Electron spectroscopy for chemical analysis of liquids

<p><strong>In the week from June 29, the following webinars await you in the field of atomic and molecular spectroscopy and spectrometry</strong></p><blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinars"><strong>👉 DETAILS AND REGISTRATION IN THE WEBINARS SECTION</strong></a></h4><p><strong>👉 Search and filter in the largest global database</strong> with over <strong>5 500 GC, LC, MS and spectroscopy webinars</strong>.</p></blockquote><h5><strong>1. Metrohm: Simplifying Through-Container Testing with Raman Spectroscopy in the Pharmaceutical Industry</strong></h5><ul><li>Mo, 29.6.2026 15:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6308">Registration</a></li></ul><p>In this webinar, we will demonstrate a more robust and practical alternative to SORS for see-through Raman analysis.</p><h5><strong>2. SelectScience: End-to-end PAT: Connecting advanced analytics and data across the bioprocess lifecycle</strong></h5><ul><li>Mo, 29.6.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6307">Registration</a></li></ul><p>Learn how integrated PAT strategies combining NMR, Raman, IR, and digital workflows enable continuous process understanding, smoother tech transfer, and QbD from development to GMP manufacturing.</p><h5><strong>3. Bruker: Bruker Fluorescence Microscopy Solutions: Automated Imaging and Light-Sheet Microscopy</strong></h5><ul><li>Tu, 30.6.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6309">Registration</a></li></ul><p>Discover Bruker’s integrated imaging ecosystem combining light-sheet microscopy, high-content screening, and high-performance data management for scalable, high-quality biological imaging workflows.</p><h5><strong>4. Agilent Technologies: Measuring Diverse Samples with UV/VIS Spectrometers and Integrating Spheres</strong></h5><ul><li>Tu, 30.6.2026 20:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6052">Registration</a></li></ul><p>This webinar will discuss diffuse transmission and reflection UV/VIS measurements, including how to perform measurements with Agilent’s Cary 60 UV/VIS Spectrometer.</p><h5><strong>5. Milestone: Unlock Smarter Digestion: AI and the Smart Features that Transform Your Daily Routine</strong></h5><ul><li>We, 1.7.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6312">Registration</a></li></ul><p>Learn how Milestone’s intelligent digestion technologies, including MAIA AI Agent, easyTEMP, and SRC, help reduce downtime, simplify workflows, and improve laboratory productivity.</p><h5><strong>6. Bruker: High-Energy XRD - Diffraction Without Limits</strong></h5><ul><li>Th, 2.7.2026 10:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6314">Registration</a></li></ul><p>Join us to explore how high-energy XRD with the D8 ADVANCE HE and D8 DISCOVER HE enables the study of materials under realistic conditions.</p><h5><strong>7. Agilent Technologies: Spectral Flow Cytometry Masterclass - Session 1</strong></h5><ul><li>Fr, 3.7.2026 07:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/6316">Registration</a></li></ul><p>Learn how full-spectrum flow cytometry enables high-dimensional cell analysis. Explore spectral flow technology, experimental design, and applications in immunology, oncology, and vaccine research.</p>

