Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ
Applications | 2015 | Agilent TechnologiesInstrumentation
GC, Speciation analysis, ICP/MS/MS
IndustriesEnergy & Chemicals , Semiconductor Analysis
ManufacturerAgilent Technologies
Key wordssulfide, icp, ppb, qqq, gas, carbonyl, cell, phosphine, silane, omega, cos, hydride, using, semiconductor, low, exit, petrochemical, level, scanlon, anticipation, calibration, were, geiger, supplied, transistors, oxygen, value, diluter, standard, integration, mass, contaminants, industry, hydrogen, purity, production, measuring, demanded, william, multipoint, based, deleterious, reaction, used, performance, either, qms, backgrounds, background, digit
Similar PDF
Agilent ICP-MS Journal (July/August 2015 – Issue 62)
2015|Agilent Technologies|Others
Agilent ICP-MS Journal July/August 2015 – Issue 62 Inside this Issue 2-3 New! Solution-ready Agilent 7800 ICP-MS 4-5 Sub-ppb Detection Limits for Hydride Gas Contaminants using GC-ICP-QQQ 6 Agilent MAPs: Innovative New Services Benefit Customers in EMEAI 7 Software Tips…
Key words
icp, icpmaps, mapsagilent, agilentpolyatomic, polyatomicphosphine, phosphinecustomers, customershydride, hydrideqqq, qqqnew, newnanoparticle, nanoparticleemeai, emeaimatrix, matrixmany, manylimits, limitshmi
Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ
2020|Agilent Technologies|Applications
Application Note Semiconductor Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ Sub-ppb detection limits for hydride gas contaminants using a single column, single injection volume, and multi-tune method Authors Introduction William M. Geiger, Blake McElmurry, Jesus Anguiano1 Mark…
Key words
germane, germanearsine, arsinephosphine, phosphinesilane, silanesulfide, sulfideicp, icpgas, gashydrogen, hydrogenintegration, integrationhydride, hydridedopants, dopantstime, timeqqq, qqqgallium, galliumstandard
Measuring Inorganic Impurities in Semiconductor Manufacturing
2022|Agilent Technologies|Guides
Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…
Key words
return, returncontents, contentsicp, icptable, tablecps, cpsppt, pptgas, gassemiconductor, semiconductorconc, concqqq, qqqbec, becdocument, documententire, entiresearch, searchmode
ANALYSIS OF PROPYLENE IMPURITIES USING SELECT LOW SULFUR COLUMN AND SINGLE TUNE WITH GC-ICP-MS QQQ ORS
2016|Agilent Technologies|Others
CHEMICAL & ENERGY ANALYSIS ANALYSIS OF PROPYLENE IMPURITIES USING SELECT LOW SULFUR COLUMN AND SINGLE TUNE WITH GC-ICP-MS QQQ ORS Solutions for Your Analytical Business Markets and Applications Programs Author William M. Geiger Blake McElmurry Jesus Anguiano CONSCI, Ltd. Pasadena,…
Key words
propylene, propylenesulfide, sulfidearsine, arsinephosphine, phosphinesulfur, sulfurtune, tunemarkets, marketscarbonyl, carbonylselect, selectpropane, propaneanalyte, analytemcelmurry, mcelmurrymatrix, matrixblake, blakesingle