ICPMS webinars focusing on Tips & Tricks - page 7

Typically challenging elements of P, S and Si and show how ultrarace level analysis of these elements can easily be achieved.

Essential principles underlying FTIR, as well as offering valuable insights and practical strategies to optimize its use in both lab and field environments.

Familiarize yourself with the hardware and software of an Agilent ICP-OES

In this presentation we will take a through approach to optimizing various ICP-MS method parameters to improve your analysis.

Learn how to utilize all the hardware and software features to simplify your pre and post run work.

Rapid NIR analysis can improve productivity and reduce quality control and development costs. Results can be gained in seconds as opposed to hours.

We will discuss the procedures to correct for doubly charged interferences (ICP-MS), and the utilization of ICP-MS/MS technology to eliminate the bias when doubly charged elements are present.

Topics like Inter Element Correction (IEC) Factors, Advanced Valve System (AVS), and Fast Automated Curve-fitting Technique (FACT), etc...

A discussion will be held around both available applications and pertinent instrument parameters.

Once you have prepped your samples and maintained contamination. The next step is properly tuning and setting up your ICPMS to give the best results.