<h3>Introduction</h3><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Fisher_Scientific_From_Raw_Signals_to_Reliable_Results_Post_Acquisition_Data_Workflows_in_ICP_Analysis_f7248bb920.jpg" alt="Thermo Fisher Scientific: From Raw Signals to Reliable Results: Post-Acquisition Data Workflows in ICP Analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Fisher_Scientific_From_Raw_Signals_to_Reliable_Results_Post_Acquisition_Data_Workflows_in_ICP_Analysis_f7248bb920.jpg 245w," sizes="100vw" width="1024" height="512">Modern elemental analysis techniques such as ICP-OES and ICP-MS are capable of generating large volumes of highly sensitive, multi-dimensional data in a single analytical run. These technologies are widely used across environmental, pharmaceutical, food, and materials science applications due to their precision and low detection limits. However, while significant emphasis is often placed on method development, instrument optimisation, and sample preparation, the true scientific value of any analysis is ultimately determined during the post-acquisition phase. It is here that raw instrumental signals are processed, interrogated, and validated before being translated into meaningful and defensible results. Whether you are working with the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=227&amp;instrumentationItems=84&amp;manufacturerItems=3&amp;search=iCAP+PRO">iCAP PRO ICP-OES</a>, the&nbsp;<a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=232&amp;manufacturerItems=3&amp;search=iCAP+MX">iCAP MX ICP-MS</a>, the iCAP 7000 OES, or Qnova ICP-MS systems, the interface and workflow logic remain familiar.<h3>Method</h3>Following data acquisition, analysts must first navigate and organise complex datasets efficiently. Large analytical sequences may contain hundreds of samples, each with multiple analytes, replicates, and quality control elements. Tools such as column sorting and filtering are therefore essential for structured data interrogation. Sorting concentration values, for example, allows rapid identification of extreme values or potential outliers, while filtering by sample type, QC category, or analyte enables targeted investigation of specific data subsets. These tools support not only workflow efficiency but also statistical awareness, helping analysts detect trends, inconsistencies, or anomalies that may otherwise go unnoticed. In parallel, maintaining a complete LabBook history ensures that all changes to methods, calibration parameters, and analytical settings are recorded. This level of traceability is essential for regulatory compliance, particularly in environments operating under ISO standards or Good Laboratory Practice, and it ensures that results can be reproduced and audited with confidence.A fundamental aspect of post-acquisition processing is the application and evaluation of correction models. ICP-based techniques are inherently susceptible to a range of interferences, including background signals, spectral overlaps, and matrix-induced signal suppression or enhancement. Blank subtraction is typically the first correction applied, removing contributions from reagents, solvents, and instrument background. By comparing results with and without blank correction, analysts can assess the significance of background contributions, particularly at low concentration levels. In ICP-OES, Inter-element correction (IEC) addresses spectral interferences by mathematically compensating for overlapping emission lines, which is especially important in complex matrices containing multiple elements.&nbsp;For ICP-MS, correction equations can be similarly implemented to correct for the presence of an isobaric interferences of mass signals.Internal standard (IS) correction is another critical component, used to normalise signal fluctuations caused by instrument drift, variations in sample introduction, or matrix effects. Reviewing data with these corrections toggled on and off provides valuable diagnostic insight, allowing analysts to determine whether corrections are appropriate and whether the underlying method is robust.While processed concentration data is the primary output of most analyses, deeper insight can be gained by examining the underlying signal intensities. Replicate measurements, for instance, provide a direct assessment of analytical precision. Consistent replicate signals indicate stable measurement conditions, whereas significant variation may suggest issues such as sample heterogeneity, nebuliser instability, or matrix interference. Similarly, blank intensities can reveal contamination or insufficient rinsing between samples, often serving as an early indicator of systematic error. In ICP-OES, spectral sub-array views allow analysts to visualise the emission profile around a selected wavelength, enabling verification of peak shape, background correction points, and potential spectral overlaps. In ICP-MS, attention must be given to detector behaviour, particularly when signals transition between pulse and analog modes at higher concentrations. Such transitions can introduce non-linearity into calibration curves, sometimes necessitating cross-calibration to maintain quantitative accuracy.Calibration is central to transforming raw signal intensity into quantitative concentration data, and its evaluation is one of the most critical steps in the workflow. Several performance indicators are used to assess calibration quality. The