<p><strong>Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 22nd June 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!</strong></p><blockquote><p><span style="font-size:20px;">👉 </span><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library"><span style="font-size:20px;"><strong>SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</strong></span></a></p></blockquote><blockquote><p><strong>👉 Need info about different analytical techniques?</strong> Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library"><strong>LabRulezLCMS</strong></a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library"><strong>LabRulezGCMS</strong></a> libraries.</p></blockquote><p>This week we bring you technical note by <strong>Agilent Technologies</strong>, application note by <strong>Shimadzu </strong>and other document by <strong>Thermo Fisher Scientific!</strong></p><h3><strong>1. Agilent Technologies: Dual-Cell System (DCS) and Advanced Helium Mode (AHM)</strong></h3><p><strong>Technological developments for higher sensitivity and better interference removal than traditional He-KED</strong></p><ul><li>Technical note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/te_batch_conversion_tool_9500_icp_ms_5994_9214en_agilent_0a1bba76e2.pdf"><strong>Full PDF for download</strong></a></li></ul><h4><strong>Evolution of Agilent’s Collision Reaction Cell (CRC) technology&nbsp;</strong></h4><ul><li><strong>2001: </strong>Launched the first ICP-MS with CRC—the Agilent 7500c with Octopole Reaction System (ORS)&nbsp;</li><li><strong>2011:</strong> Introduced High Energy Helium Mode (HEHe) using Collision Induced Dissociation (CID)&nbsp;</li><li><strong>2012: </strong>Released the world’s first Triple Quadrupole ICP-MS—the Agilent 8800 ICP-QQQ&nbsp;</li><li><strong>2016:</strong> Launched the second generation Triple Quadrupole ICP-MS with Axial Acceleration—the Agilent 8900 ICP-QQQ&nbsp;</li><li><strong>2026: </strong>Introduced the innovative Dual-Cell System (DCS) and Advanced Helium Mode (AHM) for the Agilent 9500 ICP-QQQ</li></ul><p>Collision/Reaction Cell (CRC) technology is now a standard feature in modern ICP-MS systems, providing a reliable means of eliminating spectral interferences that compromise data quality. ICP-MS systems with integrated CRCs range from single quadrupole (SQ) ICP-MS used in environmental and food analysis, to triple quadrupole ICP-MS (ICP-QQQ) for advanced research applications. For routine applications, Helium Kinetic Energy Discrimination (He KED) mode, commonly referred to as helium mode (He mode), is the most widely used CRC operational mode. The widespread use of He mode is due to its universal effectiveness in reducing a broad range of polyatomic interferences without the need for element-specific optimization.&nbsp;</p><p>Unlike CRCs that rely on reactive cell gases and require complex tuning (often referred to as reaction cells), He mode effectively mitigates many commonly occurring polyatomic ion interferences without the need for intricate adjustments. In contrast, reaction cells often require careful selection of gas type (such as ammonia or oxygen) and tuning parameters based on the specific interfering ions on analytes of interest.&nbsp;</p><p>Building on the simplicity of He mode, Agilent has developed Advanced Helium Mode (AHM) for the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=9500"><strong>Agilent 9500 Triple Quadrupole ICP-MS (ICP-QQQ)</strong></a>. AHM represents a breakthrough in interference removal technology, enabled by the newly designed Agilent Dual-Cell System (DCS) and high-speed cell voltage control. These innovations deliver high sensitivity across the mass range and superior interference removal performance for routine applications. Compared to conventional He mode, AHM demonstrates the following improvements:</p><ul><li>Around a 20-fold sensitivity improvement for low-mass elements, such as beryllium (Be) and boron (B)&nbsp;</li><li>Around a 2-fold improvement for mid-to-high mass elements&nbsp;</li><li>A reduction of more than 33% in data acquisition time while maintaining detection limits (DLs), accelerating analytical measurement times&nbsp;</li></ul><p>AHM not only replaces traditional He KED but also consolidates multiple tuning modes including no gas, He, and HEHe into a single, streamlined mode. Integrated into the 9500 ICP-QQQ, AHM is a next-generation standard He mode that is faster, simpler, and delivers higher performance than its predecessor. This technical note describes the performance enhancement mechanisms of the DCS and AHM. It also includes some comparative results with conventional He KED mode to highlight the analytical improvements of AHM.</p><h4><strong>Overview and advantages of AHM&nbsp;</strong></h4><p>Typically, multi-element ICP-MS methods apply no gas mode to the determination of low-mass elements like Be and B due to low sensitivity in traditional He KED mode. Consequently, many routine ICP-MS applications have required multiple tune setups, combining no gas, He, and HEHe. Each mode switch introduces a delay due to cell pressure stabilization requirements.&nbsp;</p><p>In practice, low-mass elements (m/z &lt; 23) are generally unaffected by polyatomic ion interferences, so KED is often unnecessary. Therefore, in AHM, different voltages are applied to the DCS (effectively disabling KED) for low-mass elements, while keeping standard settings for elements with m/z ≥ 23.&nbsp;</p><p>The DCS voltages are dynamically switched in sync with Q2 using a high-speed voltage control circuit, providing over 20× sensitivity improvement for low-mass elements compared to conventional He mode. AHM eliminates the need to run in no gas mode, greatly simplifying the method. As a default approach, AHM alone is suitable for most applications.