Organizer
SelectScience
SelectScience
SelectScience® is an innovative online publisher within the science industry, connecting scientists to information to help them make the best choices for their lab, through a combination of rich content, peer-to-peer information & trusted product reviews.
Tags
Microscopy
LinkedIn Logo

Next-gen 4D-STEM and quantitative imaging with Timepix4

RECORD | Already taken place We, 27.8.2025
Discover how ultrafast Timepix4 detectors revolutionize 4D-STEM, enabling precise electric field mapping, charge density analysis, and ptychographic imaging.
Go to the webinar
SelectScience: Next-gen 4D-STEM and quantitative imaging with Timepix4
SelectScience: Next-gen 4D-STEM and quantitative imaging with Timepix4

As dimensionality in transmission electron microscopy (TEM) expands, next-generation ultrafast detectors are making it possible to record 4D data sets at acquisition speeds comparable to traditional bright- and dark-field techniques. These advancements are paving the way for versatility in scanning TEM (STEM) and the ability to quantify charge densities with subatomic resolution, to measure polarisation-induced electric fields, and to solve the phase problem by ptychographic techniques.

Join Professor Knut Müller-Caspary, LMU Munich & Ernst-Ruska Centre and Matt Callahan, Quantum Detectors, as they hold an in-depth discussion showcasing the technologies that can transform 4D-STEM workflows to enable new levels of precision in electric field mapping, charge density analysis, and ptychographic phase retrieval. Plus, learn how you can combine real-space and reciprocal-space imaging in a single scan, and see first-hand results from pioneering applications.

Key learning objectives
  • Understand how Timepix4-based detectors enable high-speed, event-driven 4D-STEM acquisition for advanced electron microscopy workflows
  • Explore real-world application data from Merlin T4 deployments, including results from beam-sensitive and thick specimens
  • Gain insights into integrating next-generation detectors into existing TEM setups, including software compatibility and data processing strategies
Who should attend?
  • TEM users and electron microscopy researchers in materials science, semiconductors, and nanotechnology looking to advance spatial and temporal resolution through techniques like electron diffraction and 4D-STEM.
  • Facility managers and imaging leads exploring next-generation detector upgrades and workflow integration.
  • Data scientists and software developers working on reconstruction algorithms, ptychography, or real-time data processing in microscopy.
Certificate of attendance
  • If you attend the live webinar, you will automatically receive a certificate of attendance, including a learning outcomes summary, for continuing education purposes.
  • If you view the on-demand webinar, you can request a certificate of attendance by emailing [email protected].

Presenter: Prof. Knut Müller-Caspary (LMU Munich & Ernst-Ruska Centre)

Presenter: Matt Callahan (Principal Engineer, Quantum Detectors)

Moderator: Olivia Long (Editorial Team, SelectScience)

SelectScience
LinkedIn Logo
 

Related content

Analysis of copper alloys with the ARL X900 XRF Spectrometer

Applications
| 2026 | Thermo Fisher Scientific
Instrumentation
X-ray
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Measurement of Fixed Carbon, Volatile Matter, and Ash of Biocoke

Applications
| 2026 | Shimadzu
Instrumentation
Thermal Analysis
Manufacturer
Shimadzu
Industries
Energy & Chemicals

Detection of Phenol Leakage into Wastewater Using TOC Measurement

Applications
| 2026 | Shimadzu
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Environmental

Routine Analysis of Rare Earth Elements in Basalt using ICP-MS

Applications
| 2026 | Agilent Technologies
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing

Analysis of rare earth elements in clay using XRF and XRD

Applications
| 2026 | Thermo Fisher Scientific
Instrumentation
XRD
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
Other projects
GCMS
LCMS
Follow us
FacebookLinkedInYouTube
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike