<h3>Lunch &amp; learn tips &amp; tricks series 2026 – part 1</h3>In modern analytical laboratories, efficiency, consistency, and data confidence are essential. Whether you are operating an ICP-OES or ICP-MS system, the way you use your software can significantly influence productivity and analytical performance. In the first session of our Lunch &amp; Learn Tips &amp; Tricks Series, we focused on one of the most common themes raised by users: how to navigate <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/1489">Qtegra </a>software more effectively and optimize everyday workflows.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Fisher_Scientific_Mastering_Qtegra_Software_Practical_Strategies_to_Improve_Your_Daily_Lab_Workflow_3d35454782.jpg" alt="Thermo Fisher Scientific: Mastering Qtegra Software: Practical Strategies to Improve Your Daily Lab Workflow" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Fisher_Scientific_Mastering_Qtegra_Software_Practical_Strategies_to_Improve_Your_Daily_Lab_Workflow_3d35454782.jpg 245w," sizes="100vw" width="1024" height="512">This session explored three key areas in detail: understanding the structure of Qtegra and the Configurator, using the Dashboard as your operational control center, and building smarter, more efficient LabBooks. Below is a structured recap of the key insights shared during Part 1.<h3>Understanding the structure of Qtegra</h3>One of the most valuable features of Qtegra software is its consistency across multiple instrument platforms. Whether you are working with the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=227&amp;instrumentationItems=84&amp;manufacturerItems=3&amp;search=icap+pro">iCAP PRO ICP-OES</a>, the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=232&amp;instrumentationItems=83&amp;manufacturerItems=3">iCAP MX ICP-MS</a>, the iCAP 7000 OES, or Qnova ICP-MS systems, the interface and workflow logic remain familiar. This consistency reduces the learning curve when transitioning between instruments and supports standardised training across laboratories.Qtegra consists of two primary components: the Qtegra application itself and the Configurator.<ul><li>The Qtegra application is where you directly interact with your instrument. It is used to create LabBooks, control the instrument, execute analyses, and review results.</li><li>The Configurator, in contrast, defines how your system behaves at a deeper level. It controls system-level settings that underpin daily operation. Within the Configurator, users can manage features such as Fast Uptake setup, drain sensor configuration, wavelength libraries for ICP-OES systems, the Reaction Database for ICP-MS systems, and user access permissions.</li></ul>Understanding the distinction between these two components helps users troubleshoot more effectively and ensures that system configuration aligns with laboratory requirements.<h3>Using the dashboard as your central hub</h3>When Qtegra is opened, the first screen presented is the Dashboard. The Dashboard functions as the central hub for instrument monitoring and control. From this location, users can view instrument status, monitor live operating parameters, access tuning tools, review performance checks, and identify error or interlock notifications.<ul><li>For ICP-OES users, the Dashboard provides access to tune sets, source settings, AutoPeak alignment, autotuning functions, and live views such as Plasma TV. These tools allow users to confirm that the plasma and optical system are performing as expected before analysis begins.</li><li>For ICP-MS users, the Instrument tab within the Dashboard provides access to autotune routines, performance report summaries, gas flow settings, nebuliser adjustments, operating mode selection such as Standard, KED, or CCT modes, IntelliLens control, and real-time data streams.</li></ul>The Dashboard should be used as a structured checkpoint before running any analysis. Confirming that all parameters are within acceptable ranges reduces the likelihood of interruptions and supports consistent performance throughout the run.<h3>The get ready workflow: structured instrument preparation</h3><ul><li>The Get Ready function, which is launched directly from the Dashboard, provides a guided preparation workflow. This feature is designed to ensure that the instrument is fully configured and operating correctly for the selected method before analysis begins.</li><li>Within Get Ready, users can access scheduling tools that automate warmups, standby routines, shutdowns, and maintenance checks. These tools are particularly beneficial for laboratories operating multiple shifts or managing variable workloads.</li></ul>For ICP-MS systems, the Get Ready workflow includes automated performance checks, autotune routines, and controlled warm-up conditions. These routines verify that the instrument is operating within its expected performance range.By following the structured steps within Get Ready, laboratories can reduce the risk of missed preparation tasks and maintain day-to-day analytical consistency.<h3>Building smarter LabBooks</h3>The LabBook forms the foundation of every analytical sequence in Qtegra. A carefully constructed LabBook improves efficiency, reduces setup errors, and simplifies data review.Users can create a LabBook from scratch or begin with a template. Templates are particularly useful for laboratories that integrate with LIMS systems or import sample lists via CSV files, as they promote standardisation and consistency.<h4>Defining analytes</h4><ul><li>For ICP-OES methods, users must select appropriate wavelengths and evaluate potential spectral interferences.