coefficient of determination (R²) provides a measure of how well the calibration model fits the data, though a high R² alone does not guarantee accuracy. Bias offers insight into systematic deviations between expected and measured values, highlighting potential issues with standards or instrument response. Detection limits, including the limit of detection (LOD) and instrument detection limit (IDL), define the sensitivity of the method, while background equivalent concentration (BEC) reflects the contribution of background signal to the overall measurement. A comprehensive calibration assessment requires consideration of all these parameters together, rather than reliance on a single metric. In addition, quality control samples—such as calibration check standards (CCVs), certified reference materials (CRMs), and matrix spikes—are used to verify accuracy and method performance. Automated flagging of QC results that fall outside predefined acceptance criteria provides an efficient means of identifying non-compliant data and supports rapid decision-making.Equally important is the evaluation of instrument performance through diagnostic readbacks recorded during the analysis. These parameters provide insight into the physical and operational state of the instrument at the time of measurement. For ICP-MS, key readbacks include nebuliser gas pressure, vacuum levels, and interface conditions. Changes in these parameters can indicate issues such as partial blockages, salt deposition, or vacuum degradation. Similarly, plasma-related parameters and gas flow stability are critical indicators in both ICP-OES and ICP-MS systems. By correlating readback trends with analytical results, analysts can identify the root causes of anomalies, distinguish between instrument-related and sample-related issues, and take corrective action where necessary. This diagnostic capability is particularly valuable when troubleshooting unexpected results or when sharing data with technical support teams for further investigation.Once the data has been thoroughly reviewed and validated, the final step is to export and communicate the results in a clear and usable format. Structured reporting tools enable the generation of comprehensive summaries that include concentration data, calibration details, quality control results, and any associated flags or annotations. These reports are essential for documentation, regulatory submissions, and communication with stakeholders. For greater flexibility, exporting data in CSV format allows integration with external tools such as spreadsheet software, statistical analysis platforms, or laboratory information management systems (LIMS). This interoperability facilitates advanced data analysis, long-term data storage, and seamless integration into broader laboratory workflows.<h3>Conclusion</h3>In conclusion, post-acquisition data processing is not merely a procedural step but a critical component of the analytical workflow that determines the reliability and scientific validity of results. Through careful organisation of data, rigorous application of correction models, detailed evaluation of calibration performance, and continuous monitoring of instrument diagnostics, analysts can ensure that their results are both accurate and defensible. As analytical technologies continue to evolve and datasets become increasingly complex, the importance of robust and systematic data evaluation will only grow. Mastery of these workflows transforms raw instrumental signals into high-quality scientific information, underpinning confident decision-making across a wide range of applications.<h3>Acknowledgement</h3>I would like to thank&nbsp;Matthew Gregory&nbsp;Field Applications Scientist, North EMEA, Trace Elemental Analysis and&nbsp;David Fishwick&nbsp;Field Applications Scientist, North EMEA, Trace Elemental Analysis for the support on this blog and the webinars.Sign up for our webinars live and on demand.English<ul><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5795">Lunch and Learn Tips and Tricks Series: Qtegra Part 1</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5976">Lunch and Learn Tips and Tricks Series: Qtegra Part 2</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5977">Lunch and Learn Tips and Tricks Series: Trace Elemental Analysis (ICP-OES &amp; ICP-MS)</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5978">Trace Elemental Analysis: Ask the Expert</a></li></ul>Deutsch<ul><li>19. März 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179134/393E071E3B501943730958BA6203F477">Interne Standards in der ICP-OES: Ein Praxisguide für zuverlässige Qualitätssicherung im Labor</a></li><li>18. Juni 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179292/AE4C576B6A54D1AC182F7F77573D380F">Fehler reduzieren, Durchsatz steigern: Autoverdünnung mit PrepFast am ICP-MS</a></li><li>17. September 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179423/B5019C560431BADCA2A76E54E4EFE56F">ICP-OES smarter nutzen: Probendurchsatz erhöhen, Ressourcen sparen</a></li><li>17. Dezember 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179530/94EEDD1F56138F5EEE2AF24E29E6C12A">Qtegra ISDS Software Unlocked – Live im Expertengespräch</a></li></ul><blockquote>Visit us on&nbsp;<a target="_blank" rel="noopener noreferrer" href="https://www.linkedin.com/showcase/72003132/admin/dashboard/">LinkedIn:</a>&nbsp;#AnalyticalChemistry #ICPMS #ICPOES #DataAnalysis</blockquote>

