In the week from June 29, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry<blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars">👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</a></h4>👉 Search and filter in the largest global database with over 5 500 GC, LC, MS and spectroscopy webinars.</blockquote><h5>1. Metrohm: Simplifying Through-Container Testing with Raman Spectroscopy in the Pharmaceutical Industry</h5><ul><li>Mo, 29.6.2026 15:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6308">Registration</a></li></ul>In this webinar, we will demonstrate a more robust and practical alternative to SORS for see-through Raman analysis.<h5>2. SelectScience: End-to-end PAT: Connecting advanced analytics and data across the bioprocess lifecycle</h5><ul><li>Mo, 29.6.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6307">Registration</a></li></ul>Learn how integrated PAT strategies combining NMR, Raman, IR, and digital workflows enable continuous process understanding, smoother tech transfer, and QbD from development to GMP manufacturing.<h5>3. Bruker: Bruker Fluorescence Microscopy Solutions: Automated Imaging and Light-Sheet Microscopy</h5><ul><li>Tu, 30.6.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6309">Registration</a></li></ul>Discover Bruker’s integrated imaging ecosystem combining light-sheet microscopy, high-content screening, and high-performance data management for scalable, high-quality biological imaging workflows.<h5>4. Agilent Technologies: Measuring Diverse Samples with UV/VIS Spectrometers and Integrating Spheres</h5><ul><li>Tu, 30.6.2026 20:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6052">Registration</a></li></ul>This webinar will discuss diffuse transmission and reflection UV/VIS measurements, including how to perform measurements with Agilent’s Cary 60 UV/VIS Spectrometer.<h5>5. Milestone: Unlock Smarter Digestion: AI and the Smart Features that Transform Your Daily Routine</h5><ul><li>We, 1.7.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6312">Registration</a></li></ul>Learn how Milestone’s intelligent digestion technologies, including MAIA AI Agent, easyTEMP, and SRC, help reduce downtime, simplify workflows, and improve laboratory productivity.<h5>6. Bruker: High-Energy XRD - Diffraction Without Limits</h5><ul><li>Th, 2.7.2026 10:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6314">Registration</a></li></ul>Join us to explore how high-energy XRD with the D8 ADVANCE HE and D8 DISCOVER HE enables the study of materials under realistic conditions.<h5>7. Agilent Technologies: Spectral Flow Cytometry Masterclass - Session 1</h5><ul><li>Fr, 3.7.2026 07:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6316">Registration</a></li></ul>Learn how full-spectrum flow cytometry enables high-dimensional cell analysis. Explore spectral flow technology, experimental design, and applications in immunology, oncology, and vaccine research.

