Synchronous Vertical Dual View (SVDV) for High Productivity and Low Cost of OwnershipTechnical notes | 2019 | Agilent Technologies InstrumentationICP/OESManufacturerAgilent TechnologiesKey wordsradial, axial, svdv, dsc, view, elements, vertical, oes, wavelengths, light, measurements, torch, icp, emissions, dual, sequential, plasma, synchronous, enables, measure, sample, technology, conventional, same, argon, nominates, remeasurements, trace, read, measured, false, future, freeform, combiner, eies, high, dichroic, radially, eie, ionization, side, certified, modes, level, consumption, quickest, interferences, axially, from, samples
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Agilent 5900 ICP-OESThe smart way to high productivity and low cost of ownership Supercharge Your Lab’s BusinessThe smart Agilent 5900 is designed to get the right answer faster thanany other instrument, with the lowest cost per sample.Measuring a sample per minute...
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How to Reduce ICP-OESRemeasurement Caused bySample Problems and ErrorsTips and advice to prevent time-wasting remeasurement of samples,from an ICP-OES expert Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES)is a well-established technique for the measurement of elements insolution. ICP-OES is commonly used in...
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Technical OverviewResilient Vertical Torch Means LessCleaning, Less Downtime, and FewerReplacements—Even for ToughSamplesAgilent 5800 and 5900 ICP-OESIntroductionOne of the main considerations when running samples on an ICP-OES is thepercentage of total dissolved solids (TDS) in the sample. Many common sampletypes can...
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