Analysis of 15 nm Iron Nanoparticles in Organic Solvents by spICP-MS | LabRulez ICPMS
 

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5th EditionHandbook of ICP-QQQApplications using theAgilent 8800 and 8900Primer > Return to table of contents> Search entire documentForewordAgilent Technologies launched its 8800 Triple QuadrupoleICP-MS (ICP-QQQ) at the 2012 Winter Conference on PlasmaSpectrochemistry in Tucson, Arizona, USA.By the time the first ICP-QQQ...
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return, returncontents, contentstable, tableicp, icpqqq, qqqcps, cpsgas, gasmass, massdocument, documentcell, cellppt, pptconc, concentire, entiresearch, searchelements
Applications of ICP-MSMeasuring Inorganic Impuritiesin Semiconductor ManufacturingApplication Compendium > Return to table of contents> Search entire documentTable of contentsICP-MS and ICP-QQQ in the Semiconductor Industry4Agilent Has Three Decades of ICP-MS Experience DrivingContinuous Innovation7Agilent ICP-MS Solutions for the Semiconductor Industry8Automating Analysis of...
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return, returncontents, contentsicp, icptable, tablecps, cpsppt, pptgas, gassemiconductor, semiconductorconc, concqqq, qqqbec, becdocument, documententire, entiresearch, searchmode
Application NoteSemiconductorAnalysis of Nanoparticles in OrganicReagents by Agilent 8900 ICP-QQQin spICP-MS ModeDetermination of 25 and 30 nm Fe3O4 NPsin low-particle concentration solutionsAuthorDonna Hsu, YoshinoriShimamura, Brian Liao,and Michiko Yamanaka1Chun-Hua Chen andChiu-Hun Su2Ching Heng Hsu31Agilent Technologies, Inc.Industrial Technology ResearchInstitute of Taiwan, Taiwan23BASF...
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particle, particlesize, sizefrequency, frequencynps, npsconcentration, concentrationspicp, spicpbuac, buacpgmea, pgmeacps, cpsipa, ipasignal, signalnormalized, normalizedspiked, spikedwere, werenanoparticle
Application NoteSemiconductorMultielement Nanoparticle Analysisof Semiconductor Process ChemicalsUsing spICP-QQQCharacterization of Ag, Fe3O4, Al2O3, Au, andSiO2 NPs in TMAH in a single analytical runAuthorYoshinori Shimamura,Donna Hsu, andMichiko YamanakaAgilent Technologies, Inc.IntroductionTechnologies such as smartphones, cloud computing, the Internet of Things(IoT), and development of...
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cps, cpsfrequency, frequencynanoparticle, nanoparticleparticle, particlecount, countnormalized, normalizedtmah, tmahsize, sizeelement, elementsec, secintensity, intensitysignal, signalnanoparticles, nanoparticlestime, timenebulization
 

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5th EditionHandbook of ICP-QQQApplications using theAgilent 8800 and 8900Primer > Return to table of contents> Search entire documentForewordAgilent Technologies launched its 8800 Triple QuadrupoleICP-MS (ICP-QQQ) at the 2012 Winter Conference on PlasmaSpectrochemistry in Tucson, Arizona, USA.By the time the first ICP-QQQ...
Key words
return, returncontents, contentstable, tableicp, icpqqq, qqqcps, cpsgas, gasmass, massdocument, documentcell, cellppt, pptconc, concentire, entiresearch, searchelements
Applications of ICP-MSMeasuring Inorganic Impuritiesin Semiconductor ManufacturingApplication Compendium > Return to table of contents> Search entire documentTable of contentsICP-MS and ICP-QQQ in the Semiconductor Industry4Agilent Has Three Decades of ICP-MS Experience DrivingContinuous Innovation7Agilent ICP-MS Solutions for the Semiconductor Industry8Automating Analysis of...
Key words
return, returncontents, contentsicp, icptable, tablecps, cpsppt, pptgas, gassemiconductor, semiconductorconc, concqqq, qqqbec, becdocument, documententire, entiresearch, searchmode
Application NoteSemiconductorAnalysis of Nanoparticles in OrganicReagents by Agilent 8900 ICP-QQQin spICP-MS ModeDetermination of 25 and 30 nm Fe3O4 NPsin low-particle concentration solutionsAuthorDonna Hsu, YoshinoriShimamura, Brian Liao,and Michiko Yamanaka1Chun-Hua Chen andChiu-Hun Su2Ching Heng Hsu31Agilent Technologies, Inc.Industrial Technology ResearchInstitute of Taiwan, Taiwan23BASF...
Key words
particle, particlesize, sizefrequency, frequencynps, npsconcentration, concentrationspicp, spicpbuac, buacpgmea, pgmeacps, cpsipa, ipasignal, signalnormalized, normalizedspiked, spikedwere, werenanoparticle
Application NoteSemiconductorMultielement Nanoparticle Analysisof Semiconductor Process ChemicalsUsing spICP-QQQCharacterization of Ag, Fe3O4, Al2O3, Au, andSiO2 NPs in TMAH in a single analytical runAuthorYoshinori Shimamura,Donna Hsu, andMichiko YamanakaAgilent Technologies, Inc.IntroductionTechnologies such as smartphones, cloud computing, the Internet of Things(IoT), and development of...
Key words
cps, cpsfrequency, frequencynanoparticle, nanoparticleparticle, particlecount, countnormalized, normalizedtmah, tmahsize, sizeelement, elementsec, secintensity, intensitysignal, signalnanoparticles, nanoparticlestime, timenebulization
 

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