&nbsp;</li><li>For ICP-MS methods, users select the required masses, consider isobaric and polyatomic interferences, and use the Reaction Database to support reaction mode selection.</li></ul>Careful analyte selection at this stage helps prevent complications later in the analytical workflow.<h4>Configuring acquisition parameters</h4>Acquisition parameters define how the instrument collects data.<ul><li>For ICP-OES systems, this includes selecting viewing modes, choosing wavelength ranges such as iFR or eUV, and defining integration times.</li><li>For ICP-MS systems, this includes selecting operating modes such as Standard, KED, or CCT, configuring Reaction Finder options, enabling Intelligent Matrix Handling, and defining digital trigger settings.</li></ul>Thoughtful parameter configuration ensures that data quality objectives are met without unnecessary reanalysis.<h4>Using intelligent uptake and rinse</h4>The Intelligent Uptake and Rinse feature detects when the sample or rinse solution reaches the nebuliser. This ensures consistent timing across samples and improves overall throughput. In high-throughput environments, this feature contributes to both efficiency and reproducibility.<h4>Calibration and quantification strategy</h4>Calibration design is central to reliable quantification. Qtegra allows users to manage global standards, configure dilution tools, select calibration fit types, assign internal standards, and establish quality control samples.For ICP-OES systems, users can define standard ranges and switch points. For SemiQuant workflows, Relative Sensitivity Factors can be applied.Establishing these parameters during LabBook creation ensures that data validation is straightforward once analysis is complete.<h4>Autosampler and sample list setup</h4>For laboratories using the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/1715">iSC-65 autosampler</a>, features such as StepAhead, custom rack definitions, colour-coded sample views, and visual integrity checks support efficient sequence management.When constructing the sample list, users should clearly define sample types, establish a logical sequence order, and configure column layouts appropriately. Setting flags and limits during initial setup simplifies the data review process and supports quality assurance.<h3>Why workflow optimisation matters</h3>Optimising Qtegra usage does not require learning new software features. Instead, it involves using existing tools more strategically. By treating the Dashboard as a pre-run checkpoint, using Get Ready consistently, and constructing LabBooks with long-term efficiency in mind, laboratories can reduce downtime, improve reproducibility, and strengthen confidence in analytical results.<h3>Looking ahead to part 2</h3><blockquote>In Part 2 of the Qtegra Tips &amp; Tricks series, we will focus on post-analysis best practices. Topics will include interpreting signal intensities, reviewing calibration performance, evaluating recoveries and readbacks, applying flags effectively, exporting data, and implementing practical workflow improvements discussed in Part 1.</blockquote>By building a structured approach to both preparation and data review, laboratories can transform routine analysis into a streamlined, reliable, and repeatable process.We look forward to continuing the discussion in Part 2.<h5>Acknowledgement</h5>I would like to thank Matthew Gregory Field Applications Scientist, North EMEA, Trace Elemental Analysis and David Fishwick Field Applications Scientist, North EMEA, Trace Elemental Analysis for the support on this blog and the webinars<h4>Sign up for our webinars live and on demand.</h4>English<ul><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5795">Lunch and Learn Tips and Tricks Series: Qtegra Part 1</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5976">Lunch and Learn Tips and Tricks Series: Qtegra Part 2</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5977">Lunch and Learn Tips and Tricks Series: Trace Elemental Analysis (ICP-OES &amp; ICP-MS)</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5978">Trace Elemental Analysis: Ask the Expert</a></li></ul>Deutsch<ul><li>19. März 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179134/393E071E3B501943730958BA6203F477">Interne Standards in der ICP-OES: Ein Praxisguide für zuverlässige Qualitätssicherung im Labor</a></li><li>18. Juni 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179292/AE4C576B6A54D1AC182F7F77573D380F">Fehler reduzieren, Durchsatz steigern: Autoverdünnung mit PrepFast am ICP-MS</a></li><li>17. September 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179423/B5019C560431BADCA2A76E54E4EFE56F">ICP-OES smarter nutzen: Probendurchsatz erhöhen, Ressourcen sparen</a></li><li>17. Dezember 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179530/94EEDD1F56138F5EEE2AF24E29E6C12A">Qtegra ISDS Software Unlocked – Live im Expertengespräch</a></li></ul>Visit us on&nbsp;<a target="_blank" rel="noopener noreferrer" href="https://www.linkedin.com/showcase/72003132/admin/dashboard/">LinkedIn:</a>&nbsp;#Qtegra, #ICPMS, #ICPOES, #TraceElementalAnalysis<blockquote><h5>Petra Gerhards</h5>Petra Gerhards, Dipl-Ing, is Regional Marketing Manager of GC and GC-MS for EMEA at Thermo Fisher Scientific. She has more than 29 years of experience in the fields of GC-MS, SPE and LC-MS. Since joining the regional team she has contributed to workflow solutions combining vials and closures with SPE solutions, GC-MS and LC-MS. She works with KOL's on data for regional specific marketing campaigns, organizes in-house seminars and works on customer specific solutions. Her main expertise is in the field of doping and drugs-of-abuse analysis.</blockquote>

