A Method for the Detection of Tire Wear Microplastics in Zebrafish Guts by Laterally Resolved LA-ICP-MS-Based Elemental Fingerprinting and Chemometrics

This leaflet is intended to help participants in quantitative proficiency testing (PT) schemes to better understand the performance assessment made by the PT provider [1-4].<h3>Performance assessment parameters&nbsp;</h3><h4>Assigned value&nbsp;</h4>In order to assess individual performances, the results reported by participants are compared to the value assigned by the PT provider (xpt). ISO 13528 [1] suggests five different ways to obtain xpt (Figure 1). In this context, the design of the PT scheme must reflect the objectives of the scheme, comparing results either to a predetermined xpt (independent from the participant results), or to a value derived from the reported results. The PT provider is responsible for defining xpt , taking into account the advantages and disadvantages of the various possibilities when establishing metrological traceability or estimating the uncertainty of the assigned value, u(xpt).<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Figure_1_e5ef5d1f9c.jpg" alt="Eurachem - Figure 1 Options for obtaining the assigned value, Xpt" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Figure_1_e5ef5d1f9c.jpg 245w," sizes="100vw" width="640" height="382"><h4>Uncertainty of the assigned value&nbsp;</h4>The uncertainty of the assigned value u(xpt) can be estimated in at least five different ways [1], each corresponding to the value assignment strategy illustrated in Figure 1. The different uncertainty evaluation methods are listed in Figure 2. This uncertainty can be reported as a standard uncertainty (u (xpt)), or as an expanded uncertainty U (xpt) with a coverage factor k, where U (xpt) = k . u (xpt). The choice of k will impact the level of confidence (e.g. approximately 95 % for k = 2).<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Figure_2_f41ebc0c61.jpg" alt="Eurachem: Figure 2 Options for obtaining the uncertainity of the assigned value, u(Xpt)" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Figure_2_f41ebc0c61.jpg 245w," sizes="100vw" width="727" height="378"><h4>Standard deviation for proficiency assessment&nbsp;</h4>Five possibilities are suggested by ISO 13528 to set the standard deviation for proficiency assessment spt (Figure 3). The chosen approach must comply with the objectives of the PT scheme.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Figure_3_f09cb3969e.jpg" alt="Eurachem: Figure 3 Options for obtaining the standard deviation for proficiency assesment" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Figure_3_f09cb3969e.jpg 245w," sizes="100vw" width="638" height="355">Two approaches for performance assessments use spt as shown in Table 1.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Table_1_Scoring_for_performance_assessment_3dd03aa3fb.jpg" alt="Eurachem: Table 1 - Scoring for performance assessment." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Table_1_Scoring_for_performance_assessment_3dd03aa3fb.jpg 245w," sizes="100vw" width="1390" height="571"><h3>Performance assessment&nbsp;</h3>All performance assessments are based on the difference between the participant’s results (xi) and the assigned value (xpt) divided by a normalisation factor (Table 1).&nbsp;<ul><li>The percent difference D% is the normalised difference expressed as a percentage of xpt , for which a prescribed maximum relative permissible error (dE% = dE / xpt) is defined by the PT provider.&nbsp;</li><li>The z score (unitless) compares the participant’s deviation from the assigned value with the standard deviation for proficiency assessment (spt). When the uncertainty of the assigned value is significant (u(xpt) &gt; 0.3 spt), the z’ score should be used instead, to include the contribution of u(xpt) in the denominator.&nbsp;</li><li>The zeta (ζ) score (unitless) states whether the laboratory’s result agrees with the assigned value within the respective uncertainty. The denominator is the combined (standard) uncertainty of the assigned value u(xpt) and the (standard) measurement uncertainty reported by the laboratory u(xi). An unsatisfactory zeta score can either be caused by an inappropriate estimation of the measured quantity value (e.g. concentration, content), or of its measurement uncertainty, or both.&nbsp;</li><li>The En score (unitless), unlike the zeta score, uses a combination of expanded uncertainties as the normalisation factor. This combination corresponds to a confidence interval of approximately 95 %. En scores are often used in metrology comparisons among calibration laboratories.</li></ul><h3>Interpretation of performance scores&nbsp;</h3>According to ISO 13528:2022 clause 9.4.2, the conventional interpretation of the z, z’ and ζ scores is as follows:&nbsp;<ul><li>A result that gives |score| ≤ 2.0 is considered to be acceptable, indicating satisfactory performance.&nbsp;</li><li>A result that gives 2.0 &lt; |score| &lt; 3.0 is considered to give a warning signal, indicating questionable performance.&nbsp;</li><li>A result that gives |score| ≥ 3.0 is considered to be unacceptable (or action signal), indicating unsatisfactory performance.&nbsp;</li></ul>Similarly, |En| &lt; 1 and |D%| &lt; dE% indicate successful (acceptable) performance.

