<p><strong>In this leaflet we discuss whether or not you should correct for an observed significant bias and the impact this may have on the measurement uncertainty (MU). How to apply the correction and how to increase the uncertainty to take account of an uncorrected bias is outside the scope of this leaflet.&nbsp;</strong></p><p>Important issues for deciding on how to treat an observed significant bias are:&nbsp;</p><ul><li>whether we understand the cause of the bias, and&nbsp;</li><li>whether its size can be reliably determined.&nbsp;</li></ul><p><strong>Further we must decide:&nbsp;</strong></p><ul><li>whether the bias is consistent for all test samples within the scope of the method and&nbsp;</li><li>whether any correction for bias should be multiplicative or additive, depending on whether the magnitude of the bias is constant or changes with the concentration level.</li></ul><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Treatment_of_an_observed_bias_2_d221a32b8b.jpg" alt="Eurachem: Treatment of an observed bias" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Treatment_of_an_observed_bias_2_d221a32b8b.jpg 245w," sizes="100vw" width="1528" height="448"></p><h4><strong>Should we correct, and should we increase the measurement uncertainty?&nbsp;</strong></h4><p>The ISO Guide to the expression of uncertainty in measurement, GUM [1], assumes that “the result of a measurement has been corrected for all <strong>recognised significant</strong> systematic effects” (GUM 3.2.4). This implies that when developing a measurement method all known sources of bias should be investigated and if possible, eliminated or their effect minimised. If this cannot be achieved, then, if appropriate, a correction should be applied and the measurement uncertainty revised.&nbsp;</p><p>Let’s assume we have available a standardised method or a fully developed in-house method, with a clear description of the measurand, where any known bias has been minimised during method development (e.g. the effect of interferences has been minimised or a correction is included in the method). The next step, as a part of the validation, is to reliably determine any additional bias for the concentration interval and different matrices specified within the scope of the method. On the next page we present a roadmap outlining how to handle any additional significant bias.&nbsp;</p><p>Note that the observed bias in a laboratory could be due to laboratory as well as method bias. For empirical methods where the measurand is operationally defined by the method, the method bias is by definition zero, however, the laboratory bias still needs to be considered.</p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Treatment_of_an_observed_bias_3_5d99940abd.jpg" alt="Eurachem: Treatment of an observed bias" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Treatment_of_an_observed_bias_3_5d99940abd.jpg 62w," sizes="100vw" width="426" height="1060"></p><ol><li>There is no point in trying to eliminate or correct a small bias, since both elimination and correction need resources.&nbsp;</li><li>If bias is not negligible then the best approach, if possible, is to try to eliminate it by modifying the method.&nbsp;</li><li>If bias is not negligible, but eliminating it is either impossible or impractical, then we can consider correcting for bias. There are three possibilities:&nbsp;<ul><li>Correction may be required (e. g. by regulations).&nbsp;</li><li>Correction may be forbidden, in which case no correction should be made.&nbsp;</li><li>Correction may be allowed. Then we should look at two more criteria to determine whether correction is justified.&nbsp;</li></ul></li><li>If bias can be reliably determined and a correction method can be applied that is relevant for all test samples within the scope of the method we may decide to correct for bias. However, if the cause of bias is not known then correcting for bias cannot be generally recommended. If bias cannot be reliably determined then we should not correct for it. If we correct the result on the basis of an unreliable bias estimate then we may even increase the uncertainty of the results.&nbsp;</li><li>Correcting for bias is meaningful only if a useful reduction of measurement uncertainty (MU) is achieved. Correcting for the bias is only meaningful if the MU of the correction is smaller than the component of the MU arising from not applying the correction.&nbsp;</li></ol><p>If a significant bias is not corrected, it is difficult to give clear guidance on what action to take. For the case of recovery correction, IUPAC [2] lists some possibilities if no correction is applied:&nbsp;</p><ol><li>No action;&nbsp;</li><li>Report recovery separately, including the uncertainty of both the result and the recovery&nbsp;</li><li>Take the bias into account in the uncertainty estimate of the results</li></ol><p>These principles can be applied to other forms of bias. Further options have also been reviewed in the literature: See, for example, reference [3]</p>

