APWC: Measurement of nanoparticle components in sunscreens by multi-element screening function of spICP-MS

Posters | 2017 | Agilent TechnologiesInstrumentation
Agilent Technologies
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Application NoteEnvironmental, food,cosmetics, materialsMeasuring Multiple Elements inNanoparticles using spICP-MSAcquire NP data for up to 16 elements inRapid Multi-Element Nanoparticle Analysis ModeAuthorsMichiko Yamanaka,Takayuki ItagakiAgilent Technologies, JapanSteve WilburAgilent Technologies,USAIntroductionSingle Particle ICP-MS (spICP-MS) is a powerful tool used to characterizenanoparticles (NP) dispersed or...
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Applications of ICP-MSMeasuring Inorganic Impuritiesin Semiconductor ManufacturingApplication Compendium > Return to table of contents> Search entire documentTable of contentsICP-MS and ICP-QQQ in the Semiconductor Industry4Agilent Has Three Decades of ICP-MS Experience DrivingContinuous Innovation7Agilent ICP-MS Solutions for the Semiconductor Industry8Automating Analysis of...
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Application NoteSemiconductorMultielement Nanoparticle Analysisof Semiconductor Process ChemicalsUsing spICP-QQQCharacterization of Ag, Fe3O4, Al2O3, Au, andSiO2 NPs in TMAH in a single analytical runAuthorYoshinori Shimamura,Donna Hsu, andMichiko YamanakaAgilent Technologies, Inc.IntroductionTechnologies such as smartphones, cloud computing, the Internet of Things(IoT), and development of...
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Michiko Yamanaka1*, Takayuki Itagaki1,Steve Wilbur2Nanoparticle Analysis in Cosmetic Samplesby Multi-element Screening Function ofspICP-MS1.Agilent Technologies InternationalJapan, Ltd2.Agilent Technologies Inc.2018 WinterConferenceTP14Results and Discussion• spICP-MS (single particle ICP-MS) is a powerful tool to measure metalcontaining nanoparticles since it provides the particle concentration, particlesize,...
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