In the week from February 9, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry<blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars">👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</a></h4>👉 Search and filter in the largest global database with over 5 000 GC, LC, MS and spectroscopy webinars.</blockquote><h5>1. Thermo Fisher Scientific: Process Raman – A Reliable and Versatile Tool for Downstream Process Monitoring and Control for mAb Production</h5><ul><li>Tu, 10.2.2026 16:00 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5808">Registration</a></li></ul>The presentation highlights how process Raman spectroscopy offers several advantages over traditional in-line UV-Vis analysis for process monitoring and metabolite production control.<h5>2. Bruker: Meet Compact-Q DEER Spectrometer – Your Gateway to Quantum Innovation</h5><ul><li>Tu, 10.2.2026 17:00 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5757">Registration</a></li></ul>Discover how the Compact-Q DEER spectrometer enables high-fidelity qubit characterization and control, combining advanced microwave architecture, AWGs, and cryogen-free operation.<h5>3. Agilent Technologies: Novel Advancements in Trace Level Determination and Long-Term Stability of Metals in TMAH and UPW Matrices</h5><ul><li>Tu, 10.2.2026 21:30 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/3733">Registration</a></li></ul>Explore novel approaches for trace-level metal determination and long-term stability assessment in TMAH and ultrapure water matrices.<h5>4. AZoM: From First to Best – Introducing the Litesizer DIF Series</h5><ul><li>We, 11.2.2026 15:00 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5765">Registration</a></li></ul>Join this live webinar introducing the new Litesizer DIF series of laser diffraction particle size analyzers.<h5>5. Anton Paar: Polymer Rheology – Rotational and Transient Measurements on a Polymer Melt</h5><ul><li>We, 11.2.2026 18:00 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5786">Registration</a></li></ul>Learn how rotational and transient viscosity measurements on rotational rheometers reveal polymer melt flow behavior, from method setup and accessories to data interpretation.<h5>6. Milestone: Practical Guidance to Improve the Journey from Sample to Heavy Metals Analysis for Environmental Labs</h5><ul><li>Th, 12.2.2026 16:00 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5803">Registration</a></li></ul>Improve heavy metals analysis in environmental laboratories with practical tips on reagents, filtration, cleaning, and workflow optimization to enhance data quality and efficiency.<h5>7. Agilent Technologies: Moving from R&amp;D and Limited QC on a UV-Vis-NIR Instrument to Large-Scale QC Using an Autosampler</h5><ul><li>Th, 12.2.2026 20:00 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/2104">Registration</a></li></ul>This presentation covers key aspects of adding and using an autosampler to maximize UV-Vis-NIR QC workflows when scaling from R&amp;D to routine quality control.

