<div><div>Researchers led by <a target="_blank" rel="noopener noreferrer" href="https://kudova.group.uochb.cz/en">Eva Kudová</a> from IOCB Prague and Jitka Viktorová from UCT Prague have identified new androstane-based steroid derivatives that can significantly improve the effectiveness of existing antibiotics against multidrug-resistant Staphylococcus aureus.</div></div><div>The team screened dozens of natural steroidal hormones and synthetic derivatives to see whether they could block bacterial efflux pumps – mechanisms that bacteria use to eject antibiotics and survive treatment. Two compounds emerged as particularly promising: they inhibited efflux pumps and lowered the effective doses of antibiotics such as ciprofloxacin and erythromycin.Further analysis showed that one of the compounds also suppressed genes linked to bacterial virulence. Another key finding is that the most active molecules are non-toxic to human immune cells and showed no detectable endocrine activity, suggesting a favorable safety profile.These findings support the idea that rationally designed steroid-based molecules could act as antibiotic adjuvants, helping existing drugs overcome bacterial resistance.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/IOCB_Prague_Steroidal_hormones_and_neurosteroids_novel_therapeutic_strategies_in_bacterial_infections_8e5d2a7b48.jpg" alt="IOCB Prague: Steroidal hormones and neurosteroids – novel therapeutic strategies in bacterial infections" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_IOCB_Prague_Steroidal_hormones_and_neurosteroids_novel_therapeutic_strategies_in_bacterial_infections_8e5d2a7b48.jpg 222w," sizes="100vw" width="1258" height="886"><blockquote><h4>Original Article</h4><h4><a target="_blank" rel="noopener noreferrer" href="https://www.sciencedirect.com/science/article/pii/S0223523426001613?via%3Dihub">Steroidal hormones and neurosteroids - novel therapeutic strategies in bacterial infections: Design, synthesis, and biological evaluation</a></h4>Daniela Brdová, Bára Křížkovská, Jan Špaček, Zdeněk Míchal, Eva Jablonská, Ondřej Strnad, Hana Chodounská, Eszter Szánti-Pintér, Marina Morozovová, Václav Hanžl, Jan Tkadlec, Martijn Riool, Jan Lipov, Jitka Viktorová, Eva Kudová&nbsp;Eur. J. Med. Chem., 2026, 308, 118716<a target="_blank" rel="noopener noreferrer" href="https://doi.org/10.1016/j.ejmech.2026.118716">https://doi.org/10.1016/j.ejmech.2026.118716</a><h6>licensed under <a target="_blank" rel="noopener noreferrer" href="https://creativecommons.org/licenses/by/4.0/">CC-BY 4.0</a></h6></blockquote><h4>Abstract</h4>The global rise of antibiotic resistance necessitates novel therapeutic strategies for infectious diseases. Inhibition of bacterial efflux pumps, which contribute to multidrug resistance, represents a promising approach to restore or even increase the efficacy of existing antibiotics. Using fluorescence-based ethidium bromide accumulation, broth microdilution, and checkerboard assays, we evaluated 26 endogenous steroidal hormones and neurosteroids, along with 30 synthetic derivatives, for their ability to enhance antibiotic susceptibility in multidrug-resistant Staphylococcus aureus. Structure-activity relationship analysis identified compounds 13 and 16 as lead candidates, exhibiting strong efflux pump inhibition and marked reductions in the minimum inhibitory concentrations of ciprofloxacin and erythromycin. Both compounds showed additive effects in checkerboard assays. Modifications at C-3 (polar substitution) and C-17 (3α,5β-stereochemistry and nonpolar substitution) were essential for potent efflux inhibition and sensitization, although these modifications were not additive when combined. Transcriptome analysis further revealed that compound 13 significantly downregulated S. aureus virulence-associated genes when administered alone or in combination with antibiotics. Cytotoxicity assessment in human peripheral blood mononuclear cells and receptor transactivation assays for estrogen, androgen, and progesterone receptors indicated that the most active derivatives were non-toxic and lacked detectable endocrine activity, suggesting a favorable safety profile. Overall, these findings support the concept that rationally designed andostane-based steroidal scaffolds can function as competitive bacterial efflux pump inhibitors and serve as potential antibiotic adjuvants to mitigate efflux-mediated resistance.<h4>Instrumentation</h4><h5>Structural characterization</h5><ul><li>AVANCE III 400 MHz NMR spectrometer (Bruker)</li><li><a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library?mainauthorItems=3&amp;search=LTQ+Orbitrap+XL">LTQ Orbitrap XL HRMS</a> (Thermo Fisher Scientific, ESI)</li></ul></div>