From Raw Signals to Reliable Results: Post-Acquisition Data Workflows in ICP Analysis

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 18th May 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you brochure by MILESTONE and application notes by Shimadzu and Thermo Fisher Scientific!<h3>1. MILESTONE: <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?search=ETHOS+LEAN+">ETHOS™ LEAN</a> Compact Microwave Labstation</h3><ul><li>Brochure</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/Brochure_ETHOS_LEAN_1_c80f4403a4.pdf">Full PDF for download</a></li></ul>Sample preparation is the foundation of many analytical workflows, and often the most critical step. In elemental analysis, proper digestion ensures accurate and reproducible results with AAS, ICP, and ICP-MS by enabling complete recovery of target elements, minimizing interferences, and reducing blanks. With over 35 years of innovation and more than 30,000 microwave systems installed worldwide, Milestone is a global leader in microwave sample preparation. The ETHOS LEAN, now in its 2nd series, represents this expertise: a compact, affordable labstation delivering full digestion capabilities without compromise. Beyond digestion, ETHOS LEAN supports solvent extraction for chromatography, solvent-free extraction of natural products, and even microwave synthesis workflows, offering unmatched versatility in its class. Selecting the right system is more than a purchase decision: it’s choosing a partner. With Milestone, you gain not only proven technology but also the knowledge and support to ensure long-term success.<h4>BUILT FOR MORE THAN DIGESTION</h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?search=ETHOS+LEAN+">ETHOS LEAN</a> goes beyond digestion. As a compact Microwave Labstation, it supports a suite of accessories that expand its capabilities into multiple workflows. Microwave technology provides a faster, cleaner, and more efficient alternative to conventional sample preparation techniques, reducing processing time, simplifying operations, and minimizing reagent consumption.&nbsp;<h5>Solvent extraction</h5>Closed-vessel microwave technology streamlines extraction for chromatographic analysis, dramatically reducing solvent use and cutting analysis times. Ideal for organic pollutant extraction from environmental samples or fat determination in food and feed.<h5>Solvent-free extraction</h5>Patented Milestone technology enables fast and efficient essential oil extraction in just minutes, preserving aroma and natural composition while minimizing degradation. Selective heating promotes a quicker, more efficient release from plant cells.<h5>Microwave synthesis</h5>Microwave synthesis is a safer and faster alternative to heating mantles or complex reactors, enabling rapid optimization of conditions. Its speed supports research projects and allows practical teaching sessions within standard class times.<h5>High-temperature processes</h5>With the ultraFAST accessory, ETHOS LEAN reaches 1200 °C in just minutes, transforming into a microwave furnace for demanding high-temperature applications such as inorganic synthesis, fusion, or fire assay.<h3>2. Shimadzu: Discriminating between Microsamples of Similar Resins with a Combination of FTIR and Thermal Analysis Instruments</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01114_en_a9291de45e.pdf">Full PDF for download</a></li></ul><h4>User Benefits</h4><ul><li>Using the ATR method with FTIR spectroscopy enables simple and rapid qualitative analysis of polymers.</li><li>DSC analysis may be able to reveal differences in polymer thermal histories that cannot be confirmed by FTIR alone.</li><li>TG-DTA can be used to confirm the content level of inorganic additives in polymers</li></ul>A wide range of polymer resins is used in modern society for diverse applications, resulting in increasing demand for qualitative analysis of resin microsamples, such as identifying resin contaminants in products or qualitatively evaluating microplastics for environmental impact assessments. FTIR spectrophotometers are commonly used for qualitative analysis of polymers. In particular, the ATR (attenuated total reflectance) method is widely used because measurements can be performed simply and quickly by clamping a sample against a prism to ensure close contact.&nbsp;While the ATR method makes it relatively easy to discriminate between different types of polymers, clear differences may not appear when analyzing similar polymers—for example, when there are only slight differences in the type or content of additives or the thermal histories during manufacturing. In such cases, differences may be confirmed by using thermal analysis instruments, such as a DSC or TG-DTA system.