<sup>1</sup></p><h3><strong>2. Shimadzu: Damping Force Characteristic Test of Suspension Struts [JASO C611]</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01017_en_2fbbb9c247.pdf"><strong>Full PDF for download</strong></a></li></ul><h5><strong>User Benefits</strong></h5><ul><li>Damping force characteristic tests on suspension struts can be performed based on the JASO C611 standard.&nbsp;</li><li>Combination test enables automatic speed change and measurement.&nbsp;</li><li>High responsiveness of the EMT series enables testing at high excitation speed.</li></ul><p>Various components play an important role in achieving a comfortable ride in vehicles. Among them, the suspension strut used in the suspension system is an important component that stabilizes the vehicle body by mitigating the impact caused by uneven road surfaces.&nbsp;</p><p>“JASO C611 Suspension Struts for Automobiles”1), a standard of JASO (Japanese Automotive Standards Organization), established by JSAE, specifies the definition, quality, and test method for suspension struts. There is no international standard that is equivalent to JASO C611.&nbsp;</p><p>In order to improve the performance of suspension struts, it is necessary to measure the damping force against speed by changing the excitation speed. The performance of suspension struts can be confirmed by measuring the response, such as the relationship between speed and damping force and the Lissajous waveform.&nbsp;</p><p>This article introduces an example of the test method “Damping Force Characteristic Test” specified in JASO C611, which was conducted on a Shimadzu EMT series electromagnetic fatigue testing machine.</p><h4><strong>Testing Equipment&nbsp;</strong></h4><p>The EMT-1kNV-50 electromagnetic dynamic and fatigue testing machine was used in this test. Fig. 1 shows a photograph of the testing machine. The electromagnetic actuator with extremely high frequency response enables highly accurate dynamic testing. In this test, the maximum test speed was 0.6 m/s. The EMT seriesis most suitable for testing at such high frequencies.</p><h4><strong>Conclusion&nbsp;</strong></h4><p>A damping force characteristic test on a suspension strut based on JASO C611 was conducted using an EMT series electromagnetic fatigue testing machine and Windows software for 4830. The test conditions were set using the excitation speed, and it was confirmed that the test was accurately controlled as set. The standard “JASO C611 Suspension Struts for Automobiles” referred to this time is derived from “JASO C602 Automotive Parts - Telescopic Shock Absorbers for Suspension Systems”2). Although C602 also prescribes a damping force characteristic test, it is almost equivalent to the C611, and the test machine configuration can be used by replacing the jig.</p><h3><strong>3. Thermo Fisher Scientific: </strong><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2206"><strong>Hypulse Surface Analysis System</strong></a></h3><ul><li>Other document</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/Hypulse_DS_0516_EN_05_2025_1998238_WEB_0e44628a5e.pdf"><strong>Full PDF for download</strong></a></li></ul><h4><strong>Key features&nbsp;</strong></h4><ul><li><strong>Unique depth profiling capability</strong>. The femtosecond laser ablation system provides controlled material removal without inducing chemical damage to your sample.&nbsp;</li><li><strong>Fast, efficient XPS</strong>. Quick sample pump-down times, a unique sample viewing system, and high sensitivity for all analysis areas help ensure exceptional data quality, even for highly challenging samples.&nbsp;</li><li><strong>Co-incident additional spectroscopy</strong>. Optimize the information obtained from features of interest with the addition of optional analytical techniques, including ion scattering spectroscopy, reflected electron energy loss spectroscopy, and UV photoelectron spectroscopy.&nbsp;</li><li><strong>Fully featured software. </strong>The latest version of the Avantage Data System is included for data collection and analysis, with the ability to import data into Thermo Scientific Maps Software for correlation with electron microscopy images.</li></ul><h4><strong>Technical highlights&nbsp;</strong></h4><h5><strong>Micro-focused, monochromated aluminum K-alpha X-ray source&nbsp;</strong></h5><ul><li>Computer-controlled quartz-crystal monochromator&nbsp;</li><li>Software-adjustable spot size&nbsp;</li><li>Spot size range: 10–400 μm&nbsp;</li><li>Motorized, water-cooled anode with 16 positions&nbsp;</li></ul><h5><strong>Electron optics and analyzer</strong></h5><ul><li>Electrostatic objective lens&nbsp;</li><li>Full 180° hemispherical μ-metal shielded analyzer&nbsp;</li><li>Continuously selectable pass energy: 1–400 eV&nbsp;</li><li>128-channel, signature-corrected, positionsensitive detector&nbsp;</li><li>Automatic energy scale and transmission function calibration&nbsp;</li></ul><h5><strong>Charge compensation system&nbsp;</strong></h5><ul><li>Patented dual-beam electron and ion source&nbsp;</li><li>Beam energy for charge compensation: 0–5 eV&nbsp;</li></ul><h5><strong>Femtosecond-laser ablation system&nbsp;</strong></h5><ul><li>Fully integrated 1,030 nm pulsed femtosecond-laser source&nbsp;</li><li>Class 1 laser system&nbsp;</li><li>Tunable pulse energy up to 1 mJ&nbsp;</li><li>Computer-controlled attenuation optimizes ablation conditions&nbsp;</li><li>Beam imaging module for system calibration and alignment</li></ul>

