This leaflet is intended as a comprehensive checklist outlining the key steps to consider when participating in a proficiency testing (PT) scheme. Selection of an appropriate PT scheme must be ensured [1]. It provides essential tips to help participants avoid common mistakes and achieve successful outcomes. The main stages of PT participation are covered, from receipt of PT items through to the review of received evaluations [1-3]. Documentation of outcomes for many of the topics addressed below is recommended, particularly for accreditation purposes.&nbsp;<h4>1. Prior to PT participation&nbsp;</h4><ul><li>Verify that the PT provider has up-to-date billing, shipping and technical contact information for the laboratory.&nbsp;</li><li>Ensure that the laboratory has documented procedures in place or, if necessary, prepare procedures for: reviewing PT results upon receipt; taking corrective actions when assessments indicate poor performance; conducting periodic reviews of PT results over time; storing PT reports.&nbsp;</li></ul><h4>2. Receipt of PT items&nbsp;</h4><ul><li>Open the package of PT items immediately upon receipt to check their condition. Contact the PT provider and request a replacement if any PT items are missing, broken, leaking or otherwise compromised.&nbsp;</li><li>Study the PT provider’s instructions carefully to ensure they are clear and understandable (e.g. handling, storage, pre-treatment, preparation, reporting of results).&nbsp;</li><li>Register, identify, and mark the PT items according to normal procedures in the laboratory.&nbsp;</li><li>Store the PT items in accordance with any instructions provided.&nbsp;</li></ul><h4>3. Measurements&nbsp;</h4><ul><li>Read the instructions supplied by the PT provider carefully before starting the measurements.&nbsp;</li><li>Carry out the measurements under conditions as close as possible to routine testing, unless otherwise instructed by the PT provider.&nbsp;</li><li>Ensure that the analysis is carried out to meet any measurement deadline requirements.</li></ul><h4>4. Reporting results&nbsp;</h4><ul><li>Allow sufficient time for reporting the results to the PT provider.&nbsp;</li><li>Report all the information required by the PT provider.&nbsp;</li><li>Ensure that the results are reported in the requested format (e.g. units, number of significant figures, decimal places).&nbsp;</li><li>Ensure that the results you are going to submit are those that you intend, correcting for any identified transcription errors (e.g. mix-up of samples or analytes).&nbsp;</li><li>Confirm that the submission process of the results to the PT provider has been completed.&nbsp;</li></ul><h4>5. Reviewing PT reports&nbsp;</h4><ul><li>Read the PT report as soon as possible and check that your results and other information are correctly represented; report any errors immediately to the PT provider.&nbsp;</li><li>Take notice of any comments on the specific PT round, evaluation of performance, and other matters relevant to the results of the PT round which provide valuable context to your individual results.&nbsp;</li><li>Review your assessed performance carefully in accordance with your laboratory procedures.&nbsp;</li><li>Store the PT report according to internal procedures.&nbsp;</li></ul><h4>6. Follow-up on participation in a PT scheme&nbsp;</h4><ul><li>Investigate any poor performance in accordance with your laboratory quality system [4].&nbsp;</li><li>Evaluate the impact of poor performance (e.g. risk that poor quality data may have been reported to customers).&nbsp;</li><li>Implement any corrective actions as relevant, and if possible, make use of any surplus PT items [5] to assess effectiveness.&nbsp;</li><li>Monitor any trends in performance over time, concentration levels, etc.&nbsp;</li></ul><blockquote>Information about PT providers and PT schemes can be obtained from your national accreditation body, from the <a target="_blank" rel="noopener noreferrer" href="https://www.eptis.org/">EPTIS website</a> or from other national or international organizations.</blockquote>

