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WCPS: Particle Analysis of Two High Purity Grades of N-Methyl-2- Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method

Posters | 2023 | Agilent TechnologiesInstrumentation
ICP/MS, ICP/MS/MS
Industries
Energy & Chemicals , Semiconductor Analysis
Manufacturer
Agilent Technologies
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Application Note Semiconductor Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS Analysis of dissolved and particulate inorganic impurities in two grades of NMP using the Agilent 8900 ICP-QQQ Author Introduction Yoshinori Shimamura Ideally, analytical quality control (QC) testing procedures…
Key words
nmp, nmpppt, pptgrade, gradeicp, icpparticle, particlenanoparticle, nanoparticleconc, concsemiconductor, semiconductorgrades, gradeselements, elementsimpurities, impuritiesgas, gasfabs, fabsnps, npsindustry
Agilent ICP-MS Journal (November 2022, Issue 90)
2022|Agilent Technologies|Others
Agilent ICP-MS Journal November 2022, Issue 90 Page 1 Novel Sample Types, New Applications, and the Latest Revision of ICP-MS Software Novel Sample Types, New Applications, and the Latest Revision of ICP-MS Software Issue 90 of the Agilent ICP-MS Journal…
Key words
icp, icpmasshunter, masshunteragilent, agilentnps, npsrevision, revisionsemiconductor, semiconductorelements, elementsnmp, nmpnew, newparticulate, particulatecic, cicalternative, alternativedissolved, dissolvedindependent, independentcompound
Application Note Energy and fuels Single Nanoparticle Analysis of Asphaltene Solutions using ICP-QQQ Agilent 8900 and ICP-MS MassHunter software module simplify spICP-MS analysis Authors Jenny Nelson Agilent Technologies, USA Michiko Yamanaka Agilent Technologies, Japan Francisco Lopez-Linares, Laura Poirier, and Estrella…
Key words
asphaltene, asphaltenenps, npsspicp, spicpnanoparticle, nanoparticleicp, icptotal, totalmetals, metalsparticle, particledilution, dilutionwere, werespicpms, spicpmssingle, singleasphaltenes, asphaltenessamples, samplescharacterization
Application Note Semiconductor Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ Characterization of Ag, Fe3O4, Al2O3, Au, and SiO2 NPs in TMAH in a single analytical run Author Yoshinori Shimamura, Donna Hsu, and Michiko Yamanaka Agilent Technologies, Inc. Introduction…
Key words
cps, cpsfrequency, frequencynanoparticle, nanoparticleparticle, particlecount, countnormalized, normalizedtmah, tmahsize, sizeelement, elementsec, secintensity, intensitysignal, signalnanoparticles, nanoparticlestime, timenebulization
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