li><li>Optional Accessories:&nbsp;<ul><li>Thermo Scientific portable test stand</li><li>Thermo Scientific mini test stand</li></ul></li><li>Power Consumption: 12V lithium-ion battery, or 12V DC, 3A, 3.6W power supply</li><li>Security Features: Password-protected user security</li><li>Software: IonicX PC software</li><li>Spot Size: Standard: 8 mm collimation</li><li>Standard Accessories:&nbsp;<ul><li>Locking shielded carrying case</li><li>Two (2) lithium-ion battery packs</li><li>One (1) 110/220 VAC battery charger/AC adaptor</li><li>Check samples</li><li>Safety lanyard</li><li>PC connection cable (USB)</li></ul></li><li>System Details: Built-in standardization via automatic system check</li><li>Weight (English): 5.8 lbs. with battery and test stand</li><li>Weight (Metric): 2.6 kg with battery and test stand</li><li>X-Ray Source Type:&nbsp;<ul><li>X-Ray Tube: Ag anode (6–50 kV, 0–500 μA, 5W max)</li><li>Dynamically adjustable current for optimal sensitivity on every analysis</li></ul></li><li>Applications: Raw Material Testing</li><li>Detector Type: Proprietary Large Area Drift Detector</li><li>Tube Voltage: 6 to 50 kV</li><li>Unit Size: Each</li></ul></div></div>

Thermo Scientific AnStat-330 Online Sampling and Elemental Analysis Station

The AnStat-330 provides real-time elemental analysis of slurries, improving metal recovery and eliminating delays and the need for sampling pumps.

The Thermo Scientific™ AnStat-330 Online Sampling and Elemental Analysis Station is a high availability, low head loss solution for:<ul><li>Metallurgical accounting</li><li>High-quality measurement of critical slurry streams in mineral processing plants</li></ul>It features an integrated analyzer and a full-flow, multistage, representative sampler, delivering:<ul><li>Accurate real-time assays</li><li>Enhanced control of flotation circuits, including:<ul><li>Flotation plant feed</li><li>Roughing and cleaning circuits</li><li>Final concentrates and tailings</li></ul></li></ul><h3>🔧 Key Advantages</h3><ul><li>Eliminates:<ul><li>Costly and unreliable sample transport systems</li><li>Measurement lag from cycle time delays and cross-contamination common with centralized analyzers</li></ul></li><li>Delivers:<ul><li>Reliable and rapid response to process upsets and feed fluctuations</li><li>Low head loss design, removing the need for sample pumps</li><li>Simplified flotation plant layout and installation</li></ul></li></ul><h3>⚙️ Operational Benefits</h3>Use the AnStat-330 to:<ul><li>Improve processing efficiency</li><li>Reduce life-of-mine OPEX for sampling and analysis</li><li>Lower energy consumption</li><li>Optimize reagent use</li><li>Improve metal recovery</li><li>Maximize Net Smelter Return (NSR)</li></ul><h3>📌 Key Features</h3><ul><li>Real-time elemental analysis and composite sampling for effective process control and metallurgical accounting</li><li>Very low head loss for simplified plant design – no sample pumps required</li><li>Advanced EDXRF detector (Ca to U), with Peltier cooling for stable, reliable operation in harsh environments</li><li>Versatile, compact system – easy to integrate into existing plants</li><li>24/7 high availability for both analysis and sampling</li><li>Multistage proportional sampling, including final-stage hardened cross-cut sampler for representative samples</li><li>Low maintenance – only moving parts in final-stage cross-cut sampler</li><li>Final-stage sampler identical for both AnStat-330 and SamStat-30 across full flow range</li></ul><h3>🧩 Optional Features</h3><ul><li>Pebble screen: Removes oversized particles from cyclone overflow; acts as backup to upstream primary screen</li><li>Outlet distributor: Splits slurry flow into 2+ streams with defined volume ratios</li><li>Upwelling/reverse flow sampling zone: Ideal for particle size analysis (with PSM-500)</li><li>Vacuum filter: For use with composite sampling</li></ul>

Thermo Scientific ARL EQUINOX 100 X-ray Diffractometer

The ARL EQUINOX 100 is a compact benchtop XRD for QC, research, and routine use. It captures full diffraction patterns in real time with a CPS detector — no moving parts or scanning needed.