Steroidal hormones and neurosteroids – novel therapeutic strategies in bacterial infections

Wiley, a global leader in authoritative content and research intelligence for the advancement of scientific discovery, innovation and learning, today announced the release of additional data to its IR and Raman spectral libraries, significantly broadening compound coverage, including materials, polymers, minerals, and others.This latest release includes the first installment of Raman spectra from Wiley's collaboration with the American Museum of Natural History (AMNH), announced earlier this spring, drawing from one of the world's most important mineral collections.“Researchers depend on reference data as a foundation for sound scientific decisions,” said Graeme Whitley, senior director, data science solutions at Wiley. “Continuous updates ensure scientists always have the most current, reliable reference libraries at their fingertips, helping them work faster and make confident decisions when it matters most.”<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Wiley_Wiley_expands_its_trusted_IR_and_Raman_spectral_library_collections_helping_analytical_labs_make_faster_more_confident_decisions_1a54aaad3a.jpg" alt="Wiley: Wiley expands its trusted IR and Raman spectral library collections—helping analytical labs make faster, more confident decisions" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Wiley_Wiley_expands_its_trusted_IR_and_Raman_spectral_library_collections_helping_analytical_labs_make_faster_more_confident_decisions_1a54aaad3a.jpg 245w," sizes="100vw" width="1600" height="856"><h4>Summary of updates:</h4><h5>KnowItAll Raman Spectral Library Collection</h5><ul><li>Added: 1,213 spectra</li><li>Now contains: 29K+ spectra</li></ul>2 new databases:<ul><li>Raman – American Museum of Natural History Minerals – Wiley – 198 spectra</li><li>Raman – Microbiology – 71 spectra</li></ul>Spectra added to databases:<ul><li>Raman – Consumer Goods &amp; Food-Related Compounds – +104</li><li>Raman – Drugs – +128</li><li>Raman – Materials – +132</li><li>Raman – Minerals – +233</li><li>Raman – Polymers – +5</li><li>Raman – Pigments &amp; Dyes – +342</li></ul><h5>KnowItAll IR Spectral Library Collection</h5><ul><li>Added: 949 spectra</li><li>Now contains: 344K+ spectra</li></ul>7 new databases:<ul><li>ATR-IR – Clinical – 364 spectra</li><li>ATR-IR – Materials – 10 spectra</li><li>ATR-IR – Pigments &amp; Dyes – 420 spectra</li><li>ATR-IR – Polymers – 21 spectra</li><li>IR – Clinical – 20 spectra</li><li>IR – Materials – 17 spectra</li><li>IR – Microbiology – 75 spectra</li></ul>Spectra added to databases:<ul><li>IR – Minerals – +5</li><li>IR – Polymers – +17</li></ul>Spectral library subscribers automatically gain access to new data, ensuring labs always have the most current, reliable reference libraries to improve analysis, reduce errors, and increase productivity.<ul><li>Learn more at: <a target="_blank" rel="noopener noreferrer" href="https://sciencesolutions.wiley.com/spectral-databases/">www.sciencesolutions.wiley.com/spectral-databases</a></li><li>Existing subscribers can access step-by-step guidance on updating their KnowItAll databases at <a target="_blank" rel="noopener noreferrer" href="https://sciencesolutions.wiley.com/how-to-update-knowitall-databases">https://sciencesolutions.wiley.com/how-to-update-knowitall-databases</a></li></ul><h5>Wiley Spectral Databases</h5>Wiley's spectral databases are consistently evolving to meet today's research demands, covering multiple spectral techniques across a wide range of applications including polymers, materials, environmental, forensics, toxicology, pharmaceutical, biotech, automotive, aerospace, food, cosmetics, and more. Built on rigorous quality protocols, Wiley delivers industry-leading spectral data and intelligent tools to accelerate analysis and deliver deeper insights — making it the authoritative, trusted source that analytical labs worldwide rely on.&nbsp;<h5>About Wiley</h5>Wiley (NYSE: WLY) is a global leader in authoritative content and research intelligence for the advancement of scientific discovery, innovation, and learning. With more than 200 years at the center of the scholarly ecosystem, Wiley combines trusted publishing heritage with AI-powered platforms to transform how knowledge is discovered, accessed, and applied. From individual researchers and students to Fortune 500 R&amp;D teams, Wiley enables the transformation of scientific breakthroughs into real-world impact. From knowledge to impact—Wiley is redefining what's possible in science and learning.&nbsp;