Webinars LabRulezICPMS Week 27/2026

<p><strong>The international standard ISO/IEC 17025 [1] clause 7.7.2 with regards to ensuring the validity of results, requires a laboratory to participate in proficiency testing (PT) and/or to participate in interlaboratory comparisons (ILCs) other than PT. However, no guidance as to what these other ILCs might be, or indeed how they might compare in relation to PT, is provided. This leaflet aims to outline other ILCs available, pointing out some of the limitations as compared to PT.&nbsp;</strong></p><p>There are three major types of ILCs in which a group of laboratories analyses identical portions from a homogeneous, stable test sample, with each type being characterized by its intended purpose [2,3]:</p><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_2_d9263807fb.jpg" alt="Eurachem: Interlaboratory comparisons other than proficiency testing" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_2_d9263807fb.jpg 245w," sizes="100vw" width="1507" height="607"></p><p>A key point is that PT is an ILC that is designed to specifically evaluate the performance of participants, providing them with an infrastructure to monitor and assess the validity of their results. This is not the key purpose of the two other ILCs, and thus depending on their intended purpose they have a number of limitations that laboratories need to be aware of when using them rather than PT. Only proficiency testing should have been conducted in full compliance to the competency standard ISO/IEC 17043 [4].&nbsp;</p><h4><strong>Evaluation of measurement procedure performance&nbsp;</strong></h4><p>These ILCs, are designed to assess how a particular measurement procedure performs and whether it is fit for its intended purpose. These ILCs are often referred to as a ‘method performance study’ or a ‘collaborative study’ [2]. Some limitations of using such ILCs for monitoring laboratory performance as an alternative to PT are:&nbsp;</p><ul><li>All participants use the same measurement procedure i.e. the measurement procedure that is being validated. Unless the measurement procedure is being routinely used by the participating laboratory such an ILC will not assess the routine performance of the laboratory using their own routine measurement procedure. Nor does it enable them to compare their performance with other laboratories using alternative measurement procedures.&nbsp;</li><li>The measurement procedure is likely to be new, so participants may not have established stable procedures and quality control, so performance may not reflect routine use.&nbsp;</li><li>The report from such an ILC would not provide information on the performance of the participant, if the statistical model used makes the assumption that all laboratories perform with equal variability.</li><li>The design of the study may require the participants to assess multiple samples and/or to undertake multiple replicate analysis on the test materials. This may not be representative of the routine measurements or tests undertaken by the laboratory.&nbsp;</li><li>The conclusion of the ILC might be that the measurement procedure being assessed is not valid.&nbsp;</li></ul><p><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_3_a53ecd2f5d.jpg" alt="Eurachem: Interlaboratory comparisons other than proficiency testing" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Interlaboratory_comparisons_other_than_proficiency_testing_3_a53ecd2f5d.jpg 157w," sizes="100vw" width="570" height="566"></p><h4><strong>Characterisation of candidate reference materials&nbsp;</strong></h4><p>These are ILCs that assign a property value to a candidate reference material, usually with a stated measurement uncertainty. These are often referred to as a ‘material certification study’ [2]. Limitations of using such ILCs as an alternative to PT are:&nbsp;</p><ul><li>The analysis of the candidate reference material is likely to require additional care in exercising the routine measurement procedure, such as substantially more replication, and/or may require quite different reporting formats (e.g. all valid replicates instead of a mean result). Thus, such an ILC will not necessarily provide an evaluation of the performance of the laboratory based on the routine use of their measurement procedures.&nbsp;</li><li>The report from such an ILC may include the results from the participating laboratories but would not provide information on the performance of each laboratory.&nbsp;</li><li>Participating laboratories may be required to assess multiple samples and/or to undertake multiple replicate analysis on the candidate reference materials. Thus this may not be representative of the routine measurements or tests undertaken by the laboratory.&nbsp;</li></ul><h4><strong>Other ILCs&nbsp;</strong></h4><p>Some other ILCs, whilst not being conducted in full compliance of the requirements of ISO/IEC 17043, may be designed to evaluate participant performance. These would include small ILCs as defined by EA‑2/21 [5] or split sample ILCs i.e. where a portion of a single sample is sent to two or three laboratories. Whilst these ILCs are specifically designed to evaluate participant performance, they may not provide a comprehensive comparison that a PT might provide. In such cases the laboratory needs to evaluate carefully the competence of the organization managing the ILC and the suitability of the service externally provided (ISO/IEC 17025 clause 6.6).</p>

Interlaboratory comparisons other than proficiency testing

Article

Webinars

Academy

Scientific article

Science and research

Eurachem is a European network promoting international traceability of chemical measurements and good analytical practice. It provides expert guidance, supports method validation, uncertainty evaluation, proficiency testing, and facilitates discussion on technical and policy issues in analytical quality.