Understanding PT performance assessment

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 15th June 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you technical note by Agilent Technologies, application note by Shimadzu and other document by Thermo Fisher Scientific!<h3>1. Agilent Technologies: Smooth Migration from Single Quadrupole ICP-MS to the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=9500">Agilent 9500 ICP-QQQ</a></h3>Automated method transfer using the Batch Conversion Tool of Agilent OpenLab ICP-MS software<ul><li>Technical note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/te_batch_conversion_tool_9500_icp_ms_5994_9214en_agilent_0a1bba76e2.pdf">Full PDF for download</a></li></ul>Transitioning from a single quadrupole (SQ) ICP-MS to a triple quadrupole ICP-MS (ICP-QQQ) might appear daunting or disruptive, usually requiring the redevelopment of analytical methods and workflows. Users often wonder if they can reuse existing batches and whether routine processes will be interrupted during this switch.&nbsp;Switching from SQ ICP-MS to the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=9500">Agilent 9500 ICP-QQQ</a> involves minimal disruption. Agilent provides a solution that enables smooth, automated transfer of existing SQ ICP-MS methods to the 9500 ICP-QQQ, all while preserving the current batch logic and analytical purpose.This note explains how the Batch Conversion Tool in Agilent OpenLab ICP-MS software facilitates automated batch conversion. It allows users to seamlessly transition from SQ ICP-MS to the 9500 ICP-QQQ without needing to rebuild methods or alter their existing workflows.&nbsp;Three key aspects of method migration are addressed in this document:&nbsp;<ul><li>The design concept and conversion behavior of the Batch Conversion Tool, detailing which batch elements are preserved or adapted during conversion.&nbsp;</li><li>It also explains the rationale behind the available conversion options and how the advanced cell technologies of the 9500, such as Advanced Helium Mode (AHM) and Air cell mode, support operational continuity and potential performance improvements after migration.&nbsp;</li><li>Additionally, it outlines a typical end-to-end migration workflow, including methods for reviewing the postconversion process and assessing data quality using built-in indicators.&nbsp;</li></ul>These points collectively show that switching from SQ ICP-MS to the 9500 ICP-QQQ can be seamless. They also illustrate how to carry out method transfer in a controlled and transparent manner, providing a practical framework for refining the method when necessary.<h4>What is the Batch Conversion Tool?&nbsp;</h4>The Batch Conversion Tool is a feature of OpenLab ICP-MS software that transforms batches created for Agilent SQ ICP-MS systems into formats compatible with the 9500 ICP-QQQ (see Figure 1).&nbsp;Batches made for <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=7700">Agilent 7700</a>, <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=7800">7800</a>, <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=7850">7850</a>, and <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=7900">7900 </a>ICP-MS instruments using Agilent ICP-MS MassHunter or OpenLab ICP-MS software can be imported and converted. During this process, the tool applies predefined rules to produce a batch suitable for the 9500, all while maintaining the original batch setup.&nbsp;These conversion rules are based on Agilent’s over 10 years of experience in ICP-QQQ development and applications. By harnessing this expertise, the Batch Conversion Tool automatically implements optimal measurement conditions and reaction strategies for each analyte, ensuring strong interference control and consistent analytical performance post-migration.Manually recreating batch components like element selections, isotope settings, and QC configurations can be time-consuming. Alternatively, the Batch Conversion Tool automates this process, usually finishing within seconds.<h4>Conclusion&nbsp;</h4>The Batch Conversion Tool in Agilent OpenLab ICP-MS software allows for easy, automated transfer of existing SQ ICP-MS batches to the Agilent 9500 ICP-QQQ, without affecting current analytical workflows.&nbsp;By maintaining batch structure and analytical intent, users can switch to the 9500 ICP-QQQ without needing to rebuild methods or disrupt daily operations. The tool also offers structured conversion options to help users harness the advanced features of the 9500 platform.&nbsp;Additionally, migration from non-Agilent ICP-MS systems can be streamlined through element list import via the Method Advisor, providing an efficient way to create methods when transitioning to Agilent equipment. Overall, moving from SQ ICP-MS to the 9500 ICP-QQQ is a smooth, controlled process that ensures continuity and offers opportunities for method enhancement.<h3>2. Shimadzu: Static Puncture Strength of Geotextile Products Usinga 50mmProbe</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_07_2603_en_2470aa6ee5.pdf">Full PDF for download</a></li></ul>Geotextiles are permeable geosynthetic materials, typically made from polypropylene or polyester, available in woven and non-woven forms. They provide separation, filtration, drainage, and reinforcement, improving soil stability, load distribution, and the durability of infrastructure such as roads, railways, embankments, landfills, and retaining structures.