Optical Characterization of Thin Films
Applications | 2022 | Agilent TechnologiesInstrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
IndustriesMaterials Testing
ManufacturerAgilent Technologies
Key wordsangle, optical, films, thin, incidence, engineering, uma, multi, reverse, measurement, coatings, spectral, reflectance, multilayer, accessory, transmittance, characterization, data, photometric, thicknesses, normal, thickness, beam, dense, assembly, near, various, spectroscopy, using, evaporated, refractive, measurements, nir, combinations, applicability, film, input, transmission, vis, experimental, measured, universal, francis, layer, physical, reliability, index, absolute, oblique, dependencies
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