News from LabRulezICPMS Library - Week 26, 2026

Electron spectroscopy for chemical analysis of liquids

<p><strong>In the week from June 29, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry</strong></p><blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars"><strong>👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</strong></a></h4><p><strong>👉 Search and filter in the largest global database</strong> with over <strong>5 500 GC, LC, MS and spectroscopy webinars</strong>.</p></blockquote><h5><strong>1. Metrohm: Simplifying Through-Container Testing with Raman Spectroscopy in the Pharmaceutical Industry</strong></h5><ul><li>Mo, 29.6.2026 15:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6308">Registration</a></li></ul><p>In this webinar, we will demonstrate a more robust and practical alternative to SORS for see-through Raman analysis.</p><h5><strong>2. SelectScience: End-to-end PAT: Connecting advanced analytics and data across the bioprocess lifecycle</strong></h5><ul><li>Mo, 29.6.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6307">Registration</a></li></ul><p>Learn how integrated PAT strategies combining NMR, Raman, IR, and digital workflows enable continuous process understanding, smoother tech transfer, and QbD from development to GMP manufacturing.</p><h5><strong>3. Bruker: Bruker Fluorescence Microscopy Solutions: Automated Imaging and Light-Sheet Microscopy</strong></h5><ul><li>Tu, 30.6.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6309">Registration</a></li></ul><p>Discover Bruker’s integrated imaging ecosystem combining light-sheet microscopy, high-content screening, and high-performance data management for scalable, high-quality biological imaging workflows.</p><h5><strong>4. Agilent Technologies: Measuring Diverse Samples with UV/VIS Spectrometers and Integrating Spheres</strong></h5><ul><li>Tu, 30.6.2026 20:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6052">Registration</a></li></ul><p>This webinar will discuss diffuse transmission and reflection UV/VIS measurements, including how to perform measurements with Agilent’s Cary 60 UV/VIS Spectrometer.</p><h5><strong>5. Milestone: Unlock Smarter Digestion: AI and the Smart Features that Transform Your Daily Routine</strong></h5><ul><li>We, 1.7.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6312">Registration</a></li></ul><p>Learn how Milestone’s intelligent digestion technologies, including MAIA AI Agent, easyTEMP, and SRC, help reduce downtime, simplify workflows, and improve laboratory productivity.</p><h5><strong>6. Bruker: High-Energy XRD - Diffraction Without Limits</strong></h5><ul><li>Th, 2.7.2026 10:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6314">Registration</a></li></ul><p>Join us to explore how high-energy XRD with the D8 ADVANCE HE and D8 DISCOVER HE enables the study of materials under realistic conditions.</p><h5><strong>7. Agilent Technologies: Spectral Flow Cytometry Masterclass - Session 1</strong></h5><ul><li>Fr, 3.7.2026 07:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6316">Registration</a></li></ul><p>Learn how full-spectrum flow cytometry enables high-dimensional cell analysis. Explore spectral flow technology, experimental design, and applications in immunology, oncology, and vaccine research.</p>

Webinars LabRulezICPMS Week 27/2026

Article

Webinars

Application

Scientific article

Science and research

Everything from the world of analytical chemistry in one place. We connect people in solving their problems. At Labrulez you will find all the necessary information easily, quickly and clearly. Stop searching and start finding.

