Agilent 5100 ICP-OES
Others | 2014 | Agilent TechnologiesInstrumentation
ICP-OES is a fundamental technique for rapid, multi‐element analysis across environmental, industrial and quality‐control laboratories. Recent advances focus on boosting throughput, reducing gas consumption and improving long‐term stability when analyzing challenging sample matrices.
This article introduces the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES, detailing how its unique optical design and software innovations deliver faster analysis with lower argon usage and uncompromised precision.
The 5100 SVDV employs a Dichroic Spectral Combiner to capture axial and radial emission simultaneously in a single measurement. Key components include:
Performance benchmarks demonstrate:
The single‐read approach eliminates sequential axial/radial scans and high/low slit changes, streamlining throughput and reducing potential error sources.
The Agilent 5100 SVDV offers laboratories:
Looking ahead, integration of AI‐driven data analysis and remote monitoring promises further gains in productivity. Miniaturized plasma sources and on‐line coupling with separation techniques are poised to expand ICP-OES applications in pharmaceuticals, food safety and environmental surveillance.
The Agilent 5100 SVDV ICP-OES represents a step‐change in elemental analysis, combining speed, stability and efficiency in a single platform. Its synchronous dual-view capability and low gas consumption meet the growing demand for high‐throughput, cost‐effective laboratory solutions.
ICP-OES
IndustriesManufacturerAgilent Technologies
Summary
Importance of the Topic
ICP-OES is a fundamental technique for rapid, multi‐element analysis across environmental, industrial and quality‐control laboratories. Recent advances focus on boosting throughput, reducing gas consumption and improving long‐term stability when analyzing challenging sample matrices.
Objectives and Article Overview
This article introduces the Agilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES, detailing how its unique optical design and software innovations deliver faster analysis with lower argon usage and uncompromised precision.
Methods and Instrumentation
The 5100 SVDV employs a Dichroic Spectral Combiner to capture axial and radial emission simultaneously in a single measurement. Key components include:
- Vertical dual‐view torch and robust solid-state RF generator
- VistaChip II CCD detector enabling zero‐gas warm‐up
- ICP Expert software with automated method development algorithms
Key Results and Discussion
Performance benchmarks demonstrate:
- Analysis speed increased by over 40% compared to competitive systems
- Argon consumption reduced to 27 L/hour per sample versus 55 L/hour in prior dual‐view designs
- 4‐hour stability in 25% NaCl solution showing <1.3% RSD across 14 elements without internal standardization
The single‐read approach eliminates sequential axial/radial scans and high/low slit changes, streamlining throughput and reducing potential error sources.
Benefits and Practical Applications
The Agilent 5100 SVDV offers laboratories:
- Enhanced sample throughput and cost savings from lower gas usage
- Reliable performance with robust torch design for complex matrices
- Simplified method setup via intuitive software and automated spectral combiner
- Extended dynamic range and improved precision through simultaneous dual viewing
Future Trends and Potential Applications
Looking ahead, integration of AI‐driven data analysis and remote monitoring promises further gains in productivity. Miniaturized plasma sources and on‐line coupling with separation techniques are poised to expand ICP-OES applications in pharmaceuticals, food safety and environmental surveillance.
Conclusion
The Agilent 5100 SVDV ICP-OES represents a step‐change in elemental analysis, combining speed, stability and efficiency in a single platform. Its synchronous dual-view capability and low gas consumption meet the growing demand for high‐throughput, cost‐effective laboratory solutions.
Reference
- Agilent Technologies. ICP-OES Analysis Speed and Gas Consumption Comparison. Application Note 5991-4821EN.
- Agilent Technologies, Inc. Agilent 5100 ICP-OES Brochure, July 2014, Document 5991-4835EN.
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