Thermo Scientific Element XR HR-ICP-MS

Clean up your spectra. Make your analysis easy. High-Resolution ICP-MS is made for the most flexible and reliable analyses, for the best analytical results. Perform accurate and reliable quantitative multi-element analyses at trace level, with the highest sensitivity and without complicated sample preparation. The Thermo Scientific™ Element™ 2 and Element XR™ High Resolution ICP-MS systems cover the mg/L to sub pg/L concentration range—making them especially suitable for semiconductor, geological and material science laboratories.

The Element 2 and Element XR High-Resolution ICP-MS provide class-leading elimination of interferences for the highest level of confidence. With ultra-sensitive and reliable multi-element analyses at trace-level concentrations, there’s no need for complicated sample preparation and method development.

In mass spectrometry, spectral interferences occur when the mass-to-charge ratio (m/z) of interfering ions overlap with analyte ions. These interferences are the primary limitation of ICP-MS. Fortunately, there’s a better way. The high mass resolution potential of a sector-field mass spectrometer can physically distinguish and separate an analyte from interferences by exploiting small differences in mass-to-charge. Therefore, high resolution (HR) ICP-MS can quantify concentrations and determine precise isotope ratios for elements across nearly the entire periodic table, regardless of the sample matrix.

Thermo Scientific™ Element XR™ HR-ICP-MS: High mass resolution (R = 10,000) takes advantage of slight mass differences to analyze elements in the most challenging sample matrices. As an example, Arsenic (75As) in a chlorine matrix is masked by argon chloride (40Ar35Cl, 38Ar37Cl) without using high resolution.

High mass resolution (R = 10,000) takes advantage of slight mass differences to analyze elements in the most challenging sample matrices. Arsenic (75As) in a chlorine matrix is masked by argon chloride (40Ar35Cl, 38Ar37Cl) without using high resolution. Selenium (Se) is another key element that benefits from high resolution in common matrices. Beyond chloride matrices, high resolution is frequently applied to separate oxide, argide and nitride interferents, as well as multiply charged ions.

• Low resolution analyzes non-interfered isotopes with the highest sensitivity.
• Medium resolution guarantees interference-free analysis for most elements in the majority of matrix types.
• High resolution provides unequivocal separation of analytes and interferences in the most challenging matrices

The simplicity of high-resolution ICP-MS allows the most advanced performance, without compromising on straightforward and reliable method development. This makes the Element series the platform of choice in top-level research and metrology institutions, as well as advanced routine analysis laboratories across the globe.

Features and benefits

• High mass resolution: Accurately measure isotope signals separate from spectral interferences and produce clean elemental spectra while retaining flexibility.
• Straightforward analytical methods: Providing visual confirmation of accurate measurements.
• Interference removal: no use of reactive gases.
• High sensitivity: Get accurate and precise multi-element analysis down to pg·L-1 concentrations for all resolutions. The Element XR HR-ICP-MS increases the linear dynamic range by an additional three orders of magnitude for maximum flexibility.
• Ideal for transient multi-elemental signals, such as laser ablation, HPLC, GC, CE, FFF.
• High-precision isotope ratios.
• An advanced research tool with the reliability and robustness to serve in 24/7 production control.

Thermo Scientific™ Element™ 2 HR-ICP-MS

Element XR HR-ICP-MS

The gold standard for full elemental screening in high dynamic range laser ablation and solution work, and for large isotope ratios applications.

The combination of a dual-mode SEM with a Faraday detector increases the linear dynamic range by an additional three orders of magnitude. This enables analysis of any matrix element straight without further dilution or precautions to avoid detector damage from inadvertently measuring high level elements.