LabRulez

Bruker

Thermo Fisher Scientific

<p><strong>Research and quality assurance labs often must analyze materials on the micro level.</strong></p>
<p>Combining optical microscopy with vibrational spectroscopy can provide a holistic view of the structure and functional relationship of the material and can be used for identifying foreign materials and defects.</p>
<blockquote>
<p><strong>Presenter:</strong> Suja Sukumaran (Senior Application Scientist, Thermo Fisher Scientific)</p>
</blockquote>
<blockquote>
<p>Dr. Suja Sukumaran obtained her Ph.D. in Biophysics from JW Goethe University, Germany. Currently, she is an applications scientist at Thermo Fisher Scientific. Suja has worked in the field of spectroscopy for over 17 years. Her FTIR application expertise spans many industries including polymer/chemical, pharmaceutical, forensics, semiconductor, and food industries.</p>
</blockquote>


Thermo Scientific: Sweating the Small Stuff - Spectroscopy on the Micro Scale

Sweating the Small Stuff - Spectroscopy on the Micro Scale

Combining optical microscopy with vibrational spectroscopy can provide a holistic view of the structure and functional relationship of the material.

Sweating the Small Stuff

<p><strong>As we all know, the need for efficient and sustainable energy storage solutions has never been greater. With the increasing demand for electric vehicles, and storage of renewable energy, the battery industry together with academic institutes are constantly evolving and pushing the boundaries of what is possible.</strong></p><p>Bruker is at the forefront of this innovation, providing cutting-edge technologies and solutions for battery research and manufacturing. In this webinar, we will explore the latest developments in Bruker's technology and how they can be applied to optimize battery performance, reduce costs, and accelerate the path towards a cleaner energy future.</p><p>Join our 75 minutes experts discussion as they dive into the fascinating world of batteries and discover how Bruker is shaping the future of it.</p><p><strong>Key Learning Topics:</strong></p><ul><li>You will learn about a complete portfolio of technologies applied to battery research and production, including AFM, NMR, EPR, MS, FTIR, XRD, XRF, XRM, RAMAN, EDS and EBSD. These technologies represent the excellence of Bruker's analytical tools and are complementary in their applications. They are used in various ways to help researchers and manufacturers understand how batteries work, how they can be improved, and how they can be produced and recycled more efficiently.</li></ul><p><strong>Who Should Attend?</strong></p><ul><li>Battery manufacturers</li><li>Research and development organizations</li><li>Academic institutions</li><li>Material science organizations</li><li>Electrochemical and analytical chemistry organizations</li><li>Testing laboratories involved in battery research and development.</li><li>Government agencies involved in renewable energy and sustainability.</li><li>Investors interested in the battery market.</li><li>Battery technology experts and engineers</li></ul><blockquote><p><strong>Presenter: </strong>Andrea Steck Ph.D. (Principal Scientist - Bruker BioSpin (Ettlingen, Germany))</p><p>Andrea Steck joined BBIO Germany in 2010 to perform contract services, then stepped into food profiling development, acted as Quality Manager (ISO-17025), and now is responsible for supporting, developing, and driving AIC-DEV projects as Principal Scientist.</p><p>Andrea holds a PhD in Chemistry (TU Munich). She gained extensive experience in NMR pulse sequence development and structure elucidation (Berne, Switzerland), and in leading an analytical (NMR/MS/IR) laboratory in big pharmaceutical industry (Vienna, Austria). She then joined Bruker Austria as Manager Pursuant to Trade Law, responsible for contract services and customer acquisition.</p><p><strong>Presenter: </strong>Hugues Guérault (Application Manager – Bruker Advanced X-Ray Solutions (Karlsruhe, Germany))</p><p>Hugues Guérault joined Bruker in 2002 as Application Scientist. He is now leading Bruker AXS application team and manages worldwide the activities of the application laboratories for equipment demonstrations and customer training.</p><p>Hugues holds a PhD in Material Science from Le Mans University (France) and made a post-doc at the University of Leuven (Belgium). Overall, he has acquired more than 25 years of experience in material characterization using X-ray diffraction.</p><p><strong>Presenter: </strong>Peter De Wolf, PhD (Sr. Director AFM Technology Development &amp; Applications, Bruker Nano Surfaces &amp; Metrology, Santa Barbara, CA, USA)</p><p>Joined Bruker after obtaining Ph.D. in Electrical Engineering from the University Leuven &amp; IMEC, Belgium in 1998 focused on the development of novel AFM characterization methods. Author and co-author of over 40 publications related to property characterization using AFM, and co-inventor of several AFM methods. In his role, Peter is responsible for developing, driving, and leveraging new technology and applications for Bruker’s AFM Instrumentation.</p><p><strong>Presenter: </strong>Ph.D. Bob Galvin, FRSC (Vice President BAMS, Bruker Daltonics, London, UK)</p><p>Bob Galvin obtained his PhD using mass spectrometry to investigate novel catalytic reactions and since then has always been involved in this technology. &nbsp;He joined Bruker eleven years ago and has held a number of executive positions during this period.</p><p><strong>Presenter: </strong>Rebecca Keller (Scientific Content Creator – Bruker Scientific LLC (Billerica, MA, USA))</p><p>Rebecca joined Bruker Scientific in 2022 to support scientific content creation for applied markets as well as research and academia. Thanks to her extensive experience in crafting content for chemistry e-learning platforms, she excels at presenting complex ideas with exceptional clarity and precision.</p><p>Rebecca graduated in Chemistry at the University of Oregon in 2019 and has since sought to improve scientific communication by producing content across multiple platforms.</p><p><strong>Presenter: </strong>Michele Gironda (Head of Global Segment Management – Bruker Nano Analytics (Berlin, Germany))</p><p>Michele Gironda joined Bruker in 2017 when Bruker acquired XGLab where he was Director Sales and Marketing. He is now our Head of Global Market Segment Management in the Nano Analytics Division. In his role Michele manages worldwide activities for the key strategic market segments in cooperation with sales, marketing, application and product managers.</p><p>Michele holds a Master Degree in Engineering obtained with his studies in Politecnico di Milano (Italy) and Universitat Politecnica de la Catalunya in Barcelona (Spain).</p></blockquote>