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<div><div><div><div><div><div><div><div><div><div><div><div><div><div><div><div><div><div><div><div><div><div><div><p><strong>Our third and last part of the series "FT-IR Spectroscopy in Academia" is all about bio sciences. Martin Luft and Michel Stromereder begin their presentation with a brief look at the literature and continue by highlighting recent advances in protein research. More fundamental applications are also presented, with regular dips into adjacent topics to demonstrate the true value of FT-IR in the bio science.</strong></p><h5><strong>Goal of the Webinar:</strong></h5></div><div><div><div><div><div><div><p>Demonstrate the unique abilities and high relevance of FT-IR spectroscopy in bio science and provide the audience with a basic technical understanding of how proteins and other complex biological samples are analyzed.</p><h5><strong>Who Should Attend:</strong></h5></div></div></div></div></div><div><div><div><div><div><div><ul><li>PhD students, post-docs, professors</li><li>University staff and students</li><li>Biotech researchers</li><li>Biotech industry professionals</li><li>Bio science enthusiasts</li></ul><h5><strong>Topics Discussed:</strong></h5></div><div><div><div><div><div><div><ul><li>Proteins in biology, pharma, and food science</li><li>API and formulation development in pharma</li><li>Biochemicals and biopolymers in material science</li><li>Biofluids and tissue imaging in medical science</li></ul></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div><blockquote><p><strong>Presenter: </strong>Martin Luft (Application Specialist)</p><div><p>Martin Luft has been an application specialist in the field of FT-IR spectroscopy and its application in life science for more than 20 years.</p></div><p><strong>Presenter: </strong>Michel Stromereder (Product Manager)</p><p>Michel Stromereder joined Bruker as a product manager and is responsible for the life science solution portfolio of the INVENIO product line.</p></blockquote></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div>

Bruker: FT-IR in Academia: Bio Science Applications

FT-IR in Academia: Bio Science Applications

Learn about the unique role of FT-IR in biosciences and gain a basic understanding of how proteins and complex biological samples are analyzed.

<div><div><div><div><p><strong>As semiconductor technology proceeds towards nanoscale single crystalline devices, the requirements in material purity and manufacturing accuracy become more grave and demanding. Both semiconductor material R&amp;D and process analytical technology are essential to support the semiconductor line in its advancement.</strong></p><p>FT-IR stands out as an easy and effective tool to investigate the fundamentals of semiconductors among other techniques. It is non-destructive, fast and highly sensitive for impurity quantification or failure analysis.</p><p>In line with this, Bruker has held a webinar illustrating how FT-IR can assist in R&amp;D or process control by delivering in-depth analysis of semiconductor materials and devices.</p><h5><strong>Our Application Expert gives an Overview of:</strong></h5></div><div><div><div><div><div><div><ul><li>Silicon quality control using FT-IR</li><li>Room and low temperature carbon and oxygen quantification in Silicon</li><li>Shallow impurity quantification in Silicon</li><li>Low temperature photoluminescence for Si QC</li><li>Semiconductor device characterization and development (laser, diode, sensors etc.)</li><li>Phonon spectroscopy and photoluminescence spectroscopy for band structure studies.</li></ul><h5><strong>Who Should Attend:</strong></h5></div><div><div><div><div><div><div><ul><li>QC managers</li><li>Head of laboratories</li><li>Head of analytics</li><li>Lab technicians</li><li>Researchers</li></ul><blockquote><p><strong>Presenter: </strong>Dr. Dan Wu (Application Manager at Bruker Optics since over 10 years.)</p></blockquote></div></div></div></div></div></div></div></div></div></div></div></div></div></div>

Bruker: When IR Light Meets Semiconductor

When IR Light Meets Semiconductor

Bruker has held a webinar illustrating how FT-IR can assist in R&D or process control by delivering in-depth analysis of semiconductor materials and devices.