Webinars LabRulezICPMS Week 27/2026

The international standard ISO/IEC 17025 [1] clause 7.7.2 with regards to ensuring the validity of results, requires a laboratory to participate in proficiency testing (PT) and/or to participate in interlaboratory comparisons (ILCs) other than PT. However, no guidance as to what these other ILCs might be, or indeed how they might compare in relation to PT, is provided. This leaflet aims to outline other ILCs available, pointing out some of the limitations as compared to PT.&nbsp;There are three major types of ILCs in which a group of laboratories analyses identical portions from a homogeneous, stable test sample, with each type being characterized by its intended purpose [2,3]:<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_2_d9263807fb.jpg" alt="Eurachem: Interlaboratory comparisons other than proficiency testing" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_2_d9263807fb.jpg 245w," sizes="100vw" width="1507" height="607">A key point is that PT is an ILC that is designed to specifically evaluate the performance of participants, providing them with an infrastructure to monitor and assess the validity of their results. This is not the key purpose of the two other ILCs, and thus depending on their intended purpose they have a number of limitations that laboratories need to be aware of when using them rather than PT. Only proficiency testing should have been conducted in full compliance to the competency standard ISO/IEC 17043 [4].&nbsp;<h4>Evaluation of measurement procedure performance&nbsp;</h4>These ILCs, are designed to assess how a particular measurement procedure performs and whether it is fit for its intended purpose. These ILCs are often referred to as a ‘method performance study’ or a ‘collaborative study’ [2]. Some limitations of using such ILCs for monitoring laboratory performance as an alternative to PT are:&nbsp;<ul><li>All participants use the same measurement procedure i.e. the measurement procedure that is being validated. Unless the measurement procedure is being routinely used by the participating laboratory such an ILC will not assess the routine performance of the laboratory using their own routine measurement procedure. Nor does it enable them to compare their performance with other laboratories using alternative measurement procedures.&nbsp;</li><li>The measurement procedure is likely to be new, so participants may not have established stable procedures and quality control, so performance may not reflect routine use.&nbsp;</li><li>The report from such an ILC would not provide information on the performance of the participant, if the statistical model used makes the assumption that all laboratories perform with equal variability.</li><li>The design of the study may require the participants to assess multiple samples and/or to undertake multiple replicate analysis on the test materials. This may not be representative of the routine measurements or tests undertaken by the laboratory.&nbsp;</li><li>The conclusion of the ILC might be that the measurement procedure being assessed is not valid.&nbsp;</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_3_a53ecd2f5d.jpg" alt="Eurachem: Interlaboratory comparisons other than proficiency testing" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_3_a53ecd2f5d.jpg 157w," sizes="100vw" width="570" height="566"><h4>Characterisation of candidate reference materials&nbsp;</h4>These are ILCs that assign a property value to a candidate reference material, usually with a stated measurement uncertainty. These are often referred to as a ‘material certification study’ [2]. Limitations of using such ILCs as an alternative to PT are:&nbsp;<ul><li>The analysis of the candidate reference material is likely to require additional care in exercising the routine measurement procedure, such as substantially more replication, and/or may require quite different reporting formats (e.g. all valid replicates instead of a mean result). Thus, such an ILC will not necessarily provide an evaluation of the performance of the laboratory based on the routine use of their measurement procedures.&nbsp;</li><li>The report from such an ILC may include the results from the participating laboratories but would not provide information on the performance of each laboratory.&nbsp;</li><li>Participating laboratories may be required to assess multiple samples and/or to undertake multiple replicate analysis on the candidate reference materials. Thus this may not be representative of the routine measurements or tests undertaken by the laboratory.&nbsp;</li></ul><h4>Other ILCs&nbsp;</h4>Some other ILCs, whilst not being conducted in full compliance of the requirements of ISO/IEC 17043, may be designed to evaluate participant performance. These would include small ILCs as defined by EA‑2/21 [5] or split sample ILCs i.e. where a portion of a single sample is sent to two or three laboratories. Whilst these ILCs are specifically designed to evaluate participant performance, they may not provide a comprehensive comparison that a PT might provide. In such cases the laboratory needs to evaluate carefully the competence of the organization managing the ILC and the suitability of the service externally provided (ISO/IEC 17025 clause 6.6).