Basic instructions for participants in a proficiency testing scheme

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 9th March 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you application notes by Agilent Technologies, Metrohm, Shimadzu and Thermo Fisher Scientific!<h3>1. Agilent Technologies: Spectral Transmission Measurements of Pharmaceutical Packaging</h3>Using the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=Cary+60+UV%E2%80%91Vis">Agilent Cary 60 UV‑Vis</a> Diffuse Reflectance Accessory following EP &lt;3.2.1&gt;, USP &lt;660&gt;, and USP &lt;661.2&gt;<ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_pharmaceutical_packaging_transmission_cary_60_uv_vis_dra_5994_8889en_agilent_2c933e5576.pdf">Full PDF for download</a></li></ul>Pharmaceutical containers play a significant role in maintaining final drug stability, integrity, and safety, from manufacturing to distribution to the end user. The ability of the packaging system to protect the drug from external agents is critical for quality assurance. Therefore, all pharmaceutical packaging systems must conform to stringent standards.&nbsp;Plastic and glass are commonly used materials for packaging, and they are typically transparent or opaque. Transparency to ultraviolet (UV) light can pose a risk to light‑sensitive pharmaceuticals, as exposure can initiate adverse—and sometimes harmful—photochemical reactions that can significantly affect drug quality and reduce shelf-life.1&nbsp;The EP and USP define well-established standards, designed to measure physiochemical and functional properties of packaging components intended to contain a drug product (pharmaceutical containers), to meet regulatory requirements. The EP Chapter &lt;3.2.1&gt; Glass Containers for Pharmaceutical Use includes a functionality test method to demonstrate adequate light resistance of colored glass containers through spectral transmission measurement. An included acceptance criterion specifies the allowed maximum amount of light transmitted by the tested material, defined by the drug product dosage administration form. For example, for glass containers that package oral drug products, the acceptance criterion defines that the observed spectral transmission should not exceed 10% at any wavelength in the range of 290 to 450 nm (&lt; 10%T).2 The identical test and criterion are found in USP Chapter &lt;660&gt; Containers – Glass.3 In addition, the USP Chapter &lt;661.2&gt; Plastic Packaging Systems for Pharmaceutical Use also includes the analogous functionality test method and acceptance criterion for plastic pharmaceutical packaging.4&nbsp;The <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=Cary+60+UV%E2%80%91Vis">Cary 60 UV-Vis spectrophotometer</a>, equipped with the Cary 60 UV-Vis DRA, was chosen for measurement due to its extended ability to reliably measure precise transmission of scattering materials (Figure 1). The Cary 60 UV-Vis is a versatile spectrophotometer; however, measuring materials like plastics and glass, which are textured, translucent, or opaque in a manner that scatters light can result in challenges in satisfactorily measuring light transmittance with standard techniques. In a standard spectrophotometer, scattering materials tend to diffuse transmitted light, deviating an unquantifiable amount of light from the direct optical path of the detector. The detector may not collect all the scattered (lost) light, resulting in inaccurate measurements and results.&nbsp;For this reason, the Cary 60 UV-Vis was equipped with an internal DRA, which uses a 50 mm integrating PTFE-coated sphere that easily sits inside the spectrophotometer's sample compartment. For these applications, using a DRA can optimize light collection. The sphere's design captures all scattered light uniformly, overcoming scattering losses for accurate measurement of transmitted light. In applications where total transmission is crucial for quality assurance, the DRA is an essential tool for accurate measurements.<h4>Conclusion&nbsp;</h4>In this application note, an Agilent Cary 60 UV-Vis spectrophotometer, fitted with an Agilent Cary 60 UV‑Vis DRA, was used to reliably and quickly determine the spectral transmission of packaging systems used for pharmaceuticals, following the EP &lt;3.2.1&gt;, USP &lt;660&gt;, and USP &lt;661.2&gt; test methods for functionality of light-resistant packaging systems. The integrating sphere enabled the instrument to accurately measure total transmittance of plastic and glass (scattering) materials.