<p><strong>A broad range of techniques (such as XRD, AFM, XRM etc.) can be used to shed light on the working of energy storage materials, among which FT-IR enables time-resolved in-situ monitoring of (electro)chemical processes, e.g. in a lab-level battery model system.&nbsp;</strong></p><p>The combination of FT-IR spectroscopy with electrochemistry offers insight in the material activity and reaction process on a molecular level in addition to the electrochemical response of the system.</p><blockquote><p><strong>Presenter: &nbsp;</strong>Dr. Sergey Shilov (North America Product Manager, Science Business Unit, Bruker Optics)</p><p>Dr. Sergey V. Shilov is a Product Manager for North America at Bruker Optics. Sergey joined Bruker in 2001. He is responsible for the support and development of new applications for the Bruker research FTIR systems. He received his Ph.D. in 1992 from the Russian Academy of Sciences in Polymer Physics and his M.S. from St. Petersburg State University (Russia) in Physics in 1986. Alexander Von Humboldt Foundation (Germany) awarded him a research fellowship in 1996. Sergey published 37 papers in peer-reviewed journals. His research interests include time-resolved FTIR spectroscopy, surface science, polymer, and life-science applications.&nbsp;</p></blockquote>

Bruker: IR Spot on green energy, battery research and CO2 reduction

IR Spot on green energy, battery research and CO2 reduction

<p><strong>In this ~45 minute webinar Sebastian Primpke of the renowned Alfred-Wegener-Institute will tell you about the daily work of a microplastic researcher, the challenges in harmonization and why they use FT-IR imaging as the main tool. The session will conclude with a live Q&amp;A.</strong></p><div><h5><strong>Goals of the webinar:</strong></h5><ul><li>Provide insights into the work of experts in the field of microplastic particle analysis.</li><li>Attendees will learn about best practices, the future of microplastic analysis and the technologies involved.</li></ul><h5><strong>Topics discussed:</strong></h5><ul><li>Techniques used for microplastics analysis</li><li>Requirements for standardization and automation</li><li>Applicational example: drinking water</li><li>Applicational example: treated waste water</li><li>siMPle software and FT-IR imaging technology</li></ul><h5><strong>Who should attend:</strong></h5><ul><li>Microplastics Enthusiasts</li><li>Analytical Service Laboratories</li><li>Environmental Scientist</li></ul><blockquote><p><strong>Presenter: </strong>Dr. Sebastian Primpke</p><div><p>Dr. Sebastian Primpke entered the field of microplastic analytics at the Alfred-Wegener-Institute Helmholtz Centre for Polar- and Marine Research in 2015. In his current research&nbsp; he is focused on the automation and harmonization of spectroscopic analyses of microplastic particles.</p></div><p><strong>Presenter: </strong>Dr. Marten Seeba</p><p>Dr. Marten Seeba graduated in chemistry from the University of Göttingen before joining Bruker as an application expert for FT-IR and IR laser microscopy. He is a point of contact for our customers and as such has gained a great deal of expertise in many applications such as microplastics, pharmaceuticals, tissue analysis and materials science.</p></blockquote></div>

Bruker: The harmonization of microplastics analysis and the role of FT-IR imaging

The harmonization of microplastics analysis and the role of FT-IR imaging

This webinar explores the work of microplastic researchers, challenges in harmonization, and why FT-IR imaging is key.

Harmonizing Microplastics Analysis with FT-IR Imaging

<div><div><div><div><p><strong>This webinar is aimed at the packaging industry, or more precisely, specialists involved in packaging in the food industry. In a first hands-on session, our host will first present two samples and then analyze them together with the audience.&nbsp;</strong></p><p>First, we will look for an EVOH layer in a multi-layer packaging film and then we will check the influence of the adhesive in a cold weld on a candy bar packaging. After that, the utility of FT-IR will be further illustrated briefly by other use-cases, before we continue with the question and answer session.</p><h5><strong>What you will learn about:</strong></h5></div><div><div><div><div><div><div><ul><li>FT-IR microscopy in packaging failure analysis</li><li>Multi-layer polymer films and very thin layers (EVOH)</li><li>Behavior of adhesives in complex matrices</li><li>Troubleshooting of food packaging</li></ul><h5><strong>What is the goal of the webinar:</strong></h5></div><div><div><div><div><div><div><ul><li>Demonstrate the utility of FT-IR microscopy</li><li>Showcase the importance of unbiased data</li><li>Highlight the unique advantages of IR imaging</li></ul><h5><strong>We will discuss:</strong></h5></div></div></div></div></div><div><div><div><div><div><div><ul><li>Application example: Multilayer-Film with EVOH layer smaller than 2 µm</li><li>Application example: Cold weld seal on a candy bar wrapper</li><li>Further application examples from packaging materials</li></ul><h5><strong>Who should attend:</strong></h5></div></div></div></div></div><div><div><div><div><div><div><ul><li>Research experts in food packaging development</li><li>QC specialists for food packaging</li><li>Polymer experts and researchers</li></ul><blockquote><p><strong>Presenter: </strong>Eric Klein, Bruker Optics (Sales &amp; Application / Compact Systems &amp; Micro Analysis)</p><p>Eric Klein started as an application specialist at Bruker in 2009 and has since taken on a leading role as solution expert in failure and root cause analysis using FT-IR microscopy. He has presented multiple webinars on the topic and likes to engage with the audience in Q&amp;A sessions.</p></blockquote></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div>