Mastering Qtegra Software: Practical Strategies to Improve Your Daily Lab Workflow

Since the beginning of this year, a project to develop a light-based electron microscope, LightEM, has been underway at CEITEC Brno University of Technology (BUT). The principal investigator is Andrea Konečná from CEITEC BUT and the Faculty of Mechanical Engineering BUT, who has secured support for the project through the prestigious ERC CZ program. Over the next five years, her research team aims to develop and test a light-based electron microscope. This technology would allow scientists to adaptively modulate the electron beam during experiments or observe processes over time – capabilities that are not possible with conventional electron microscopes.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_VUT_Vaclav_Konicek_Mikroskop_budoucnosti_Spojeni_svetla_a_elektronu_ziskalo_prestizni_grant_4_2062655721.jpeg" alt="CEITEC/Václav Koníček: Microscope of the Future: Combining Light and Electrons Wins Prestigious Grant: Andrea Konečná's group" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_VUT_Vaclav_Konicek_Mikroskop_budoucnosti_Spojeni_svetla_a_elektronu_ziskalo_prestizni_grant_4_2062655721.jpeg 235w," sizes="100vw" width="1600" height="1067">Over the coming five years, Andrea's team will work on improving existing electron microscopes. Her project, Light-Based Electron Microscope (LightEM), focuses on the interaction between electrons and light and could help overcome some of the limitations of classical electron microscopy. “We are trying to improve the electron beam. What we want to do is, figuratively speaking, shoot an intense laser beam into the microscope and influence electrons using light. Simply put, we aim to create adjustable ‘glasses’ for the electron microscope using light and change how optics is traditionally done in electron microscopy,” explained Andrea.According to her, this approach should bring higher resolution, new imaging techniques, and the ability to study dynamic processes. “With light, the resolution should be even better. Moreover, we could image sensitive samples, which is usually problematic. We could also observe processes over time –&nbsp;stimulate a sample with light, for example by heating it, and then dynamically monitor what is happening,” she added.<h3>The microscope will offer better resolution and new imaging techniques</h3>Andrea points out that standard electron microscopes use magnetic lenses to image and focus electrons onto a sample, but these lenses have imperfections that limit resolution. The best electron microscopes in the world therefore use many lenses – similar to professional camera lenses – to compensate for these defects and achieve atomic resolution. A light-based electron microscope could change this.“We would like to demonstrate that such complex lens systems –&nbsp;whose production, alignment, and operation are very expensive and demanding –&nbsp;could be replaced by a specially modulated laser beam. Compared to conventional lenses, a laser beam can be used not only for magnification, reduction, or aberration correction, but also offers great flexibility and the possibility to create new ‘exotic’ types of electron beams. Electrons don’t have to be focused only into a point; we can create a beam shaped like a ‘donut.’ In addition, the beams could be modulated quickly and adaptively,” said Andrea.According to her, such a modified microscope could be used in many fields. “Thanks to the possibility of light-based modulation of the electron beam during experiments, we could more efficiently image sensitive samples, which is crucial for biology. Or we could detect defects in materials and semiconductor components more quickly,” she added.This is highly unique research with no equivalent in scope, either in the Czech Republic or abroad. According to Andrea, only a few studies on the topic have been published so far. “At the time I was writing the grant, only a few theoretical and experimental papers had demonstrated the basic concept –&nbsp;that electrons can be focused or otherwise modulated using a laser beam. But they did not go as far as we would like, namely to create a prototype microscope where part of the standard electron optics is replaced by a laser beam,” she said.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_VUT_Vaclav_Konicek_Mikroskop_budoucnosti_Spojeni_svetla_a_elektronu_ziskalo_prestizni_grant_3_1ec4c49bf5.jpeg" alt="CEITEC/Václav Koníček: Microscope of the Future: Combining Light and Electrons Wins Prestigious Grant: Andrea Konečná's research" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_VUT_Vaclav_Konicek_Mikroskop_budoucnosti_Spojeni_svetla_a_elektronu_ziskalo_prestizni_grant_3_1ec4c49bf5.jpeg 235w," sizes="100vw" width="1600" height="1067"><h3>Unique research supported by the Ministry of Education</h3>The project’s strong potential is confirmed by the fact that Andrea Konečná received an ERC CZ grant from the Czech Ministry of Education, Youth and Sports. The program aims to support researchers who applied for a European ERC grant, succeeded in evaluation, but were not funded due to limited resources.“There is enormous competition within the European ERC program. I submitted this project twice and both times advanced to the second round, where I presented it and discussed it with the panel. Each time I received an A rating, but unfortunately without funding. The Ministry looks at these European evaluations and ultimately supported my project. To be honest, it is mainly about prestige, because otherwise the conditions are the same. The project still runs for five years, and the Ministry supported it in full, so we receive the same funding we would have received from the European Union,” Andrea noted.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_VUT_Vaclav_Konicek_Mikroskop_budoucnosti_Spojeni_svetla_a_elektronu_ziskalo_prestizni_grant_2_3114b2e414.jpeg" alt="CEITEC/Václav Koníček: Microscope of the Future: Combining Light and Electrons Wins Prestigious Grant: Andrea Konečná's research" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_VUT_Vaclav_Konicek_Mikroskop_budoucnosti_Spojeni_svetla_a_elektronu_ziskalo_prestizni_grant_2_3114b2e414.jpeg 235w," sizes="100vw" width="1600" height="1067"><h3>Two prestigious grants – and motherhood alongside</h3>A few years ago, Andrea Konečná also received the prestigious JUNIOR STAR grant from the Czech Science Foundation, which supports outstanding early-career researchers. She is currently the principal investigator of two major projects, while also balancing motherhood since last year.“Maybe it’s still too early to evaluate, because my daughter is still small and I was on maternity leave for some time. But honestly, it is demanding. At the same time, the flexibility of our work makes it easier than in other professions. Moreover, the JUNIOR STAR project is already in its fourth year, and several excellent PhD and master’s students have joined during that time, so many smaller projects were able to continue even during my maternity leave. I’m also happy that several of these colleagues will now join the ERC CZ project,” she concluded.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_VUT_Vaclav_Konicek_Mikroskop_budoucnosti_Spojeni_svetla_a_elektronu_ziskalo_prestizni_grant_1_8369f441d5.jpeg" alt="CEITEC/Václav Koníček: Microscope of the Future: Combining Light and Electrons Wins Prestigious Grant: Andrea Konečná" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_VUT_Vaclav_Konicek_Mikroskop_budoucnosti_Spojeni_svetla_a_elektronu_ziskalo_prestizni_grant_1_8369f441d5.jpeg 235w," sizes="100vw" width="1600" height="1067"><h3>A major success for CEITEC Brno University of Technology</h3>“I greatly appreciate the success of Andrea Konečná, who managed to succeed in a highly competitive environment. It is the result of long-term high-quality scientific work and significant personal dedication. At the same time, I am pleased that at BUT, we are systematically creating conditions to support excellent research. One of the key tools is the Research Excellence Support Fund, through which we motivate and support researchers in preparing applications for prestigious grants such as ERC, EXPRO, JUNIOR STAR, or MSCA. These are precisely the types of projects that push the boundaries of knowledge and strengthen the international standing of our university,” said Martin Weiter, Vice-Rector of BUT for Research and Knowledge Transfer.