&nbsp;All containers presented less than the defined maximum %T specification, demonstrating light-resistance functionality for containing light-sensitive drug products for oral administration. This method illustrates the importance of accurate testing for quality assurance of pharmaceutical packaging. The Agilent Cary 60 UV-Vis spectrophotometer, paired with Cary WinUV Pharma software, delivers secure data management and compliance for regulated pharmaceutical labs.<h3>2. Metrohm: Multiparameter hops analysis by near-infrared spectroscopy (NIRS)</h3>Rapid determination of alpha acids, beta acids, cohumulone content, total oil content, HSI, and moisture<ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_nir_130_download_6177b89ee1.pdf">Full PDF for download</a></li></ul>The quality of hops and hop pellets is vital across the entire brewing supply chain. Traditional methods used for quality control (e.g., titration and HPLC) are highly accurate and widely accepted. They are also time consuming, labor intensive, and dependent on chemical reagents which not only incur ongoing material costs but also require careful handling and proper disposal. Near-infrared spectroscopy (NIRS) offers a compelling alternative when ultra-high precision is not necessary. It enables the rapid analysis of multiple parameters within a minute without using any chemicals. This Application Note outlines the measurement setup and the results of cohumulone, hop oils, and moisture content, the hop storage index (HSI), and hops acids analysis with NIRS.<h4>EXPERIMENTAL EQUIPMENT&nbsp;</h4>More than 500 fresh hop samples and ground hop pellets were analyzed on an <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=220&amp;search=omnis+nir">OMNIS NIR Analyzer Solid</a> (Figure 1). The samples were added to an OMNIS sample cup and analyzed in diffuse reflection mode. To include sample variety, the sample rotated during measurement to collect spectra from different locations. The automatically averaged spectra were used for model development. Spectra acquisition, model development, and validation were carried out with the OMNIS Software.&nbsp;Reference values for alpha acids were obtained using various official methods, including EBC 7.4, EBC 7.5, and EBC 7.7. Total oils and beta acid content were determined using EBC 7.4, while EBC 7.7 was employed for cohumulone analysis. Moisture content and the hop storage index (HSI) were measured using a halogen moisture analyzer and a UV-VIS photometer, respectively.<h4>CONCLUSION</h4>This Application Note demonstrates the feasibility of using NIR spectroscopy for the analysis of freshly harvested hops and ground hop pellets to determine cohumulone, moisture, and total oil content, HSI, and alpha and beta acids. Using alpha acids as an example, the difference between a prediction model covering the full concentration range and a model specific to a narrower range was highlighted. The latter reduced the prediction error by a factor of two.&nbsp;Users can apply this approach to maximize accuracy. In the OMNIS Software, both models can be combined to automatically perform the following sequence. First, the alpha acid concentration is estimated using the broad-range model; then, a more precise prediction is made using the restricted-range model.<h3>3. Shimadzu: Observation of Acrylic Block Fracture during Impact Compression Using the Hopkinson Bar Method</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01146_en_dc42e77a9c.pdf">Full PDF for download</a></li></ul><h4>User Benefits</h4><ul><li>The HPV -X3 offers three times the resolution of conventional models, enabling observation of specimen fracture at much higher resolution.</li><li>With a maximum frame rate of 20 Mfps, the HPV-X3 is well-suited for observing high-speed phenomena such as an impact test</li></ul>Understanding materials properties is critical to product design. In particular, for applications such as transportation equipment, where materials may be subjected to impact loads, it is essential to evaluate not only static properties but also impact properties. When subjected to impact, materials may exhibit stress and strain characteristics different from those under static loading, making it essential to quantify these characteristics through impact testing.&nbsp;The Hopkinson bar method is a well-established technique for impact compression testing. Proposed by B. Hopkinson, this method enables detailed analysis of a material’s impact response and evaluation of its fracture properties by subjecting the specimen to a sudden force using a bar-launching device. This paper presents an example of an impact compression test on an acrylic specimen with a central circular hole, recorded with an HPV-X3 high-speed video camera (Fig. 2) using the Hopkinson bar method.