Bruker: Shaping the future of batteries: Bruker technologies across the entire value chain

Shaping the future of batteries: Bruker technologies across the entire value chain

Join our 75 minutes experts discussion as they dive into the fascinating world of batteries and discover how Bruker is shaping the future of it.

Bruker technologies - Shaping future of batteries

<p><strong>By combining infrared spectroscopy with atomic force microscopy (AFM-IR), it is possible to perform chemical analysis and compositional mapping with a spatial resolution down to 10 nm, which greatly surpasses standard optical diffraction limits. During this 2-hour event, our speakers explore:</strong></p><ul><li>Origins of the AFM-IR technique</li><li>Recent advances in AFM-IR technology</li><li>Applications that can benefit from AFM-IR spectroscopy—especially life sciences and environmental chemistry</li></ul><p>Bruker Application Scientist Dr. Cassandra Phillips hosts the workshop and live demos, providing an overview of Bruker's latest nanoIR product updates.&nbsp;</p><p><strong>Watch this webinar to:</strong></p><ul><li>Hear distinguished guest speakers discuss their work on AFM-IR with the nano-IR platform</li><li>Experience Bruker's new patented Surface Sensitive mode</li><li>Become familiar with Bruker's new AFM-IR platforms</li></ul><blockquote><p><strong>Presenter: </strong>Xiaoji Xu, Ph.D.</p><p><strong>Presentation:</strong> NanoIR through PeakForce Infrared (PFIR) Microscopy</p><p>Here, Xiaoji Xu, Ph.D. (Lehigh University) introduces the novel PFIR method of AFM-IR developed at Lehigh University. This method of label-free chemical nanoscopy is based on the mechanical detection of photothermal response by AFM operated in PeakForce Tapping mode and ultimately can achieve a higher spatial resolution (sub-10 nm) and provide more rich chemical information than many of the existing tools we use for chemical imaging—or imaging in general—while also providing greater flexibility in applicability to samples in both air and liquid.</p><p>In addition to providing a review of the strengths and benefits of PFIR as they relate to foundational AFM-IR and PeakForce Tapping principles and capabilities, the presentater explores and provides detailed, real-world examples of PFIR's applicability to a broad range of sample types and experimental settings.</p><p><strong>Presenter: </strong>Dmitry Kurouski, Ph.D.</p><p><strong>Presentation:</strong> Biology at the Nanoscale: From Viruses to Amyloids</p><p>In this presentation, Dmitry Kurouski, Ph.D. (Texas A&amp;M University) showcases his team's research and findings using TERS and AFM-IR to investigate viruses, viral particles, and alpha-synuclein oligomers. Topics of this discussion range from an exploration of how IR/AFMIR spectroscopy reveals a variety of infrared spectra in biological samples that are otherwise inaccessible by traditional Raman microscopy methods, to a detailed presentation of the team's findings via a combination of AFM-IR and TERS about changes observed in the secondary structural organization and surface structure information of populations of oligomers relative to their impact on the development of Parkinson's disease.</p><p>These two technologies possess different capabilities that demonstrate strong complementarity in terms of both the chemical information available and the achievable probing depth.</p><p><strong>Presenter: </strong>Cassandra Philips, Ph.D.</p><p><strong>Presentation:</strong> Quantitative Demonstration of Surface Sensitivity with nanoIR3</p><p>The presenter conducts a profile analysis of a PMMA wedge sample in both Resonance enhanced and Surface Sensitivity modes, then demonstrate the analytical process for data collected in Surface Sensitivity mode.</p><p>Comparison of the data outputs of various operational modes demonstrates that using the same probe and sample, users can switch from looking at bulk measurements (where the signal increases linearly with the thickness) to measurements with a surface sensitivity on the order of 15 nm just by adjusting the parameters.</p><p>Surface Sensitivity mode enables measurement of the top layer of a sample with significantly improved accuracy over other operational modes, as it collects data only from the surface and not from the absorbing material beneath it.&nbsp;</p><p><strong>Presentation:</strong> Demonstration: New Platforms for AFM-IR</p><p>The presenter introduces the unique capabilities of a new Bruker platform for AFM-IR imaging.</p><p>Looking at a sample of PMMA beads in epoxy resin, the presenter demonstrates the new platform's capability to achieve higher acuity and operate at higher scan speeds than other nanoIR systems. Its integration with both Bruker's most advanced AFM controller and legacy Tapping Mode imaging capabilities are explored.</p><p>Additionally, the presenter showcases the ability to switch wavenumber and reconfigure laser power mid-scan (to look at both the epoxy band and the carbonyl band of the sample), as well as the platform's unique capacity to switch between sample-scanning and tip-scanning configurations, enabling investigation of the chemical composition and mechanical properties of the same sample using the same probe.</p></blockquote>