<h4>Compact, powerful, and flexible benchtop XRD system for routine and advanced applications</h4>The ARL EQUINOX 100 is a compact benchtop X-ray diffractometer (XRD) designed for quality control, academic research, and routine analysis. It features a unique curved position-sensitive (CPS) detector that enables real-time acquisition of the entire diffraction pattern — with no moving parts and no scanning required.<h3>Key Features</h3><ul><li>Real-time acquisition: entire diffraction pattern captured in seconds</li><li>Wide angular range: up to 110° 2θ without moving components</li><li>No external water cooling: no chiller required</li><li>Standard power outlet: plug-and-play with no special electrical setup</li><li>Low-power microfocus X-ray source: high intensity and efficient optics</li><li>Versatile measurement: reflection and transmission modes</li><li>Easy installation: suitable for labs, mobile labs, and field vans</li></ul><h3>Sample Handling &amp; Accessories</h3><ul><li>Fixed non-spinning sample stage</li><li>Spinning stages for powders, bulks, filters, and pressed pellets</li><li>Capillary sample stage for transmission mode</li><li>Controlled atmosphere sample stage</li><li>6-position automatic sample changer</li><li>Dedicated stage for thin film analysis (GIXRD, XRR)</li><li>Temperature-controlled stages (–10 °C to 500 °C)</li></ul><h3>Typical Applications</h3><ul><li>Phase identification and quantification</li><li>Degree of crystallinity, crystallite size, and lattice parameters</li><li>Crystal structure solutions and Rietveld refinement</li><li>Thin film characterization (GIXRD, XRR)</li><li>In-situ and dynamic studies (e.g., phase transitions)</li><li>Fields: materials science, geology, nanomaterials, chemistry, pharmaceuticals, metallurgy, teaching</li></ul><h3>Software &amp; Compliance</h3><ul><li>SolstiX™ XRD Software with 21 CFR Part 11 compliance</li><li>Electronic signatures, audit trails, secured data handling — ideal for pharmaceutical QA/QC environments</li></ul><h3>Why Choose ARL EQUINOX 100?</h3><ul><li>Simultaneous, real-time data acquisition</li><li>Compact, rugged, and mobile-ready design</li><li>High performance at low operating cost</li><li>Flexible platform for a broad range of samples and applications</li></ul>

Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat

Streamline slurry analysis with the Thermo Scientific™ MEP-300 probe—no liquid nitrogen needed. Replaces MEP/MEP-200 and features SDD technology for reliable, high-performance XRF results.

<h4>Enhance XRF Slurry Analysis with the Thermo Scientific™ MEP-300 Multi-Element Probe – No Liquid Nitrogen Required</h4>Streamline elemental analysis of slurries with the Thermo Scientific™ MEP-300 Multi-Element Probe, designed to eliminate the need for liquid nitrogen while improving performance and reliability. Developed as a direct replacement for earlier MEP and MEP-200 immersion probes used in <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2027">AnStat </a>and <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2004">MSA</a> X-ray analyzer systems, the MEP-300 leverages advanced Silicon Drift Detector (SDD) technology for superior results in demanding industrial environments.<h3>Why Choose the MEP-300 Probe?</h3><h4>Advanced SDD Technology</h4><ul><li>Operates without cryogenic cooling</li><li>Delivers lower detection limits and improved analytical accuracy</li><li>Achieves higher count rates, reduced background, and wider field of view</li><li>Demonstrated stability under shock and vibration, ideal for on-line industrial use</li><li>No special storage or handling required</li></ul><h4>Occupational Health &amp; Safety</h4><ul><li>No liquid nitrogen, eliminating associated hazards</li><li>Enhanced radiation safety with:<ul><li>Automatic source retraction on window rupture or probe lift</li><li>Fail-safe, spring-loaded design to withdraw the source on power loss</li><li>High-visibility beacon for status and alarm indication</li></ul></li></ul><h4>Optimized Maintenance &amp; Operations</h4><ul><li>Zero ongoing cost for liquid nitrogen</li><li>Lower cost of spare parts</li><li>Field-repairable detector — no need to return to the factory</li><li>Easy-to-replace modules and cable assemblies</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg" alt="Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg 192w," sizes="100vw" width="1374" height="1116"><h3>Specifications</h3><ul><li>Air Requirements:&nbsp;<ul><li>Instrument Air: ANSI ISA-S7 0 0-1996 (clean and dry to 0.1 microns with dew point &lt;2°C)</li><li>Air Pressure: 550 kPa nominal – 1000 kPa maximum</li></ul></li><li>Certifications/Compliance: CE, ICES 001, CSA, FCC Part 15B and RCM AS/NZS CISPR11</li><li>Electrical Requirements:&nbsp;<ul><li>Three Phase 48 to 62 Hz. Max 2.5kVA Neutral not required.</li><li>Identical power requirements to previous generation products.</li><li>Any of the standard three phase voltages used in the world mining industry in the range 380–600 Volts AC may be factory or field selected.</li><li>Variation should not exceed ±10% of the nominal voltage selected.</li></ul></li><li>Operating Temperature:&nbsp;<ul><li>Ambient -10°C to +55°C (measured at enclosure surface temperature, temperature to not exceed 55°C)</li><li>Process Fluid: 0°C to 45°C, Check with factory for higher temperature options</li></ul></li><li>Type: MEP-300 Upgrade Package for MSA and AnStat</li><li>Unit Size: Each</li></ul>

Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ARL X’TRA Companion X-ray Diffractometer

Thermo Scientific™ ARL™ X’TRA Companion is a benchtop θ/θ Bragg–Brentano X-ray diffractometer for routine QC. 600 W (Cu/Co), pixel detector (55 × 55 µm), one-click Rietveld, ±0.02° accuracy.