&nbsp;During transportation, installation, and service geotextiles can be exposed to concentrated loads and sharp objects which can reduce the effectiveness of materials therefore puncture resistance is a critical parameter for evaluating geotextile durability. The puncture resistance of geotextiles are commonly determined as per ASTM D62411) and ISO 122362), which measures the force required to penetrate the fabrics using a standard plunger. Overall, puncture resistance testing plays a vital role in ensuring the long-term durability and reliability of geotextilesin demanding engineering applications.&nbsp;The <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=AGS-X2">Shimadzu AGS-X2 series Universal Testing Machine </a>is a high-precision universal testing system designed for accurate evaluation of mechanical properties such as tensile, compression, and puncture resistance. It features advanced control technology, high data acquisition rates, and reliable load measurement, ensuring consistent and reproducible results. The system is operated using TRAPEZIUMX-V software, enabling efficient test control, data acquisition, and analysis that complies with national and international standards.<h4>2. Test Method&nbsp;</h4>The test was conducted on the non-woven geotextile using the AGS-50kNX2D UTM, shown in the Figure 1. Two different samples (1000 and 400 GSM) were procured from the market and five specimens were prepared from various areas of each sample. Table 1 shows testing apparatus and test conditions and Figure 2 shows the typical clamping and loading system.<h4>4. Conclusion</h4>The test results are consistent across multiple specimens and exhibit gradual deformation behavior. This indicates that the material can withstand high penetration forces without sudden failure, demonstrating its ability to effectively resist localized stresses.&nbsp;Geotextiles are available in different GSM values, representing mass per unit area and directly influence their mechanical and physical performance. Lower GSM geotextiles are lighter, flexible and lower thickness making them suitable for applications involving moderate loads. In contrast higher GSM geotextiles are thicker and denser, offering significantly higher puncture resistance and making them suitable for heavy duty applications.&nbsp;The Shimadzu’s universal testing machine AGS-X2 series demonstrated accurate, stable, and repeatable performance for conducting puncture resistance testing in accordance with ASTM D6241 and ISO 12236. The system provided precise control of crosshead speed, reliable load measurement, and clear identification of the initial peak load as required by the standard. The high-resolution load–displacement data acquisition enabled accurate determination of puncture strength and displacement at maximum force. Overall, the Shimadzu system ensures compliance with ASTM D6241 and ISO 12236 requirements and offers a dependable solution for quality control, research, and material comparison of geotextiles.¨<h3>3. Thermo Fisher Scientific: Small parts analysis with the Niton Apollo LIBS Analyzer</h3><ul><li>Other document (Smart note)</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/small_parts_analysis_with_the_niton_apollo_libs_analyzer_sn1608_en_c69d4c0695.pdf">Full PDF for download</a></li></ul>Small parts and precision components are critical to product quality and safety. Their limited surface areas and complex geometries make them some of the most challenging items to analyze accurately. Traditional optical emission spectroscopy (OES) delivers excellent accuracy but often lacks the portability needed for challenging environments.&nbsp;The <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2000">Thermo Scientific™ Niton™ Apollo™ Handheld Laser-Induced Breakdown Spectroscopy (LIBS) Analyzer</a> changes the equation by delivering accurate analysis of steel and stainless steel in a portable format.<h4>A lower cost of ownership, with repeatability and reliability you can trust&nbsp;</h4>For industries where a single incorrect part can have significant consequences, consistency is crucial. The Apollo analyzer delivers the dependable features you need, in a unit designed to save users time and money over the long term:&nbsp;<ul><li>Carbon detection – Detects carbon for equivalent carbon content (C.E.) for welding &amp; L/H grade ID of stainless steel&nbsp;</li><li>Efficient argon use – Optimized purge minimizes gas consumption.&nbsp;</li><li>Reduced downtime – Portable OES-like accuracy eliminates long lab lead time.</li><li>Rugged durability – Field-ready build lowers repair and replacement costs.&nbsp;</li><li>Ease of training – Intuitive interface reduces errors and onboarding costs.</li><li>Designed to perform – Reliable data across a wide range of finishes and geometries&nbsp;</li></ul>By combining technical performance with durability and efficiency, the Apollo analyzer delivers the lowest total cost of ownership in its class.&nbsp;<h4>Conclusion&nbsp;</h4>The Niton Apollo LIBS analyzer sets the standard for small parts analysis. With its unique argon seal and updated small nose design, it delivers repeatable, OES-like accuracy unmatched by any other handheld LIBS device for the analysis of steel and stainless-steel including carbon. Add in a lower total cost of ownership, and the Apollo analyzer becomes the clear choice for manufacturers and inspectors who demand precision, reliability, and value.

