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Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ

 

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Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…
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Application Note Semiconductor Analysis of Nanoparticles in Organic Reagents by Agilent 8900 ICP-QQQ in spICP-MS Mode Determination of 25 and 30 nm Fe3O4 NPs in low-particle concentration solutions Author Donna Hsu, Yoshinori Shimamura, Brian Liao, and Michiko Yamanaka1 Chun-Hua Chen…
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5th Edition Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900 Primer > Return to table of contents > Search entire document Foreword Agilent Technologies launched its 8800 Triple Quadrupole ICP-MS (ICP-QQQ) at the 2012 Winter Conference on Plasma…
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Yoshinori Shimamuraand Satoshi Kondo Particle Analysis of Two High Purity Grades of N-Methyl-2Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method Agilent Technologies, Inc., Tokyo, Japan Sample analysis performed in collaboration with Kakeru Usuba, Naoki Katano, and Takao Shibasaki EWCPS 2023 Th…
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