&nbsp;This article describes an example in which three instruments— an <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=IRSpirit-TX">IRSpirit-TX</a> FTIR spectrophotometer, a <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=DSC-60+Plus">DSC-60 Plus</a> differential scanning calorimeter, and a DTG-60 simultaneous DTA-TG unit (Fig. 1)—were used to confirm differences among six microsamples of polypropylene (PP) resin.<h4>Conclusion</h4>Details of the six types of PP resin identified from the above measurement results are shown in Table 4. The results indicate that by using an FTIR spectrophotometer in combination with thermal analysis equipment, such as DSC and TG-DTA systems, it is possible to distinguish between minute amounts of the same type of resin with various different properties.<h3>3. Thermo Fisher Scientific: XPS depth profiling of advanced solar cells with femtosecond laser ablation</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/xps_depth_profiling_advanced_solar_cells_appnote_7bda4471a5.pdf">Full PDF for download</a></li></ul>Perovskites are an emerging class of materials in the solar cell industry, exhibiting a number of promising properties, such as improved efficiency and weight, compared to traditional silicon-based devices. X-ray photoelectron spectroscopy (XPS) is an established tool in solar cell research due to its ability to provide extremely surface-sensitive information about elemental composition along with chemical and electronic states.¹ XPS is ultimately a surface analysis technique, however, and in order to assess the full composition of complex, multi-layered structures such as solar cells, a technique known as depth profiling is necessary, which performs multiple rounds of successive material removal and analysis.&nbsp;This application note explores a recent study by Chandler et al. that focuses on solar cells designed for aerospace applications,² where accurate determination of the “true” starting composition of the stacks is essential for tests that simulate space conditions, such as radiation exposure. Without a reliable baseline, it becomes impossible to distinguish between changes induced by the experimental conditions and artifacts introduced during analysis. Conventional ion beam sputtering methods used for depth profiling are known to distort chemical information for perovskites; femtosecond laser ablation (fs-LA) is presented as a novel, alternative method that helps to preserve vital chemical information.<h4>Experimental</h4>A halide-perovskite-based solar cell was fabricated on an ITO/SnO₂ substrate using a spin coating method; the structure of the layers is shown in Figure 1.Analysis was performed with the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2206">Thermo Scientific™ Hypulse™ Surface Analysis System</a>, which is equipped with both traditional ion-beam sputtering and femtosecond-laser ablation capabilities. XPS data was collected in SnapShot acquisition mode using an X-ray spot size of 30-200 µm, depending on the method of depth profiling.&nbsp;A MAGCIS ion gun was employed for the sputter depth profiles, generating either a 500 eV monatomic Ar⁺ beam or 8 keV Ar₁₅₀⁺ clusters. The fs-LA depth profiles were generated using a 1,030 nm wavelength laser operating at a 160 fs pulse length. The pulse energy was increased from 42 µJ to 167 µJ when transitioning from the perovskite layer into the substrate structure. A flood gun was employed for charge neutralization during profiling.<h4>Summary&nbsp;</h4>This study confirms the challenges associated with traditional ion sputtering (both monatomic and cluster) for the depth profiling of perovskite-based solar cells. These methods cause preferential sputtering, particularly of lighter elements like carbon, nitrogen, and iodine, which distorts elemental ratios in the profiles and results in artificial signals, such as the formation of metallic lead (Pb⁰). Depth profiling with femtosecond laser ablation represents a novel and robust alternative that preserves the original chemical composition and oxidation states throughout the perovskite layer. By avoiding preferential removal effects, accurate compositional information is maintained during the profile, and erroneous peak signals associated with chemical reduction are eliminated. These factors are vital in establishing a chemically undisturbed baseline before performing tests that simulate environmental effects on the solar cells.&nbsp;With fs-LA depth profiling, any induced changes can be confidently delineated from analytical artifacts, and researchers can better understand and mitigate environmental effects on solar-cell performance, eventually leading to improved solar technologies for aerospace applications.