<h4>Imaging System&nbsp;</h4>The imaging devices are listed in Table 1, and the imaging conditions are listed in Table 2. As shown in Fig. 4(b), laser illumination was directed from the rear of the specimen toward the lens, and imaging was performed with the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=HPV-X3">HPV-X3</a> using a close-up ring, bellows, and macro lens. This setup enabled observation of the fracture process in the acrylic block. Two types of imaging were conducted: observation of crack propagation immediately after loading, and observation of subsequent fracture.<h4>Conclusion&nbsp;</h4>The impact compression test of an acrylic specimen using the Hopkinson bar method was observed using the HPV-X3 highspeed video camera. Inside the compressed specimen, the propagation of a wavefront believed to be a stress wave was first observed. Subsequently, cracks propagated from the central circular hole toward the left and right surfaces, and finally, diagonal cracks formed, leading to complete fracture. The progress of this series of fracture processes was clearly captured.&nbsp;The HPV-X3 has three times the resolution of the previous <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=HPV-X2">HPVX2 model</a>, enabling more detailed observation of specimens during impact tests, including the Hopkinson bar method. Furthermore, because fracture phenomena during impact testing occur at high speeds, the HPV-X3, which can record images at up to 20 Mfps, is ideal for capturing them.<h3>4. Thermo Fisher Scientific: Analysis of silica in air filters using ARL X’TRA Companion X-ray Diffractometer</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/analysis_of_silica_in_air_an41521_a3b8eb33d5.pdf">Full PDF for download</a></li></ul>The analysis of silica in air filters is a critical aspect of occupational health and safety, aimed at protecting workers from the harmful effects of inhaling crystalline silica particles, which can lead to diseases such as silicosis and lung cancer. The NIOSH 7500 method (NIOSH, 2003) provides a detailed and standardized procedure for the determination of crystalline silica in air samples using X-ray diffraction (XRD). This method involves the collection of air samples on filters, which are then analyzed to identify and quantify the crystalline silica phases, including quartz, cristobalite, and tridymite.&nbsp;XRD is chosen for its high specificity and sensitivity in distinguishing different crystalline forms of silica, making it a reliable analytical technique. The method outlined in NIOSH 7500 requires meticulous sample preparation, including the proper collection and handling of air filters, calibration with known standards, and strict adherence to analytical parameters to ensure accurate and reproducible results. Following the NIOSH 7500 norm and equivalent standards helps ensure the reliable monitoring of workplace air quality, thereby safeguarding workers’ health. The use of XRD in analyzing silica in air filters is an essential component of industrial hygiene and environmental monitoring programs, facilitating the detection and control of hazardous silica exposure in occupational settings.<h4>Instrument and software&nbsp;</h4>The <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2296">Thermo Scientific™ ARL™ X’TRA Companion X-ray Diffractometer</a> (c.f. Figure 1) is a simple, easy-to-use benchtop XRD instrument for routine phase analysis as well as more advanced applications. The ARL X’TRA Companion XRD uses a θ/θ goniometer (160 mm radius) in Bragg-Brentano geometry coupled with a 600 W X-ray source (Cu or Co). The radial and axial collimation of the beam is controlled by divergence and Soller slits, while air scattering is reduced by a variable beam knife. An integrated water chiller is available on demand. Thanks to the innovative solid state pixel detector (55 x 55 μm pitch), the ARL X’TRA Companion XRD provides very fast data collection and comes with one-click Rietveld quantification capabilities and automated result transmission to a LIMS (laboratory information management system).<h4>Your benefits&nbsp;</h4>The ARL X’TRA Companion XRD provides data perfectly suited to quantify respirable quartz in air filters. Utilizing a calibration curve in a one-click refinement delivers results within minutes, ensuring ease-of-use for operators and reducing training requirements. XRD analysis of air filter samples complies with the NIOSH 7500 standard.

