Quality Control of Beam Splitters and Quarter-Wave-Mirrors
Technical notes | 2020 | Agilent TechnologiesInstrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
IndustriesMaterials Testing
ManufacturerAgilent Technologies
Key wordsincidence, measurements, coating, transmittance, situ, normal, coatings, optical, layer, reflectance, reverse, engineering, aoi, deposited, suprasil, layers, thickness, model, bsar, deposition, refractive, measured, oblique, thicknesses, angle, uncertainties, index, angles, mirrors, multilayer, beam, reflectors, hafnia, transmission, wave, positioning, broadband, properties, data, measurement, ambiguity, variations, quarter, final, accurate, agreement, design, materials, from, surface
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