News from LabRulezICPMS Library - Week 21, 2026

In February of this year, a GAČR project focused on high-speed scanning probe microscopy was launched. Over the next three years, scientists from CEITEC Brno University of Technology (BUT), in collaboration with the Czech Metrology Institute (CMI), will work to accelerate measurement processes using this technique and to improve the analysis of the acquired data with the help of custom-developed artificial intelligence algorithms. The research results will find applications in both scientific and industrial practice, for example, in monitoring live cells or in chip manufacturing.High-speed atomic force microscopy is a field that allows scientists to study the properties of surfaces of various materials. They use microscopes equipped with a miniature tip and probe only a few nanometers (a millionth of a millimeter) in size, which repeatedly glide along regular paths across the sample surface. The scanned area is on the order of micrometers – smaller than a human red blood cell – and the surface shape is recorded with precision comparable to the distance between individual atoms. The probe scans the surface, enabling scientists to obtain highly detailed images with extremely high resolution. Such measurements usually take only a few minutes, but even that can be too long in some cases,&nbsp;especially for samples that change over time, such as living biological materials, as well as non-living materials whose changes are of interest. Addressing this challenge is the core of the GAČR project, officially titled High-Speed Atomic Force Microscopy with Sparse Sampling.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_a30ca0e27e.jpeg" alt="CEITEC BUT: CEITEC Scientists Aim to Increase &quot;High-Speed Microscopy&quot; Up to Fivefold " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_a30ca0e27e.jpeg 150w," sizes="100vw" width="1600" height="1666">“Our joint work aims to speed up the scanning process by optimizing the path along which the microscope tip moves, so that only truly useful data is measured. At the same time, we want to develop an algorithm capable of evaluating images without the need for an intermediate step of reconstructing data from the omitted parts of the surface,” says principal investigator Petr Klapetek from the Czech Metrology Institute (CMI). He points out that conventional high-speed scanning produces hundreds of images across the entire surface, but for samples that change rapidly over time, the probe may miss the area of interest at a critical moment. Changes occurring within milliseconds may therefore not be captured continuously, and important details can be lost. Researchers worldwide have been seeking ways to speed up scanning, usually by modifying microscopes so that the tip moves faster. However, mechanical acceleration increases error rates, for example, due to excessive vibrations. “Since we are aware of the inherent limits of scanning microscopy, we decided to take a completely different approach and tackle the problem through smarter measurement rather than major hardware modifications,”&nbsp;Petr&nbsp;adds.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_3_86682e0c39.jpeg" alt="CEITEC BUT: CEITEC Scientists Aim to Increase &quot;High-Speed Microscopy&quot; Up to Fivefold " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_3_86682e0c39.jpeg 208w," sizes="100vw" width="1600" height="1200"><h4>Software-based acceleration to overcome design limits</h4>One of the main tasks of the project will therefore be to design new scanning paths. These will remain regular but will be arranged in entirely different patterns to maximize the amount of information obtained in minimal time. Combined with more efficient data processing, this approach could increase scanning speed by up to five times. “Data processing is absolutely crucial for us. We need to develop AI algorithms capable of analyzing and interpreting images directly from such sparsely sampled grids, without needing to know what happened in the unmeasured areas. That will likely be our biggest challenge,” adds co-investigator David Nečas from CEITEC BUT. CEITEC BUT will be responsible for designing the scanning patterns and developing the necessary mathematical methods, while the experimental part – including all measurements and testing – will take place at the CMI.The outcome of this three-year collaboration should be a comprehensive theoretical methodology supported by experimental procedures. It could be used, for example, in biological laboratories studying changes in the behaviour of living samples – typically cells – over time. It may also find applications in semiconductor labs, where high-speed scanning microscopy is used mainly for quality control and defect detection during chip production. The method can measure not only the shape and surface structure of a sample, but also its electrical and other properties. “In practice, it could eventually become part of specialized industrial applications, where high-speed scanning microscopes perform imaging and evaluation almost in real time within inspection lines,” concludes David Nečas.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_2_de02ff2fb2.jpeg" alt="CEITEC BUT: CEITEC Scientists Aim to Increase &quot;High-Speed Microscopy&quot; Up to Fivefold " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_2_de02ff2fb2.jpeg 208w," sizes="100vw" width="1600" height="1200"><blockquote>Brno University of Technology is also currently collaborating with the <a target="_blank" rel="noopener noreferrer" href="https://cmi.gov.cz/?language=en">Czech Metrology Institute</a> and other academic and industrial partners on the European project <a target="_blank" rel="noopener noreferrer" href="https://www.ptb.de/epm2024/dinamo/project">DINAMO</a>, which focuses on developing data-processing methods for calibrating all types of scanning probe microscopes. The team at BUT, led by principal investigator David Nečas, is working on standardizing these methods so that even scientists who are not specialists in this type of microscopy can easily set up the instruments themselves and measure their samples as accurately as possible.</blockquote>

CEITEC Scientists Aim to Increase "High-Speed Microscopy" Up to Fivefold 

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Since its establishment in 2011, CEITEC has quickly developed into a cutting-edge infrastructure for research which performs highly alongside the best institutes in Europe. Among the main priorities of CEITEC are the promotion of a motivating and dynamic international scientific environment, the provision of state-of-the-art research infrastructure, and the policy of open communication and equal opportunities.

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Thermo Scientific Nexsa G2 XPS System

Thermo Scientific™ Nexsa™ G2 delivers high-resolution XPS with optional UPS, ISS, REELS, and unique Raman integration for correlative surface spectroscopy.