News from LabRulezICPMS Library - Week 11, 2026

How can we make the production of supercapacitors for energy storage more sustainable and replace the traditionally used but toxic solvent NMP (N-methyl-2-pyrrolidone)? According to scientists from CATRIN at Palacký University, the “green” solvents Cyrene and Tamisolve may be a suitable alternative. In an article published in the <a target="_blank" rel="noopener noreferrer" href="https://www.sciencedirect.com/science/article/pii/S1385894725130696?via%3Dihub#s0060">Chemical Engineering Journal</a>, they have shown that these solvents can be used in production without reducing the performance of the equipment. They thus offer a path to the next generation of sustainable, high-performance supercapacitors for industrial use.“Supercapacitors are one of the modern technologies for storing electric energy. As sustainable energy storage becomes more prominent, it is essential to replace the hazardous solvents used in the production of supercapacitor electrodes. Our study presents Cyrene and Tamisolve as environmentally friendly alternatives to the toxic solvent NMP, which is traditionally used in production. Both tested solvents enabled the preparation of electrodes that maintain high electrochemical performance while improving environmental compatibility,” said Michal Otyepka, corresponding author of the article.The electrodes were prepared using nitrogen-doped graphene as the active material in combination with two types of binders. The first was a common fluorinated binder (PVDF), which is widely used in industry, including in the manufacturing of battery electrodes. The researchers also tested a fluorine-free binder (PVP), which has a lower environmental impact and is more soluble in environmentally friendly solvents. Using various combinations, they monitored the performance and stability of the electrodes as well as their mechanical resistance.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CATRIN_Vedci_z_CATRIN_nabizeji_zelenejsi_cestu_pro_vyrobu_superkondenzatoru_443775296a.jpg" alt="CATRIN: CATRIN researchers offer a “greener” way to make supercapacitors" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CATRIN_Vedci_z_CATRIN_nabizeji_zelenejsi_cestu_pro_vyrobu_superkondenzatoru_443775296a.jpg 245w," sizes="100vw" width="1536" height="768">“The results showed that not only can the alternative solvents Cyrene and Tamisolve fully replace the toxic solvent NMP, but also that the prepared electrodes have the necessary mechanical properties. Their compatibility with both fluorinated PVDF and non-fluorinated PVP binders, together with excellent layer uniformity and electrochemical stability, makes them ideal for use in scalable applications. This is essential for industrial production,” said the publication’s first author, Ivan Dědek.Cyrene, or dihydrolevoglucosenone, is obtained from renewable biomass sources such as cellulose. Tamisolve (N-butyl-2-pyrrolidone) is a substance related to the commonly used NMP, but is more gentle on human health and the environment.Supercapacitor research has been a priority at CATRIN for almost ten years. In addition to developing new active materials, such as the successful nitrogen-doped graphene (SC-GN3), it also focuses on environmentally friendly and industrially feasible manufacturing processes. The replacement of toxic NMP with the “greener” solvents Cyrene and Tamisolve confirms that more sustainable production can go hand in hand with high performance and represents an important step towards industrial implementation.<blockquote><h4>The original article</h4><h4><a target="_blank" rel="noopener noreferrer" href="https://www.sciencedirect.com/science/article/pii/S1385894725130696?via%3Dihub#s0060">Toward transitioning to green and sustainable supercapacitors</a></h4>Ivan Dědek, Vojtěch Kupka, Veronika Šedajová, Petr Jakubec, Matěj Navrátil, Michal Otyepka&nbsp;Chemical Engineering Journal, 529, 2026, 172220<a target="_blank" rel="noopener noreferrer" href="https://doi.org/10.1016/j.cej.2025.172220">https://doi.org/10.1016/j.cej.2025.172220</a><h6>licensed under <a target="_blank" rel="noopener noreferrer" href="https://creativecommons.org/licenses/by/4.0/">CC-BY 4.0</a></h6></blockquote><h4>Abstract</h4>The rapid advancement of supercapacitor technologies has intensified the demand for sustainable electrode fabrication methods that minimize environmental impact. A major challenge arises from the extensive use of the toxic solvent N-methyl-2-pyrrolidone (NMP), which is subject to increasingly stringent regulatory restrictions. We demonstrate that NMP can be effectively replaced with two green solvents, dihydrolevoglucosenone (Cyrene) and N-butyl-2-pyrrolidone (Tamisolve), without compromising electrochemical performance. Electrode formulations were prepared using nitrogen-doped graphene as the active material, in combination with either polyvinylidene fluoride (PVDF), a widely employed fluorinated binder, or polyvinylpyrrolidone (PVP), a non-fluorinated alternative with improved environmental profile. Optimized coatings exhibited high mass loadings exceeding 6 mg cm−2 while maintaining strong adhesion to current collectors, an often overlooked yet critical parameter for scalable manufacturing. Electrochemical testing revealed that PVDF in Cyrene delivered an energy density of 66.6 Wh kg−1 at a power density of 1.85 kW kg−1, with excellent cycling stability, retaining 91 % of capacitance after 100,000 cycles. PVP in Cyrene provided a more environmentally benign alternative, achieving an energy density of 64.2 Wh kg−1 at 1.80 kW kg−1, with 78 % capacitance retention after 100,000 cycles, thereby highlighting the trade-off between performance and sustainability.

CATRIN researchers offer a “greener” way to make supercapacitors

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Eurachem is a European network promoting international traceability of chemical measurements and good analytical practice. It provides expert guidance, supports method validation, uncertainty evaluation, proficiency testing, and facilitates discussion on technical and policy issues in analytical quality.

Eurachem

The Czech Advanced Technology and Research Institute (CATRIN) at Palacký University is a cutting-edge scientific hub dedicated to advancing research in the fields of nanotechnology, biotechnology, and biomedicine. At its core, CATRIN boasts outstanding scientific teams, featuring international researchers. We emphasize interdisciplinarity, foster global collaborations, and work to translate our research findings into practical applications.

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Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Products from category XPS from Thermo Fisher Scientific - page 1

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