News from LabRulezICPMS Library - Week 25, 2026

Article

Application

Academy

Scientific article

Science and research

Eurachem is a European network promoting international traceability of chemical measurements and good analytical practice. It provides expert guidance, supports method validation, uncertainty evaluation, proficiency testing, and facilitates discussion on technical and policy issues in analytical quality.

Eurachem

Everything from the world of analytical chemistry in one place. We connect people in solving their problems. At Labrulez you will find all the necessary information easily, quickly and clearly. Stop searching and start finding.

LabRulez

Agilent Technologies

Bruker

Wiley

Shimadzu Corporation

Preparation of water samples for isolation and identification of microplastics can be the most time-consuming part of the analysis. This presentation will focus on preparation of water samples for analysis of microplastics, with an emphasis on the SCCWRP SOP for drinking water, and ASTM D8333 for waste water samples.Please join us for the next presentation in this series which will highlight Agilent’s turn-key approach for analyzing microplastics using the 8700 LDIR.<blockquote>Presenter: Louis Tisinger, PhD (Application Engineer, Molecular Spectroscopy, Agilent Technologies, Inc.)Louis (Lou) Tisinger has a Ph.D. in Analytical Chemistry from Miami University in Oxford Ohio, where his graduate research involved the study of ATR imaging and microscope performance in vibrational spectroscopy. Most of his career has been related to pre- and post-sales support of FTIR spectrometers, microscopes, imaging systems, and thermal analytical instruments, focusing on analyzing customer samples, demonstrations, post-sales training, troubleshooting, and R&amp;D.</blockquote>

Agilnt Technologies: A Discussion on Sample Preparation of Water Samples for Analysis of Microplastics

A Discussion on Sample Preparation of Water Samples for Analysis of Microplastics

Please join us for the next presentation in this series which will highlight Agilent’s turn-key approach for analyzing microplastics using the 8700 LDIR.

Sample Preparation of Water Samples for Microplastics

Thousands of polymeric compounds and materials have been developed over the years to optimize the properties and performance of products spanning nearly every industry. There are a few areas where characterizing these products can be important: first is performing a quick polymer identification for recycling purposes; second is quality control to identify product defects or failures; and third is reverse engineering to facilitate product development in a highly competitive marketplace.
Infrared (IR) and Raman spectroscopy are especially useful for the analysis of polymers in an industrial setting because in most cases it does not require sample preparation or expensive consumables. Examples will be presented demonstrating the effectiveness of IR and Raman analysis in each of these categories.
Mass Spectrometry (MS) has become an indispensable tool for polymer analysis and has been widely used to study polymer structure and composition, end groups and additives, molecular weight distribution, and so on. MS analysis is extremely sensitive, allowing the detection and identification of minor polymer components and synthesis by-products, as well as low-level impurities and products of decomposition. Matrix Assisted Laser Desorption Ionization (MALDI) allows performing rapid MS analysis without lengthy pre-separation and with minimal sample preparation. MALDI MS can provide structural and copolymer composition information, as well as be used for imaging of polymer surfaces, characterization of complex polymer mixtures, and many other analytical tasks.
In this webinar, we will discuss several MS analytical techniques and their applications for polymer analysis using real-life examples from the industry and academia.
<blockquote>
Presenter: Sergey V. Shilov, Ph.D. (R&amp;D Product Manager for North America, Bruker Optics)
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<blockquote>
Dr. Sergey V. Shilov is the R&amp;D Product Manager for North America at Bruker Optics. Sergey joined Bruker in 2001. He is responsible for the support and development of new applications for the Bruker research FTIR systems. He received his Ph.D in 1992 from the Russian Academy of Sciences in Polymer Physics and his M.S. from St. Petersburg State University (Russia) in Physics in 1986. Alexander Von Humboldt foundation (Germany) awarded him research fellowship in 1996. Sergey published 37 papers in peer-reviewed journals. His research interests include time-resolved FTIR spectroscopy, surface science, polymer and life-science applications. 
</blockquote>
<blockquote>
Presenter: Kushal Modi (Business Development Manager, Polymers, and Industrial Chemicals, Bruker Applied Mass Spectrometry)
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Kushal Modi has been serving the scientific community for over 10 years. He joined Bruker in 2022 under the Applied Mass Spectrometry division after a legacy with Waters Corporation. He is a leading expert as a Business Development Manager and is currently supporting the polymers and industrial chemical markets nationally. 
</blockquote>
<blockquote>
Presenter: Dr. Rebecca Pool (Editor Microscopy and Analysis, Wiley, Moderator)
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Rebecca is news editor of Microscopy&amp;Analysis and a freelance science journalist with a doctorate in Materials Science. She has published in Wiley Analytical Science, Nature Photonics, SPIE Photonics Focus, Physics World, Sci Fi Generation, Engineering and Technology magazine, WorldSteel and more.
</blockquote>

Wiley Analytical Science: Effective Analysis of Polymers Using IR, Raman Spectroscopy, and MALDI-TOF Mass Spectrometry

Effective Analysis of Polymers Using IR, Raman Spectroscopy, and MALDI-TOF Mass Spectrometry

Examples will be presented demonstrating the effectiveness of IR and Raman analysis and will discuss several MS techniques and apps for polymer analysis.