Treatment of an observed bias

<p><strong>Scientists from the CTLAB at CEITEC Brno University of Technology used a new industrial CT scanner to examine the Bastion ballistic helmet manufactured by the U.S.-based company Ballistic Armor Co. Without making a single cut, the scanner revealed the helmet's internal structure, including its individual protective layers, and confirmed the absence of manufacturing defects. The results demonstrate the technology's potential for quality control and the development of protective equipment for the defense industry.</strong></p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_4be342238c.jpeg" alt="CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: Bastion Helmet by Ballistic Amor Co. scanned at CTLAB CEITEC." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_4be342238c.jpeg 235w," sizes="100vw" width="1600" height="1067"></p><p><strong>Computed tomography (CT)</strong> is an imaging technique widely used in medicine. Using <strong>X-rays</strong>, CT scanners produce detailed 2D cross-sectional images or 3D models of internal organs, allowing physicians to examine the inside of the human body without surgery and identify structural changes in tissues. Industrial CT scanners at <a target="_blank" rel="noopener noreferrer" href="https://ctlab.ceitec.cz/"><i><strong>CTLAB CEITEC</strong></i></a><strong> </strong>operate on the same principle but use significantly higher X-ray energies than medical systems. This enables researchers to inspect larger and more complex objects with exceptional precision while keeping them completely intact through <strong>non-destructive testing</strong>.</p><p>The laboratory's newest scanner, the <strong>Waygate Technologies phoenix v|tome|x L450</strong>, installed only at the end of last year, is unique in the research environment. Its size and power allow it to penetrate, for example, steel objects up to <strong>7 centimeters</strong> (2.8 inches) thick while maintaining a resolution of only a few tens of micrometers.</p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_4_bf54aa6ef1.jpeg" alt="CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: Anna Smith from Ballistic Armor Co. and Michaela Škaroupková from CTLAB CEITEC." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_4_bf54aa6ef1.jpeg 235w," sizes="100vw" width="1600" height="1067"></p><p><i>"Based on its technical capabilities, we knew this system could analyze highly complex composite materials. That's why we challenged it with the Bastion ballistic helmet from Ballistic Armor Co.,"</i> explains <strong>Tomáš Zikmund from the </strong><i><strong>X-ray Computed Micro- and Nano-Tomography Laboratory</strong></i><strong> at CEITEC Brno University of Technology</strong> (<a target="_blank" rel="noopener noreferrer" href="https://ctlab.ceitec.cz/"><i><strong>CTLAB CEITEC</strong></i></a>). The helmet is designed to provide protection against handgun ammunition.</p><p>The helmet is manufactured from Aramid fibers, better known by the trade name Kevlar. Aramid is widely used in ballistic protection and aerospace applications because of its exceptional strength, durability, and low weight. Combined with the helmet's other materials, it forms a highly complex internal structure that only the most advanced CT systems can visualize.</p><h3><strong>CT Helps Ensure Quality Without Damaging the Product</strong></h3><p>As part of the study, the Bastion helmet was exposed to X-rays for several hours. The result was <strong>a highly detailed 3D model </strong>of its internal structure, clearly revealing the individual ballistic layers as well as the soft padding materials—all without cutting the helmet apart. The analysis also detected no manufacturing defects.