Scientists from the CTLAB at CEITEC Brno University of Technology used a new industrial CT scanner to examine the Bastion ballistic helmet manufactured by the U.S.-based company Ballistic Armor Co. Without making a single cut, the scanner revealed the helmet's internal structure, including its individual protective layers, and confirmed the absence of manufacturing defects. The results demonstrate the technology's potential for quality control and the development of protective equipment for the defense industry.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_4be342238c.jpeg" alt="CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: Bastion Helmet by Ballistic Amor Co. scanned at CTLAB CEITEC." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_4be342238c.jpeg 235w," sizes="100vw" width="1600" height="1067">Computed tomography (CT) is an imaging technique widely used in medicine. Using X-rays, CT scanners produce detailed 2D cross-sectional images or 3D models of internal organs, allowing physicians to examine the inside of the human body without surgery and identify structural changes in tissues. Industrial CT scanners at <a target="_blank" rel="noopener noreferrer" href="https://ctlab.ceitec.cz/">CTLAB CEITEC</a> operate on the same principle but use significantly higher X-ray energies than medical systems. This enables researchers to inspect larger and more complex objects with exceptional precision while keeping them completely intact through non-destructive testing.The laboratory's newest scanner, the Waygate Technologies phoenix v|tome|x L450, installed only at the end of last year, is unique in the research environment. Its size and power allow it to penetrate, for example, steel objects up to 7 centimeters (2.8 inches) thick while maintaining a resolution of only a few tens of micrometers.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_4_bf54aa6ef1.jpeg" alt="CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: Anna Smith from Ballistic Armor Co. and Michaela Škaroupková from CTLAB CEITEC." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_4_bf54aa6ef1.jpeg 235w," sizes="100vw" width="1600" height="1067">"Based on its technical capabilities, we knew this system could analyze highly complex composite materials. That's why we challenged it with the Bastion ballistic helmet from Ballistic Armor Co.," explains Tomáš Zikmund from the X-ray Computed Micro- and Nano-Tomography Laboratory at CEITEC Brno University of Technology (<a target="_blank" rel="noopener noreferrer" href="https://ctlab.ceitec.cz/">CTLAB CEITEC</a>). The helmet is designed to provide protection against handgun ammunition.The helmet is manufactured from Aramid fibers, better known by the trade name Kevlar. Aramid is widely used in ballistic protection and aerospace applications because of its exceptional strength, durability, and low weight. Combined with the helmet's other materials, it forms a highly complex internal structure that only the most advanced CT systems can visualize.<h3>CT Helps Ensure Quality Without Damaging the Product</h3>As part of the study, the Bastion helmet was exposed to X-rays for several hours. The result was a highly detailed 3D model of its internal structure, clearly revealing the individual ballistic layers as well as the soft padding materials—all without cutting the helmet apart. The analysis also detected no manufacturing defects."Results from non-destructive CT inspections like this improve our understanding of how protective equipment is built and help manufacturers maintain the highest standards of quality and safety," says Anna Smith, Director of Business Development at <a target="_blank" rel="noopener noreferrer" href="https://ballisticarmorco.com/">Ballistic Armor Co</a>.Non-destructive CT analysis, however, is not a substitute for standard ballistic testing, which remains essential for verifying that protective equipment meets the required ballistic resistance specified by applicable standards. Instead, the technology serves as an effective tool for routine manufacturing quality control, verification of production consistency, and regular audits of products whose ballistic performance has already been validated.According to Tomáš Zikmund, the successful test marks another important milestone in demonstrating the capabilities of the laboratory's new CT system for defense applications. Earlier this spring, the research team showcased the scanner by examining an airsoft rifle, non-destructively verifying the correct placement of mechanical components and wiring while also inspecting the materials for pores and microcracks.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_3_9a68c9c71c.jpeg" alt="CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: Bastion Helmet by Ballistic Amor Co. scanned at CTLAB CEITEC." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_3_9a68c9c71c.jpeg 235w," sizes="100vw" width="1600" height="1067">These studies demonstrate that industrial CT has an important role to play in the defense sector. In many cases, it can complement destructive quality-control methods used during manufacturing by enabling detailed inspections without disassembling or damaging the product. Modern CT technology provides deep, highly precise, and completely non-destructive inspection. It does not, however, replace conventional ballistic testing, which remains the only method capable of verifying the required level of ballistic protection."Our goal is to strengthen collaboration between science, technology development, and the defense industry," Zikmund concludes. "We believe our technology can help manufacturers not only improve production quality but also gain valuable insights into the behavior of materials and the design principles behind modern protective equipment."<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_2_1559697260.jpeg" alt="CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: Bastion Helmet by Ballistic Amor Co. scanned at CTLAB CEITEC." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_2_1559697260.jpeg 104w," sizes="100vw" width="1600" height="2400"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_5_8dab8c31ab.jpeg" alt="CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: Anna Smith from Ballistic Armor Co. and Michaela Škaroupková from CTLAB CEITEC." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_5_8dab8c31ab.jpeg 103w," sizes="100vw" width="1600" height="2420">

Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut 

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 3rd August 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you application notes by Agilent Technologies and Shimadzu and other document by Thermo Fisher Scientific!<h3>1. Agilent Technologies: Determination of Toxic Elements in Durian and Jackfruit Using an Agilent Automated ICP-MS System According to China GB 5009.268</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_icpms_durian_5994_9351en_agilent_fcafe537c7.pdf">Full PDF for download</a>&nbsp;</li></ul>Fruit is an essential part of daily human nutrition, providing vital vitamins, minerals, and dietary fiber.3 The Chinese market, with over 1.4 billion people, has become one of the largest fruit markets in the world. It is expected that China's total fruit consumption will reach about 312 million tons by 2025.4 Additionally, fruit imports are projected to exceed 9 million tons annually, underscoring the country's strong domestic demand and reliance on imported supplies.&nbsp;Within this context, China has become a major export destination for Asian countries, including Vietnam, Thailand, Laos, Cambodia, Philippines, Indonesia, and others. Thanks to favorable climate conditions and a wide variety of tropical fruit cultivars, these countries have strategically increased their fruit exports to satisfy Chinese market demand. Specifically, products such as durian and jackfruit have gained significant popularity, playing an increasingly vital role in regional agricultural trade.&nbsp;However, the biggest challenge for those countries when entering the Chinese market is strict food safety regulations, especially limits on trace elements and heavy metals such as lead (Pb), cadmium (Cd), mercury (Hg), and arsenic (As). The General Administration of Customs of the People's Republic of China (GACC) sets very low Maximum Residue Limits (MRLs, Table 1). Additionally, the large, continuous volume of fruit exports makes time a critical factor, as any delay can affect product quality and reduce its economic value. This situation places significant pressure on testing laboratories, requiring the development of stable, rapid, and accurate methods to ensure continuous and reliable operations.&nbsp;To address these challenges, the Agilent ICP Workflow Automation System offers a practical solution. The ICP‑MS 7900 provides high-throughput, highly sensitive, and precise measurements of trace elements and heavy metals, including Pb, Cd, Hg, and As. The combination of ADS2 and AVS helps reduce sample turnaround time and cost per analysis. The Advanced Dilution System (ADS2) automatically performs important tasks such as preparing a multipoint calibration from a single stock standard up to 400 times, diluting samples above the calibration range, or, if there is an internal standard recovery issue, eliminating the need for manual dilution. The Advanced Valve System (AVS) automatically rinses the sample introduction system while the next sample is being analyzed, virtually eliminating the delays typical of conventional analysis. Using controlled argon bubble injection between the sample and rinse solution prevents mixing, reducing uptake and rinse times. This study describes the use of the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=7900">Agilent 7900 ICP-MS</a>, <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=SPS+4">Agilent SPS 4 autosampler</a>, AVS, and ADS2 auto-dilution for the analysis of four toxic elements in durian and jackfruit samples using the China GB 5009.268 method.1<h4>Results and discussion&nbsp;</h4><h5>Automatic calibration standards and Instrument stability&nbsp;</h5>A 7-point calibration curve automatically prepared using the ADS 2 demonstrated excellent linearity over the concentration range of 0.05–10 µg/L. Using a 1/x weighted regression without forcing the calibration through the origin, all analytes achieved coefficients of determination (R²) ≥ 0.995 (Figure 3), with back-calculated concentrations within 90–110% of their theoretical values, confirming the suitability of the calibration range for routine quantification. The integrated automation workflow significantly improved laboratory productivity by completing calibration preparation and analysis in approximately 1.5 minutes per sample. By minimizing manual operations and operator intervention, the ADS 2 reduced the risk of contamination and human error while enabling higher sample throughput for routine food safety testing.&nbsp;To evaluate instrument stability during continuous operation, the variation in internal standard recoveries was monitored throughout an analytical sequence of more than 70&nbsp;consecutive samples. The recoveries of the three internal standards across different measurement modes remained consistently within the ±20% acceptance limit throughout the analytical sequence (Figure 4). Blank samples interspersed between concentration intervals showed no evidence of carryover, demonstrating effective system cleanliness and analytical robustness. These results confirm the excellent long-term stability and robust matrix tolerance of the Agilent 7900 ICP-MS, providing reliable performance for high-throughput routine food safety testing.<h4>Conclusion&nbsp;</h4>The Agilent 7900 ICP-MS, integrated with the SPS 4 autosampler, ADS 2, and AVS, delivers a fully automated, high-throughput workflow for routine trace-level multi-element analysis. By eliminating manual standard preparation and minimizing operator intervention, the solution reduces labor costs, improves data consistency, and empowers laboratories to maximize productivity and analytical capacity to meet increasing testing demands.