Thermo Scientific™ Nexsa™ G2 Surface Analysis System

Significance of the Topic

Surface and interface analysis underpin the understanding and optimization of materials in fields such as electronics, energy storage, catalysis and coatings. High-confidence measurements of elemental composition, chemical states and depth profiles at the nanometer scale are critical for guiding material design, process control and failure analysis.

Objectives and Study Overview

This summary presents the Thermo Scientific Nexsa G2 Surface Analysis System, a modular X-ray photoelectron spectrometer (XPS) platform engineered for definitive surface characterization. Key goals are to highlight its multi-technique integration, rapid imaging capabilities, insulator analysis performance and data management features.

Methodology

The Nexsa G2 employs monochromated Al Kα X-rays, a high-efficiency electron lens and an optimized detector for superior sensitivity. It incorporates:

• XPS for chemical state quantification at the topmost layers.
• Optional UPS (ultraviolet photoelectron spectroscopy) to probe valence band structure.
• REELS (reflected electron energy loss spectroscopy) for electronic structure and light element detection.
• ISS (ion scattering spectroscopy) for elemental analysis of the outermost atomic layer.
• iXR Raman spectroscopy for molecular bonding and structural information.
• XPS SnapMap imaging for rapid, focused chemical state mapping.

Instrumental Setup

Standard configuration:

• Monochromated Al Kα micro-focused X-ray source (10–400 μm spot).
• EX06 monatomic ion source (200 eV–4 keV) for sputter depth profiling.
• Dual-beam flood gun for automated charge compensation on insulating samples.
• Three-camera optical system and load-lock with fast pumping and transfer.
• Avantage Data System for instrument control, data acquisition, processing and reporting.

Upgrade options include the MAGCIS dual-mode gas cluster ion source, UV source for UPS, high-energy flood mode for REELS, vacuum transfer module for air-sensitive samples, sample heating (NX Heater), tilt and bias modules for ARXPS and work function measurements, and an MCA holder for SEM correlation.

Main Results and Discussion

The Nexsa G2 achieves research-quality spectra with high count rates and signals from low concentration species. Key performance highlights:

• Fast acquisition and high sensitivity enable detection limits below 0.1 at% in minutes.
• Single-click dual-beam charge compensation simplifies insulating sample analysis without manual referencing.
• Depth profiles with both monatomic ions and gas clusters deliver controlled material removal and minimal damage.
• XPS SnapMap produces fully focused chemical images with consistent pixel size and sub-200 μm field of view, facilitating feature-specific analysis.
• Multi-technique integration accelerates comprehensive surface and interface characterization in a single workstation.

Benefits and Practical Applications

The modular design and advanced automation of the Nexsa G2 System support a broad range of applications:

• Battery electrodes and interfaces analysis for next-generation energy storage.
• Catalyst surface composition and state monitoring under reaction conditions.
• Thin films, coatings, ceramics and semiconductors quality control.
• Graphene, nanomaterials and OLED surface chemistry studies.
• Biomaterial and polymer surface functionalization evaluation.

The Avantage Data System ensures reproducible workflows, intuitive operation for multi-user environments, and comprehensive reporting.

Future Trends and Applications

Emerging directions in surface analysis include:

• Integration of in situ and operando environmental cells for real-time process monitoring.
• Advanced cluster ion chemistries to minimize sputter damage in delicate materials.
• Machine learning-driven data processing for automated spectral interpretation and anomaly detection.
• Correlative multimodal imaging with electron and optical microscopy for comprehensive materials characterization.
• Expanded high-throughput screening for materials discovery and quality assurance.

Conclusion

The Thermo Scientific Nexsa G2 Surface Analysis System delivers definitive surface and interface characterization through its high-performance XPS core, versatile multi-technique options and robust data management. Its flexibility, sensitivity and automation streamline workflows across research and industrial laboratories, supporting advances in materials science and process control.