Optical Characterization of Thin Films
Applications | 2022 | Agilent TechnologiesInstrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
IndustriesMaterials Testing
ManufacturerAgilent Technologies
Key wordsangle, optical, films, thin, incidence, engineering, uma, multi, reverse, measurement, spectral, reflectance, coatings, multilayer, transmittance, accessory, characterization, data, photometric, normal, thicknesses, beam, thickness, dense, assembly, near, various, spectroscopy, using, evaporated, refractive, measurements, nir, combinations, applicability, input, film, transmission, measured, vis, experimental, francis, universal, layer, index, absolute, reliability, physical, magnetron, oblique
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Applications of UV-Vis-NIROptical Characterization ofMaterials Using SpectroscopyApplication Compendium > Return to table of contentsTable of contentsIntroduction 4Optics 5Characterizing Sub-Nanometer Narrow Bandpass Filters Evaluation of the Cary Specular Reflectance Accessory for theMeasurement of Optical Constants of Thin FilmsGaining Deeper Insights into Thin...
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Application NoteMaterials testingand researchQuality Control of Beam Splittersand Quarter-Wave-MirrorsMulti-angle UV-Vis-NIR measurements of multiplelayer optical coatingsAuthorIntroductionDavid DeathFarinaz HaqAgilent Technologies,AustraliaOptical coatings and coating technologies have matured over many years in termsof the design, production and characterization processes. Today optical coatingsare ubiquitous and...
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