Interlaboratory comparisons other than proficiency testing

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 29th June 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you application notes by Agilent Technologies and Thermo Fisher Scientific and brochure by Shimadzu!<h3>1. Agilent Technologies: Analysis of High Purity Titanium Using an <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=9500">Agilent 9500 ICP-QQQ</a></h3>Ensuring purity and performance of titanium materials used in high-tech industries&nbsp;<ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_high_purity_titanium_9500_icp_qqq_5994_9024en_agilent_56ab5e943b.pdf">Full PDF for download</a></li></ul><h5>Importance of high-purity titanium and the role of ICP-QQQ&nbsp;</h5>High-purity titanium (Ti) is a critical material in high-tech industries such as semiconductor manufacturing and aerospace engineering. In semiconductor applications, Ti is widely used as a sputtering target for thin-film deposition, where even trace levels of impurities can negatively affect film uniformity, electrical properties, and device reliability. In aerospace applications, Ti is valued for its high strength-to-weight ratio and corrosion resistance, making it an ideal material for engine components and structural parts. However, any impurities can compromise the mechanical integrity and diminish the long-term performance of components, especially when operating under extreme conditions.Ensuring the reliability and functionality of Ti in these demanding environments requires precise quantification of trace impurities in the raw material. Triple quadrupole Inductively Coupled Plasma Mass Spectrometry (ICP-QQQ) provides robust suppression of spectral interferences and ultra-low detection limits (DLs), enabling accurate determination of impurities at or below the 1 mg/kg (ppm) level in the solid. This level of sensitivity is particularly important for quality control (QC) of high-purity Ti, where conventional techniques such as XRF, ICP-OES, and GD-MS lack the sensitivity and DLs.&nbsp;For unrivalled interference reduction using reactive cell gases, Agilent ICP-QQQ instruments include two unit mass (1 u) quadrupole mass filters, Q1 and Q2.1 Q1 is positioned before the collision/reaction cell (CRC) to select which ions enter the cell for reaction with the cell gas. Q2 filters ions that exit the cell before they pass to the detector. This tandem mass spectrometer (MS/MS) operation allows for unmatched control of reaction chemistry in the CRC, making the technique useful for handling intense spectral interferences, including polyatomic, doubly charged ion (M++), isobaric, and peak overlap interferences.&nbsp;Using the newly developed <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=9500">Agilent 9500 Triple Quadrupole ICP-MS</a> featuring a Dual-Cell System (DCS) CRC and equipped with an optional m-lens, analysts can confidently analyze Ti matrix samples and verify material purity over extended measurement periods. The m-lens is designed with an optimized geometry that minimizes background signals from easily ionized elements that can deposit on interface components during long runs. This feature enables the instrument to maintain high-power, matrix-tolerant plasma conditions while achieving ultralow background equivalent concentrations (BECs), which is critical for ppt-level impurity analysis. Operating the DCS with a suitable cell gas effectively controls spectral interferences from Ti-based species (Ti²+ and TiO+ ) that impact elements like sodium (Na), magnesium (Mg), copper (Cu), and zinc (Zn). Together with the m‑lens, this approach ensures accurate measurement of trace elemental impurities, enabling compliance within stringent industry standards. The effectiveness of the m‑lens in minimizing background signals and enabling ppt‑level impurity analysis under robust plasma conditions has also been demonstrated in high-matrix applications using ICP‑QQQ.2, 3 In addition to interference control, the 9500 ICP-QQQ system’s robustness and reproducibility make it well suited for routine analysis in both research and production settings. This capability supports the continued advancement of high-tech applications that rely on ultra-clean titanium.In this study, a 200 ppm Ti solution prepared from a high-purity Ti powder was used to represent a typical sample encountered in advanced material analysis. The performance of the 9500 ICP-QQQ for quantifying trace impurities, including Na, Mg, Cu, and Zn, in a high Ti matrix was assessed through spike-recovery experiments and long-term stability tests.<h4>Conclusion&nbsp;</h4>This study demonstrated the effectiveness of the Agilent 9500 ICP-QQQ with m-lens for the ultra-trace analysis of impurity metals in high-purity titanium. By applying optimized reaction gas conditions and mass-shift techniques, spectral interferences from Ti-based species such as Ti²+ and TiO+ were successfully mitigated, enabling accurate quantification of elements like Mg, Cu, and Zn.&nbsp;The method achieved limits of quantification in the sub-ppm range for the undiluted Ti digestion solution and maintained stable ISTD signals over extended measurement periods. Spike recovery tests confirmed high accuracy and reproducibility, with most elements showing recoveries within ±10% and RSDs below 3%.&nbsp;These results confirm that the 9500 ICP-QQQ is a robust and reliable tool for quality control of high-purity Ti, supporting its critical applications in semiconductor and aerospace industries where impurity levels must be strictly controlled.<h3>2. Shimadzu: Scanning Probe Microscope /Atomic Force Microscope SPM-9700HT Plus</h3><ul><li>Brochure</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/c147_e021_4c550d3be3.pdf">Full PDF for download</a></li></ul>The Shimadzu SPM-9700HT Plus is a high-throughput scanning probe microscope (SPM) / atomic force microscope (AFM) designed for three-dimensional surface imaging and nanoscale characterization of material properties across a broad range of scientific and industrial applications. The system combines high-resolution topographical imaging with multiple AFM measurement modes, including contact, dynamic, phase, lateral force, force modulation, and force-curve measurements, while optional modules extend its capabilities to techniques such as Kelvin probe force microscopy (KPFM), magnetic force microscopy (MFM), conductive AFM, piezoresponse force microscopy (PFM), and scanning tunneling microscopy (STM). A wide selection of interchangeable scanners, environmental accessories, optical microscope units, and specialized sample holders enables the instrument to be configured for diverse analytical requirements.A major focus of the brochure is the system's emphasis on automation and ease of use through Shimadzu's Analytical Intelligence technology. Features such as Observation