Microscope of the Future: Combining Light and Electrons Wins Prestigious Grant

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 30th March 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you application notes by Metrohm, Shimadzu, Thermo Fisher Scientific and Waters Corporation!<h3>1. Metrohm: Quantification of methanol in contaminated spirits</h3>Protecting consumers from contaminated beverages<ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_rs_056_download_3b37cb883a.pdf">Full PDF for download</a></li></ul>An alarming global trend highlights the serious harm that can result from ingesting illegal, improperly distilled alcohol. Home-distilled spirits prepared using industrial solvents (i.e., wood alcohol) and presented as legitimate alcoholic beverages often contain methanol. Methanol causes blindness and can lead to death when ingested. This has led to fatal consequences around the world [1–3].&nbsp;The breaking point for the Czech Republic came in September 2012. The sale of hard liquor was temporarily banned after 20 people died from the consumption of spirits with dangerous levels of methanol [2]. After an exhaustive study using various screening tools, the Czech Republic adopted Raman spectroscopy as the method of choice for identifying and quantifying methanol in contaminated spirits. This Application Note demonstrates how Raman spectroscopy can be employed as an efficient and rapid screening method for samples of rum contaminated with methanol.<h4>EXPERIMENT&nbsp;</h4>This example study measures commercially available coconut rum that is spiked with methanol in concentrations between 0.33% and 5.36%. The <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=220&amp;search=iRaman">iRaman NxG 785H</a> with a fiber-optic probe is used to collect Raman spectra of the mixtures (Figure 3). Table 1 lists the relevant equipment and instrument settings used for this application study. The peak at around 1000 cm-1 (highlighted by the inlay of Figure 3) visibly increases with increasing concentration of methanol, becoming significant at approximately 1%.<h4>CONCLUSION</h4>These results validate that Raman spectroscopy can be used for rapid, quantitative screening of dangerous adulterants in alcoholic beverages. This technique can be expanded to investigate adulteration in other media such as food, petroleum, and pharmaceutical drugs [4].<h3>2. Shimadzu: Evaluation of Organic Impurities in Lithium Carbonate by TOC Analysis</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01098_en_ec9b3e73fc.pdf">Full PDF for download</a></li></ul><h4>User Benefits</h4><ul><li>TOC analysis enables effective control of organic impurities in lithium carbonate.</li><li>Using the combustion tube kit for high-salt samples can extend the lifespan of the combustion tube and catalyst, reducing maintenance frequency.</li><li>With the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=ASI-L+autosampler">ASI-L autosampler</a>, multiple samples can be measured automatically, improving throughput and efficiency</li></ul>Lithium carbonate (Li2CO3) is an important material used in a wide range of applications in the lithium-ion battery industry. For example, it is used as a lithium source for cathode active material synthesis and electrolyte salt production, as a raw material for oxide-based solid electrolytes, and as a form of lithium commonly recovered in recycling processes.&nbsp;Because impurities in lithium carbonate can affect downstream processes and final products, appropriate control is essential. In particular, organic impurities require especially careful attention because they may originate from so many sources, such as solvents and processing aids used during purification, residual organics from manufacturing steps, or contamination introduced during handling and storage.&nbsp;Total organic carbon (TOC) analysis offers an effective way to manage such organic impurities in raw materials. This article presents an example of using a <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=TOC-L">Shimadzu TOC-L</a> total organic carbon analyzer (Fig. 1) to evaluate the TOC content of lithium carbonate.<h4>TOC Analysis&nbsp;</h4><h5>TOC Analysis Methods&nbsp;</h5>Two commonly used methods are available for TOC analysis:&nbsp;(1) TC - IC method: Total carbon (TC) and inorganic carbon (IC) are measured separately, and then TOC is calculated as the difference (TOC = TC – IC).(2) NPOC method: TOC is measured as non-purgeable organic carbon (NPOC). After acidifying the sample to pH &lt; 3, IC is subsequently removed by sparging and the remaining carbon is measured as TC, which is regarded as TOC. The acidification and sparging steps are performed automatically by the instrument.&nbsp;For lithium carbonate solutions, the amount of carbonatederived IC is typically very high. As a result, the TC–IC method tends to yield calculated TOC values with a larger relative error. Therefore, the NPOC method isrecommended.&nbsp;In lithium carbonate solutions prepared as described above, IC is expected to be present mainly as bicarbonate (HCO3 –) and carbonic acid (H2CO3). If IC is not fully removed during NPOC pretreatment, the TOC result may be overestimated. Therefore, thorough IC removal is critical for samples with high IC content. For actual samples, sparging parameters, such as sparge gas flow rate and sparge time settings, can be adjusted.&nbsp;<h5>Combustion Tube for High-Salt Samples&nbsp;</h5>The prepared lithium carbonate solution contains a large amount of salts. When a large number of salt-containing samples are analyzed, salts may accumulate inside the combustion tube, which can lead to catalyst clogging, reduced sensitivity, and poorer repeatability.For this analysis, the optional combustion tube for high-salt samples was used, shown in Fig. 2. The high-salt combustion tube has a larger diameter than the standard combustion tube and contains larger catalyst particles to help mitigate saltrelated clogging. Thus, the frequency of combustion tube replacement can be significantly reduced.<h4>Conclusion&nbsp;</h4>In this article, TOC analysis was performed for a 10 g/L lithium carbonate solution using a Shimadzu TOC-L total organic carbon analyzer. By measuring TOC in the prepared solution, the TOC content in the lithium carbonate solid was calculated. The results showed good recovery rates in the spike-recovery test and consistent performance was also confirmed during long-term continuous analysis. These findings demonstrate that the TOC-L is a reliable solution for measuring TOC in lithium carbonate and for effective management of organic impurities.&nbsp;When applying the NPOC method to lithium salt-containing solutions, careful selection of the acid is essential because salts formed during acidification can affect both data quality and instrument condition. For this example, sulfuric acid is recommended.In addition, using the optional combustion tube kit for high-salt samples can extend the lifespan of the combustion tube and catalyst, thereby reducing maintenance frequency. This option is especially helpful for samples with high salt concentrations.&nbsp;In addition to lithium carbonate, the TOC-L can also be applied to TOC analysis of lithium hydroxide solutions, determination of water-extractable TOC in recycled black mass, and analytical needs in lithium refining processes based on direct lithium extraction (DLE). With its broad applicability across various upstream materials, recycling streams, and refining processes, the TOC-L supports both quality control and process optimization operations throughout the lithium-ion battery value chain.