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ICPMS webinars focusing on Microscopy - page 4

Intrinsic Structure of Sodium Battery Interfaces via cryoEM

Intrinsic Structure of Sodium Battery Interfaces via cryoEM

Join us for an enlightening webinar on the intrinsic structure of sodium battery interfaces, explored through advanced cryoEM techniques.
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Already taken place Th, 10.4.2025
Wiley
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Intrinsic Structure of Sodium Battery Interfaces via cryoEM
Simultaneous polyclonal antibody sequencing and epitope mapping by cryo-electron microscopy and mass spectrometry

Simultaneous polyclonal antibody sequencing and epitope mapping by cryo-electron microscopy and mass spectrometry

Learn how to characterize antigen-specific antibodies from serum using a combined cryo-EM and LC-MS/MS approach for simultaneous antibody sequencing and epitope mapping.
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Already taken place We, 9.4.2025
Thermo Fisher Scientific
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Simultaneous polyclonal antibody sequencing and epitope mapping by cryo-electron microscopy and mass spectrometry
Biomechanical Analysis of Tissues, Organoids, and 3D Cellular Structures using AFM

Biomechanical Analysis of Tissues, Organoids, and 3D Cellular Structures using AFM

Join us and special guest speaker Dr. Lydia Powell, Swansea University Medical School, for this webinar on the Biomechanical Analysis of Tissues, Organoids, and 3D Cellular Structures using AFM.
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Already taken place Th, 27.2.2025
Bruker
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Biomechanical Analysis of Tissues, Organoids, and 3D Cellular Structures using AFM
The New Future of Micro-CT and 3D X-Ray Microscopy

The New Future of Micro-CT and 3D X-Ray Microscopy

Discover the new, enhanced 3D imaging system.
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Already taken place Th, 27.2.2025
Bruker
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The New Future of Micro-CT and 3D X-Ray Microscopy
Nanoscale Chemical Characterization of Semiconductor Materials and Devices using Photothermal AFM-IR

Nanoscale Chemical Characterization of Semiconductor Materials and Devices using Photothermal AFM-IR

In this webinar, Bruker nanoscale IR spectroscopy experts show how photothermal AFM-IR can identify the local chemistry of defects.
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Already taken place We, 22.1.2025
Bruker
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Nanoscale Chemical Characterization of Semiconductor Materials and Devices using Photothermal AFM-IR
Lightfield 4D – Keeping Pace with the Pulse of Life

Lightfield 4D – Keeping Pace with the Pulse of Life

Discover how Lightfield 4D enables instant 3D imaging at up to 80 volumes/sec. Capture rapid biological events like heartbeats and neuron firing with unmatched spatiotemporal precision.
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Already taken place Tu, 31.12.2024
Wiley
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Lightfield 4D – Keeping Pace with the Pulse of Life
Control of Membrane Protein Motion by Submembrane Actin Ring

Control of Membrane Protein Motion by Submembrane Actin Ring

Learn how single particle tracking and super-resolution microscopy unravel how actin rings influence the plasma membrane of cells.
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Already taken place We, 11.12.2024
Bruker
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Control of Membrane Protein Motion by Submembrane Actin Ring
Nanoscopic Imaging of Neuroendocrine Regulatory Processes Using Super-Resolution Microscopy

Nanoscopic Imaging of Neuroendocrine Regulatory Processes Using Super-Resolution Microscopy

Using super-resolution microscopy to reveal the inner workings of neuronal and neuroendocrine cells.
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Already taken place We, 27.11.2024
Bruker
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Nanoscopic Imaging of Neuroendocrine Regulatory Processes Using Super-Resolution Microscopy
Automated AFM for Inline Hybrid Bonding Metrology in the Semiconductor Industry

Automated AFM for Inline Hybrid Bonding Metrology in the Semiconductor Industry

Learn how automated AFM can be applied to the most current hybrid bonding technology nodes and wafer processing steps.
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Already taken place Th, 21.11.2024
Bruker
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Automated AFM for Inline Hybrid Bonding Metrology in the Semiconductor Industry
The latest advances in in-situ SEM nanoindentation testing

The latest advances in in-situ SEM nanoindentation testing

In this webinar, presenters will cover recent advances in in-situ nanomechanics testing, highlighting a case study on fracture toughness in nitride hard coatings.
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Already taken place Tu, 12.11.2024
Bruker
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The latest advances in in-situ SEM nanoindentation testing
 

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