Bruker: Troubleshooting Food Packaging Materials by µ-FT-IR

Troubleshooting Food Packaging Materials by µ-FT-IR

This webinar shows how FT-IR microscopy supports the food packaging industry by analyzing multilayer films, adhesives, and solving common packaging issues.

<div><div><div><div><div><div><div><div><div><p><strong>FT-IR technique is an indispensable analytical tool in most chemical labs, analytical centers and quality control departments. FT-IR spectroscopy is an ease to use and non-destructive analytical method for verification, identification or quantification. To face the daily challenges arising from high sample amount, unknown materials and multiple (maybe unexperienced) users, you need a highly flexible FT-IR spectrometer with user-friendly automation and outstanding performance.</strong></p><p>Bruker cares about your need and presents you the INVENIO spectrometer platform to make your daily work easy and convenient. In the upcoming free-of-charge webinar on the 18th of March we will focus on the difficulties in analytical labs and explain which features of INVENIO can help in such situations.&nbsp;</p><h5><strong>Key Learning Objectives</strong></h5></div><div><div><div><div><div><div><p>The latest advances in the instrumentation and applications of vibrational spectroscopy for the chemical analysis of surfaces will be reviewed in this presentation with a thorough discussion of the following topics:</p><ul><li>Surface characterization techniques: ATR (attenuated total reflection), including GATR (grazing angle germanium ATR): External (specular) reflection, including IRRAS (infrared reflection and absorption spectroscopy); and DRIFTS (Diffuse Reflection Infrared Fourier Transform Spectroscopy)</li><li>Characterization of thin films and molecular monolayers deposited onto metallic, semiconductor, and dielectric substrates</li><li>Heterogeneous gas-solid catalysis studies of gases interacting with catalytic surfaces</li><li>Optimization of FT-IR instrument parameters for surface analysis</li><li>Techniques to reduce the spectral contribution of atmospheric water and CO<sub>2</sub></li></ul><blockquote><p><strong>Presenter: </strong>Dr. Sergey Shilov (North America Product Manager, Science Business Unit, Bruker Optics)</p><div><p>Dr. Sergey V. Shilov is a Product Manager for North America at Bruker Optics. Sergey joined Bruker in 2001. He is responsible for the support and development of new applications for the Bruker research FTIR systems. He received his Ph.D. in 1992 from the Russian Academy of Sciences in Polymer Physics and his M.S. from St. Petersburg State University (Russia) in Physics in 1986. Alexander Von Humboldt Foundation (Germany) awarded him a research fellowship in 1996. Sergey published 37 papers in peer-reviewed journals. His research interests include time-resolved FTIR spectroscopy, surface science, polymer, and life-science applications.&nbsp;</p></div></blockquote></div></div></div></div></div></div></div></div></div></div></div></div></div></div>

Bruker: Analysis of Surface Chemistry by FT-IR Spectroscopy

Analysis of Surface Chemistry by FT-IR Spectroscopy

Bruker cares about your need and presents you the INVENIO spectrometer platform to make your daily work easy and convenient.