</p><p><i>"Results from non-destructive CT inspections like this improve our understanding of how protective equipment is built and help manufacturers maintain the highest standards of quality and safety,</i>" says Anna Smith, Director of Business Development at<strong> </strong><a target="_blank" rel="noopener noreferrer" href="https://ballisticarmorco.com/"><strong>Ballistic Armor Co</strong></a>.</p><p>Non-destructive CT analysis, however, is not a substitute for standard ballistic testing, which remains essential for verifying that protective equipment meets the required ballistic resistance specified by applicable standards. Instead, the technology serves as an effective tool for routine manufacturing quality control, verification of production consistency, and regular audits of products whose ballistic performance has already been validated.</p><p>According to Tomáš Zikmund, the successful test marks another important milestone in demonstrating the capabilities of the laboratory's new CT system for defense applications. Earlier this spring, the research team showcased the scanner by examining an airsoft rifle, non-destructively verifying the correct placement of mechanical components and wiring while also inspecting the materials for pores and microcracks.</p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_3_9a68c9c71c.jpeg" alt="CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: Bastion Helmet by Ballistic Amor Co. scanned at CTLAB CEITEC." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_3_9a68c9c71c.jpeg 235w," sizes="100vw" width="1600" height="1067"></p><p>These studies demonstrate that industrial CT has an<strong> important role to play in the defense sector</strong>. In many cases, it can complement destructive quality-control methods used during manufacturing by enabling detailed inspections without disassembling or damaging the product. Modern CT technology provides deep, highly precise, and <strong>completely non-destructive</strong> inspection. It does not, however, replace conventional ballistic testing, which remains the only method capable of verifying the required level of ballistic protection.</p><p><i>"Our goal is to strengthen collaboration between science, technology development, and the defense industry,"</i> Zikmund concludes. <i>"We believe our technology can help manufacturers not only improve production quality but also gain valuable insights into the behavior of materials and the design principles behind modern protective equipment."</i></p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_2_1559697260.jpeg" alt="CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: Bastion Helmet by Ballistic Amor Co. scanned at CTLAB CEITEC." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_2_1559697260.jpeg 104w," sizes="100vw" width="1600" height="2400"><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_5_8dab8c31ab.jpeg" alt="CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: CEITEC BUT/CEITEC BUT with the permission of Ballistic Armor Co.: Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut: Anna Smith from Ballistic Armor Co. and Michaela Škaroupková from CTLAB CEITEC." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_Profesionalni_ochranne_vybaveni_pod_rentgenem_Vyzkumnici_z_CEITEC_overili_kvalitu_balisticke_prilby_bez_jedineho_rezu_5_8dab8c31ab.jpeg 103w," sizes="100vw" width="1600" height="2420"></p>