Wiley expands its trusted IR and Raman spectral library collections

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 4th May 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you application notes by KNAUER, Shimadzu, and Thermo Fisher Scientific!<h3>1. KNAUER: Analysis of HPLC fractions by Benchtop NMR</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/knauer_hplc_benchtop_nmr_web_638c60e13c.pdf">Full PDF for download</a></li></ul>Preparative HPLC is essential for isolating compounds and removing impurities in pharmaceutical and chemical industries. Non-destructive, fast analysis is preferred to maintain yield and enable at-line monitoring, avoiding lengthy sample preparation. Recent advancements in benchtop NMR spectrometers (up to 90 MHz) allow quick analysis without deuterated solvents. In this proof-of-concept study we purified a pharmaceutical sample via HPLC and confirmed its identity using benchtop NMR. Fractions (0.7–4.4 mM) were analyzed without preparation, using only 300 µL per sample, ensuring rapid batch control with no product loss. This study demonstrates the seamless integration of HPLC and benchtop NMR.<h4>Experimental</h4><h5>Preparative HPLC Method</h5>Eluent 20:80 Ethanol/water, isocratic mode, flow rate 12.5 ml/min, detection UV254 nm 2 Hz, 500 µl stacked injection, automated fractionation with threshold function, column temperature ambient, Column Eurospher II 100-10 C18 150x20 mm&nbsp;<h5>Analytical HPLC Method</h5>Eluent 20:80 Ethanol /water + 0.1% formic acid, isocratic mode, flow rate 1 ml/min, detection UV254 nm 10 Hz, 5 µl partial loop injection, column temperature 25 °C, Column <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/products/1633">Eurospher II 100-5 C18</a> 150x4 mm&nbsp;<h5>NMR Method&nbsp;</h5>NMR spectra were acquired on a Magritek Multi-X Ultra 80 MHz benchtop NMR system using an adapted WET sequence for solvent suppression. 32 scans were acquired with a repetition time of 15s. WET parameters were adjusted for each sample to yield optimal suppression for all solvent signals. Pooled HPLC fractions were analysed directly without addition of deuterated solvents or other sample preparation.<h4>Conclusion</h4>This proof-of-concept study successfully shows that HPLC and benchtop NMR can be used together easily. Samples can be analyzed non-destructively within minutes and without any further preparation due to highly efficient suppression of multiple solvent signals. Compounds can be identified without the need of reference standards. This study shows that NMR can provide a valid compatible alternative detector for HPLC fraction analysis.<h3>2. Shimadzu: DIC Analysis in High-Speed Tensile Test of CFRP</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_00854_en_fb6c68b858.pdf">Full PDF for download</a></li></ul><h4>User Benefits</h4><ul><li>The <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=HPV-X3">HPV-X3</a> is suitable for observation of fracture of brittle materials such as CFRP because it has a maximum recording speed (framerate) of 20 Mfps.&nbsp;</li><li>The HPV-X3 provides improved DIC analysis performance, as its resolution is 3 times higher than that of the conventional highspeed video camera.</li><li>The HITS-TX impact testing machine enables testing at a maximum speed of 20 m/s</li></ul>Carbon fiber reinforced plastic (CFRP) is a material with particularly high specific strength, even among composite materials, and used in various applications such as transport aircraft, taking advantage of its excellent mechanical properties. Because CFRP consists of carbon fibers and resin, it shows complex fracture behavior, and brittle fracture progresses from damage as the point of origin. Since fracture proceeds instantaneously, a high-speed video camera with a high recording speed is necessary when observing fracture of CFRP. One method for measuring strain in a high-speed tensile test is Digital Image Correlation (DIC), which visualizes the distribution of strain at the specimen surface by comparing a random pattern on the specimen surface before and after deformation. Thus, a high-speed video camera with a high resolution is also necessary in order to improve the DIC performance.&nbsp;Newly-developed <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=HPV-X3">Hyper Vision HPV-X3 high-speed video camera</a> is extremely well-suited to DIC analysis of CFRP, as its recording speed is 2 timesfaster and itsresolution is 3 times higher than the conventional HPV-X2. In this experiment, a high-speed tensile test of CFRP was conducted using a HITS-TX high-speed tensile testing machine. The condition of the test was observed with the new HPV-X3, and the strain distribution of the CFRP test piece was clarified by a DIC analysis of the recorded images.<h4>Test Piece and Test Instruments</h4>A CFRP quasi-isotropic laminate was used as the test piece. Aluminum foil was glued to the back side of the test piece, and the timing when the electrical conduction of the aluminum foil was interrupted by fracture of the test piece was used as the trigger for video recording. The HITS-TX was used in the highspeed tensile test. The HPV-X3 was used in fracture observation, and for comparison, the fracture process was also recorded with the conventional HPV-X2 camera. Fig. 1 shows the condition of the test, and Table 1 and Table 2 show the equipment composition and test conditions, respectively.<h4>DIC Analysis Results in High-Speed Tensile Test</h4>Fig. 3 shows the DIC analysis results in the high-speed tensile test. The color bar was set to display the color purple at around 0 % strain and red at around 2 % strain. Fig. 3 (1) is an image at the start of the test. After the test started, strain in the 45˚ direction concentrated from the lower left to the right central area, as can be seen in Fig. 3 (2). Then, as the test progressed, a condition of increasing strain in the initial area of strain concentration can be seen in Fig. 3 (3) to (9). A crack occurs in Fig. 3 (10), and strain decreases in the crack area. Following this, the test piece fractured completely in Fig. 3 (11) and (12), and a decrease in the strain in the area around the crack could be observed.