Polymers Using IR, Raman Spectroscopy, and MALDI-TOF MS

The Cary 60 UV-Vis spectrophotometer can be used for the application of contaminant analysis in drinking water and waste water.
Join me as we explore discuss various accessories simplifying the creation of calibration curves for different key analytes such as cyanides, phenols, detergents, and hexavalent chromium.
<blockquote>
Presenter: Rogelio García Juárez (Application Scientist, Agilent Technologies, Inc.)
</blockquote>
Rogelio García has a Bachelor’s degree in Pharmaceutical Chemistry from the University National of Mexico and a Master´s degree in Environmental Engineering from the National Polytechnic Institute. He worked in environmental laboratories in the development of methods and applications in water, soil, and air and method design for the pharmaceutical and food industry. He also worked in the implementation of quality management systems in laboratories to obtain accreditation in the 17025 standard, validation process, and analysis of the uncertainty of the method. In 2015, he joined Agilent Technologies as an Application Scientist for Molecular Spectroscopy in UV-Vis, FTIR, and Raman techniques, at Agilent México and Latin America.

Agilent Technologies: Analysis of contaminants in water and waste water by UV-Vis

Analysis of contaminants in water and waste water by UV-Vis

Various accessories simplifying the creation of calibration curves for different key analytes such as cyanides, phenols, detergents, and hexavalent chromium.

The widespread challenge posed by microplastics is a pressing issue that necessitates innovative solutions.
In this Digital Classrooms session, explore how Shimadzu&#39;s state-of-the-art analytical and measuring instruments are leading the way in microplastics research, analysis, and characterization.
In the first part of the session, we will explore the analysis of microplastics in oceans and other environmental waters using Fourier-Transform Infrared Spectroscopy (FTIR) and Infrared/Raman microscope. Learn how these tools, combined with our innovative automated sample preparation device and the resourceful degraded plastics libraries, can accurately identify and characterize microplastics, contributing to a more profound comprehension of their prevalence in aquatic ecosystems.
In the second part, we&#39;ll unveil an automated workflow leveraging Pyrolysis-Gas Chromatography/Mass Spectrometry (Pyrolysis-GCMS). This cutting-edge approach streamlines the identification and quantitative analysis of microplastics in environmental samples, increasing efficiency while maintaining accuracy.
Join us to explore how Shimadzu&#39;s solutions are meeting the needs of today – Be part of the change and understand how we can overcome this environmental challenge together.
Learning Objectives:
<ul>
<li>Explore Shimadzu&#39;s analytical tools for microplastics research and analysis
</li>
<li>Understand use of FTIR and Infrared/Raman microscopy in microplastics identification
</li>
<li>Learn how to streamline identification and quantification of microplastics using Pyrolysis-GCMS
</li>
<li>Discover how automated workflows enhance efficiency in microplastics analysis in environmental samples
</li>
</ul>
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Presenter: Pravin Konde, PhD (Senior Product Specialist, Shimadzu (Asia Pacific) Pte Ltd)
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Pravin Konde is a Senior Product Specialist (for Spectroscopy &amp; TOC) at Shimadzu Asia Pacific Singapore. He has about 15 years of industry experience of which about 12 years in analytical instruments with expertise in trace element analysis and spectroscopy applications. He is engaged primarily in technical support to regional sales teams and customers. Prior to joining industry, he has done his PhD in Chemistry from Institute of Chemical Technology (formerly UDCT), Mumbai, India.
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Presenter: Chua Chun Kiang, PhD (Senior Product Specialist (GCMS), Shimadzu (Asia Pacific) Pte Ltd)
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Chun Kiang received his Ph.D. in Chemistry from Nanyang Technological University, Singapore. He has been at Shimadzu Asia Pacific since 2019. He has more than 10 years of experience in research and training across multiple disciplines including mass spectrometry, gas and liquid chromatography, nanomaterials, electrochemistry, and organic chemistry. He enjoys sharing technical knowledge and helping to identify solutions for challenges in chemistry.
</blockquote>

Shimadzu: Fast-Track Microplastics Research: Advanced, Automated Workflows For Environmental Analysis

Fast-Track Microplastics Research: Advanced, Automated Workflows For Environmental Analysis

Explore how Shimadzu's state-of-the-art analytical and measuring instruments are leading the way in microplastics research, analysis, and characterization.