Webinars LabRulezICPMS Week 07/2026

LA-ICP-MS imaging, particularly in TOF mode, provides rapid, high-resolution elemental maps of complex geological materials, but quantitative accuracy is often limited by heterogeneous mineralogy. This study introduces a workflow using UMAP for unsupervised dimensionality reduction combined with k-means clustering to segment mineral phases directly from per-pixel elemental data.Cluster compositions are matched to known minerals based on stoichiometry, allowing phase-specific normalization and reducing quantification errors by up to 60%. Validated on dawsonite-bearing sandstones, the approach enables consistent phase-resolved geochemical comparisons across depth profiles and establishes UMAP as a practical tool for accurate, interpretable multielement imaging.<blockquote><h4>The original article</h4><h4><a target="_blank" rel="noopener noreferrer" href="https://pubs.acs.org/doi/10.1021/acs.analchem.5c05398">Mineral Phase-Resolved Quantification in LA-ICP-MS Imaging</a></h4>Barbara Umfahrer, Jakub Buday, Pavel Pořízka, Jozef Kaiser, Paolo S. Garofalo*, and Detlef Günther*Anal. Chem. 2026, 98, 1, 581–589<a target="_blank" rel="noopener noreferrer" href="https://doi.org/10.1021/acs.analchem.5c05398">https://doi.org/10.1021/acs.analchem.5c05398</a><h6>licensed under <a target="_blank" rel="noopener noreferrer" href="https://creativecommons.org/licenses/by/4.0/">CC-BY 4.0</a></h6></blockquote>Selected sections from the article follow. Formats and hyperlinks were adapted from the original.Since its introduction in 1985, <a href="javascript:void(0);">(1)</a> Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry (LA-ICP-MS) has matured into a routine technique for both qualitative and quantitative elemental analysis, finding use in diverse fields such as geology, <a href="javascript:void(0);">(2−4)</a> biology, <a href="javascript:void(0);">(5,6)</a> materials science, <a href="javascript:void(0);">(7)</a> and cultural heritage. <a href="javascript:void(0);">(8,9)</a> Especially in comparison to liquid analysis techniques, the method excels through minimal sample preparation, negligible sample destruction, and low limits of detection, which enable trace element analysis. However, besides the availability of standard reference materials, a longstanding challenge of quantitative LA-ICP-MS is the need for a suitable internal standard to account for variations in ablation rate and transport efficiency, as well as instrumental drift. <a href="javascript:void(0);">(10)</a> Developed for applications in geological matrices, this requirement was elegantly circumvented by Liu et al. <a href="javascript:void(0);">(11)</a> through 100 wt % normalization, which assumes that all detected elements form oxides summing up to 100 wt %. This approach was conceptually inspired by the summed-spectrum normalization calibration procedure introduced by Leach and Hieftje in 2000, which emphasized the use of total signal intensities for robust internal standardization. <a href="javascript:void(0);">(12)</a> The 100 wt % normalization strategy was subsequently extended to the bulk analysis of carbonates. <a href="javascript:void(0);">(13)</a>Concurrently, the advent of time-of-flight (TOF) mass analyzers and the development of fast-washout laser ablation cells <a href="javascript:void(0);">(14−16)</a> have transformed LA-ICP-MS into a powerful imaging tool, capable of generating spatial maps across a variety of sample matrices at high data acquisition rates. <a href="javascript:void(0);">(17−19)</a> Furthermore, in comparison to, e.g., X-ray fluorescence spectroscopy (XRF) or Scanning Electron Microscopy with Energy-Dispersive X-ray Spectroscopy (SEM-EDS), LA-ICP-MS offers a high depth resolution of approximately 0.2 μm on glass, enabling precise measurement of fine-scale structures not only laterally but also in depth. <a href="javascript:void(0);">(18)</a> However, as the volume and complexity of these elemental images have grown according to the progressive advancement of the method itself, now consisting of gigabytes of data produced within minutes, manual data interpretation has become increasingly impractical. To uncover meaningful details and patterns, researchers have applied multivariate methods such as Principal Component Analysis (PCA) and k-means clustering to reduce dimensionality and delineate distinct regions within the images. <a href="javascript:void(0);">(20−23)</a> The nonlinear dimensionality reduction technique Uniform Manifold Approximation and Projection (UMAP), <a href="javascript:void(0);">(24)</a> which supports data interpretation with its capability to capture and separate subtle local structures, has first been employed to LA-ICP-MS bulk analysis data in 2024, where it was used to classify pyrite samples and discriminate between Pb and Zn deposit types. <a href="javascript:void(0);">(25,26)</a> In combination with elemental imaging, UMAP has recently been applied to biological tissue data sets as an exploratory analysis tool, <a href="javascript:void(0);">(27)</a> further enhancing the ability to visualize and interpret complex elemental distributions.Despite these advances, no existing approach combines the unsupervised segmentation of mineral phases by UMAP with phase-specific normalization. In this study, we introduce a UMAP-driven workflow that (1) automatically segments distinct mineralogical phases within fine-grained geological matrices and (2) applies phase-specific 100 wt % normalization (e.g., oxide <a href="javascript:void(0);">(11)</a> or carbonate <a href="javascript:void(0);">(13)</a>), thereby improving quantification accuracy and enabling phase-specific quantitative interpretation of mineral distributions in complex matrices.<h4>Materials and Methods</h4><h5>LA-ICP-TOFMS Imaging</h5>LA-ICP-TOFMS analyses were performed using a 193 nm ArF excimer laser (GeoLas C, Lambda Physik, Göttingen, Germany) coupled to an ICP-TOFMS instrument (icpTOF 2R, TOFWERK AG, Thun, Switzerland). Ablation was conducted in the modified parallel flow ablation cell (MPFAC) <a href="javascript:void(0);">(16,34)</a> under a He atmosphere (99.999%, Linde Gas Schweiz AG, Dagmersellen, Switzerland) with Ar (99.996%, Linde Gas Schweiz AG) used as the carrier gas. A piezoelectrically driven xyz translational stage (1 nm resolution, SmarAct GmbH, Oldenburg, Germany) enabled precise sample positioning. Laser, stage movement, and ICP-TOFMS data acquisition were synchronized using a custom-built imaging control system. <a href="javascript:void(0);">(19)</a> The system was optimized each day based on maximum sensitivity while ensuring a 238U+/232Th+ intensity ratio of 1.0 to 1.1 on NIST SRM 610 and a 232Th16O+/232Th+ rate of below 0.5%.<h5>LIBS Imaging</h5>The LIBS analyses were performed on a Firefly system (Lightigo, Czech Republic). The laser (1064 nm, 5 mJ, pulse duration ∼10 ns, diameter 6 mm, operating at 50 Hz) was focused on the sample with a singlet lens (focal length 50 mm) to a 30 μm spot. The spatial resolution of the acquired elemental maps, with a size of about 16 mm × 26 mm, was 20 μm. Plasma radiation is collected by a multifiber configuration with a collimator and an optical fiber (400 μm core diameter), which delivered the light to several Czerny–Turner spectrometers (resolution 0.25–0.4 nm). The spectral range of the spectrometers is 180–850 nm. The radiation is collected 1.5 μs after ablation, with a gate width of 15 μs.Data processing was done with Python 3.11.8 in the Spyder environment and included background correction and per-pixel z-score normalization.