ICPMS webinars focusing on Tips & Tricks - page 8

Rapid NIR analysis can improve productivity and reduce quality control and development costs. Results can be gained in seconds as opposed to hours.

We will discuss the procedures to correct for doubly charged interferences (ICP-MS), and the utilization of ICP-MS/MS technology to eliminate the bias when doubly charged elements are present.

Topics like Inter Element Correction (IEC) Factors, Advanced Valve System (AVS), and Fast Automated Curve-fitting Technique (FACT), etc...

A discussion will be held around both available applications and pertinent instrument parameters.

Once you have prepped your samples and maintained contamination. The next step is properly tuning and setting up your ICPMS to give the best results.

We will cover steps to ensure maximum stability and robustness in organic solvent analysis using proper hardware selection, optimized plasma conditions, and background correction techniques.

This presentation will discuss the different types of interferences present in ICP and how to correct for them.

UV-VIS typical maintenance and some common validation tests will be discussed.

We will share Agilent’s default conditioning recommendations and demonstrate how to condition the cones with all the tips and tricks that Agilent Application Scientists use daily.

We will address the most asked questions from customers, as well as important questions to ask when evaluating an ICP-OES.