Microplastics: Workflows For Environmental Analysis

Calling all food safety analysts! Gear up for an exciting session with us on Digital Classrooms into the heart of food safety analysis, focusing on 3 crucial aspects: organic contaminants identification, elemental analysis, and the pressing issue of PFAS.
Our dedicated expert, Qi An, will kick off the session by introducing Shimadzu’s innovative FTIR analysis workflow that identifies organic contaminants in just seconds to boost your productivity at work. Besides, explore the flexibility offered by various FTIR configurations tailored to analyze different contaminant sizes and uncover the capabilities of <a href="https://icpms.cz/products/849">Shimadzu LabSolutions IR software</a>, particularly on its Food Additive Identification and Contaminant Analysis Macro programs for robust data analysis.
Following that, our seasoned expert Mangesh will delve into elemental analysis, demonstrating how Shimadzu’s ICP-MS is ushering in a new era without compromise. Whether it&#39;s the nourishing minerals in milk or the potentially harmful elements in fruit juice, Shimadzu&#39;s ICPMS accurately quantifies both micro and macro elements present in our daily diet.
Lastly, our specialist, Elton, will address the emerging food safety concern of PFAS in food. Gain valuable insights into the evolving regulatory landscape, explore the current EFSA and FDA guidelines, and discover measures to manage this complex issue. Specifically, Elton will introduce how Shimadzu&#39;s LC-MS/MS solutions can effectively address PFAS concerns in food.
Don&#39;t take any chances with food safety – Make it your priority. Level up your approach in contaminant analysis with us today. Register now!
Learning Objectives
<ul>
<li>Learn how Shimadzu’s FTIR analysis can enable quick characterization of organic contaminants
</li>
<li>Understand how LabSolutions IR software can effectively translate spectral data into actionable insights
</li>
<li>Discover the capabilities of Shimadzu’s ICP-MS to detect harmful elements in food
</li>
<li>Explore how Shimadzu’s LC-MS/MS solutions can effectively address PFAS concerns in food
</li>
</ul>
<blockquote>
Presenter: Tan Qi An (Application Specialist, Shimadzu (Asia Pacific) Pte Ltd)
</blockquote>
<blockquote>
Qi An is a highly skilled professional with a bachelor&#39;s degree in Chemistry and Biological Chemistry from Nanyang Technological University, Singapore. His passion for food science led him to pursue a concurrent second major in Food Science and Technology from Wageningen University. With over two years of experience as an Application Specialist for spectroscopy and TOC instruments at Shimadzu Asia Pacific, Qi An has successfully conducted pre-sales demonstrations, sample analysis, and provided application support across diverse industries. His expertise and commitment to delivering high-quality solutions make him a valuable asset to the field of analytical chemistry.
</blockquote>
<blockquote>
Presenter: Elton Goh (Senior Product Specialist (GCMS), Shimadzu (Asia Pacific) Pte Ltd)
</blockquote>
<blockquote>
Elton is a dedicated and experienced Food Market Specialist at Shimadzu, bringing over nine years of expertise in food safety and analytical chemistry to his role. His career began at the Singapore Food Regulatory Board, where he spent seven years honing his skills and developing a profound understanding of regulatory standards and testing protocols. With a passion for knowledge and innovation, Elton transitioned to the private sector, contributing significantly to the advancement of analytical techniques and the development of novel food safety solutions during his two-year tenure at a research and development centre.
</blockquote>
<blockquote>
Now at Shimadzu, Elton continues to excel, leveraging his expertise to develop cutting-edge analytical methods for detecting and quantifying various compounds in food products. His commitment to food science is evident in his efforts to enhance safety standards, build consumer trust, and make meaningful contributions to the global food industry.
</blockquote>
<blockquote>
Presenter: Mangesh Pawar (Deputy Manager - CSC, Shimadzu Analytical (India) Pvt Ltd)
</blockquote>
<blockquote>
Mangesh S. Pawar is a seasoned professional with a master&#39;s degree in physical chemistry from Mumbai University. With nearly nine years of expertise in the pharmaceutical sector, Mangesh has a rich background, having worked for reputable companies such as Teva Pharmaceuticals, Inventia Healthcare, and Cipla Ltd. Over the past nine years, he has been an integral part of the Shimadzu team in India, accumulating a total of eighteen years of experience.
</blockquote>
<blockquote>
Mangesh specializes in elemental, thermal, and spectroscopic techniques at Shimadzu, where he plays a crucial role in assisting clients throughout India both before and after-sales. In order to fulfil Shimadzu&#39;s ultimate objective of offering a complete solution and ensuring customer satisfaction, pre-sale interactions with customers, instrumental trainings, and troubleshooting during routine analysis are of Mangesh’s particular focus of interests.
</blockquote>

Shimadzu: For the Love of Food! Solutions for Contaminants From PFAS to Heavy Metals