<h4>Results and Discussion</h4><h5>LIBS and XRD Measurements</h5>To assess whether carbonate-based normalization <a href="javascript:void(0);">(13)</a> is warranted, first, large-scale LIBS elemental intensity maps of the samples across about a third of the thin sections were acquired. <a target="_blank" rel="noopener noreferrer" href="https://pubs.acs.org/doi/10.1021/acs.analchem.5c05398#fig1">Figure 1</a> reveals the results for “Layer 2” of the Poggio del Gatto sandstone for selected elements. A complete mapping of all four thin sections can be found in <a target="_blank" rel="noopener noreferrer" href="https://pubs.acs.org/doi/suppl/10.1021/acs.analchem.5c05398/suppl_file/ac5c05398_si_001.pdf">Figures S3 and S6</a> in the Supporting Information. The maps reveal that C is strongly enriched in fracture veins as well as in finer-grained domains within the matrix and correlates with Ca, indicating carbonate minerals rather than oxides. Bulk XRD analysis identifies calcite alongside quartz, plagioclase, white mica, and kaolinite. These complementary observations confirm calcite as a major phase and thus justify the need for performing the 100 wt % normalization on a carbonate basis for pixels representing calcite.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Anal_Chem_2026_98_1_581_589_Figure_1_LIBS_elemental_intensity_maps_of_the_data_set_from_Layer_2_of_the_Poggio_del_Gatto_sandstone_mounted_on_a_microscope_slide_73ada1b7b8.jpg" alt="Anal. Chem. 2026, 98, 1, 581–589: Figure 1. LIBS elemental intensity maps of the data set from “Layer 2” of the Poggio del Gatto sandstone mounted on a microscope slide, depicting calcite veins and fine-grained structures within the matrix, underlining the need for carbonate-based normalization for specific pixels. Emission lines for evaluation are shown in the corresponding subfigure title. The epoxy used to fix the thin section on the slide is visible along the margin." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Anal_Chem_2026_98_1_581_589_Figure_1_LIBS_elemental_intensity_maps_of_the_data_set_from_Layer_2_of_the_Poggio_del_Gatto_sandstone_mounted_on_a_microscope_slide_73ada1b7b8.jpg 245w," sizes="100vw" width="2088" height="414"><h5>Renormalization Based on Carbonates</h5>Applying an oxide-based normalization to carbonate samples will introduce composition-dependent biases that cannot immediately be generalized as a singular numerical value. The difference between the molecular masses of carbonate CO32– and its oxide equivalent O2– yields an intrinsic bias on the order of a factor of about two, depending on the stoichiometry. Once this data is renormalized to a total of 100 wt %, the magnitude of the error becomes highly dependent on the specific elemental composition of the sample. An exemplary calculation illustrating this effect for a representative calcite pixel is provided in <a target="_blank" rel="noopener noreferrer" href="https://pubs.acs.org/doi/suppl/10.1021/acs.analchem.5c05398/suppl_file/ac5c05398_si_001.pdf">Table S2</a>, yielding a relative error of 79%. In practice, this error varies across the image according to the local phase composition. <a target="_blank" rel="noopener noreferrer" href="https://pubs.acs.org/doi/10.1021/acs.analchem.5c05398#fig6">Figure 6</a> illustrates the impact of normalization approaches for layer 2 of the samples as well as the spatial distribution of the resulting relative error. The figure presents Ca and Si elemental maps in two rows, while the first three columns compare different normalization strategies: normalization based on all oxides, normalization based on all carbonates, and a pixel-wise normalization guided by mineral phase identification, as outlined in the workflow proposed in this study. The final column displays the relative error between the bulk oxide- or carbonate-based normalization and the pixel-wise, phase-informed normalization.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Anal_Chem_2026_98_1_581_589_Figure_6_Comparison_of_normalization_strategies_for_Ca_and_Si_LA_ICP_TOFMS_elemental_maps_in_Layer_2_ce3a0c1a5c.jpg" alt="Anal. Chem. 2026, 98, 1, 581–589: Figure 6. Comparison of normalization strategies for Ca and Si LA-ICP-TOFMS elemental maps in “Layer 2” of the Poggio del Gatto sandstone. Rows show Ca (top) and Si (bottom); columns compare (1) oxide-based normalization, (2) carbonate-based normalization, (3) pixel-wise, phase-informed normalization (this study), and (4) relative error between the first two and the phase-informed approach." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Anal_Chem_2026_98_1_581_589_Figure_6_Comparison_of_normalization_strategies_for_Ca_and_Si_LA_ICP_TOFMS_elemental_maps_in_Layer_2_ce3a0c1a5c.jpg 202w," sizes="100vw" width="2088" height="1622">For Ca (in this matrix primarily associated with calcite, a dominant carbonate phase in our samples), the relative error depicted quantifies the effect of applying oxide-based normalization across the entire image. This results in a systematic overestimation of the Ca concentration by approximately 60%. Conversely, for Si─in this matrix found mainly in quartz and various plagioclase phases─the error is shown for applying carbonate-based normalization across an oxidic matrix. In such cases, the Si concentrations are underestimated by roughly 10% to 40%, depending on the mineral phase.These findings highlight that using a single normalization scheme across heterogeneous samples introduces substantial quantification errors. To mitigate this, the pixel-wise phase segmentation enabled by the proposed UMAP-based workflow offers a significant advantage, especially in fine-grained matrices. In short, phase-aware, pixel-wise normalization combines the strengths of both normalization approaches and proves to be highly beneficial.<h4>Conclusion</h4>This study demonstrates that phase-specific normalization, guided by unsupervised phase segmentation of LA-ICP-MS images, can substantially improve the accuracy of elemental quantification in fine-grained geological matrices. Rather than relying on a single global assumption (e.g., all oxides or all carbonates), the workflow adapts normalization to the actual mineralogy, minimizing systematic errors and enabling phase-resolved geochemical interpretation.The segmentation step, based on UMAP embedding and k-means clustering, is fully unsupervised. However, the subsequent matching of clusters to specific minerals still relies on a limited set of preidentified stoichiometries and is therefore not yet fully unsupervised. Expansion to larger stoichiometric databases could help overcome this limitation and move toward automated mineral classification. A key challenge remains the similarity of cation ratios in certain mineral groups, which may still require complementary data to ensure robust assignments.Overall, beyond the specific case of the Poggio del Gatto sandstone presented in this study, this work provides a framework for quantitative elemental imaging of complex geological samples and is readily transferable to other contexts that require spatially resolved composition-aware normalization. This contribution adds a practical implementation to a growing literature that already uses multivariate statistics to unlock the immense information depth of LA-ICP-TOFMS.

