Nexsa Surface Analysis System Brochure

Importance of the Topic

Precise surface and interface characterization is essential in fields such as materials science, catalysis, energy storage and semiconductors. X-ray photoelectron spectroscopy (XPS) provides elemental and chemical state information from the top few nanometers of a sample, guiding design, quality control and troubleshooting at the nanoscale.

Objectives and Study Overview

This study introduces the Thermo Scientific Nexsa Surface Analysis System, a high-performance XPS platform engineered for multi-technique integration. The objective is to demonstrate how the system achieves sensitive detection, versatile imaging and seamless integration of complementary spectroscopies without sacrificing throughput or data quality.

Methodology and Instrumentation

The Nexsa system combines a micro-focused, monochromated Al Kα X-ray source with a hemispherical analyzer and advanced electron optics for sensitive XPS measurements. Key components and options include:

• Micro-focused, monochromated Al Kα X-ray source (10–400 µm spot size)
• Dual beam MAGCIS ion source (monatomic and gas cluster for depth profiling)
• EX06 monatomic ion source (200 eV–4 keV) and vacuum transfer module for sensitive samples
• Raman integration via iXR Raman Spectrometer for molecular bonding analysis
• UPS, REELS and ISS modules for valence, energy loss and top-layer elemental analysis
• Avantage software for automated control, data processing and reporting

Key Results and Discussion

The Nexsa system delivers:

• High sensitivity to low-concentration species enabled by the high-efficiency X-ray source and electron lens
• Rapid, automated imaging with XPS SnapMap for sub-100 µm feature localization and chemical state mapping
• Effective charge compensation for insulating samples using the dual beam flood gun, reducing the need for charge referencing
• Reproducible depth profiling performance achieved with monatomic and cluster ion sources, supported by automated gas handling and source optimization

Benefits and Practical Applications

This integrated platform streamlines workflows across a wide range of applications:

• Battery electrode and solid electrolyte characterization
• Catalyst surface composition and oxidation state analysis
• Thin film, semiconductor and solar cell interface studies
• Graphene, nanomaterials and polymer depth profiling
• Corrosion-resistant coatings and metal/oxide interfaces

Future Trends and Applications

Future developments in surface analysis may focus on real-time operando measurements, AI-driven data interpretation and further expansion of multi-modal integration. Advancements in high-energy cluster sources and cryogenic transfer modules will enhance the study of soft and air-sensitive materials.

Conclusion

The Nexsa Surface Analysis System offers a flexible, high-performance XPS core with optional UPS, REELS, ISS, Raman and advanced ion sources. Its combination of sensitivity, automation and integration potential makes it a powerful tool for comprehensive surface and interface characterization in research and industry.