<h3>3. Thermo Fisher Scientific: Evaluating Silicon using Raman Microscopy</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/vib_silicon_analysis_with_raman_microscope_app_note_mcs_an1232_en_11_2024_1887815_web_50639c9148.pdf">Full PDF for download</a></li></ul>Raman spectroscopy is a form of vibrational spectroscopy that probes chemical bonds and molecular structure and is sensitive to small changes in chemical and structural environments. The Raman spectrum of a material is a molecular “fingerprint” that can be used for identification of unknown materials and for characterizing and qualifying expected materials. Since intermolecular effects and lattice vibrations are also detected, it can be used to evaluate crystallinity. Mechanical phenomena such as strain can also be detected from peak shifts in Raman spectra. Raman imaging allows visualization of the distribution of components or changes in physical state across the sample.<h4>Silicon in aluminum&nbsp;</h4>Silicon is used in alloys with aluminum to increase the strength of lightweight aluminum-based parts. Addition of silicon to aluminum also alters the viscosity of melted aluminum, improving the castability. These alloys typically contain 3% to 25% silicon. While silicon and aluminum can form a eutectic mixture, it is common to have finely dispersed silicon particles throughout the material.¹ The size and distribution of silicon particles can affect the strength of the aluminum.&nbsp;One common example of an aluminum product, aluminum foil, is made up of almost pure aluminum (approximately 98.5%) but it does contain small amounts of silicon and iron.² Raman imaging of a piece of aluminum foil reveals small particles of silicon (Figure 1). A <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2237">Thermo Scientific™ DXR3xi Raman Imaging Microscope </a>was used with a 532 nm laser and a 100X&nbsp;metallurgical objective to collect the Raman imaging data. An area of 408 μm x 208 μm was imaged using an image pixel size of 1 μm. The Raman image, based on the 520 cm-1 peak of silicon, shows the spatial distribution of the particles and image analysis provides size and shape information. In this case, 81&nbsp;silicon particles were identified with a size (area) range of 6-151 μm². This analytical approach may be extrapolated to other types of Si/Al alloy parts.<h4>Conclusion&nbsp;</h4>The importance of silicon as a technologically significant material cannot be overstated. It has properties that make it useful in numerous different types of products. Raman micro-spectroscopy has proven itself an important tool for the assessment of molecular structure and physical states of silicon. Raman images provide a way to observe the spatial distribution of silicon and silicon-containing components, structural variations such as crystallinity, and physical effects such as strain. This note showed a few representative examples to illustrate some of the advantages offered by Raman microscopic analysis of silicon. The coverage is not intended to be comprehensive as there are numerous other areas where the Raman analysis of silicon is currently employed and other opportunities where it could be used. The Thermo Scientific DXR3 Raman Microscope and the Thermo Scientific DXR3xi Raman Imaging Microscope have both been shown to be excellent choices for the Raman analysis of silicon samples.<h3>4. Waters Corporation: High-Throughput Detection of Degraded Polysorbate in Biological Formulations with FMM</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/720009114_en_99c7483d1a.pdf">Full PDF for download</a></li></ul>The FDA requires that all biologic formulations be free of visible particles and has defined allowable levels of subvisible particles (SVPs) larger than 10 µm to ensure the potency, efficiency, and safety of these drug.1 While most protein drug particle analysis focuses on particles formed due to formulation instability, SVPs formed through the degradation of formulation excipients must also be considered.&nbsp;Polysorbates 20 (PS20) and 80 (PS80), best known as Tween-20 and -80, are excipients used in &gt;70% of marketed parenteral biological drugs to improve product stability and shelf life.2 However, when these formulations are stored for long periods of time (&gt;6 months) at low temperatures (4 °C), visible and subvisible particles are formed due to the enzymatic hydrolysis of the polysorbates by host cell proteins (HCPs) such as esterases and lipases.3,4 PS20 in particular has been found to be extremely prone to degrading into fatty acid particles.5 Lauric, myristic and palmitic acids are the most common fatty acid degradation products, and there is a direct correlation between low fatty acid solubility and particle formation in common formulation buffers.3–7 However, high-throughput, sensitive, and specific analysis of polysorbate particles has been difficult due to their complex chemistry and their low concentrations (&lt;&lt;0.5%) in high protein concentration (&gt;100–200 mg/mL) formulation environments, making it a perennial needle in a haystack problem.In this application note, we introduce the Aura™ polysorbate degradation assay, a specific and quantitative assay that detects free fatty acid particles (FFAs) formed during polysorbate degradation on Aura PTx System. The assay analyzes 96 samples using anywhere from 5 µL–10 mL of sample in a few hours. <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2190">Aura™ Systems</a> use backgrounded membrane imaging (BMI) and fluorescence membrane microscopy (FMM) to count, size and ID particles from 1 µm to 5 mm. Fluorescent labels utilized by FMM are selected based on thier ability to interact with particles of a certain nature, allowing for the generation of key information related to identity of the particles.<h4>Results and Discussion&nbsp;</h4><h5>Morphological Appearance of Different Fatty Acid Particles&nbsp;</h5>Aura systems image every particle, enables subvisible particle size distributions analysis, and makes morphological differentiation possible using built-in image analysis filters. When we analyze different free fatty acid solutions with Aura PTx System, we find that each forms particles with different morphological characteristics. Lauric acid particles are large and irregular clusters, myristic acid particles are small and oval shaped, and palmitic acid particles form fibril-like particles and small circular clusters (Figure 2a-c). These unique morphological characteristics suggest the presence of free fatty acid particles that can then be confirmed with FMM using labeled fluorescence.<h4>Conclusion&nbsp;</h4>Aura PTx System and <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2190">Aura+ System</a> can easily detect the major degradation components of PS20 in proteincontaining samples at any stage of the drug manufacturing process. The method only requires 5 µL of sample, is specific and sensitive, and can analyze 96 samples in just a few hours, far outperforming other techniques. Aura PTx System and Aura+ System can also identify and differentiate the key degraded particulates from polysorbate formulation by their distinguishable shape, appearance, and specific labeling with BODIPY FL C16. The Aura polysorbate assay can detect FFAs at concentrations relative to lauric acid above 9.38 µM (&gt;2183 counts/mL) and quantitate above 18.75 µM (&gt;2976 counts/mL).