Mineral Phase-Resolved Quantification in LA-ICP-MS Imaging

Eurachem and CITAC welcome analysts interested in the evaluation of chemical analysis uncertainty and in how to use this information in results interpretation. The Eurachem Week 2026 will begin with a training course on “Evaluation of the measurement uncertainty from in-house precision and recovery data” scheduled for Sunday, 10 May 2026. A two-days workshop on “Quality in Analytical Measurements: Uncertainty Evaluation and Results Interpretation” open to all interested participants will take place from 11 to 12 May 2026. On 13 May 2026, the Eurachem Working Groups will convene, followed by the Eurachem General Assembly, which will bring together the Executive and national delegates on 14 and 15 May. Both Working Group Meetings and the General Assembly are restricted to their members.The results of qualitative and quantitative chemical analyses should have an acceptable uncertainty, which should ideally be reported and considered in results interpretation.For many analytical applications, simplified uncertainty evaluations can determine uncertainty values that meet the defined requirements for this parameter. The workshop will focus on the key technical challenges involved in practical evaluations of measurement uncertainty based on precision and recovery data gathered during in-house method validation and quality control. There will be a discussion of how to model the variation of the measurement uncertainty within the analytical range and how to handle divergent recovery values from the analysis of various reference materials. A session on the use of measurement uncertainty in conformity assessment will explore how the risk of false conformity decisions can be managed.<blockquote><h5>New Eurachem guidance on using in-house precision and recovery data will be discussed at the workshop.</h5></blockquote>Topics will also include the validation and uncertainty evaluation for qualitative analyses with particular attention to current accreditation requirements for these types of analysis. The last session of the workshop will be dedicated to the evaluation of measurement uncertainty arising from sampling and using it to judge the fitness for purpose, and hence validation, of measurement procedures that include sampling. Four sessions of the workshop will include engaging breakout sessions where participants will have the chance to share their views about challenging aspects of the analytical work. Participants are invited to propose posters and oral communications on session topics or any other relevant topic for analytical chemists or stakeholders of the analytical work.<h3>Registration</h3><blockquote>👉<a target="_blank" rel="noopener noreferrer" href="https://conferences.chemistry.pt/register/eurachem2026">Register here for the workshop</a></blockquote><h4>Registration Fees</h4><h5>Early bird (EUR) - Until April 15th</h5><ul><li>Workshop: Regular participant (11 &amp; 12 May 2026): 400 EUR</li><li>Workshop: Student (11 &amp; 12 May 2026): 250 EUR</li><li>Eurachem Working Group1 (13 May 2026): 75</li><li>General Assembly2 (14 &amp; 15 May 2026): 250</li><li>Training On Uncertainty Evaluation3 (10 May 2026): 150</li></ul><h5>After April 15th</h5><ul><li>Workshop: Regular participant (11 &amp; 12 May 2026): 450 EUR</li><li>Workshop: Student (11 &amp; 12 May 2026): 300 EUR</li><li>Eurachem Working Group1 (13 May 2026): 100</li><li>General Assembly2 (14 &amp; 15 May 2026): 300</li><li>Training On Uncertainty Evaluation3 (10 May 2026): 200</li></ul><blockquote>§ - 50 EUR reduction for members of Eurachem, CITAC, SPQ, RELACRE, ForMEQ and SPMet at the workshop.10% reduction for organisations that registered more than one participant.1 - Working group members2 - Eurachem members3 - 50% reduction for workshop participants</blockquote><h3>Workshop</h3><h4>Eurachem/CITAC Workshop on Quality in Analytical Measurements:</h4><h5>Uncertainty Evaluation and Results Interpretation</h5>The results of qualitative and quantitative chemical analyses should have an acceptable uncertainty, which should ideally be reported and considered in results interpretation. For many analytical applications, simplified uncertainty evaluations can determine uncertainty values meeting defined requirements for this parameter. The workshop will focus on the key technical challenges involved in practical evaluations of measurement uncertainty based on precision and recovery data gathered during in-house method validation. It will be discussed how to model the variation of the measurement uncertainty within the analytical range and how to handle divergent recovery values from the analysis of various reference materials. A session on the use of measurement uncertainty in conformity assessment will explore how the risk of false conformity decisions can be managed.Topics will also include the validation and uncertainty evaluation of qualitative analyses with particular attention to current accreditation requirements for these types of analysis. The last session of the workshop will be dedicated to the evaluation of measurement uncertainty arising from sampling and using it to judge the fitness for purpose, and hence validation, of measurement procedures that include sampling.Four sessions of the workshop will include engaging breakout sessions where participants will have the chance to share their views about challenging aspects of the analytical work. Participants are invited to propose posters and oral communications on session topics or any other relevant topic for analytical chemists or stakeholders of the analytical work.<h3>Training Course</h3><h4>Evaluation of the measurement uncertainty from in-house precision and recovery data</h4><ul><li>10 May 2026</li></ul>A course on the fundamentals of the evaluation of the measurement uncertainty from in-house precision and recovery data will be held on Sunday, 10 May 2026. This training is targeted for analysts with a basic understanding of the measurement uncertainty concept, how uncertainty components propagate, and how the combined uncertainty is expanded. Following the morning presentation of the theory of uncertainty evaluation, the afternoon will be dedicated to applying the theory to real-world cases. Trainees should have basic skills in using Microsoft Excel spreadsheets and bring a laptop with Microsoft Excel to complete the exercises. The interaction between trainers and trainees will be promoted to guarantee learning efficiency.<h5>Trainers:</h5><ul><li>Ricardo Bettencourt da Silva, Faculdade de Ciências da Universidade de Lisboa, Portugal (rjsilva@ciencias.ulisboa.pt)</li><li>Stephen L. R. Ellison - UK National Measurement Laboratory (NML) hosted at LGC, United Kingdom</li><li>Vicki Barwick - UK National Measurement Laboratory (NML) hosted at LGC, United Kingdom</li></ul><h4>Agenda</h4><h5>8:00 Registration</h5><h5>9:00 Opening</h5><h5>9:05 Identifying, combining, and expanding uncertainty components: Theory and examples</h5><h5>9:45 Precision uncertainty: Theory and examples</h5><h5>10:30 Coffee break</h5><h5>10:50 Trueness-related uncertainty: Theory and examples</h5><h5>12:00 Additional questions and discussion</h5><h5>12:30 Lunch</h5><h5>13:30 Application example 1</h5><h5>15:30 Coffee break</h5><h5>15:50 Application example 2</h5><h5>17:00 Additional questions and discussion</h5><h5>17:30 Closing</h5><h3>Venue</h3>The series of Eurachem events will be held in:<ul><li>Meliã Lisboa Aeroporto ****</li><li>Rua C,2 1749-125 Lisboa, Portugal&nbsp;</li></ul>