Bruker: NanoIR Spectroscopy & Imaging: Recent Developments and Applications

NanoIR Spectroscopy & Imaging: Recent Developments and Applications

Find out more about Bruker's latest nano IR product updates and see real-time demonstrations of the new Surface Sensitive mode and new AFM-IR platforms

NanoIR Spectroscopy & Imaging - Developments & Applications

<div><div><div><div><p><strong>This webinar is aimed at the packaging industry, or more precisely, specialists involved in packaging in the food industry. In a first hands-on session, our host will first present two samples and then analyze them together with the audience.&nbsp;</strong></p><p>First, we will look for an EVOH layer in a multi-layer packaging film and then we will check the influence of the adhesive in a cold weld on a candy bar packaging. After that, the utility of FT-IR will be further illustrated briefly by other use-cases, before we continue with the question and answer session.</p><h5><strong>What you will learn about:</strong></h5></div><div><div><div><div><div><div><ul><li>FT-IR microscopy in packaging failure analysis</li><li>Multi-layer polymer films and very thin layers (EVOH)</li><li>Behavior of adhesives in complex matrices</li><li>Troubleshooting of food packaging</li></ul><h5><strong>What is the goal of the webinar:</strong></h5></div><div><div><div><div><div><div><ul><li>Demonstrate the utility of FT-IR microscopy</li><li>Showcase the importance of unbiased data</li><li>Highlight the unique advantages of IR imaging</li></ul><h5><strong>We will discuss:</strong></h5></div></div></div></div></div><div><div><div><div><div><div><ul><li>Application example: Multilayer-Film with EVOH layer smaller than 2 µm</li><li>Application example: Cold weld seal on a candy bar wrapper</li><li>Further application examples from packaging materials</li></ul><h5><strong>Who should attend:</strong></h5></div></div></div></div></div><div><div><div><div><div><div><ul><li>Research experts in food packaging development</li><li>QC specialists for food packaging</li><li>Polymer experts and researchers</li></ul><blockquote><p><strong>Presenter: </strong>Eric Klein, Bruker Optics (Sales &amp; Application / Compact Systems &amp; Micro Analysis)</p><p>Eric Klein started as an application specialist at Bruker in 2009 and has since taken on a leading role as solution expert in failure and root cause analysis using FT-IR microscopy. He has presented multiple webinars on the topic and likes to engage with the audience in Q&amp;A sessions.</p></blockquote></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div>

Bruker: Troubleshooting Food Packaging Materials by µ-FT-IR

Troubleshooting Food Packaging Materials by µ-FT-IR

This webinar shows how FT-IR microscopy supports the food packaging industry by analyzing multilayer films, adhesives, and solving common packaging issues.