<div><div data-g-name="OverviewStage"><div><div><div><strong>No matter where you look, functional surfaces are part of your life. Whether it's your morning shave, the paint on your car or the anti-fingerprint coating on your cell phone - specially engineered surfaces play a central role in almost everything!</strong></div><div><div><div><div><div><div><p>In this webinar, our surface analysis expert Eric Klein will take you to his lab and work through typical examples of industrial surface analysis. We will show you the step by step analysis and troubleshooting of:</p><ul><li>Treated quality razor blades for consumers</li><li>Painted sheet metal from the automotive sector</li><li>Contaminated sheet metal before refinement</li><li>DLC coated tools and equipment&nbsp;</li><li>Cleanliness check of soldering and bonding pads</li></ul><h5><strong>You will learn about:</strong></h5></div><div><div><div><div><div><div><ul><li>How to elucidate the causes of surface damages</li><li>Which experimental technique should be used for certain samples types</li><li>Proper experimental procedure using FT-IR microscopy and imaging</li><li>The value of FT-IR in process troubleshooting and industrial QC</li></ul><h5><strong>We will cover the basics of:</strong></h5><ul><li>Surface Analysis and Troubleshooting</li><li>Infrared (FT-IR) Microscopy and Imaging</li><li>FT-IR Sampling Techniques</li></ul><h5><strong>Who should attend:</strong></h5></div><div><div><div><div><div><div><ul><li>Automotive QA/QC Specialists</li><li>Coating Experts and Surface Refiners</li><li>Industrial Manufacturers and Material Researchers</li><li>Analytical Service Laboratories</li></ul><blockquote><p><strong>Presenter: &nbsp;</strong>Eric Klein, Bruker Optics (Sales &amp; Application / Compact Systems &amp; Micro Analysis)</p><p>Eric Klein started as an application specialist at Bruker in 2009 and has since taken on a leading role as solution expert in failure and root cause analysis using FT-IR microscopy. He has presented multiple webinars on the topic and likes to engage with the audience in Q&amp;A sessions.</p></blockquote></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div></div>

Bruker: How to Utilize FT-IR for the Analysis of Coatings, Surface Treatments and Technical Cleanliness

How to Utilize FT-IR for the Analysis of Coatings, Surface Treatments and Technical Cleanliness.

In this webinar, our surface analysis expert Eric Klein will take you to his lab and work through typical examples of industrial surface analysis. 

Using FT-IR for Coatings, Surface Treatments & Cleanliness

<div><p><strong>For decades, research and development (R&amp;D) has propelled the rapid pace of innovation in the semiconductor industry for developing new materials and improving manufacturing process. In many application fields, such as renewable energy (photovoltaics or hydrogen technology), aerospace and electronics, semiconductors (especially silicon) serve as fundamental and indispensable material. On the other hand, to ensure high efficiency and product quality, silicon quality control in form of identification and quantification of impurities, detection of defects or functionality test of optical devices becomes a crucial and demanding task in semiconductor industry.</strong></p><p>For semiconductor QC, among other techniques, FT-IR spectroscopy stands out as an easy and effective tool. Bruker provides a broad product portfolio to help innovating in development and process control. Phonon spectroscopy, photoluminescence, studies of band gap and electronic features using bench-top spectrometers reveal valuable information on crystal structure and quality. All-in-one Si QC system or at-line ingot analyzer dedicated for industrial environment, are highly sensitive, easy to use and optimized for saving cost in the manufacturing process.</p><p>In an upcoming free-of-charge two-part webinar we will introduce you Bruker’s high sensitivity solutions for semiconductor quality control using FT-IR spectroscopy. Bench-top or at-line systems, measuring at low temperature or room temperature, Bruker can provide the suitable instrument.&nbsp;</p></div>

Bruker: High sensitivity Silicon QC using FT-IR Spectroscopy

High sensitivity Silicon QC using FT-IR Spectroscopy

We will introduce you Bruker’s high sensitivity solutions for semiconductor quality control using FT-IR spectroscopy.