Professional Protective Gear Under X-Rays: CEITEC Researchers Verify the Quality of a Ballistic Helmet Without Making a Single Cut 

<p><strong>Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 3rd August 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!</strong></p><blockquote><p><span style="font-size:20px;">👉 </span><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library"><span style="font-size:20px;"><strong>SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</strong></span></a></p></blockquote><blockquote><p><strong>👉 Need info about different analytical techniques?</strong> Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library"><strong>LabRulezLCMS</strong></a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library"><strong>LabRulezGCMS</strong></a> libraries.</p></blockquote><p>This week we bring you application notes by <strong>Agilent Technologies </strong>and <strong>Shimadzu </strong>and other document by <strong>Thermo Fisher Scientific!</strong></p><h3><strong>1. Agilent Technologies: Determination of Toxic Elements in Durian and Jackfruit Using an Agilent Automated ICP-MS System According to China GB 5009.268</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_icpms_durian_5994_9351en_agilent_fcafe537c7.pdf"><strong>Full PDF for download</strong></a><strong>&nbsp;</strong></li></ul><p>Fruit is an essential part of daily human nutrition, providing vital vitamins, minerals, and dietary fiber.3 The Chinese market, with over 1.4 billion people, has become one of the largest fruit markets in the world. It is expected that China's total fruit consumption will reach about 312 million tons by 2025.4 Additionally, fruit imports are projected to exceed 9 million tons annually, underscoring the country's strong domestic demand and reliance on imported supplies.&nbsp;</p><p>Within this context, China has become a major export destination for Asian countries, including Vietnam, Thailand, Laos, Cambodia, Philippines, Indonesia, and others. Thanks to favorable climate conditions and a wide variety of tropical fruit cultivars, these countries have strategically increased their fruit exports to satisfy Chinese market demand. Specifically, products such as durian and jackfruit have gained significant popularity, playing an increasingly vital role in regional agricultural trade.&nbsp;</p><p>However, the biggest challenge for those countries when entering the Chinese market is strict food safety regulations, especially limits on trace elements and heavy metals such as lead (Pb), cadmium (Cd), mercury (Hg), and arsenic (As). The General Administration of Customs of the People's Republic of China (GACC) sets very low Maximum Residue Limits (MRLs, Table 1). Additionally, the large, continuous volume of fruit exports makes time a critical factor, as any delay can affect product quality and reduce its economic value. This situation places significant pressure on testing laboratories, requiring the development of stable, rapid, and accurate methods to ensure continuous and reliable operations.&nbsp;</p><p>To address these challenges, the Agilent ICP Workflow Automation System offers a practical solution. The ICP‑MS 7900 provides high-throughput, highly sensitive, and precise measurements of trace elements and heavy metals, including Pb, Cd, Hg, and As. The combination of ADS2 and AVS helps reduce sample turnaround time and cost per analysis. The Advanced Dilution System (ADS2) automatically performs important tasks such as preparing a multipoint calibration from a single stock standard up to 400 times, diluting samples above the calibration range, or, if there is an internal standard recovery issue, eliminating the need for manual dilution. The Advanced Valve System (AVS) automatically rinses the sample introduction system while the next sample is being analyzed, virtually eliminating the delays typical of conventional analysis. Using controlled argon bubble injection between the sample and rinse solution prevents mixing, reducing uptake and rinse times. This study describes the use of the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=7900"><strong>Agilent 7900 ICP-MS</strong></a>, <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=SPS+4"><strong>Agilent SPS 4 autosampler</strong></a>, <strong>AVS</strong>, and <strong>ADS2 auto-dilution</strong> for the analysis of four toxic elements in durian and jackfruit samples using the China GB 5009.268 method.