&nbsp;Excellent sensitivity, long-term stability, and robust interference removal, together with satisfactory recoveries, repeatability, and reproducibility for As, Cd, Pb, and Hg at an LOQ of 5 µg/kg, demonstrate reliable analytical performance. Compliance with Chinese regulatory requirements further position the Agilent automation solution as a cost-effective platform for high-volume food safety testing and export quality assurance, enabling laboratories to confidently support the growing demand for exports to the Chinese&nbsp;market.<h3>2. Shimadzu: TOC Evaluation of Surfactants</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01160_en_539fba0ba2.pdf">Full PDF for download</a></li></ul><h5>User benefits</h5><ul><li>TOC can be evaluated accurately using the TC-IC method, even for foaming surfactants.&nbsp;</li><li>The ASI-L autosampler enables automatic, continuous measurement of multiple samples, improving analytical efficiency.</li></ul>Surfactants are important chemicals widely used in detergents and dispersants for pharmaceutical equipment cleaning processes, chemical manufacturing processes, and environmental water management. If surfactant residues remain after such processes, they can not only affect manufacturing processes and final product quality, but also increase the organic load in wastewater and environmental water. Therefore, quality control is also needed for organic matter derived from surfactants.&nbsp;Total organic carbon (TOC) analysis is effective for evaluating the quality of surfactants. In general, the NPOC (non-purgeable organic carbon) method is often selected for TOC measurement in terms of sample volume and analysis time requirements. On the other hand, because surfactants have both hydrophilic and hydrophobic groups in their structure, they tend to foam even at low concentrations. When such samples are measured by the NPOC method, which involves acid addition and sparging, foaming can cause the sample to overflow from the syringe vessel inside the instrument into the waste line. That can result in measurement valuesthat are lower than the true value.&nbsp;This article compares TOC measurement results for surfactants obtained by the NPOC method and the TC-IC method using the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=TOC-L">Shimadzu TOC-L total organic carbon analyzer</a>, which uses the combustion oxidation method.<h4>Conclusion&nbsp;</h4>Table 5 summarizes the results obtained by measuring sodium dodecylbenzenesulfonate solutions, used here as representative surfactant samples, by the NPOC method and the TC-IC method. With the NPOC method, the TOC recovery rates were below 50 % for all samples, whereas the TC-IC method produced satisfactory TOC recovery rates close to 100 % for all samples.Sodium dodecylbenzenesulfonate solutions (carbon concentration: 0.5 mg/L) is also used in Japanese Pharmacopoeia (JP) recovery tests. For surfactants that readily foam, such as in this example, NPOC measurements involving acid addition and sparging may affect measurement accuracy due to sample loss. For such samples, accurate TOC values can be obtained by using the TC-IC method. In addition, by using the ASI-L autosampler, multiple samples can be measured automatically and continuously.<h3>3. Thermo Fisher Scientific: How rhodium plating can affect gold XRF results</h3><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=315&amp;manufacturerItems=3&amp;search=niton">Thermo Scientific™ Niton™ XRF Analyzers</a> can help precious metals professionals detect rhodium (Rh) plating and interpret gold (Au) results with confidence.<ul><li>Other document (smart note)</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/rhodium_plating_can_affect_gold_xrf_results_sn1862_en_331edc099a.pdf">Full PDF for download</a></li></ul><h4>Benefits of XRF in jewelry analysis&nbsp;</h4>Niton XRF analyzers provide capabilities that can enhance a jeweler’s operations in several ways:&nbsp;<ul><li>Identify Rh-plated gold items during routine testing&nbsp;</li><li>Reduce confusion around unexpected Au readings&nbsp;</li><li>Support more confident buying, selling, refining, and verification decisions&nbsp;</li><li>Help explain results to customers, suppliers, and trading partners&nbsp;</li></ul><h4>Reduce risk in precious metals trading&nbsp;</h4>In precious metals trading, small differences in reported gold concentration can affect pricing, settlement, customer trust, and supplier relationships. Recognizing Rh plating helps users avoid unnecessary disputes, retesting, or destructive testing when the surface finish is influencing the measurement.&nbsp;<h4>Best practices&nbsp;</h4>One should always check the result for Rh when Au appears lower than expected.&nbsp;<ul><li>Test multiple locations, especially where plating may vary&nbsp;</li><li>Look for worn or unplated areas when appropriate&nbsp;</li><li>Interpret Au results in the context of surface finish and item history&nbsp;</li><li>If appropriate, remove the rhodium plating prior to XRF analysis to evaluate the underlying alloy&nbsp;</li></ul><h4>The bottom line&nbsp;</h4>Rhodium plating can make a properly karated gold item appear to return a lower Au result when it is evaluated by XRF. <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=315&amp;manufacturerItems=3&amp;search=niton">Niton XRF analyzers</a> can detect Rh at the surface, helping precious metals professionals recognize plating, interpret results correctly, and make more confident decisions.

