Agilent 5110 ICP-OES

Importance of the Topic

Inductively coupled plasma optical emission spectrometry is a cornerstone of multi element analysis in environmental monitoring quality control and industrial applications. Advances that improve speed precision and resource efficiency are crucial to meet growing analytical demands and reduce operational costs.

Objectives and Overview of the Article

This article presents the design performance and practical benefits of the Agilent 5110 Synchronous Vertical Dual View ICP OES. The focus is on its unique synchronous dual view technology which delivers both axial and radial measurements in a single acquisition enabling high throughput without compromising data quality.

Methodology and Instrumentation

The system uses a dichroic spectral combiner to merge axial and radial emission paths into the VistaChip II detector in one shot. A solid state RF generator ensures stable plasma excitation while an advanced valve system supports rapid gas switching. Integrated software tools provide intuitive method development and real time element screening.

Used Instrumentation

• Agilent 5110 Synchronous Vertical Dual View ICP OES
• Solid state RF generator
• VistaChip II high efficiency CCD detector
• Advanced Valve System for gas switching
• Dichroic Spectral Combiner for dual view acquisition
• IntelliQuant mode and ICP Expert software

Main Results and Discussion

The 5110 delivers the fastest ICP OES analysis at reduced argon consumption of 20 liters per sample compared to over 50 liters for competitor systems. Single measurement acquisition of all wavelengths enhances precision and doubles productivity. Stability tests in a 25 percent sodium chloride matrix showed less than 1.3 percent relative standard deviation over four hours without internal standardization. The system also achieves rapid warm up with minimal training requirements.

Benefits and Practical Applications of the Method

• Reduced cost per analysis through low gas consumption and high sample throughput
• Improved analytical stability for challenging matrices such as high salt content solutions
• Simplified method development with automated element screening and intuitive software
• Flexible configurations to suit diverse laboratory workflows including radial and dual view options

Future Trends and Opportunities for Use

The trend towards synchronous dual view designs will continue to drive faster analysis with lower resource consumption. Integration of advanced data analytics and AI assisted method optimization will further enhance productivity. Portable and miniaturized plasma optical emission systems may extend this technology to field applications.

Conclusion

The Agilent 5110 Synchronous Vertical Dual View ICP OES represents a significant advancement in elemental analysis offering unmatched speed precision and stability while minimizing operational costs. Its innovative design and user friendly features make it a valuable tool for high throughput laboratories and demanding analytical environments.

References

• Agilent Technologies Inc Agilent 5110 ICP OES Whitepaper 5991 6855EN May 2016
• Agilent application note 5991 4821EN