<sup>1</sup></p><h4><strong>Results and discussion&nbsp;</strong></h4><h5><strong>Automatic calibration standards and Instrument stability&nbsp;</strong></h5><p>A 7-point calibration curve automatically prepared using the ADS 2 demonstrated excellent linearity over the concentration range of 0.05–10 µg/L. Using a 1/x weighted regression without forcing the calibration through the origin, all analytes achieved coefficients of determination (R²) ≥ 0.995 (Figure 3), with back-calculated concentrations within 90–110% of their theoretical values, confirming the suitability of the calibration range for routine quantification. The integrated automation workflow significantly improved laboratory productivity by completing calibration preparation and analysis in approximately 1.5 minutes per sample. By minimizing manual operations and operator intervention, the ADS 2 reduced the risk of contamination and human error while enabling higher sample throughput for routine food safety testing.&nbsp;</p><p>To evaluate instrument stability during continuous operation, the variation in internal standard recoveries was monitored throughout an analytical sequence of more than 70&nbsp;consecutive samples. The recoveries of the three internal standards across different measurement modes remained consistently within the ±20% acceptance limit throughout the analytical sequence (Figure 4). Blank samples interspersed between concentration intervals showed no evidence of carryover, demonstrating effective system cleanliness and analytical robustness. These results confirm the excellent long-term stability and robust matrix tolerance of the Agilent 7900 ICP-MS, providing reliable performance for high-throughput routine food safety testing.</p><h4><strong>Conclusion&nbsp;</strong></h4><p>The Agilent 7900 ICP-MS, integrated with the SPS 4 autosampler, ADS 2, and AVS, delivers a fully automated, high-throughput workflow for routine trace-level multi-element analysis. By eliminating manual standard preparation and minimizing operator intervention, the solution reduces labor costs, improves data consistency, and empowers laboratories to maximize productivity and analytical capacity to meet increasing testing demands.&nbsp;</p><p>Excellent sensitivity, long-term stability, and robust interference removal, together with satisfactory recoveries, repeatability, and reproducibility for As, Cd, Pb, and Hg at an LOQ of 5 µg/kg, demonstrate reliable analytical performance. Compliance with Chinese regulatory requirements further position the Agilent automation solution as a cost-effective platform for high-volume food safety testing and export quality assurance, enabling laboratories to confidently support the growing demand for exports to the Chinese&nbsp;market.</p><h3><strong>2. Shimadzu: TOC Evaluation of Surfactants</strong></h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01160_en_539fba0ba2.pdf"><strong>Full PDF for download</strong></a></li></ul><h5><strong>User benefits</strong></h5><ul><li>TOC can be evaluated accurately using the TC-IC method, even for foaming surfactants.&nbsp;</li><li>The ASI-L autosampler enables automatic, continuous measurement of multiple samples, improving analytical efficiency.</li></ul><p>Surfactants are important chemicals widely used in detergents and dispersants for pharmaceutical equipment cleaning processes, chemical manufacturing processes, and environmental water management. If surfactant residues remain after such processes, they can not only affect manufacturing processes and final product quality, but also increase the organic load in wastewater and environmental water. Therefore, quality control is also needed for organic matter derived from surfactants.