For the Love of Food! Solutions for Contaminants From PFAS to Heavy Metals

Analysis of Food Contaminants From PFAS to Heavy Metals

&nbsp;<blockquote>Presenter: Dr. Tom Tague (Applications Manager and Chair of the Safety Committee Bruker Corporation)Dr. Tom Tague is the Applications Manager (FTIR and Raman products) and Chair of the Safety Committee for Bruker Corporation. He is also a member of the Visiting Advisory Committee of the Metropolitan Museum of Art in New York and the Advisory Board of Amplified Sciences. Dr. Tague received his Ph.D. from the University of Utah in Physical Chemistry and his B.S. in Chemistry, from the University of Texas at San Antonio. He conducted his postdoctoral research at the University of Virginia working with professor Lester Andrews. He is a member of the American Chemical Society, the Society for Applied Spectroscopy, the American Physical Society, and the Optical Society of America. Dr. Tague is active in developing new methods and instrumentation with the goal of improving the sensitivity and detection limits of spectroscopy related applications. Dr. Tague has more than 80 publications and 5 patents.</blockquote>

Bruker: Infrared and Raman Analysis of Geological Samples

Infrared and Raman Analysis of Geological Samples

In this webinar, you will learn about using Infrared and Raman in analysis of geological samples.

LUMOS II ushers in a new era in FT-IR Microscopy.<blockquote>Presenter: &nbsp;Dr. Tom Tague (Applications Manager and Chair of the Safety Committee Bruker Corporation)<div>Dr. Tom Tague is the Applications Manager (FTIR and Raman products) and Chair of the Safety Committee for Bruker Corporation. He is also a member of the Visiting Advisory Committee of the Metropolitan Museum of Art in New York and the Advisory Board of Amplified Sciences. Dr. Tague received his Ph.D. from the University of Utah in Physical Chemistry and his B.S. in Chemistry, from the University of Texas at San Antonio. He conducted his postdoctoral research at the University of Virginia working with professor Lester Andrews. He is a member of the American Chemical Society, the Society for Applied Spectroscopy, the American Physical Society, and the Optical Society of America. Dr. Tague is active in developing new methods and instrumentation with the goal of improving the sensitivity and detection limits of spectroscopy related applications. Dr. Tague has more than 80 publications and 5 patents.</div></blockquote>

Bruker: The State-of-the-Art in Infrared Microscopy

The State-of-the-Art in Infrared Microscopy

LUMOS II ushers in a new era in FT-IR Microscopy.

<div><div><div>Due to the systematic shrinking of the size of devices in the semiconductor industry, characterizing nanoscale surface contaminations in interconnects and circuitries has become a pivotal issue in test and failure analysis. Continuous development in process technology/engineering has led to the fabrication of semiconductor devices with sub-µm feature resolution, which in turn demands high-resolution analytical tools for proper characterization.&nbsp;Nanoscale AFM-IR spectroscopy is a non-destructive chemical analysis method that takes advantage of the nanoscale capabilities of AFM and outputs easy-to-understand, FTIR-like spectra. As described by the presenters, the advantages of nanoscale AFM-IR can be leveraged in the semiconductor industry in many ways, like for chemical characterization of organic contaminants, nano-patterned metal/low-k dielectrics, and directed self-assembly of block copolymers.</div></div></div><div><div><blockquote><ul><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/two-complementary-nanoscale-ir-techniques-photothermal-afm-ir-and-s-snom.html">watch part 1: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM&nbsp;</a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/online-demo-of-the-nanoir3-system-photothermal-afm-ir.html">watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR&nbsp;</a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/chemical-characterization-of-heterogenous-polymeric-materials-on-the-nanoscale-using-photothermal-afm-ir.html">watch part 3: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR&nbsp;</a></a></li><li><a data-g-name="CallToAction" data-protectable="" data-tracking="{&quot;classification&quot;:&quot;default&quot;,&quot;webinarDate&quot;:1587340800000,&quot;onWebinar&quot;:true,&quot;external&quot;:false}" target="_self"><a target="_blank" rel="noopener noreferrer" href="https://www.bruker.com/en/news-and-events/webinars/2020/2d-material-characterization-using-photothermal-afm-ir-and-s-snom.html">watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM&nbsp;</a></a></li></ul></blockquote></div></div>

Bruker: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices

Characterizing nanometer-scale features in semiconductor devices using nanoIR spectroscopy

Nanoscale AFM-IR for Failure Analysis of Electronics

<div><div container-id="cq-colctrl-lt0" comp-id="A1"><div>Join us for an insightful session on Vaya Method Development Tips and Tricks! Dive into the world of Spatially Offset Raman Spectroscopy (SORS) and the Agilent Vaya Handheld Raman. We'll explore the unique value proposition of SORS and provide guidance on developing robust methods on the Vaya for ID testing in a manufacturing environment. Don't miss this opportunity to enhance your understanding and skills!<h5>Key learning objectives:</h5><ul><li>What is spatially offset Raman spectroscopy?</li><li>How to interpret the information supplied by the Vaya?</li><li>How to develop robust methods on the Vaya?</li><li>What is a custom method on Vaya?</li></ul><h5>Who should attend?</h5>All Vaya user or any pharma/biopharma customers interested to know more on through-packaging raw materials identification.<blockquote>Presenter: Frederic Prulliere (Product Manager Raman ID, Agilent Technologies)Frederic Prulliere is the Product Manager for the Raman ID product line at Agilent Technologies. Prulliere leads the product development of spatially offset Raman spectroscopy-based solutions, particularly for verifying raw materials at reception. He joined Agilent Technologies in 2012 as a business development manager for mobile Fourier transform infrared spectroscopy (FTIR).</blockquote></div></div></div>

Agilent Technologies: Handheld Raman Vaya - Advanced Tips & Tricks

Handheld Raman Vaya - Advanced Tips & Tricks

Join us for an insightful session on Vaya Method Development Tips and Tricks! 