<h4>Conclusion</h4>A high-speed tensile test of CFRP was conducted using a HITSTX high-speed tensile testing machine and the newlydeveloped HPV-X3 high-speed video camera, and the strain distribution at the time of test piece fracture was visualized by a DIC analysis. Because the HPV-X3 offers a 3 times higher resolution and a 2 times faster recording speed than the conventional device, it is a suitable high-speed video camera for fracture observation and DIC analysis in impact tests of brittle materials such as CFRP. The measurement system introduced in this Application News article is a useful tool for the development of composite materials.<h3>3. Thermo Fisher Scientific: Polymer analysis using femtosecond-laser-ablation depth profiling</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/xps_depth_profiling_polymer_analysis_appnote_c731e2e7e0.pdf">Full PDF for download</a></li></ul>X-ray photoelectron spectroscopy (XPS) is an essential polymer characterization technique that can identify not just the elemental composition but also the chemical state of polymer samples. This allows the chemical bonding environment to be deduced and, as a result, the polymer species can be identified. This can all be achieved with minimal sample preparation thanks to the built-in charge-compensation systems found in XPS instruments, which simplify the analysis of insulating samples.&nbsp;The introduction of gas cluster ion sources (GCIS), such as the Thermo Scientific™ MAGCIS Dual Mode Ion Source, marked a major step forward in polymer analysis. Unlike monatomic ion beams, GCIS are able to clean surface contamination, and etch away layers of sample material, without damaging the underlying chemistry of organic samples such as polymers. As a result, GCIS has allowed chemical-damage-free analysis to reach micrometers below the sample surface. This depth of analysis can be highly time consuming, however, and total experimental times can range from multiple hours to days.&nbsp;The addition of femtosecond-laser-ablation (fs-LA) technology is alleviating this, allowing for XPS spectra to be collected from a depth of tens of µm into a sample in a matter of minutes. This is because the laser ablation occurs on the femtosecond timescale (i.e., nearly instantaneously), effectively eliminating the material removal time of the depth profile. Additionally, unlike other material removal techniques such as atomic ion beam impact (where a collision cascade effect is induced to remove surface material) fs-LA is capable of removing material without chemical damage due to the ultrashort columbic explosion process used to eject the material. The resulting profile is therefore representative of the actual sample chemistry.<h4>Paint layer analysis&nbsp;</h4>In traditional ion-beam depth profiling, analytical depths are generally limited to several hundred nanometers, up to a micrometer. This means that it is extremely difficult to analyze the interfaces between multiple micrometer-thick layers in a sample without the use of additional techniques such as ultralow-angle microtome (ULAM) sectioning.¹ The introduction of fs-LA technology, however, allows micrometers of material to be removed rapidly, enabling the characterization of layered samples.&nbsp;As an example, a multi-layer paint specimen (provided by the University of Surrey, UK) was depth profiled using the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2206">Thermo Scientific™ Hypulse™ Surface Analysis System</a>. The sample consists of an aluminum substrate coated with a 5 µm layer of polyurethane primer followed by a 25 µm PMMA/PVdF topcoat.The depth profile was generated using a 1,030 nm laser with an energy of 250 µJ for ablation, along with a 30 µm X-ray spot size for data collection. XPS spectra were collected after each ablation cycle to obtain an atomic concentration plot through both paint layers into the substrate material (Figure 2).&nbsp;5 distinct regions throughout the analyzed depth can be seen. The top surface of the sample consists of an adventitious layer of carbon contamination, which is commonly found on samples exposed to air. The second layer is the 25 µm PVdF/PMMA topcoat, and the third layer is the PU primer. Between the primer and the final aluminum substrate layer, a clear increase in adventitious carbon is observed, similar to the signal seen at the top sample surface. This suggests residual carbon contamination was present on the substrate before the paint layers were applied.&nbsp;It would take hours to produce the XPS depth profile shown in Figure 2 using traditional ion beam approaches. Even with the use of a monatomic beam with a high energy per atom, the length of the analysis could still be just as long, depending on the sample material, and would sacrifice the chemistry of any organic/polymeric materials. The combination of fs-LA depth profiling and snapshot XPS acquisition, meanwhile, can reduce the experimental time to less than 20 minutes without inducing any chemical damage to the sample surface.<h4>Summary&nbsp;</h4>One of the most critical aspects of successful polymer XPS depth profiling is the preservation of the sample chemistry during material removal. Additionally, experiment time can be a significant limiting factor, and thicker samples could lead to reduced time for repeat experiments. The femtosecond laser ablation capabilities of the Hypulse Surface Analysis System provide fast, efficient, and chemical-damage-free material removal from a sample surface, enabling analysis multiple micrometers into a sample. This means that hidden sample interfaces, that were largely inaccessible before, can now be analyzed easily and efficiently