Eurachem/CITAC Workshop on Quality in Analytical Measurements 2026

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Eurachem is a European network promoting international traceability of chemical measurements and good analytical practice. It provides expert guidance, supports method validation, uncertainty evaluation, proficiency testing, and facilitates discussion on technical and policy issues in analytical quality.

Eurachem

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Thermo Scientific IonicX Portable XRF Analyzer

Thermo Scientific™ IonicX enables fast and accurate salt analysis in raw materials using portable XRF without complex preparation or destructive testing.

<div><div>Identify ionic salts in seconds with minimal sample preparation. The Thermo Scientific™ IonicX™ Portable XRF Analyzer provides:<ul><li>Fast and accurate verification of ionic salt raw materials</li><li>High sample throughput for pharmaceutical and biopharmaceutical manufacturers</li></ul>Cut testing time and costs by replacing:<ul><li>time-consuming</li><li>resource-intensive</li><li>wet chemistry and benchtop methods</li></ul>with a ✅ non-destructive, ✅ non-contact, ✅ portable XRF analyzer for ionic salts.<h3>⚙️ Key Features</h3><ul><li>Portable verification of a wide range of ionic salts in seconds</li><li>Compliant with 21 CFR Part 11:<ul><li>electronic signatures</li><li>user access control</li><li>audit trails</li></ul></li><li>Non-destructive testing of raw materials</li><li>Minimal sample preparation</li><li>Simple operation, no extensive operator training required</li><li>Lightweight and compact design for easy portability</li><li>Wi-Fi enabled</li><li>Hot Swap Battery</li><li>IP54 Certified – splash and dust proof</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Ionic_X_Portable_XRF_Analyzer_2_aa24221e46.jpg" alt="Thermo Scientific™ IonicX Portable XRF Analyzer " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Ionic_X_Portable_XRF_Analyzer_2_aa24221e46.jpg 156w," sizes="100vw" width="650" height="650"><h3>📏&nbsp;Specifications</h3><ul><li>Bluetooth: Supports print functionality and barcode reader</li><li>Camera:<ul><li>Macro Camera: Integrated CCD macro camera for capturing overview images of parts and tagging measurement locations</li><li>Micro Camera: Integrated CCD micro camera for locating and recording measurement positions</li></ul></li><li>Certifications/Compliance:&nbsp;<ul><li>EN 55011:2010</li><li>EN 61326:2013</li><li>FCC 47 CFR Part 15</li><li>Safety EN 61010; 2010 (3rd Ed) with national deviations for US and Canada</li><li>RoHS EN 50581; 2012</li></ul></li><li>Data Entry:&nbsp;<ul><li>Touchscreen keyboard</li><li>User customizable data entry</li><li>Optional wireless remote barcode reader</li></ul></li><li>Data Storage:&nbsp;<ul><li>512 MB internal system memory/16 GB industrial grade storage</li><li>Stores approximately 130,000 readings with spectra (fewer if macro and micro images are saved)</li></ul></li><li>Data Transfer: Wi-Fi, USB</li><li>Dimensions: 12 × 12 × 8 in. (30.48 × 30.48 × 20.32 cm)</li><li>Display Type: Tilting, color, resistive touchscreen display</li><li>IP Rating: IP54 (splash and dust proof)</li><li>Languages: English</li><li>Licensing: Varies by region; Contact your local distributor</li><li>Operating Environment:&nbsp;<ul><li>Temperature: 0°C to 50°C (external fan recommended when ambient temperature is greater than 33°C)</li><li>Humidity: 10% to 90% relative humidity non-condensing</li></ul></li><li>Operating System: Linux</li><li>Optional Accessories:&nbsp;<ul><li>Thermo Scientific portable test stand</li><li>Thermo Scientific mini test stand</li></ul></li><li>Power Consumption: 12V lithium-ion battery, or 12V DC, 3A, 3.6W power supply</li><li>Security Features: Password-protected user security</li><li>Software: IonicX PC software</li><li>Spot Size: Standard: 8 mm collimation</li><li>Standard Accessories:&nbsp;<ul><li>Locking shielded carrying case</li><li>Two (2) lithium-ion battery packs</li><li>One (1) 110/220 VAC battery charger/AC adaptor</li><li>Check samples</li><li>Safety lanyard</li><li>PC connection cable (USB)</li></ul></li><li>System Details: Built-in standardization via automatic system check</li><li>Weight (English): 5.8 lbs. with battery and test stand</li><li>Weight (Metric): 2.6 kg with battery and test stand</li><li>X-Ray Source Type:&nbsp;<ul><li>X-Ray Tube: Ag anode (6–50 kV, 0–500 μA, 5W max)</li><li>Dynamically adjustable current for optimal sensitivity on every analysis</li></ul></li><li>Applications: Raw Material Testing</li><li>Detector Type: Proprietary Large Area Drift Detector</li><li>Tube Voltage: 6 to 50 kV</li><li>Unit Size: Each</li></ul></div></div>