&nbsp;</p><p>Total organic carbon (TOC) analysis is effective for evaluating the quality of surfactants. In general, the NPOC (non-purgeable organic carbon) method is often selected for TOC measurement in terms of sample volume and analysis time requirements. On the other hand, because surfactants have both hydrophilic and hydrophobic groups in their structure, they tend to foam even at low concentrations. When such samples are measured by the NPOC method, which involves acid addition and sparging, foaming can cause the sample to overflow from the syringe vessel inside the instrument into the waste line. That can result in measurement valuesthat are lower than the true value.&nbsp;</p><p>This article compares TOC measurement results for surfactants obtained by the NPOC method and the TC-IC method using the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=TOC-L"><strong>Shimadzu TOC-L total organic carbon analyzer</strong></a>, which uses the combustion oxidation method.</p><h4><strong>Conclusion&nbsp;</strong></h4><p>Table 5 summarizes the results obtained by measuring sodium dodecylbenzenesulfonate solutions, used here as representative surfactant samples, by the NPOC method and the TC-IC method. With the NPOC method, the TOC recovery rates were below 50 % for all samples, whereas the TC-IC method produced satisfactory TOC recovery rates close to 100 % for all samples.</p><p>Sodium dodecylbenzenesulfonate solutions (carbon concentration: 0.5 mg/L) is also used in Japanese Pharmacopoeia (JP) recovery tests. For surfactants that readily foam, such as in this example, NPOC measurements involving acid addition and sparging may affect measurement accuracy due to sample loss. For such samples, accurate TOC values can be obtained by using the TC-IC method. In addition, by using the ASI-L autosampler, multiple samples can be measured automatically and continuously.</p><h3><strong>3. Thermo Fisher Scientific: How rhodium plating can affect gold XRF results</strong></h3><p><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=315&amp;manufacturerItems=3&amp;search=niton"><strong>Thermo Scientific™ Niton™ XRF Analyzers</strong></a><strong> can help precious metals professionals detect rhodium (Rh) plating and interpret gold (Au) results with confidence.</strong></p><ul><li>Other document (smart note)</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/rhodium_plating_can_affect_gold_xrf_results_sn1862_en_331edc099a.pdf"><strong>Full PDF for download</strong></a></li></ul><h4><strong>Benefits of XRF in jewelry analysis&nbsp;</strong></h4><p>Niton XRF analyzers provide capabilities that can enhance a jeweler’s operations in several ways:&nbsp;</p><ul><li>Identify Rh-plated gold items during routine testing&nbsp;</li><li>Reduce confusion around unexpected Au readings&nbsp;</li><li>Support more confident buying, selling, refining, and verification decisions&nbsp;</li><li>Help explain results to customers, suppliers, and trading partners&nbsp;</li></ul><h4><strong>Reduce risk in precious metals trading&nbsp;</strong></h4><p>In precious metals trading, small differences in reported gold concentration can affect pricing, settlement, customer trust, and supplier relationships. Recognizing Rh plating helps users avoid unnecessary disputes, retesting, or destructive testing when the surface finish is influencing the measurement.&nbsp;</p><h4><strong>Best practices&nbsp;</strong></h4><p>One should always check the result for Rh when Au appears lower than expected.&nbsp;</p><ul><li>Test multiple locations, especially where plating may vary&nbsp;</li><li>Look for worn or unplated areas when appropriate&nbsp;</li><li>Interpret Au results in the context of surface finish and item history&nbsp;</li><li>If appropriate, remove the rhodium plating prior to XRF analysis to evaluate the underlying alloy&nbsp;</li></ul><h4><strong>The bottom line&nbsp;</strong></h4><p>Rhodium plating can make a properly karated gold item appear to return a lower Au result when it is evaluated by XRF. <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=315&amp;manufacturerItems=3&amp;search=niton"><strong>Niton XRF analyzers</strong></a> can detect Rh at the surface, helping precious metals professionals recognize plating, interpret results correctly, and make more confident decisions.</p>