News from LabRulezICPMS Library - Week 19, 2026

Article

Product

Application

Video

Science and research

Software

The Institute of Organic Chemistry and Biochemistry of the Czech Academy of Sciences (IOCB Prague) is a leading scientific institution in the Czech Republic, recognized internationally. Its primary mission is basic research in the fields of chemical biology and medicinal chemistry, organic and material oriented chemistry, chemistry of natural compounds, biochemistry and molecular biology, physical chemistry, theoretical chemistry, and analytical chemistry. 

Institute of Organic Chemistry and Biochemistry of the Czech Academy of Sciences

Everything from the world of analytical chemistry in one place. We connect people in solving their problems. At Labrulez you will find all the necessary information easily, quickly and clearly. Stop searching and start finding.

LabRulez

For over 200 years we have been helping people and organizations develop the skills and knowledge they need to succeed.
We develop digital education, learning, assessment, and certification solutions to help universities, businesses, and individuals move between education and employment and achieve their ambitions.

Wiley

Thermo Scientific™ ARL™ iSpark Plus Fire Assay Analyzer

Thermo Scientific™ ARL™ iSpark Plus Fire Assay Analyzer – fast and accurate spark-OES system for direct precious metals analysis in lead buttons without cupellation.

<h4>Efficient and Clean Alternative to Traditional Fire Assay</h4>Traditional fire assay analysis is labor-intensive, expensive and environmentally harmful. The Thermo Scientific™ ARL™ iSpark Plus Fire Assay Analyzer provides a simple and clean alternative to traditional cupellation and analysis stages by using spark optical emission spectrometry (OES) to determine precious metal concentrations directly in lead buttons.With this system, you can achieve simultaneous quantitative determination of all precious metals in fire assay lead buttons in less than a minute. The ARL iSpark Plus is a high-end spark OES spectrometer specially optimized for lead button analysis.<h3>Applications and Detection Capabilities</h3>The analyzer is ideal for various types of samples in:<ul><li>Gold and platinum mining (plant control, exploration, metal accounting)</li><li>Precious metals refining and recycling</li><li>Contract laboratories</li></ul>Thanks to:<ul><li>1-meter focal length Paschen-Runge optics</li><li>High-performance photomultiplier tubes (PMTs)</li><li>Advanced signal processing technologies</li></ul>…it offers excellent detection limits for trace levels of gold, silver, and platinum group elements in lead buttons.<h4>Key Benefits and Technical Highlights</h4><ul><li>Unmatched hardware for long-term stability and reliability</li><li>Exceptional performance in detection limits, precision, accuracy and speed</li><li>Minimal training required for operators</li><li>Automation-ready: streamlined sample prep and high throughput</li><li>Factory-calibrated for fast commissioning</li><li>Compatible with automated fire assay labs</li></ul><h4>Advanced Technology Inside</h4><ul><li>Current Controlled Source (CCS): Flexible spark discharge control for high sensitivity, reproducibility and small sample geometry</li><li>Time Resolved Spectroscopy (TRS): Signal acquisition at optimal timing for improved sensitivity and precision</li><li>1-meter Paschen-Runge vacuum polychromator for excellent resolution</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2028">Thermo Scientific™ OXSAS™ software</a>: Powerful and intuitive interface</li><li>Temperature-controlled cast iron cabinet: ±0.1°C at 38 °C</li><li>Argon-flushed, water-cooled table with closed-loop coolant system</li></ul>