Handheld Raman Vaya - Tips & Tricks

<h4>Highly productive nanoscale spectroscopy that is easy to use and easy to interpret</h4>With photothermal atomic force microscope infrared spectroscopy (AFM-IR), chemical identification at the nanoscale is achieved by measuring local IR spectra directly at the AFM tip. This method stands out among nanoscale spectroscopic approaches for its user-friendly operation, straightforward data interpretation, fast measurement times, and reliable repeatability. Bruker's AFM-IR technology delivers monolayer sensitivity, offers spatial resolution below 10 nm, accommodates various probing depths, and supports correlative analysis of chemical and mechanical properties.In this webinar, Bruker experts will provide a thorough introduction to photothermal AFM-IR, tailored for IR spectroscopists. They will share explanations of underlying physics, examples of FTIR spectral correlation, and practical experimental considerations.<h4>Join us to learn:</h4><ul><li>How the technique works, both theoretically and practically</li><li>Why AFM-IR is spectrally correlated with FTIR</li><li>When AFM-IR is an ideal technique choice</li><li>What experimental factors impact AFM-IR spectra</li></ul><h4>Webinar Summary</h4>Photothermal atomic force microscope infrared spectroscopy (AFM-IR) enables chemical identification at the nanoscale by collecting local infrared spectra at the AFM tip. Compared to other nanoscale spectroscopic techniques, AFM-IR provides major advantages in ease of use, ease of interpretation, measurement speed, and data repeatability. The AFM-IR technique developed at Bruker has achieved monolayer sensitivity, sub-10 nm spatial resolution, a range of probing depths, and correlative measurements of chemical and mechanical properties.The AFM-IR signal is proportional to sample absorption coefficients of the IR irradiation, leading to correlation between the collected AFM-IR spectra and the transmission mode bulk Fourier transform infrared (FTIR) spectra. This correlation is critical and forms the basis of the chemical identification capability of the AFM-IR technique. Several application examples in different research fields will be highlighted to demonstrate such correlation. Valuable nanoscale chemical information is extracted from the AFM-IR spectra’s peak ratios, band positions and shapes. After that, experimental factors that may impact the AFM-IR spectra will be discussed. These factors need to be properly considered to have correct interpretations of the AFM-IR spectra.<h4>Featured Products and Technology</h4><ul><li>NanoIR Spectrometers: Bruker's nanoIR spectrometers are the world leader in photothermal IR spectroscopy from the nanoscale to the sub-micron and macro scales.</li><li>Dimension IconIR: Flagship photothermal AFM-IR system, offering correlative imaging modes and 150 mm of sample access for ultimate versatility in materials research and industrial R&amp;D</li></ul><blockquote>Speaker: Cassandra Phillips, Ph.D. (Senior Product Manager, Bruker)Cassandra did her Ph.D. at the University of Toronto exploring the photophysics of boron nitride nanotubes using scattering scanning nearfield optical microscopy (s-SNOM) and computational models. She has been working at Bruker Nano Surfaces and Metrology since September 2019 as an Applications Scientist focusing on nanoscale IR spectro-microscopy and other correlated imaging techniques realized with atomic force microscopy.</blockquote><blockquote>Speaker:&nbsp;Dr. Qichi Hu (Senior Applications Scientist)Qichi is currently a Senior Staff Applications Scientist at Bruker Nano. He received a bachelor’s degree from Peking University and Ph.D. from University of British Columbia. He then did postdocs in U.S. university and national labs. Qichi has been working on nanoIR development and applications for over a decade, at Anasys and now at Bruker.</blockquote><blockquote>Speaker:&nbsp;Hartmut Stadler, Ph.D. (Applications Engineer, Bruker Nano GmbH)Hartmut Stadler works as an application scientist for Bruker Nano Surfaces and is now mainly focussed on the chemical side of AFM, including electrochemical operation and nanoscale IR techniques. His background is Physical Chemistry, with a PhD thesis in the field of biofilm characterization using macroscopic and nanoscopic methods. Since more than 25 years he operates AFMs and since more than 20 years he supports Bruker’s European AFM customers and distribution channel partners in AFM-application related questions.</blockquote>

Introduction to Photothermal AFM-IR for Infrared Spectroscopists