<div><div data-g-name="OverviewStage"><div><div><div><strong>No matter where you look, functional surfaces are part of your life. Whether it's your morning shave, the paint on your car or the anti-fingerprint coating on your cell phone - specially engineered surfaces play a central role in almost everything!</strong></div><div><div><div><div><div><div><p>In this webinar, our surface analysis expert Eric Klein will take you to his lab and work through typical examples of industrial surface analysis. We will show you the step by step analysis and troubleshooting of:</p><ul><li>Treated quality razor blades for consumers</li><li>Painted sheet metal from the automotive sector</li><li>Contaminated sheet metal before refinement</li><li>DLC coated tools and equipment&nbsp;</li><li>Cleanliness check of soldering and bonding pads</li></ul><h5><strong>You will learn about:</strong></h5></div><div><div><div><div><div><div><ul><li>How to elucidate the causes of surface damages</li><li>Which experimental technique should be used for certain samples types</li><li>Proper experimental procedure using FT-IR microscopy and imaging</li><li>The value of FT-IR in process troubleshooting and industrial QC</li></ul><h5><strong>We will cover the basics of:</strong></h5><ul><li>Surface Analysis and Troubleshooting</li><li>Infrared (FT-IR) Microscopy and Imaging</li><li>FT-IR Sampling Techniques</li></ul><h5><strong>Who should attend:</strong></h5></div><div><div><div><div><div><div><ul><li>Automotive QA/QC Specialists</li><li>Coating Experts and Surface Refiners</li><li>Industrial Manufacturers and Material Researchers</li><li>Analytical Service Laboratories</li></ul><blockquote><p><strong>Presenter: &nbsp;</strong>Eric Klein, Bruker Optics (Sales &amp; Application / Compact Systems &amp; Micro Analysis)</p><p>Eric Klein started as an application specialist at Bruker in 2009 and has since taken on a leading role as solution expert in failure and root cause analysis using FT-IR microscopy. He has presented multiple webinars on the topic and likes to engage with the audience in Q&amp;A sessions.</p></blockquote></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div>

Bruker: How to Utilize FT-IR for the Analysis of Coatings, Surface Treatments and Technical Cleanliness

How to Utilize FT-IR for the Analysis of Coatings, Surface Treatments and Technical Cleanliness.

In this webinar, our surface analysis expert Eric Klein will take you to his lab and work through typical examples of industrial surface analysis. 

Using FT-IR for Coatings, Surface Treatments & Cleanliness

<p><strong>LUMOS II ushers in a new era in FT-IR Microscopy.</strong></p><blockquote><p><strong>Presenter: &nbsp;</strong>Dr. Tom Tague (Applications Manager and Chair of the Safety Committee Bruker Corporation)</p><div><p>Dr. Tom Tague is the Applications Manager (FTIR and Raman products) and Chair of the Safety Committee for Bruker Corporation. He is also a member of the Visiting Advisory Committee of the Metropolitan Museum of Art in New York and the Advisory Board of Amplified Sciences. Dr. Tague received his Ph.D. from the University of Utah in Physical Chemistry and his B.S. in Chemistry, from the University of Texas at San Antonio. He conducted his postdoctoral research at the University of Virginia working with professor Lester Andrews. He is a member of the American Chemical Society, the Society for Applied Spectroscopy, the American Physical Society, and the Optical Society of America. Dr. Tague is active in developing new methods and instrumentation with the goal of improving the sensitivity and detection limits of spectroscopy related applications. Dr. Tague has more than 80 publications and 5 patents.</p></div></blockquote>

Bruker: The State-of-the-Art in Infrared Microscopy

The State-of-the-Art in Infrared Microscopy

LUMOS II ushers in a new era in FT-IR Microscopy.

<div><div><div><p><strong>Due to the systematic shrinking of the size of devices in the semiconductor industry, characterizing nanoscale surface contaminations in interconnects and circuitries has become a pivotal issue in test and failure analysis. Continuous development in process technology/engineering has led to the fabrication of semiconductor devices with sub-µm feature resolution, which in turn demands high-resolution analytical tools for proper characterization.&nbsp;</strong></p><p>Nanoscale AFM-IR spectroscopy is a non-destructive chemical analysis method that takes advantage of the nanoscale capabilities of AFM and outputs easy-to-understand, FTIR-like spectra. As described by the presenters, the advantages of nanoscale AFM-IR can be leveraged in the semiconductor industry in many ways, like for chemical characterization of organic contaminants, nano-patterned metal/low-k dielectrics, and directed self-assembly of block copolymers.</p></div></div></div><div><div><blockquote><ul><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/two-complementary-nanoscale-ir-techniques-photothermal-afm-ir-and-s-snom.html"><strong>watch part 1: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/online-demo-of-the-nanoir3-system-photothermal-afm-ir.html"><strong>watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/chemical-characterization-of-heterogenous-polymeric-materials-on-the-nanoscale-using-photothermal-afm-ir.html"><strong>watch part 3: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/2d-material-characterization-using-photothermal-afm-ir-and-s-snom.html"><strong>watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li></ul></blockquote></div></div>

Bruker: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Characterizing nanometer-scale features in semiconductor devices using nanoIR spectroscopy

