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Analysis of Nanoparticles in Organic Reagents by Agilent 8900 ICP-QQQ in spICP-MS Mode

 

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Application Brief Semiconductor Analysis of 15 nm Iron Nanoparticles in Organic Solvents by spICP-MS Using the exceptional sensitivity and low background of the Agilent 8900 ICP-QQQ Authors Monitor metallic nanoparticles in process chemicals Donna Hsu1 Yoshinori Shimamura1 Katsuo Mizobuchi1 Brian…
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Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…
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Application Note Semiconductor Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ Characterization of Ag, Fe3O4, Al2O3, Au, and SiO2 NPs in TMAH in a single analytical run Author Yoshinori Shimamura, Donna Hsu, and Michiko Yamanaka Agilent Technologies, Inc. Introduction…
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Application Note Energy and fuels Single Nanoparticle Analysis of Asphaltene Solutions using ICP-QQQ Agilent 8900 and ICP-MS MassHunter software module simplify spICP-MS analysis Authors Jenny Nelson Agilent Technologies, USA Michiko Yamanaka Agilent Technologies, Japan Francisco Lopez-Linares, Laura Poirier, and Estrella…
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