The Thermo Scientific™ ARL™ X’TRA Companion is a θ/θ Bragg–Brentano benchtop X-ray diffractometer designed for routine process and quality control applications. The system combines high analytical performance with robust mechanical construction and intuitive software operation.The instrument is based on a vertical θ/θ Bragg–Brentano geometry (160 mm radius) and is suitable for qualitative and quantitative XRD analysis of polycrystalline materials. It operates at 600 W using copper or cobalt radiation, with an optional integrated water chiller available.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_10_4ec7dc4708.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Schema of the geometry of the θ/θ goniometer." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_10_4ec7dc4708.jpg 245w," sizes="100vw" width="1338" height="626">Fast and resolute data acquisition is enabled by a state-of-the-art solid-state pixel detector (55 × 55 µm pitch). One-click Rietveld refinement based on a fundamental parameter approach ensures robust and reproducible phase quantification. Automated result transmission to LIMS is supported.The system is fully shielded in accordance with international X-ray safety regulations and designed for stable operation even in environments exposed to vibration.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_3_b426717a92.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_3_b426717a92.jpg 221w," sizes="100vw" width="1153" height="814"><h3>Key Features</h3><ul><li>θ/θ Bragg–Brentano geometry (160 mm radius)</li><li>600 W operation (Cu or Co radiation)</li><li>Solid-state pixel detector (55 × 55 µm pitch)</li><li>One-click Rietveld quantification (fundamental parameter approach)</li><li>Automated result transmission to LIMS</li><li>Mechanical slits, Soller slits and variable beam knife for precise beam collimation</li><li>Ultra-compact θ/θ goniometer with stepper motors and optical encoders</li><li>Modular design with exchangeable pre-aligned sample stages</li><li>Optional 6-position sample changer (φ 51.5 mm; optional φ 40 mm)</li><li>Angular accuracy better than ±0.02° over full 2θ range</li><li>Angular resolution &lt; 0.04° FWHM (standard configuration)</li><li>Shielded cabinet with lead glass windows, flushing lamps and safety interlocks</li><li>Robust construction resistant to shock and vibration</li><li>Data combination capability with XRF results</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_11_fa2374532a.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: An angular accuracy better than ± 0.02° over the whole 2θ range guarantees optimal instrument alignment to support accurate and reliable analysis. Test with a Si powder." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_11_fa2374532a.jpg 238w," sizes="100vw" width="872" height="573"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_12_ec8343a5a4.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: An angular resolution &lt; 0.04° FWHM can be measured easily in standard configuration. Test with a LaB₆ powder." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_12_ec8343a5a4.jpg 215w," sizes="100vw" width="870" height="630"><h4>Analysis of Cement Clinker according to ASTM C1365</h4>A clinker sample was measured (21 x 10 min) and a Rietveld fit was carried out consecutively using a fundamental parameter approach. Comparing standard deviations calculated from the repetitive refinements with limits given by ASTM C1365 clearly shows that results are in good agreement with the norm, as determined by considering C3A total and C3S total.The ARL X’TRA Companion XRD yields data in compliance with ASTM C1365 norm for analyzing clinker samples. The one-click Rietveld refinement based on a fundamental parameter approach is an extremely robust method with high reproducibility which yields accurate results even for C3S M1 and M3. This makes clear the ARL X’TRA Companion is the perfect solution for any process control tasks in the cement industry.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_6_0d10ca1dc4.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Results of the 21 consecutive refinements of clinker (values in weight percent)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_6_0d10ca1dc4.jpg 245w," sizes="100vw" width="1159" height="465"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_7_8da3de0f8e.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Rietveld fit of clinker (10 min acquisition)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_7_8da3de0f8e.jpg 170w," sizes="100vw" width="872" height="801"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_8_9aad68624e.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Rietveld fit of clinker (29-35° 2θ)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_8_9aad68624e.jpg 169w," sizes="100vw" width="868" height="800"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_9_c7ceefee8d.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Measurement of clinker (55-61° 2θ). Fit for C3S M1 (purple) and C3S M3 (green) explains intensity and shape of the reflections well." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_9_c7ceefee8d.jpg 211w," sizes="100vw" width="871" height="643">

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