Thermo Scientific ARL EQUINOX 100 X-ray Diffractometer

The ARL EQUINOX 100 is a compact benchtop XRD for QC, research, and routine use. It captures full diffraction patterns in real time with a CPS detector — no moving parts or scanning needed.

<h4>Compact, powerful, and flexible benchtop XRD system for routine and advanced applications</h4>The ARL EQUINOX 100 is a compact benchtop X-ray diffractometer (XRD) designed for quality control, academic research, and routine analysis. It features a unique curved position-sensitive (CPS) detector that enables real-time acquisition of the entire diffraction pattern — with no moving parts and no scanning required.<h3>Key Features</h3><ul><li>Real-time acquisition: entire diffraction pattern captured in seconds</li><li>Wide angular range: up to 110° 2θ without moving components</li><li>No external water cooling: no chiller required</li><li>Standard power outlet: plug-and-play with no special electrical setup</li><li>Low-power microfocus X-ray source: high intensity and efficient optics</li><li>Versatile measurement: reflection and transmission modes</li><li>Easy installation: suitable for labs, mobile labs, and field vans</li></ul><h3>Sample Handling &amp; Accessories</h3><ul><li>Fixed non-spinning sample stage</li><li>Spinning stages for powders, bulks, filters, and pressed pellets</li><li>Capillary sample stage for transmission mode</li><li>Controlled atmosphere sample stage</li><li>6-position automatic sample changer</li><li>Dedicated stage for thin film analysis (GIXRD, XRR)</li><li>Temperature-controlled stages (–10 °C to 500 °C)</li></ul><h3>Typical Applications</h3><ul><li>Phase identification and quantification</li><li>Degree of crystallinity, crystallite size, and lattice parameters</li><li>Crystal structure solutions and Rietveld refinement</li><li>Thin film characterization (GIXRD, XRR)</li><li>In-situ and dynamic studies (e.g., phase transitions)</li><li>Fields: materials science, geology, nanomaterials, chemistry, pharmaceuticals, metallurgy, teaching</li></ul><h3>Software &amp; Compliance</h3><ul><li>SolstiX™ XRD Software with 21 CFR Part 11 compliance</li><li>Electronic signatures, audit trails, secured data handling — ideal for pharmaceutical QA/QC environments</li></ul><h3>Why Choose ARL EQUINOX 100?</h3><ul><li>Simultaneous, real-time data acquisition</li><li>Compact, rugged, and mobile-ready design</li><li>High performance at low operating cost</li><li>Flexible platform for a broad range of samples and applications</li></ul>

Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat

Streamline slurry analysis with the Thermo Scientific™ MEP-300 probe—no liquid nitrogen needed. Replaces MEP/MEP-200 and features SDD technology for reliable, high-performance XRF results.