<h4>Unique correlative spectroscopy</h4>The Thermo Scientific™ Nexsa™ G2 Surface Analysis System is a fully automated, multi-technique instrument. It features a new, micro-focus X-ray source, delivering both high sensitivity and high spatial resolution XPS. In addition, the system offers options for other surface analysis techniques: UPS, ISS and REELS. Uniquely, there is also the option to integrate a Raman spectrometer, aligned to the XPS analysis position, for true, correlative spectroscopy. With these features, the Nexsa G2 XPS System unlocks the potential for new insights in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_11_0cc1ab57d2.jpg 174w," sizes="100vw" width="986" height="881"><ul><li>High performance XPS</li><li>Rapid SnapMap XPS imaging</li><li>Depth profiling</li><li>Optional multi-technique integration<ul><li>Raman</li><li>ISS</li><li>UPS</li><li>REELS</li></ul></li><li>MAGCIS ion source for expanded depth profiling capabilities</li><li>Large sample handling</li><li>Avantage Software for instrument control, data processing, and reporting</li><li>Optional transfer capabilities for air-sensitive samples</li><li>Optional sample heating capability</li><li>SEM data correlation Thermo Scientific Maps TM Software</li></ul><h3>Nexsa G2 Surface Analysis System features</h3>High-performance X-ray source A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_6_2ad98d565b.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the Nexsa G2 Surface Analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow Correlate XPS data with SEM images through the correlative imaging and surface analysis workflow using Thermo Scientific Maps Software.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg" alt="Thermo Scientific Nexsa G2 XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_2_a0ba3d232c.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific K-Alpha XPS System

Thermo Scientific™ K-Alpha™ XPS combines high-performance hardware with intuitive workflows, ideal for both research and routine multi-user surface analysis.

<h4>Designed for productivity</h4>The Thermo Scientific K-Alpha™ XPS System bridges the requirements for both research and routine XPS analysis. The high-performance system hardware makes the K-Alpha XPS System ideally suited to creating world-class data in a busy R&amp;D environment. Intuitive workflows make it possible to put the K-Alpha XPS System into a multi-user, shared facility, allowing operators of all skill levels to add surface analysis to their materials analysis portfolio.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg" alt="Thermo Scientific K-Alpha XPS System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_2_979618dd54.jpg 208w," sizes="100vw" width="1086" height="815"><ul><li>High-performance, fully featured XPS system</li><li>Unique sample viewing with capability to facilitate rapid feature identification</li><li>Chemical state imaging</li><li>Large sample handling</li><li>Variable micro-focus X-ray source to match analysis area to feature</li><li>Ion source for depth profiling</li><li>Low energy flood source for insulator analysis</li><li>Built-in standards for self-calibration</li></ul><h3>K-Alpha XPS System features</h3>High-performance X-ray source The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_K_Alpha_XPS_System_160ceb9fbc.jpg 245w," sizes="100vw" width="1024" height="576">Optimized electron optics The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_5_bf3ca91a30.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample viewing Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_1_c2f5b1665d.jpg 245w," sizes="100vw" width="1024" height="576">XPS insulator analysis The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_8_30732ff276.jpg 245w," sizes="100vw" width="1024" height="576">XPS depth profiling Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_7_dadbf53b24.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_4_15d30eb387.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg" alt="Thermo Scientific K-Alpha XPS System" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_3_d7321554fd.jpg 245w," sizes="100vw" width="1024" height="576"><h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB™ QXi XPS Microprobe is a flexible, multi-technique platform with seamless Avantage software integration for advanced surface analysis.