<p><strong>A standard ATR measurement using FT-IR technique for the mid IR spectral range usually lasts a few seconds to half a minute. This is very convenient and fast for identification, verification of substance or similar routine analysis. But when it comes to applications, for which temporal resolution is required, e.g. kinetics studies, reaction monitoring, identification and separation of intermediate species or characterization of pulsed laser, time-resolved FT-IR spectroscopy (TRS) is mandatory.</strong></p><p>With up-to-date electronics, long-time experience and knowhow, Bruker as a FT-IR manufacturer can provide research spectrometers achieving a temporal resolution of a few ms , µs or even ns, depending on the applied TRS technique. The rapid-scan technique is limited to a time resolution in the low millisecond range and is widely used to characterize the kinetics of single shot chemical reactions. For repetitive kinetics, step-scan overcomes these limitations and reaches a time resolution down to the low nanosecond range. Interleaved TRS is a technique applicable to a certain class of repetitive kinetics, where the measurement time is used much more efficiently compared to step-scan. A Bruker research spectrometer can be equipped with all above TRS options. Depending on the application and the required temporal resolution, one of these options can be applied.</p><p>In the upcoming free-of-charge two-part webinar about TRS techniques you will learn about the functional principles, practical handling, instrumental setups and application fields of the time-resolved FT-IR techniques.</p>

Bruker: Different TRS Techniques of FT-IR

Different TRS Techniques of FT-IR

This free two-part webinar covers the principles, setup, handling, and applications of time-resolved FT-IR (TRS) techniques in research and practical use.

<div><p><strong>Thermal gravimetric analysis (TGA) is an ideal tool for the characterization of all kinds of organic and inorganic solids and liquids. Thermodynamic transitions, thermal stability, decomposition and chemical reactions can be detected and quantified with high accuracy over a broad temperature range. However, this method does not provide details about the chemistry behind the processes under study</strong>.</p><p>The combination of thermal analysis with infrared spectroscopy bridges this analytical gap. Fourier-Transform Infrared (FT-IR) spectroscopy is a classical tool for the identification and quantification of gases. This technique is based on the interaction of infrared radiation with the vibrating dipole moments of molecules. FT-IR yields a unique IR spectrum for each substance, except for homonuclear diatomic gases and pure metals</p><p>In a simple case, only one type of gas molecule is evolved with an applied temperature increase in the TGA. The evolved gas is flowed into the FT-IR and can be readily identified by searching its spectrum against a gas phase reference library. In a typical decomposition process, evolved fume is a mixture of gases. Different hardware and software approaches to identify the composition of complex gas mixtures will be presented with a thorough discussion of the following topics:</p><ul><li>Mixture analysis using library search</li><li>TGA-IR at reduced pressure&nbsp;</li><li>Spectra manipulation method for deconvoluting complex spectra (mixtures)</li></ul><p>Examples of applications will include the identification of plasticizers in polymers, PVC undercoating analysis, decomposition of&nbsp;PETN explosive, NHF propellant, and others.</p><blockquote><p><strong>Presenter: </strong>Dr. Sergey Shilov (North America Product Manager, Science Business Unit, Bruker Optics)</p><div><p>Dr. Sergey V. Shilov is a Product Manager for North America at Bruker Optics. Sergey joined Bruker in 2001. He is responsible for the support and development of new applications for the Bruker research FTIR systems. He received his Ph.D. in 1992 from the Russian Academy of Sciences in Polymer Physics and his M.S. from St. Petersburg State University (Russia) in Physics in 1986. Alexander Von Humboldt Foundation (Germany) awarded him a research fellowship in 1996. Sergey published 37 papers in peer-reviewed journals. His research interests include time-resolved FTIR spectroscopy, surface science, polymer, and life-science applications.&nbsp;</p></div></blockquote></div>

Bruker: To Evaluate Complex Gas Mixtures evolved during Thermal Decomposition

To Evaluate Complex Gas Mixtures evolved during Thermal Decomposition

Learn how combining TGA with FT-IR enables chemical analysis of evolved gases, including mixture analysis, spectral deconvolution, and practical applications.

ICPMS webinars focusing on FTIR Spectroscopy - page 17