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Thermo Scientific MSA-330 Multi-Stream Slurry XRF Analyzer

Thermo Scientific MSA-330 (XRF) analyzer delivers elemental analysis (Ca–U) for up to 12 slurry streams, eliminating cross-contamination, with low operational cost and easy maintenance.

The Thermo Scientific™ MSA-330 Multi-Stream Slurry XRF Analyzer provides reliable, flexible, cost-effective elemental analysis for up to 12 slurry streams, delivering information for the monitoring and control (manual or automatic) of mineral beneficiation circuits. Keeping each stream in a separate analysis zone, it eliminates cross-contamination without any need for a multiplexer or demultiplexer, minimizing head loss and plant elevation requirements. Use the MSA-330 to monitor feed, concentrate and tailings grades, to drive up process efficiency, improve metal recovery, optimize reagent consumption, and reduce costs.The MSA-330 quantifies % solids and up to 20 elements for between 3 and 12 slurry streams according to a predefined schedule to deliver real-time process trend information for monitoring and control.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_MSA_330_Multi_Stream_Slurry_XRF_Analyzer_56ef33bd34.jpg" alt="Thermo Scientific™ MSA-330 Multi-Stream Slurry XRF Analyzer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_MSA_330_Multi_Stream_Slurry_XRF_Analyzer_56ef33bd34.jpg 156w," sizes="100vw" width="650" height="650"><h3>Key features include:</h3><ul><li>Capability to measure and provide composite samples for 3 to 12 slurry streams, for flexible, cost-efficient process monitoring.</li><li>Dedicated, separate path for each process stream, from sample point to sample discharge, for the elimination of cross-contamination and simplified sample return.</li><li>Low head design simplifies sample transport design and is advantageous for gravity feed or return of samples to the process.</li><li>Advanced energy dispersive X-ray detector, for accurate measurement from calcium to uranium with integrated Peltier cooler for reliable, trouble-free operation over a wide range of in-plant environmental conditions.</li><li>Cross-cut sampler for each stream provides sampling for analyser calibration and composite samples.</li><li>Optional vacuum filter station available for each of the composite samplers.</li><li>When fed from a SamStat30C, the dedicated cross-cut samplers in the MSA-330 can be used to acquire composite samples for material balancing and accounting purposes.</li><li>No multiplexer or demultiplexer delivers a flow head space solution, lowering implementation and operational costs for a centralized analyser system.</li><li>High flow capability, for handling the full flow of low flowrate process streams, eliminating additional costs associated with a sampler and sample delivery system. 300mm wide tank as standard with larger sizes available for higher flow rates.</li></ul>

Thermo Scientific ARL EQUINOX 100 X-ray Diffractometer

The ARL EQUINOX 100 is a compact benchtop XRD for QC, research, and routine use. It captures full diffraction patterns in real time with a CPS detector — no moving parts or scanning needed.

<h4>Compact, powerful, and flexible benchtop XRD system for routine and advanced applications</h4>The ARL EQUINOX 100 is a compact benchtop X-ray diffractometer (XRD) designed for quality control, academic research, and routine analysis. It features a unique curved position-sensitive (CPS) detector that enables real-time acquisition of the entire diffraction pattern — with no moving parts and no scanning required.<h3>Key Features</h3><ul><li>Real-time acquisition: entire diffraction pattern captured in seconds</li><li>Wide angular range: up to 110° 2θ without moving components</li><li>No external water cooling: no chiller required</li><li>Standard power outlet: plug-and-play with no special electrical setup</li><li>Low-power microfocus X-ray source: high intensity and efficient optics</li><li>Versatile measurement: reflection and transmission modes</li><li>Easy installation: suitable for labs, mobile labs, and field vans</li></ul><h3>Sample Handling &amp; Accessories</h3><ul><li>Fixed non-spinning sample stage</li><li>Spinning stages for powders, bulks, filters, and pressed pellets</li><li>Capillary sample stage for transmission mode</li><li>Controlled atmosphere sample stage</li><li>6-position automatic sample changer</li><li>Dedicated stage for thin film analysis (GIXRD, XRR)</li><li>Temperature-controlled stages (–10 °C to 500 °C)</li></ul><h3>Typical Applications</h3><ul><li>Phase identification and quantification</li><li>Degree of crystallinity, crystallite size, and lattice parameters</li><li>Crystal structure solutions and Rietveld refinement</li><li>Thin film characterization (GIXRD, XRR)</li><li>In-situ and dynamic studies (e.g., phase transitions)</li><li>Fields: materials science, geology, nanomaterials, chemistry, pharmaceuticals, metallurgy, teaching</li></ul><h3>Software &amp; Compliance</h3><ul><li>SolstiX™ XRD Software with 21 CFR Part 11 compliance</li><li>Electronic signatures, audit trails, secured data handling — ideal for pharmaceutical QA/QC environments</li></ul><h3>Why Choose ARL EQUINOX 100?</h3><ul><li>Simultaneous, real-time data acquisition</li><li>Compact, rugged, and mobile-ready design</li><li>High performance at low operating cost</li><li>Flexible platform for a broad range of samples and applications</li></ul>

Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat

Streamline slurry analysis with the Thermo Scientific™ MEP-300 probe—no liquid nitrogen needed. Replaces MEP/MEP-200 and features SDD technology for reliable, high-performance XRF results.