News from LabRulezICPMS Library - Week 32, 2026

In late February 2025, a train carrying benzene derailed in Hustopeče nad Bečvou, and within hours, a race was on to save the groundwater and surface water. One of the most toxic industrial substances began seeping into the gravel-sand subsoil. While fieldwork was underway to prevent the spread of contamination, decisions were already being made in the CXI TUL laboratories regarding how to subsequently clean up the contaminated rock environment.The accident ranks among the most serious environmental incidents in the Czech Republic in recent years. After a tanker train derailed, hundreds of metric tons of benzene leaked; due to the highly permeable geological subsoil, it quickly seeped into deeper soil layers and into the groundwater. The combination of the substance’s high toxicity and local conditions complicated both the emergency response and the subsequent remediation. The key was to stop further spread, determine the extent of the contamination, and establish a remediation strategy for the entire site.It was at this stage that CXI TUL became involved in the solution. At the request of the renowned remediation company DEKONTA, a.s., a team led by RNDr. Jan Němeček, Ph.D., began testing the feasibility of the in situ chemical oxidation (ISCO) method. This technology is designed to break down benzene directly within the rock matrix, without the need for extensive excavation of contaminated soil or the pumping out of large volumes of groundwater. The goal was simple: to find a method that would work quickly, safely, and under the actual conditions of the affected site.<h4>Benzene Remediation: Technically Simple, Complicated in Practice</h4>Benzene is a highly toxic and carcinogenic substance that rapidly penetrates into groundwater in permeable subsoil, where it dissolves and spreads further as the water flows toward surface water bodies. Benzene also binds to rock particles and migrates in the form of vapors into overlying unconsolidated layers.Scientists in Liberec therefore tested in situ chemical oxidation (ISCO) technology under laboratory conditions. The goal was to find an oxidant capable of breaking down benzene directly underground into less hazardous substances.The tests evaluated two main options: activated hydrogen peroxide and sodium peroxodisulfate. Both substances removed up to 99.99% of the benzene, but there was a difference in their kinetics and impacts on the natural environment. Activated hydrogen peroxide achieved nearly complete degradation of the contaminant within a single day. Activated sodium peroxodisulfate was slower and also significantly altered the chemistry of the water; it acidified the environment and increased the sulfate content in the water, which poses an additional environmental burden.For field applications, the researchers therefore unequivocally recommended activated hydrogen peroxide.<h4>Dosage Matters</h4>It was not just the oxidant’s effectiveness that was key. It was equally important to determine how the chemical reaction would behave in a real geological environment. The team of scientists therefore also analyzed what is known as soil oxidant consumption (SOD). It turned out that a significant portion of the oxidizing agent does not react solely with benzene but is also consumed to a significant extent by the rock environment itself, particularly by natural organic substances present in the fine-grained fraction of the soil.An oxidant consumption value was determined specifically for the local composition of the aquifers, which is essential for the correct dosing of chemicals in the field so that the remediation is not only effective but also economically viable and safe for surrounding ecosystems.<h4>One Year After the Accident: Research Turns into Real-World Assistance</h4>While the public often perceives university science as a distant world of laboratories and grant projects, it is precisely situations like this that demonstrate its practical impact. The results of the work by researchers at CXI TUL did not remain confined to academic studies but directly influenced decisions regarding the technology used to clean up one of the largest environmental accidents in recent years.

Science on the Front Lines: Cleanup of a Benzene Spill

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Since its establishment in 2011, CEITEC has quickly developed into a cutting-edge infrastructure for research which performs highly alongside the best institutes in Europe. Among the main priorities of CEITEC are the promotion of a motivating and dynamic international scientific environment, the provision of state-of-the-art research infrastructure, and the policy of open communication and equal opportunities.

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The Institute for Nanomaterials, Advanced Technologies and Innovations of the Technical University of Liberec, also known as CXI TUL, was founded in 2009. Our mission is to support TUL's long-term vision of collaboration with industry and innovation.

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Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Products from category XPS focused on X-ray from Thermo Fisher Scientific - page 1

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