<h4>Performance and versatility</h4>The Thermo Scientific ESCALAB™ QXi XPS Microprobe is the latest development in our renowned ESCALAB product line. The ESCALAB QXi XP Microprobe is designed as an expandable, multi-technique platform with unparalleled flexibility and configurability. System control, data acquisition, processing and reporting are seamlessly integrated by the powerful Thermo Scientific Avantage Data System for surface analysis.<ul><li>High-resolution, quantitative XPS imaging for smallest feature analysis</li><li>High-performance spectroscopy</li><li>Ion source for depth profiling</li><li>Optional automated sample exchange capability</li><li>Flood source for insulator analysis</li><li>Ion scattering spectroscopy (ISS) as standard</li><li>Reflected electron energy loss spectroscopy (REELS) as standard</li><li>Optional additional techniques:<ul><li>Ultra-violet photoelectron spectroscopy (UPS)</li><li>Auger electron spectroscopy (AES)</li><li>Microanalysis (EDS)</li><li>Inverse photoemission spectroscopy (IPES)</li></ul></li><li>Optional MAGCIS dual mode ion source</li><li>Full range of sample preparation options:<ul><li>Sample heating and cooling</li><li>Fracture stage</li><li>Inert transfer</li></ul></li></ul><h3>ESCALAB QXi XPS microprobe features</h3>Monochromated XPS analysis and HAXPES The twin-crystal, micro-focusing monochromator has a 500 mm Rowland circle, uses an Al anode (or a dual Al and Ag anode with the dual monochromator option for automated switching from XPS to HAXPES), and allows you to select any sample spot size ranging from 200 µm to 900 µm.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_9_0d0e98b8c2.jpg 245w," sizes="100vw" width="1024" height="576">Spectroscopy imaging The lens and analyzer system on the ESCALAB QXi XPS Microprobe incorporates the Deflector Lens, enabling fast parallel imaging. Two detector systems: one optimized for spectroscopy and one for parallel imaging, consisting of a pair of channel plates and a continuous position-sensitive detector.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_10_927e6a3bfb.jpg 245w," sizes="100vw" width="1024" height="576">Charge neutralisation in XPS analysis An electron source, co-axial with the analyzer input lens, is used for charge compensation when analyzing non-conducting samples with the monochromatic X-ray source, while a second flood source produces both low-energy ions to assist in providing effective charge compensation and low-energy electrons when the magnetic lens is not in use.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_8_0e101d66b1.jpg 245w," sizes="100vw" width="1024" height="576">XPS ion gun The ESCALAB QXi XPS Microprobe has two options for rapid, high-resolution depth profiling: the standard EX06 ion gun, which is optimized for monatomic ion sputtering and ion scattering spectroscopy, and the optional monatomic and gas cluster ion source, the Thermo Scientific MAGCIS Dual Beam Ion Source, which is capable of monatomic ion profiling, cluster ion profiling, and ion scattering spectroscopy.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_1_9bd51609c7.jpg 245w," sizes="100vw" width="1024" height="576">Avantage Software All analytical functions are controlled from Thermo Scientific Avantage Software, meaning that the entire analysis process can be performed remotely, if required. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_2_3b0968d8c6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample handling and alignment All axes of movement on the sample stage are controlled by Avantage Software. With the auto-exchange system, samples can be exchanged from the preparation chamber to the load-lock automatically for a continuous sample flow. A high-resolution digital video camera is fitted to the instrument and is accurately aligned with the analysis position. XPS parallel imaging can also be used to locate features for analysis.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_3_592c7c58d0.jpg 245w," sizes="100vw" width="1024" height="576">Multi-technique capabilities The ESCALAB QXi XPS Microprobe includes ISS and REELS, which complement XPS, as standard. Additional analytical options, including UPS, AES, HAXPES, Raman, and IPES, can be added to provide a tailored solution to meet your experimental needs.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_4_79a3dbd662.jpg 245w," sizes="100vw" width="1024" height="576">XPS instrument alignment and calibration A calibration sample block, which has samples of copper, silver, and gold, is supplied for assessing sensitivity, setting the linearity of the analyzer energy scale, calibrating the ion source, aligning the X-ray monochromator, and determining the transmission function of the analyzer.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_5_bb5b4ff7aa.jpg 245w," sizes="100vw" width="1024" height="576">Vacuum system The analysis chamber is constructed from 5 mm-thick mu-metal to maximize the efficiency of the magnetic shielding, and the chamber is pumped using both a turbomolecular pump and a titanium sublimation pump, allowing the analysis chamber to achieve a vacuum better than 5 × 10⁻¹⁰ mbar.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_6_44b53211d6.jpg 245w," sizes="100vw" width="1024" height="576">XPS sample preparation chambers The standard Preploc chamber, which is a combined sample entry lock and preparation chamber, has ports that accommodate a variety of sample preparation devices, such as heating and cooling probes, ion guns, high-pressure gas cells, sample parking, and gas admission.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg" alt="Thermo Scientific ESCALAB QXi XPS Microprobe" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_ESCALAB_Q_Xi_XPS_Microprobe_7_ff59084cff.jpg 245w," sizes="100vw" width="1024" height="576">Beyond XPS, the ESCALAB QXi XPS Microprobe is a true multi-technique system, with ion scattering spectroscopy (ISS) and reflected electron energy loss spectroscopy (REELS) included as standard. Additional options such as HAXPES, AES, UPS, Raman, and IPES allow you to tailor the platform to your research needs. With versatile sample preparation capabilities and seamless integration with other vacuum hardware, the ESCALAB QXi is the surface analysis instrument designed to meet the most demanding research requirements.<h4>The full spectrum of surface analysis</h4><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg" alt="Thermo Scientific - The full spectrum of surface analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Nexsa_G2_XPS_System_9_4250fce7c4.jpg 245w," sizes="100vw" width="1054" height="632">

Thermo Scientific Hypulse Surface Analysis System

Thermo Scientific Hypulse Surface Analysis System combines ion-beam techniques with femtosecond laser ablation for accurate XPS depth profiling of thin films, coatings, and complex multilayer materials.