<h4>Enhance XRF Slurry Analysis with the Thermo Scientific™ MEP-300 Multi-Element Probe – No Liquid Nitrogen Required</h4>Streamline elemental analysis of slurries with the Thermo Scientific™ MEP-300 Multi-Element Probe, designed to eliminate the need for liquid nitrogen while improving performance and reliability. Developed as a direct replacement for earlier MEP and MEP-200 immersion probes used in <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2027">AnStat </a>and <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2004">MSA</a> X-ray analyzer systems, the MEP-300 leverages advanced Silicon Drift Detector (SDD) technology for superior results in demanding industrial environments.<h3>Why Choose the MEP-300 Probe?</h3><h4>Advanced SDD Technology</h4><ul><li>Operates without cryogenic cooling</li><li>Delivers lower detection limits and improved analytical accuracy</li><li>Achieves higher count rates, reduced background, and wider field of view</li><li>Demonstrated stability under shock and vibration, ideal for on-line industrial use</li><li>No special storage or handling required</li></ul><h4>Occupational Health &amp; Safety</h4><ul><li>No liquid nitrogen, eliminating associated hazards</li><li>Enhanced radiation safety with:<ul><li>Automatic source retraction on window rupture or probe lift</li><li>Fail-safe, spring-loaded design to withdraw the source on power loss</li><li>High-visibility beacon for status and alarm indication</li></ul></li></ul><h4>Optimized Maintenance &amp; Operations</h4><ul><li>Zero ongoing cost for liquid nitrogen</li><li>Lower cost of spare parts</li><li>Field-repairable detector — no need to return to the factory</li><li>Easy-to-replace modules and cable assemblies</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg" alt="Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg 192w," sizes="100vw" width="1374" height="1116"><h3>Specifications</h3><ul><li>Air Requirements:&nbsp;<ul><li>Instrument Air: ANSI ISA-S7 0 0-1996 (clean and dry to 0.1 microns with dew point &lt;2°C)</li><li>Air Pressure: 550 kPa nominal – 1000 kPa maximum</li></ul></li><li>Certifications/Compliance: CE, ICES 001, CSA, FCC Part 15B and RCM AS/NZS CISPR11</li><li>Electrical Requirements:&nbsp;<ul><li>Three Phase 48 to 62 Hz. Max 2.5kVA Neutral not required.</li><li>Identical power requirements to previous generation products.</li><li>Any of the standard three phase voltages used in the world mining industry in the range 380–600 Volts AC may be factory or field selected.</li><li>Variation should not exceed ±10% of the nominal voltage selected.</li></ul></li><li>Operating Temperature:&nbsp;<ul><li>Ambient -10°C to +55°C (measured at enclosure surface temperature, temperature to not exceed 55°C)</li><li>Process Fluid: 0°C to 45°C, Check with factory for higher temperature options</li></ul></li><li>Type: MEP-300 Upgrade Package for MSA and AnStat</li><li>Unit Size: Each</li></ul>

Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer

The Thermo Scientific™ ARL™ EQUINOX 1000 enables ultra-fast XRD with a unique curved detector capturing all diffraction peaks at once, delivering complete analysis in just minutes.

The Thermo Scientific™ ARL™ EQUINOX 1000 offers very fast measurements compared to other diffractometers due to our unique EQUINOX curved detector that can measure all diffraction peaks simultaneously across a wide angular range. It will take you just a few minutes on most samples to get a complete analysis regardless of your resolution requirements.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg 245w," sizes="100vw" width="800" height="361">The ARL EQUINOX 1000 is a rugged multi-purpose benchtop style instrument designed for QA/QC, academic and routine X-ray diffraction applications. The ARL EQUINOX 1000 is the perfect instrument when space becomes a priority. With its truly excellent performance it is the perfect match for laboratories that are looking for a simple and powerful benchtop X-ray diffractometer. Several sample holders are available on this instrument such as a 6 or 30 positions sample holder, powder transmission mode sample holders, small thin film sample attachment.<ul><li>Real time acquisition</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg 245w," sizes="100vw" width="1074" height="286"><ul><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement on small samples? Try our Small Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Silver Behenate powder sample recorded on EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg 245w," sizes="100vw" width="871" height="450"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Si powder sample recorded on ARL EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg 245w," sizes="100vw" width="871" height="452"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Cu, Co - Standard sealed X-ray tube</li><li>Detector: Curved Position Sensitive X-ray Detector, CPS 180 Curvature radius: 180mm Acquisition in real time over 110° 2Theta</li><li>Goniometric table: No moving parts: acquisition in asymmetric mode</li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Zero background sample cup&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Optic: Monochromatic (Germanium, Graphite)</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase indentification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60Hz</li><li>Weight: ~90 kg</li><li>Cooling water:&nbsp;<ul><li>Flow: ~3,5l/min&nbsp;</li><li>T°C: ~18 / 25°C</li></ul></li><li>Dimensions: 996 mm H x 715 mm D x 750 mm W</li></ul>

Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer

Thermo Scientific ARL EQUINOX 3000 XRD: real-time acquisition, no scanning, superb resolution, versatile sample handling, reliable and easy to use for research and industry.