Nanoscale AFM-IR for Failure Analysis of Electronics

<div><p><span style="letter-spacing:0.0px;"><strong>This webinar will show you the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II.&nbsp;</strong></span></p><p>Our application specialist Eric Klein skips lengthy PowerPoint presentations and welcomes you directly to our demo lab for a hands-on instrument session. After 20 minutes of analyzing typical samples, Eric will answer your questions about using µ-FT-IR in your daily QC and failure analysis for at least 30 minutes.</p><p><strong>About the samples:</strong></p><ul><li>The first sample is a typical customer complaint which was returned due to an unknown contaminant on the products surface.</li><li>The second sample is is a product contamination found during quality control. It is analyzed to understand the contamination route and prevent recurrence.</li></ul><p><strong>Content of webinar:</strong></p><ul><li>Measurement two typical µ-FT-IR samples</li><li>Detection and identification of unknown contaminants</li><li>Q&amp;A session on failure analysis by FT-IR</li></ul><p><strong>What you'll learn:</strong></p><ul><li>How to FT-IR microscopy is used to analyze contaminations.</li><li>How to apply the LUMOS II FT-IR microscope</li><li>How to evaluate using OPUS software</li></ul><blockquote><p><strong>Presenter: </strong>Eric Klein&nbsp;</p><p>Eric Klein has been with Bruker for 10 years and started out as an application scientist. During this time, he has acquired a great deal of expertise in infrared microscopy and, as a product manager, played a leading role in the development of LUMOS II. The session will be moderated.</p></blockquote></div>

Bruker: About Failure Analysis, Customer Complaints and Troubleshooting

About Failure Analysis, Customer Complaints and Troubleshooting

This webinar will show you the analysis of two standard samples in failure analysis and troubleshooting with the LUMOS II. 

Failure Analysis, Complaints & Troubleshooting Insights

<div><p><strong>Photothermal AFM-IR can provide nanoscale chemical information with highly resolved IR spectra, that directly correlate to FTIR transmission spectroscopy. This webinar covers numerous AFM-IR applications in the field of life sciences, illustrating broad applicability for samples from tissue to single protein fibrils. The speaker also discusses issues, challenges, and potentials of correlative measurements.</strong></p><p><strong>Some of the samples and applications presented include:</strong></p><ul><li>Lipids bodies stored in microorganisms</li><li>Abnormal accumulations in kidney biopsy</li><li>Penetration of nanocarriers in tissue or model cell lines</li><li>Protein nano-assemblies structures</li></ul><p><strong>The speaker discusses the new experimental approaches developed to solve problems encountered during these studies, and the efforts to overcome technical constraints imposed by the system itself, such as:</strong></p><ul><li>Configuration of illumination</li><li>Sensitivity</li><li>Soft-sample damage</li></ul></div>

Bruker: Photothermal AFM-IR Spectroscopy and Imaging for Life Science

Photothermal AFM-IR Spectroscopy and Imaging for Life Science

This webinar explores AFM-IR applications in life sciences, showing its wide use from tissue samples to single protein fibrils.

Photothermal AFM-IR for Life Science Spectroscopy & Imaging

<div><p><strong>During this webinar, the speaker considers how photothermal AFM-IR can benefit the polymer characterization applications of:</strong></p><ul><li>Multilayer films</li><li>Polymer blends/block copolymers</li><li>Organic photovoltaics</li></ul><div><div><div><p>This webinar covers numerous academia and industry applications in the field of polymer characterization. To illustrate the broad applicability, select examples are discussed in detail, ranging from phase separation in polymer blends/block copolymers and reverse engineering in multilayer films to fibers and thin film characterization. This webinar shows how photothermal AFM-IR provides nanoscale chemical information with highly resolved IR spectra that directly correlate to FT-IR transmission spectroscopy.</p></div></div></div><div><div><blockquote><ul><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1586649600000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/two-complementary-nanoscale-ir-techniques-photothermal-afm-ir-and-s-snom.html"><strong>watch part 1: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1586649600000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/online-demo-of-the-nanoir3-system-photothermal-afm-ir.html"><strong>watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1586649600000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/nanoscale-afm-ir-spectroscopy-and-imaging-for-failure-analysis-of-electronic-devices.html"><strong>watch part 4: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices&nbsp;</strong></a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1586649600000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/2d-material-characterization-using-photothermal-afm-ir-and-s-snom.html"><strong>watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM&nbsp;</strong></a></a></li></ul></blockquote></div></div></div>

Bruker: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR

Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR

This webinar covers numerous academia and industry applications in the field of polymer characterization. 

ICPMS webinars focusing on Microscopy - page 11