Thermo Scientific AnStat-330 Online Sampling and Elemental Analysis Station

The AnStat-330 provides real-time elemental analysis of slurries, improving metal recovery and eliminating delays and the need for sampling pumps.

The Thermo Scientific™ AnStat-330 Online Sampling and Elemental Analysis Station is a high availability, low head loss solution for:<ul><li>Metallurgical accounting</li><li>High-quality measurement of critical slurry streams in mineral processing plants</li></ul>It features an integrated analyzer and a full-flow, multistage, representative sampler, delivering:<ul><li>Accurate real-time assays</li><li>Enhanced control of flotation circuits, including:<ul><li>Flotation plant feed</li><li>Roughing and cleaning circuits</li><li>Final concentrates and tailings</li></ul></li></ul><h3>🔧 Key Advantages</h3><ul><li>Eliminates:<ul><li>Costly and unreliable sample transport systems</li><li>Measurement lag from cycle time delays and cross-contamination common with centralized analyzers</li></ul></li><li>Delivers:<ul><li>Reliable and rapid response to process upsets and feed fluctuations</li><li>Low head loss design, removing the need for sample pumps</li><li>Simplified flotation plant layout and installation</li></ul></li></ul><h3>⚙️ Operational Benefits</h3>Use the AnStat-330 to:<ul><li>Improve processing efficiency</li><li>Reduce life-of-mine OPEX for sampling and analysis</li><li>Lower energy consumption</li><li>Optimize reagent use</li><li>Improve metal recovery</li><li>Maximize Net Smelter Return (NSR)</li></ul><h3>📌 Key Features</h3><ul><li>Real-time elemental analysis and composite sampling for effective process control and metallurgical accounting</li><li>Very low head loss for simplified plant design – no sample pumps required</li><li>Advanced EDXRF detector (Ca to U), with Peltier cooling for stable, reliable operation in harsh environments</li><li>Versatile, compact system – easy to integrate into existing plants</li><li>24/7 high availability for both analysis and sampling</li><li>Multistage proportional sampling, including final-stage hardened cross-cut sampler for representative samples</li><li>Low maintenance – only moving parts in final-stage cross-cut sampler</li><li>Final-stage sampler identical for both AnStat-330 and SamStat-30 across full flow range</li></ul><h3>🧩 Optional Features</h3><ul><li>Pebble screen: Removes oversized particles from cyclone overflow; acts as backup to upstream primary screen</li><li>Outlet distributor: Splits slurry flow into 2+ streams with defined volume ratios</li><li>Upwelling/reverse flow sampling zone: Ideal for particle size analysis (with PSM-500)</li><li>Vacuum filter: For use with composite sampling</li></ul>

Thermo Scientific ARL EQUINOX 100 X-ray Diffractometer

The ARL EQUINOX 100 is a compact benchtop XRD for QC, research, and routine use. It captures full diffraction patterns in real time with a CPS detector — no moving parts or scanning needed.

<h4>Compact, powerful, and flexible benchtop XRD system for routine and advanced applications</h4>The ARL EQUINOX 100 is a compact benchtop X-ray diffractometer (XRD) designed for quality control, academic research, and routine analysis. It features a unique curved position-sensitive (CPS) detector that enables real-time acquisition of the entire diffraction pattern — with no moving parts and no scanning required.<h3>Key Features</h3><ul><li>Real-time acquisition: entire diffraction pattern captured in seconds</li><li>Wide angular range: up to 110° 2θ without moving components</li><li>No external water cooling: no chiller required</li><li>Standard power outlet: plug-and-play with no special electrical setup</li><li>Low-power microfocus X-ray source: high intensity and efficient optics</li><li>Versatile measurement: reflection and transmission modes</li><li>Easy installation: suitable for labs, mobile labs, and field vans</li></ul><h3>Sample Handling &amp; Accessories</h3><ul><li>Fixed non-spinning sample stage</li><li>Spinning stages for powders, bulks, filters, and pressed pellets</li><li>Capillary sample stage for transmission mode</li><li>Controlled atmosphere sample stage</li><li>6-position automatic sample changer</li><li>Dedicated stage for thin film analysis (GIXRD, XRR)</li><li>Temperature-controlled stages (–10 °C to 500 °C)</li></ul><h3>Typical Applications</h3><ul><li>Phase identification and quantification</li><li>Degree of crystallinity, crystallite size, and lattice parameters</li><li>Crystal structure solutions and Rietveld refinement</li><li>Thin film characterization (GIXRD, XRR)</li><li>In-situ and dynamic studies (e.g., phase transitions)</li><li>Fields: materials science, geology, nanomaterials, chemistry, pharmaceuticals, metallurgy, teaching</li></ul><h3>Software &amp; Compliance</h3><ul><li>SolstiX™ XRD Software with 21 CFR Part 11 compliance</li><li>Electronic signatures, audit trails, secured data handling — ideal for pharmaceutical QA/QC environments</li></ul><h3>Why Choose ARL EQUINOX 100?</h3><ul><li>Simultaneous, real-time data acquisition</li><li>Compact, rugged, and mobile-ready design</li><li>High performance at low operating cost</li><li>Flexible platform for a broad range of samples and applications</li></ul>

Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat

Streamline slurry analysis with the Thermo Scientific™ MEP-300 probe—no liquid nitrogen needed. Replaces MEP/MEP-200 and features SDD technology for reliable, high-performance XRF results.