News from LabRulezICPMS Library - Week 32, 2026

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Academy

Science and research

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Since its establishment in 2011, CEITEC has quickly developed into a cutting-edge infrastructure for research which performs highly alongside the best institutes in Europe. Among the main priorities of CEITEC are the promotion of a motivating and dynamic international scientific environment, the provision of state-of-the-art research infrastructure, and the policy of open communication and equal opportunities.

CEITEC

Eurachem is a European network promoting international traceability of chemical measurements and good analytical practice. It provides expert guidance, supports method validation, uncertainty evaluation, proficiency testing, and facilitates discussion on technical and policy issues in analytical quality.

Eurachem

Everything from the world of analytical chemistry in one place. We connect people in solving their problems. At Labrulez you will find all the necessary information easily, quickly and clearly. Stop searching and start finding.

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LECO GDS950 Extended Range Glow Discharge Atomic Emission Spectrometer

GDS950 is a glow discharge spectrometer for bulk elemental analysis and depth profiling of conductive and non-conductive solids, combining high-resolution optics with Cornerstone software for efficient, reliable results.

<p><strong>The GDS950 Glow Discharge Spectrometer delivers advanced technology for routine elemental analysis and compositional depth profiling of both electrically conductive and non-conductive solid materials. By combining robust hardware with intuitive Cornerstone® software, the GDS950 simplifies operation, reporting, and data handling while reducing overall analysis time in the laboratory.</strong></p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/LECO_GDS_950_Atomovy_emisni_spektrometr_s_doutnavym_vybojem_s_rozsirenym_rozsahem_b7ff6d66f6.jpg" alt="LECO: GDS950 Extended Range Glow Discharge Atomic Emission Spectrometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_LECO_GDS_950_Atomovy_emisni_spektrometr_s_doutnavym_vybojem_s_rozsirenym_rozsahem_b7ff6d66f6.jpg 190w," sizes="100vw" width="1824" height="1500"></p><h4><strong>Key Features</strong></h4><h5><strong>Glow Discharge Source Advantages</strong></h5><ul><li>Simple, linear calibrations compared with alternative excitation sources</li><li>Controlled excitation occurring away from the sample surface</li><li>Reduced consumption of reference materials</li><li>Automatic source cleaning between analyses to minimize matrix effects and improve analytical performance</li></ul><h5><strong>Detection System Performance</strong></h5><ul><li>Full wavelength coverage from <strong>120 to 460 nm</strong></li><li>High spectral resolution of <strong>30 pm (0.030 nm)</strong> to resolve complex spectral features</li><li>Stable and flexible CCD-based detection system</li></ul><h5><strong>Optional CDP (Compositional Depth Profiling)</strong></h5><ul><li>Enables depth-resolved elemental analysis of solid materials</li><li>Ideal for plating, galvanizing, cladding, and surface heat treatments</li><li>Seamlessly integrated within Cornerstone software for simplified analysis and reporting</li></ul><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/LECO_GDS_950_Atomovy_emisni_spektrometr_s_doutnavym_vybojem_s_rozsirenym_rozsahem_2_512aa03c89.jpg" alt="LECO: GDS950 Extended Range Glow Discharge Atomic Emission Spectrometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_LECO_GDS_950_Atomovy_emisni_spektrometr_s_doutnavym_vybojem_s_rozsirenym_rozsahem_2_512aa03c89.jpg 245w," sizes="100vw" width="1345" height="433"></p><h4><strong>Applications</strong></h4><p>The GDS950 is well suited for bulk elemental determination in metals and other solid materials such as steel, cast iron, titanium, and related alloys. With the optional CDP capability, the system supports depth profile analysis of surface treatments including galvanizing, plating, heat treatment layers, and claddings. When equipped with the optional DC/RF lamp configuration, the analytical scope expands to include electrically non-conductive materials such as paints, glass, plastics, and other coated or polymeric solids.</p><h4><strong>Theory of Operation</strong></h4><p>Glow Discharge Spectrometry (GDS) is a direct analytical technique for determining the elemental composition of solid samples. A flat, prepared sample is mounted on the glow discharge source, which is evacuated and then backfilled with argon gas. An electric field is applied between the sample, acting as the cathode, and the grounded lamp body, serving as the anode, resulting in a stable, self-sustained glow discharge plasma.</p><p>The applied current is controlled by the power supply, while lamp voltage is stabilized through regulation of the argon pressure. Once the plasma is formed, argon ions are accelerated toward the sample surface. Through cathodic sputtering, kinetic energy is transferred to surface atoms, ejecting them into the plasma.</p><p>Models equipped with the optional radio frequency (RF) source use RF energy instead of direct current to sustain the plasma. LECO’s proprietary True Plasma Power algorithm compensates for radiated and reflected power losses, enabling accurate quantitative bulk analysis and depth profiling of both conductive and non-conductive samples.</p><p>Ejected atoms undergo inelastic collisions with energetic electrons or metastable argon atoms, becoming electronically excited. As these atoms return to lower energy states, they emit photons at wavelengths characteristic of each element. Because every element has a unique emission spectrum, elemental identification is achieved through spectrochemical signatures.</p><p>The emitted light is collected by a spectrometer whose optical system is continuously purged with argon to maintain transparency across the ultraviolet and visible range. CCD detector arrays capture the full spectrum from 120 to 460 nm simultaneously. The resulting signals are digitized and processed to remove dark current, normalize pixel response, extend dynamic range, and eliminate pixel artifacts. Quantitative results are obtained by calibrating against reference materials of known composition.</p>

LECO GDS900 Glow Discharge Atomic Emission Spectrometer

GDS900 is a glow discharge spectrometer for fast, reliable bulk elemental and optional depth profiling analysis of conductive solids, combining high resolution optics with intuitive Cornerstone software.