<h4>Enhance XRF Slurry Analysis with the Thermo Scientific™ MEP-300 Multi-Element Probe – No Liquid Nitrogen Required</h4>Streamline elemental analysis of slurries with the Thermo Scientific™ MEP-300 Multi-Element Probe, designed to eliminate the need for liquid nitrogen while improving performance and reliability. Developed as a direct replacement for earlier MEP and MEP-200 immersion probes used in <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2027">AnStat </a>and <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2004">MSA</a> X-ray analyzer systems, the MEP-300 leverages advanced Silicon Drift Detector (SDD) technology for superior results in demanding industrial environments.<h3>Why Choose the MEP-300 Probe?</h3><h4>Advanced SDD Technology</h4><ul><li>Operates without cryogenic cooling</li><li>Delivers lower detection limits and improved analytical accuracy</li><li>Achieves higher count rates, reduced background, and wider field of view</li><li>Demonstrated stability under shock and vibration, ideal for on-line industrial use</li><li>No special storage or handling required</li></ul><h4>Occupational Health &amp; Safety</h4><ul><li>No liquid nitrogen, eliminating associated hazards</li><li>Enhanced radiation safety with:<ul><li>Automatic source retraction on window rupture or probe lift</li><li>Fail-safe, spring-loaded design to withdraw the source on power loss</li><li>High-visibility beacon for status and alarm indication</li></ul></li></ul><h4>Optimized Maintenance &amp; Operations</h4><ul><li>Zero ongoing cost for liquid nitrogen</li><li>Lower cost of spare parts</li><li>Field-repairable detector — no need to return to the factory</li><li>Easy-to-replace modules and cable assemblies</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg" alt="Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg 192w," sizes="100vw" width="1374" height="1116"><h3>Specifications</h3><ul><li>Air Requirements:&nbsp;<ul><li>Instrument Air: ANSI ISA-S7 0 0-1996 (clean and dry to 0.1 microns with dew point &lt;2°C)</li><li>Air Pressure: 550 kPa nominal – 1000 kPa maximum</li></ul></li><li>Certifications/Compliance: CE, ICES 001, CSA, FCC Part 15B and RCM AS/NZS CISPR11</li><li>Electrical Requirements:&nbsp;<ul><li>Three Phase 48 to 62 Hz. Max 2.5kVA Neutral not required.</li><li>Identical power requirements to previous generation products.</li><li>Any of the standard three phase voltages used in the world mining industry in the range 380–600 Volts AC may be factory or field selected.</li><li>Variation should not exceed ±10% of the nominal voltage selected.</li></ul></li><li>Operating Temperature:&nbsp;<ul><li>Ambient -10°C to +55°C (measured at enclosure surface temperature, temperature to not exceed 55°C)</li><li>Process Fluid: 0°C to 45°C, Check with factory for higher temperature options</li></ul></li><li>Type: MEP-300 Upgrade Package for MSA and AnStat</li><li>Unit Size: Each</li></ul>

Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer

The Thermo Scientific™ ARL™ EQUINOX 1000 enables ultra-fast XRD with a unique curved detector capturing all diffraction peaks at once, delivering complete analysis in just minutes.

The Thermo Scientific™ ARL™ EQUINOX 1000 offers very fast measurements compared to other diffractometers due to our unique EQUINOX curved detector that can measure all diffraction peaks simultaneously across a wide angular range. It will take you just a few minutes on most samples to get a complete analysis regardless of your resolution requirements.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg 245w," sizes="100vw" width="800" height="361">The ARL EQUINOX 1000 is a rugged multi-purpose benchtop style instrument designed for QA/QC, academic and routine X-ray diffraction applications. The ARL EQUINOX 1000 is the perfect instrument when space becomes a priority. With its truly excellent performance it is the perfect match for laboratories that are looking for a simple and powerful benchtop X-ray diffractometer. Several sample holders are available on this instrument such as a 6 or 30 positions sample holder, powder transmission mode sample holders, small thin film sample attachment.<ul><li>Real time acquisition</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg 245w," sizes="100vw" width="1074" height="286"><ul><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement on small samples? Try our Small Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Silver Behenate powder sample recorded on EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg 245w," sizes="100vw" width="871" height="450"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Si powder sample recorded on ARL EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg 245w," sizes="100vw" width="871" height="452"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Cu, Co - Standard sealed X-ray tube</li><li>Detector: Curved Position Sensitive X-ray Detector, CPS 180 Curvature radius: 180mm Acquisition in real time over 110° 2Theta</li><li>Goniometric table: No moving parts: acquisition in asymmetric mode</li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Zero background sample cup&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Optic: Monochromatic (Germanium, Graphite)</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase indentification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60Hz</li><li>Weight: ~90 kg</li><li>Cooling water:&nbsp;<ul><li>Flow: ~3,5l/min&nbsp;</li><li>T°C: ~18 / 25°C</li></ul></li><li>Dimensions: 996 mm H x 715 mm D x 750 mm W</li></ul>

Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer

Thermo Scientific ARL EQUINOX 3000 XRD: real-time acquisition, no scanning, superb resolution, versatile sample handling, reliable and easy to use for research and industry.