<h4>Enhance XRF Slurry Analysis with the Thermo Scientific™ MEP-300 Multi-Element Probe – No Liquid Nitrogen Required</h4>Streamline elemental analysis of slurries with the Thermo Scientific™ MEP-300 Multi-Element Probe, designed to eliminate the need for liquid nitrogen while improving performance and reliability. Developed as a direct replacement for earlier MEP and MEP-200 immersion probes used in <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2027">AnStat </a>and <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2004">MSA</a> X-ray analyzer systems, the MEP-300 leverages advanced Silicon Drift Detector (SDD) technology for superior results in demanding industrial environments.<h3>Why Choose the MEP-300 Probe?</h3><h4>Advanced SDD Technology</h4><ul><li>Operates without cryogenic cooling</li><li>Delivers lower detection limits and improved analytical accuracy</li><li>Achieves higher count rates, reduced background, and wider field of view</li><li>Demonstrated stability under shock and vibration, ideal for on-line industrial use</li><li>No special storage or handling required</li></ul><h4>Occupational Health &amp; Safety</h4><ul><li>No liquid nitrogen, eliminating associated hazards</li><li>Enhanced radiation safety with:<ul><li>Automatic source retraction on window rupture or probe lift</li><li>Fail-safe, spring-loaded design to withdraw the source on power loss</li><li>High-visibility beacon for status and alarm indication</li></ul></li></ul><h4>Optimized Maintenance &amp; Operations</h4><ul><li>Zero ongoing cost for liquid nitrogen</li><li>Lower cost of spare parts</li><li>Field-repairable detector — no need to return to the factory</li><li>Easy-to-replace modules and cable assemblies</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg" alt="Thermo Scientific MEP-300 Upgrade Package for MSA and AnStat." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_MEP_300_Upgrade_Package_for_MSA_and_An_Stat_87564bbe7b.jpg 192w," sizes="100vw" width="1374" height="1116"><h3>Specifications</h3><ul><li>Air Requirements:&nbsp;<ul><li>Instrument Air: ANSI ISA-S7 0 0-1996 (clean and dry to 0.1 microns with dew point &lt;2°C)</li><li>Air Pressure: 550 kPa nominal – 1000 kPa maximum</li></ul></li><li>Certifications/Compliance: CE, ICES 001, CSA, FCC Part 15B and RCM AS/NZS CISPR11</li><li>Electrical Requirements:&nbsp;<ul><li>Three Phase 48 to 62 Hz. Max 2.5kVA Neutral not required.</li><li>Identical power requirements to previous generation products.</li><li>Any of the standard three phase voltages used in the world mining industry in the range 380–600 Volts AC may be factory or field selected.</li><li>Variation should not exceed ±10% of the nominal voltage selected.</li></ul></li><li>Operating Temperature:&nbsp;<ul><li>Ambient -10°C to +55°C (measured at enclosure surface temperature, temperature to not exceed 55°C)</li><li>Process Fluid: 0°C to 45°C, Check with factory for higher temperature options</li></ul></li><li>Type: MEP-300 Upgrade Package for MSA and AnStat</li><li>Unit Size: Each</li></ul>

Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer

The Thermo Scientific™ ARL™ EQUINOX 1000 enables ultra-fast XRD with a unique curved detector capturing all diffraction peaks at once, delivering complete analysis in just minutes.

The Thermo Scientific™ ARL™ EQUINOX 1000 offers very fast measurements compared to other diffractometers due to our unique EQUINOX curved detector that can measure all diffraction peaks simultaneously across a wide angular range. It will take you just a few minutes on most samples to get a complete analysis regardless of your resolution requirements.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_ec89ff8753.jpg 245w," sizes="100vw" width="800" height="361">The ARL EQUINOX 1000 is a rugged multi-purpose benchtop style instrument designed for QA/QC, academic and routine X-ray diffraction applications. The ARL EQUINOX 1000 is the perfect instrument when space becomes a priority. With its truly excellent performance it is the perfect match for laboratories that are looking for a simple and powerful benchtop X-ray diffractometer. Several sample holders are available on this instrument such as a 6 or 30 positions sample holder, powder transmission mode sample holders, small thin film sample attachment.<ul><li>Real time acquisition</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_2_2d447eb239.jpg 245w," sizes="100vw" width="1074" height="286"><ul><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement on small samples? Try our Small Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Silver Behenate powder sample recorded on EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_3_7b095f3848.jpg 245w," sizes="100vw" width="871" height="450"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg" alt="Thermo Scientific ARL EQUINOX 1000 Benchtop X-Ray Diffractometer: Si powder sample recorded on ARL EQUINOX 1000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_1000_Benchtop_X_Ray_Diffractometer_4_4ef24412ee.jpg 245w," sizes="100vw" width="871" height="452"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Cu, Co - Standard sealed X-ray tube</li><li>Detector: Curved Position Sensitive X-ray Detector, CPS 180 Curvature radius: 180mm Acquisition in real time over 110° 2Theta</li><li>Goniometric table: No moving parts: acquisition in asymmetric mode</li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Zero background sample cup&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Optic: Monochromatic (Germanium, Graphite)</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase indentification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60Hz</li><li>Weight: ~90 kg</li><li>Cooling water:&nbsp;<ul><li>Flow: ~3,5l/min&nbsp;</li><li>T°C: ~18 / 25°C</li></ul></li><li>Dimensions: 996 mm H x 715 mm D x 750 mm W</li></ul>

Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer

Thermo Scientific ARL EQUINOX 3000 XRD: real-time acquisition, no scanning, superb resolution, versatile sample handling, reliable and easy to use for research and industry.

