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High-Speed X-Ray Diffraction Analysis of Medicine Using OneSight Wide-Range High-Speed Detector
Applications
| 2015 | Shimadzu
XRD
Instrumentation
XRD
Manufacturer
Shimadzu
Industries
Pharma & Biopharma
High-Speed X-Ray Diffraction Analysis of Asbestos (Chrysotile) Using Wide-Range High-Speed Detector "OneSight"
Applications
| 2014 | Shimadzu
XRD
Instrumentation
XRD
Manufacturer
Shimadzu
Industries
Materials Testing
High-Speed Spectral Analysis of Samples that Change over Time - Using the UV-1900i Plus Ultra High-Speed Scan
Applications
| 2025 | Shimadzu
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Shimadzu
Industries
Energy & Chemicals
True simultaneous ICP-OES for unmatched speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Superior ICP-OES optical design for unmatched speed and performance
Technical notes
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Synchronous Vertical Dual View (SVDV) for superior speed and performance
Technical notes
| 2016 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Superior ICP-OES optical design for unmatched speed and performance
Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Synchronous Vertical Dual View (SVDV) for superior speed and performance
Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Dedicated axial or radial plasma view for superior speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
High-Speed Residual Stress Measurement by X-Ray Diffraction (Linear Guide)
Applications
| 2019 | Shimadzu
XRD
Instrumentation
XRD
Manufacturer
Shimadzu
Industries
Materials Testing
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike