Explore damage-free XPS depth profiling with the Hypulse Surface Analysis System
The Thermo Scientific Hypulse Surface Analysis System delivers a new approach to XPS depth profiling. It combines traditional ion beam milling with femtosecond laser ablation technology to help you accurately examine thin films, coatings, and multi-layer structures, all without the risk of chemical damage to the sample.
Join us as we introduce the Hypulse System and highlight how it can help you revolutionize XPS depth profiling.
In this webinar, you will:
- Learn how femtosecond laser ablation delivers depth profiling to over 30 µm
- Discover advanced depth profiling capabilities available with the Hypulse System
- See how the combination of laser ablation and ion milling makes it possible to analyze a wider variety of materials
Presenter: Tim Nunney
Tim is an applications development and marketing manager for the Thermo Scientific surface analysis (X-ray photoelectron spectroscopy) product line. He has been with Thermo Fisher Scientific since 2004, previously holding positions as an applications scientist, product manager, and in operations. Prior to joining Thermo Fisher, Tim worked as a post-doctoral research fellow at the University of Southampton investigating the dynamics of molecular dissociation on metal surfaces.