Navigation, NanoAssist, and the optional Cantilever Master automate instrument setup, cantilever installation, optimization of imaging parameters, and measurement workflows, allowing operators with varying levels of experience to acquire high-quality, reproducible AFM data. The redesigned control electronics and scanning system also enable high-throughput imaging and rapid physical property mapping while maintaining nanoscale resolution. In addition, the head-slide mechanism simplifies sample exchange without removing the cantilever, increasing productivity during routine measurements.Beyond surface topography, the SPM-9700HT Plus provides extensive quantitative analysis capabilities through integrated software for roughness measurements, particle analysis, cross-sectional profiling, and morphological characterization. Optional Nano 3D Mapping Fast technology extends the instrument to nanoscale mechanical property measurements by performing force-curve mapping, allowing localized evaluation of adhesion, Young's modulus, and other mechanical properties of thin films, polymers, biomaterials, and soft samples. The optional Particle Analysis Software further enables automated extraction, classification, statistical evaluation, and export of particle size and morphology data for large datasets.The brochure demonstrates the versatility of the platform through numerous application examples spanning electronics, semiconductor devices, magnetic materials, life sciences, industrial materials, batteries, polymers, nanomaterials, food science, and chemistry. Representative studies include magnetic domain imaging, organic thin-film transistor characterization, collagen and DNA visualization, live-cell imaging, lithium-ion battery electrode and separator analysis, photocatalyst surface potential measurements, polymer phase imaging, cellulose nanofiber characterization, and beer yeast morphology. Together, these examples highlight the Shimadzu SPM-9700HT Plus as a comprehensive AFM platform capable of combining rapid imaging, advanced nanoscale property mapping, and automated data analysis for both research and routine industrial quality control.<h3>3. Thermo Fisher Scientific: Enhancing Monoclonal Antibody Yield and Quality Through Automated Multi-Component Feedback Control Loops Using the MarqMetrix All-In-One Process Raman Analyzer</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/enhancing_monoclonal_antibody_an1506_en_bba763e865.pdf">Full PDF for download</a></li></ul>The application of Raman spectroscopy for real-time monitoring and control of bioreactors marks a significant advancement in bioprocessing technology. Over the past decade, its adoption has enabled tighter control of critical process parameters (CPPs), offering early indicators of process performance to ensure consistency and improve product quality. Raman spectroscopy leverages the unique vibrational signatures of molecules, allowing for highly specific detection even in complex biological matrices. This enables simultaneous, real-time monitoring of multiple CPPs, including nutrient concentrations, metabolic by-products, and cell density. As a result, users gain deep, real-time insights into cellular metabolism and can implement more dynamic, adaptive feeding strategies based on metabolic network understanding.&nbsp;Previous studies have demonstrated the negative impact of high lactate on cell health and quantity and quality of titer produced.² In this study, we demonstrate the successful implementation of process Raman analyzer for simultaneous multi-component feedback control of glucose and lactate in a bioreactor. By continuously monitoring both analytes, the feedback control loop dynamically maintained a constant total carbon concentration (glucose + lactate) at a setpoint of 2 g/L.&nbsp;This advanced carbon-source-based control strategy ensured that cellular metabolic demands were met while promoting lactate consumption toward the end of the run. As a result, lactate accumulation was significantly reduced, leading to substantial improvements in titer yield, product quality, and cell viability compared to standard bolus feeding strategies (Figure 2).The outcomes of this work underscore the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2233">Thermo Scientific™ MarqMetrix™ All-In-One Process Raman Analyzer </a>as a key Process Analytical Technology (PAT) tool-enabling real-time, multi-analyte control for any biomanufacturer seeking to engage in intelligent, automated biomanufacturing.<h4>Conclusion&nbsp;</h4><h5>1. Unmatched Real-Time Control Capability:&nbsp;</h5>Maintaining a constant total carbon concentration (glucose + lactate) of 2 g/L in dynamic bioreactor environments demands precise, simultaneous analyte monitoring. The MarqMetrix All-In-One Process Raman Analyzer delivers near real-time, high-fidelity data every two minutes, empowering advanced control strategies that are simply not feasible with conventional technologies. This makes it an indispensable PAT tool for modern bioprocessing.&nbsp;<h5>2. Proven Impact on Product Yield and Quality:&nbsp;</h5>The Raman-enabled carbon control strategy resulted in a &gt;10% increase in titer and a reduction in glycation by 83% and 66% compared to continuous and fed-batch glucose control, respectively. These outcomes underscore the analyzer’s transformative impact on both product quantity and quality.&nbsp;<h5>3. Versatile Automation Across Bioprocesses:&nbsp;</h5>All three bioreactor runs—each employing distinct control logics (Table 2)—were successfully managed through automated feedback using the process Raman analyzer. Its flexible design, including easily swappable probes, supports seamless adaptation to other critical metabolites such as amino acids, making it a universal solution for bioprocess control.&nbsp;<h5>4. Foundation for Intelligent Manufacturing:&nbsp;</h5>With its real-time, data-rich insights and seamless integration into automated systems, the MarqMetrix All-InOne analyzer is not just a monitoring tool; it is a cornerstone technology for intelligent, AI-driven biomanufacturing. It enables consistent, high-quality production while reducing time, cost, and variability.

News from LabRulezICPMS Library - Week 27, 2026

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Webinars

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Eurachem is a European network promoting international traceability of chemical measurements and good analytical practice. It provides expert guidance, supports method validation, uncertainty evaluation, proficiency testing, and facilitates discussion on technical and policy issues in analytical quality.

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Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Products from category XPS focused on X-ray - page 1

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