The Thermo Scientific™ ARL™ EQUINOX 3000 measurements are very fast compared with other diffractometers in that the unique Inel curved detector can measure all diffraction peaks simultaneously. Due to this acquisition in real time, all kinetic studies are facilitated.The Thermo Scientific™ ARL™ EQUINOX 3500 is an evolution of ARL EQUINOX 3000 model. It is exactly the same configuration except that it works with a bigger radius of curvature detector. So, obtained data have a better resolution.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg 222w," sizes="100vw" width="790" height="556">The ARL EQUINOX 3000 is a a research-grade diffractometer with a very high resolution diffraction system providing the user a choice of features including higher resolution detectors, a larger sample area and choice of X-ray sources.The free space in the sample compartment is very large and will accommodate practically any sample and any sample handling device including furnaces, auto samplers, large assemblies, etc.<ul><li>Real time acquisition</li><li>Extremely accurate</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs. &nbsp;</li><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement? Try our Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: HTK1200N, TTK450." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg 245w," sizes="100vw" width="1228" height="336"><ul><li>This system allows you to work with controlled temperature or atmosphere chamber. Anton Paar and other suppliers chambers can be availabledepending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: LaB6 powder sample recorded on ARL EQUINOX 3000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg 245w," sizes="100vw" width="850" height="334"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Standard sealed X-ray tube: Cu, Co, Mo, ... radiation</li><li>Detector:&nbsp;<ul><li>Curved Position Sensitive X-ray Detector, CPS120&nbsp;</li><li>Curvature radius: 250mm&nbsp;</li><li>Acquisition in real time over 120° 2Theta&nbsp;</li><li>Option: CPS590 (500mm, 90° 2Theta – EQUINOX 3500)</li></ul></li><li>Goniometric table:&nbsp;<ul><li>No moving parts&nbsp;</li><li>Acquisition in asymmetric mode</li></ul></li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Special camera:&nbsp;<ul><li>Heating camera: low and high temperature&nbsp;</li><li>Humidity chamber, Electrochemistry cell</li></ul></li><li>Optic: Monochromatic</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase identification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Transition phase&nbsp;</li><li>Thin film (reflectometry, etc.)&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60 Hz</li><li>Cooling water: Flow: ≈ 3,5 L/min - T°C: ≈18 to 25 °C</li><li>Dimensions:&nbsp;<ul><li>1565 mm H x 750 mm D x 1040 mm W EQUINOX 3000&nbsp;</li><li>1815 mm H x 744 mm D x 1206 mm W EQUINOX 3500</li></ul></li></ul>

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Thermo Scientific ARL X’TRA Companion X-ray Diffractometer

Thermo Scientific™ ARL™ X’TRA Companion is a benchtop θ/θ Bragg–Brentano X-ray diffractometer for routine QC. 600 W (Cu/Co), pixel detector (55 × 55 µm), one-click Rietveld, ±0.02° accuracy.

The Thermo Scientific™ ARL™ X’TRA Companion is a θ/θ Bragg–Brentano benchtop X-ray diffractometer designed for routine process and quality control applications. The system combines high analytical performance with robust mechanical construction and intuitive software operation.The instrument is based on a vertical θ/θ Bragg–Brentano geometry (160 mm radius) and is suitable for qualitative and quantitative XRD analysis of polycrystalline materials. It operates at 600 W using copper or cobalt radiation, with an optional integrated water chiller available.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_10_4ec7dc4708.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Schema of the geometry of the θ/θ goniometer." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_10_4ec7dc4708.jpg 245w," sizes="100vw" width="1338" height="626">Fast and resolute data acquisition is enabled by a state-of-the-art solid-state pixel detector (55 × 55 µm pitch). One-click Rietveld refinement based on a fundamental parameter approach ensures robust and reproducible phase quantification. Automated result transmission to LIMS is supported.The system is fully shielded in accordance with international X-ray safety regulations and designed for stable operation even in environments exposed to vibration.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_3_b426717a92.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_3_b426717a92.jpg 221w," sizes="100vw" width="1153" height="814"><h3>Key Features</h3><ul><li>θ/θ Bragg–Brentano geometry (160 mm radius)</li><li>600 W operation (Cu or Co radiation)</li><li>Solid-state pixel detector (55 × 55 µm pitch)</li><li>One-click Rietveld quantification (fundamental parameter approach)</li><li>Automated result transmission to LIMS</li><li>Mechanical slits, Soller slits and variable beam knife for precise beam collimation</li><li>Ultra-compact θ/θ goniometer with stepper motors and optical encoders</li><li>Modular design with exchangeable pre-aligned sample stages</li><li>Optional 6-position sample changer (φ 51.5 mm; optional φ 40 mm)</li><li>Angular accuracy better than ±0.02° over full 2θ range</li><li>Angular resolution &lt; 0.04° FWHM (standard configuration)</li><li>Shielded cabinet with lead glass windows, flushing lamps and safety interlocks</li><li>Robust construction resistant to shock and vibration</li><li>Data combination capability with XRF results</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_11_fa2374532a.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: An angular accuracy better than ± 0.02° over the whole 2θ range guarantees optimal instrument alignment to support accurate and reliable analysis. Test with a Si powder." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_11_fa2374532a.jpg 238w," sizes="100vw" width="872" height="573"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_12_ec8343a5a4.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: An angular resolution &lt; 0.04° FWHM can be measured easily in standard configuration. Test with a LaB₆ powder." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_12_ec8343a5a4.jpg 215w," sizes="100vw" width="870" height="630"><h4>Analysis of Cement Clinker according to ASTM C1365</h4>A clinker sample was measured (21 x 10 min) and a Rietveld fit was carried out consecutively using a fundamental parameter approach. Comparing standard deviations calculated from the repetitive refinements with limits given by ASTM C1365 clearly shows that results are in good agreement with the norm, as determined by considering C3A total and C3S total.The ARL X’TRA Companion XRD yields data in compliance with ASTM C1365 norm for analyzing clinker samples. The one-click Rietveld refinement based on a fundamental parameter approach is an extremely robust method with high reproducibility which yields accurate results even for C3S M1 and M3. This makes clear the ARL X’TRA Companion is the perfect solution for any process control tasks in the cement industry.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_6_0d10ca1dc4.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Results of the 21 consecutive refinements of clinker (values in weight percent)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_6_0d10ca1dc4.jpg 245w," sizes="100vw" width="1159" height="465"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_7_8da3de0f8e.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Rietveld fit of clinker (10 min acquisition)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_7_8da3de0f8e.jpg 170w," sizes="100vw" width="872" height="801"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_8_9aad68624e.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Rietveld fit of clinker (29-35° 2θ)." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_8_9aad68624e.jpg 169w," sizes="100vw" width="868" height="800"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_9_c7ceefee8d.jpg" alt="Thermo Scientific ARL X’TRA Companion X-ray Diffractometer: Measurement of clinker (55-61° 2θ). Fit for C3S M1 (purple) and C3S M3 (green) explains intensity and shape of the reflections well." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_X_TRA_Companion_X_ray_Diffractometer_9_c7ceefee8d.jpg 211w," sizes="100vw" width="871" height="643">

Products from category X-Ray - page 1

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