The Thermo Scientific Hypulse Surface Analysis System is a high-performance X-ray photoelectron spectroscopy (XPS) platform designed for accurate depth profiling of thin films, coatings, and complex multilayer materials. By combining traditional ion-beam techniques with femtosecond laser ablation (fs-LA), the system delivers efficient and chemically representative depth profiles from the surface down to deeply buried regions within the sample. Hypulse supports advanced materials research, process development, and failure analysis across a wide range of applications.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg" alt="Thermo Scientific Hypulse Surface Analysis System " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_2_5834bc6da0.jpg 245w," sizes="100vw" width="650" height="338"><h3>Key benefits</h3>Achieve more accurate analysis By integrating monatomic ion beam etching, cluster ion beam etching, and fs-LA depth profiling, the Hypulse System enables reliable analysis of a broader range of materials compared to conventional ion-beam-only approaches.Enhance productivity Fs-LA depth profiling allows multiple depth profiles to be acquired in the time typically required to process a single sample using ion beam profiling, significantly improving analytical throughput.Gain deeper insight into materials The system enables practical depth profiling beyond 10 µm into the sample. Buried layers and transition regions that are difficult and time-consuming to access using ion beam techniques can be reached more efficiently using fs-laser ablation.Optimize analysis for different material types Laser parameters can be tuned to the specific material, eliminating the need to choose between cluster and monatomic ions and simplifying the profiling of complex and composite samples.<h3>System features</h3>Integrated fs-laser ablation system The Hypulse System incorporates a fully integrated 1,030 nm femtosecond laser with high-quality optical components. Laser attenuation and control are managed through Thermo Scientific Advantage Software. As a Class 1 laser system, no special laser safety requirements are needed in the laboratory.MAGCIS ion source A Thermo Scientific MAGCIS Dual Beam Ion Source for XPS instruments is included as standard. Automatic source optimization and controlled gas handling ensure high performance and excellent experimental reproducibility.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (1).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_1_74f35f9481.jpg 245w," sizes="100vw" width="1024" height="576">High-performance surface analysis In addition to XPS, the system supports complementary surface-sensitive techniques such as REELS and ISS, providing enhanced chemical and structural information.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (6).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_6_fc0bd9c61c.jpg 245w," sizes="100vw" width="1024" height="576">XPS analysis of insulating materials The patented dual-beam flood source combines low-energy ion beams with very low-energy electrons (&lt;1 eV) to prevent sample charging. This eliminates the need for charge referencing and enables reliable analysis of insulating samples.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (3).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_3_c6019a92eb.jpg 245w," sizes="100vw" width="1024" height="576">Optional XPS sample holders Specialist sample holders are available for angle-resolved XPS, sample bias measurements, sample heating, and inert transfer from a glove box.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (5).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_5_6e5ccfdbed.jpg 245w," sizes="100vw" width="1024" height="576">Advantage Software Instrument control, data processing, and reporting are fully integrated within Advantage Software. The platform includes Knowledge View, offering comprehensive tutorials and reference materials to support efficient data interpretation.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg" alt="Thermo Scientific Hypulse Surface Analysis System (4).jpg" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_Hypulse_Surface_Analysis_System_4_ce38c429e6.jpg 245w," sizes="100vw" width="1024" height="576">Correlative XPS imaging and surface analysis workflow XPS data can be correlated with SEM images using the correlative imaging and surface analysis (CISA) workflow via Thermo Scientific Maps Software.<h3>Hypulse Surface Analysis System specifications</h3><ul><li>Analyzer type: 180º, double-focusing, hemispherical analyzer with 128-channel detector</li><li>X-ray source: Monochromated, micro-focused, low-power Al K-alpha X-ray source</li><li>X-ray spot size: 10 to 400 µm (adjustable in 5 µm steps)</li><li>Laser ablation system:<ul><li>Fully integrated 1,030 nm pulsed fs-laser source</li><li>Tunable pulse energy up to 1 mJ</li><li>Computer-controlled attenuation to ensure optimum ablation conditions</li><li>Beam imaging module for system calibration and alignment</li></ul></li><li>Ion depth profiling: MAGCIS dual-mode ion source</li><li>Additional included analytical methods:<ul><li>Bi-polar analyzer power supply and helium gas input for ion source for ISS (ion scattering spectroscopy)</li><li>High-voltage upgrade to electron flood source for REELS (reflection electron energy loss spectroscopy)</li></ul></li><li>Maximum sample area: 60 x 60 mm</li><li>Maximum sample thickness: 20 mm</li><li>Vacuum system: Two turbo molecular pumps with automated titanium sublimation pump and backing pump</li><li>Optional accessories:<ul><li>UV photoelectron spectroscopy (UPS)</li><li>Sample tilt module</li><li>NX sample heating module</li><li>Sample bias module</li><li>Vacuum transfer module</li></ul></li></ul>

Products from category XPS focused on X-ray - page 1

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