The Thermo Scientific™ ARL™ EQUINOX 3000 measurements are very fast compared with other diffractometers in that the unique Inel curved detector can measure all diffraction peaks simultaneously. Due to this acquisition in real time, all kinetic studies are facilitated.The Thermo Scientific™ ARL™ EQUINOX 3500 is an evolution of ARL EQUINOX 3000 model. It is exactly the same configuration except that it works with a bigger radius of curvature detector. So, obtained data have a better resolution.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg 222w," sizes="100vw" width="790" height="556">The ARL EQUINOX 3000 is a a research-grade diffractometer with a very high resolution diffraction system providing the user a choice of features including higher resolution detectors, a larger sample area and choice of X-ray sources.The free space in the sample compartment is very large and will accommodate practically any sample and any sample handling device including furnaces, auto samplers, large assemblies, etc.<ul><li>Real time acquisition</li><li>Extremely accurate</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs. &nbsp;</li><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement? Try our Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: HTK1200N, TTK450." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg 245w," sizes="100vw" width="1228" height="336"><ul><li>This system allows you to work with controlled temperature or atmosphere chamber. Anton Paar and other suppliers chambers can be availabledepending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: LaB6 powder sample recorded on ARL EQUINOX 3000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg 245w," sizes="100vw" width="850" height="334"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Standard sealed X-ray tube: Cu, Co, Mo, ... radiation</li><li>Detector:&nbsp;<ul><li>Curved Position Sensitive X-ray Detector, CPS120&nbsp;</li><li>Curvature radius: 250mm&nbsp;</li><li>Acquisition in real time over 120° 2Theta&nbsp;</li><li>Option: CPS590 (500mm, 90° 2Theta – EQUINOX 3500)</li></ul></li><li>Goniometric table:&nbsp;<ul><li>No moving parts&nbsp;</li><li>Acquisition in asymmetric mode</li></ul></li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Special camera:&nbsp;<ul><li>Heating camera: low and high temperature&nbsp;</li><li>Humidity chamber, Electrochemistry cell</li></ul></li><li>Optic: Monochromatic</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase identification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Transition phase&nbsp;</li><li>Thin film (reflectometry, etc.)&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60 Hz</li><li>Cooling water: Flow: ≈ 3,5 L/min - T°C: ≈18 to 25 °C</li><li>Dimensions:&nbsp;<ul><li>1565 mm H x 750 mm D x 1040 mm W EQUINOX 3000&nbsp;</li><li>1815 mm H x 744 mm D x 1206 mm W EQUINOX 3500</li></ul></li></ul>

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Thermo Scientific ARL iSpark Plus Inclusion Analyzer

High-performance spark OES analyzer enabling ultra-fast simultaneous analysis of elemental composition and non-metallic inclusions in steel for improved process control and product quality.

The Thermo Scientific™ ARL iSpark Plus Inclusion Analyzer with Spark-DAT technology provides ultra-fast and comprehensive analysis of non-metallic inclusions in steel. It enables simultaneous determination of elemental composition and inclusion characteristics within a single spark OES measurement. This capability allows near real-time monitoring of inclusion content during steel production, supporting process optimization, improved product quality, and prevention of costly issues such as nozzle clogging during continuous casting.Designed as a complete solution for steelmaking applications, the analyzer integrates advanced optical design, high-sensitivity detection, and dedicated software tools to evaluate inclusion type, size, concentration, and volume fraction.<h4>Key features</h4><ul><li>Trusted ARL iSpark Plus spark OES platform for advanced inclusion and elemental analysis</li><li>1 m Paschen-Runge optical system with photomultiplier tube (PMT) detectors</li><li>Full elemental coverage including gas elements</li><li>Ultra-fast inclusion analysis combined with elemental determination</li><li>Determination of inclusion type, number, size, concentration, and volume fraction</li><li>Dedicated software tools: Spark Explorer, Inclusions Report, SPC</li><li>Customizable inclusion analysis methods with expert training support</li><li>Compatible with ARL SMS (Sample Manipulation System) for automated workflows</li></ul><h4>Technical specifications</h4><ul><li>Frequency: 50/60 Hz</li><li>Detector type: Photomultiplier Tubes (PMT)</li><li>Application: Steelmaking</li><li>Instrument type: Inclusion analyzer</li><li>Exterior dimensions (H × W): 1200 mm × 860 mm</li><li>Weight: Approx. 500 kg</li></ul>

Products from Thermo Fisher Scientific - page 1

Related content

Steroidal hormones and neurosteroids – novel therapeutic strategies in bacterial infections

News from LabRulezICPMS Library - Week 19, 2026

Wiley expands its trusted IR and Raman spectral library collections