The Thermo Scientific™ ARL™ EQUINOX 3000 measurements are very fast compared with other diffractometers in that the unique Inel curved detector can measure all diffraction peaks simultaneously. Due to this acquisition in real time, all kinetic studies are facilitated.The Thermo Scientific™ ARL™ EQUINOX 3500 is an evolution of ARL EQUINOX 3000 model. It is exactly the same configuration except that it works with a bigger radius of curvature detector. So, obtained data have a better resolution.<ul><li>Research</li><li>Environment</li><li>Geology, Cement, Mining</li><li>Metallurgy</li><li>Pharmaceuticals</li><li>Education</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: No scanning required. Measures the whole 2 theta range simultaneously and in real time." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_3_9768c30fd3.jpg 222w," sizes="100vw" width="790" height="556">The ARL EQUINOX 3000 is a a research-grade diffractometer with a very high resolution diffraction system providing the user a choice of features including higher resolution detectors, a larger sample area and choice of X-ray sources.The free space in the sample compartment is very large and will accommodate practically any sample and any sample handling device including furnaces, auto samplers, large assemblies, etc.<ul><li>Real time acquisition</li><li>Extremely accurate</li><li>Easy to use</li><li>No alignment needed</li><li>Very reliable</li><li>Superb resolution</li><li>No maintenance &nbsp;</li><li>You want to perform transmission analysis? Choose either the Sample Spinner for reflection and transmission analysis on powder samples or the capillary sample holder for Transmission mode analysis depending on your needs. &nbsp;</li><li>You need to analyze several powder samples a day? Optimize your throughput with the 6 or 30 position sample changer. &nbsp;</li><li>You need to perform grazing incidence measurement? Try our Thin Layer analysis attachment.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: HTK1200N, TTK450." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_9649c7af2e.jpg 245w," sizes="100vw" width="1228" height="336"><ul><li>This system allows you to work with controlled temperature or atmosphere chamber. Anton Paar and other suppliers chambers can be availabledepending on your needs.</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg" alt="Thermo Scientific ARL EQUINOX 3000 Benchtop X-Ray Diffractometer: LaB6 powder sample recorded on ARL EQUINOX 3000 in reflection mode." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ARL_EQUINOX_3000_Benchtop_X_Ray_Diffractometer_2_94015af651.jpg 245w," sizes="100vw" width="850" height="334"><h3>Specification</h3><ul><li>X-ray source: Generator: 3500 W (60kV / 60mA - Option 30kV limitation) Standard sealed X-ray tube: Cu, Co, Mo, ... radiation</li><li>Detector:&nbsp;<ul><li>Curved Position Sensitive X-ray Detector, CPS120&nbsp;</li><li>Curvature radius: 250mm&nbsp;</li><li>Acquisition in real time over 120° 2Theta&nbsp;</li><li>Option: CPS590 (500mm, 90° 2Theta – EQUINOX 3500)</li></ul></li><li>Goniometric table:&nbsp;<ul><li>No moving parts&nbsp;</li><li>Acquisition in asymmetric mode</li></ul></li><li>Sample holders:&nbsp;<ul><li>Fixed, with or without sample rotation&nbsp;</li><li>Reflection or transmission mode&nbsp;</li><li>Sample changer: 6 or 30 positions&nbsp;</li><li>Thin layer attachment</li></ul></li><li>Special camera:&nbsp;<ul><li>Heating camera: low and high temperature&nbsp;</li><li>Humidity chamber, Electrochemistry cell</li></ul></li><li>Optic: Monochromatic</li><li>Computer: Windows© 8, 7 Vista, XP</li><li>Software:&nbsp;<ul><li>Real time diffractogram display&nbsp;</li><li>Multiple and automatic recording&nbsp;</li><li>Peak search&nbsp;</li><li>Deconvolution with several shapes&nbsp;</li><li>Phase identification and quantification&nbsp;</li><li>Degree of crystallinity determination&nbsp;</li><li>Cell parameters, crystallite size, lattice strain&nbsp;</li><li>Crystal structure analysis&nbsp;</li><li>Transition phase&nbsp;</li><li>Thin film (reflectometry, etc.)&nbsp;</li><li>Rietveld analysis&nbsp;</li><li>Free open database for search match&nbsp;</li><li>Option: ICDD PDF2 or PDF4 databases</li></ul></li><li>Power: 30-32A / 208-230V / 50-60 Hz</li><li>Cooling water: Flow: ≈ 3,5 L/min - T°C: ≈18 to 25 °C</li><li>Dimensions:&nbsp;<ul><li>1565 mm H x 750 mm D x 1040 mm W EQUINOX 3000&nbsp;</li><li>1815 mm H x 744 mm D x 1206 mm W EQUINOX 3500</li></ul></li></ul>

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Products from category X-Ray focused on X-ray - page 1

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