<p><strong>The GDS900 Glow Discharge Spectrometer delivers advanced, reliable technology for routine elemental determination in electrically conductive solid materials. Designed for high-performance industrial and laboratory environments, the GDS900 combines robust hardware with intuitive Cornerstone® software to simplify operation, reporting, and data handling while reducing overall analysis time.</strong></p><h4><strong>Key Features</strong></h4><h5><strong>Glow Discharge Source Advantages</strong></h5><ul><li>Simple, linear calibrations compared to alternative excitation sources</li><li>Controlled excitation occurring away from the sample surface</li><li>Reduced consumption of reference materials</li><li>Automatic source cleaning between analyses to save time and minimize matrix effects</li><li>Improved analytical performance and reproducibility</li></ul><h5><strong>Detection System Performance</strong></h5><ul><li>Full wavelength coverage from <strong>160 to 460 nm</strong></li><li>High spectral resolution of <strong>50 pm (0.050 nm)</strong> for resolving complex spectral features</li><li>Stable, flexible detection platform based on CCD array technology</li></ul><h5><strong>Optional CDP (Compositional Depth Profiling) Capability</strong></h5><ul><li>Enables depth-resolved elemental analysis of conductive solids</li><li>Ideal for applications such as plating, galvanizing, cladding, and surface heat treatments</li></ul><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/LECO_GDS_900_Atomovy_emisni_spektrometr_s_doutnavym_vybojem_1878a3a2c6.jpg" alt="LECO: GDS900 Glow Discharge Atomic Emission Spectrometer" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_LECO_GDS_900_Atomovy_emisni_spektrometr_s_doutnavym_vybojem_1878a3a2c6.jpg 235w," sizes="100vw" width="600" height="399"></p><h4><strong>Applications</strong></h4><p>The GDS900 is optimized for bulk elemental analysis of conductive solid materials, including steel, cast iron, titanium, and other metals. When equipped with the CDP option, it also supports compositional depth profiling of treated surfaces such as galvanizing layers, plated coatings, claddings, and heat-treated materials.</p><h4><strong>Theory of Operation</strong></h4><p>Glow Discharge Spectrometry (GDS) is a direct analytical technique for determining the elemental composition of solid samples. A flat, prepared sample is mounted onto the glow discharge source, which is evacuated and then filled with argon gas. An electric field is applied between the sample, acting as the cathode, and the grounded lamp body, serving as the anode.</p><p>This setup generates a stable, self-sustained glow discharge plasma. Argon ions formed in the plasma are accelerated toward the sample surface, where they transfer kinetic energy to surface atoms through cathodic sputtering. These atoms are ejected into the plasma and become excited through collisions with energetic electrons or metastable argon atoms.</p><p>As the excited atoms return to lower energy states, they emit photons at characteristic wavelengths unique to each element. The emitted light is collected by a spectrometer whose optical system is continuously purged with argon to maintain transparency across the ultraviolet and visible range.</p><p>Photosensitive CCD detector arrays capture the full emission spectrum from 160 to 460 nm simultaneously. The resulting signals are digitized and processed to correct for dark current, normalize pixel response, extend dynamic range, and eliminate pixel artifacts. Since emitted photon intensity is proportional to elemental concentration, quantitative results are obtained through calibration with certified reference materials.</p><h4><strong>Models</strong></h4><h5><strong>GDS900DCBO</strong></h5><ul><li>DC lamp for electrically conductive samples</li><li>Bulk elemental analysis</li><li>Rotary vane pump</li></ul><h5><strong>GDS900DCEXBO</strong></h5><ul><li>DC lamp for electrically conductive samples</li><li>Bulk elemental analysis with extended wavelength range</li><li>Rotary vane pump</li></ul><h5><strong>GDS900DCQO</strong></h5><ul><li>DC lamp for electrically conductive samples</li><li>Bulk elemental and CDP analysis</li><li>Rotary vane pump</li></ul><h5><strong>GDS900DCQEXO</strong></h5><ul><li>DC lamp for electrically conductive samples</li><li>Bulk elemental and CDP analysis with extended wavelength range</li><li>Rotary vane pump</li></ul><h4><strong>Options</strong></h4><ul><li>Integrated desk or mobile workstation</li><li>High-purity gas regulators</li><li>Vacuum pump sound abatement enclosure</li></ul>

Products from category GD-AES - page 1

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